{"id":"https://openalex.org/W7123723866","doi":"https://doi.org/10.1109/comnetsat68601.2025.11324576","title":"Low-Light Welding Defect Detection Using Retinex-Enhanced YOLOv11 for Steel Welding Inspection","display_name":"Low-Light Welding Defect Detection Using Retinex-Enhanced YOLOv11 for Steel Welding Inspection","publication_year":2025,"publication_date":"2025-12-11","ids":{"openalex":"https://openalex.org/W7123723866","doi":"https://doi.org/10.1109/comnetsat68601.2025.11324576"},"language":"en","primary_location":{"id":"doi:10.1109/comnetsat68601.2025.11324576","doi":"https://doi.org/10.1109/comnetsat68601.2025.11324576","is_oa":false,"landing_page_url":"https://doi.org/10.1109/comnetsat68601.2025.11324576","pdf_url":null,"source":{"id":"https://openalex.org/S7407087273","display_name":"IEEE International Conference on Communication, Networks and Satellite (COMNETSAT)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Conference on Communication, Networks and Satellite (COMNETSAT)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089353228","display_name":"Yonky Pernando","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I166073570","display_name":"Binus University","ror":"https://ror.org/03zmf4s77","country_code":"ID","type":"education","lineage":["https://openalex.org/I166073570"]}],"countries":["ID"],"is_corresponding":false,"raw_author_name":"Yonky Pernando","raw_affiliation_strings":["Bina Nusantara University,BINUS Graduate Program - Computer Science,Computer Science Department,Jakarta,Indonesia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bina Nusantara University,BINUS Graduate Program - Computer Science,Computer Science Department,Jakarta,Indonesia","institution_ids":["https://openalex.org/I166073570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036256072","display_name":"Nur Afny Catur Andryani","orcid":"https://orcid.org/0000-0002-2945-3391","observed_orcids":["https://orcid.org/0000-0002-2945-3391"]},"institutions":[{"id":"https://openalex.org/I166073570","display_name":"Binus University","ror":"https://ror.org/03zmf4s77","country_code":"ID","type":"education","lineage":["https://openalex.org/I166073570"]}],"countries":["ID"],"is_corresponding":false,"raw_author_name":"Nur Afny Catur Andryani","raw_affiliation_strings":["Bina Nusantara University,BINUS Graduate Program - Computer Science,Computer Science Department,Jakarta,Indonesia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bina Nusantara University,BINUS Graduate Program - Computer Science,Computer Science Department,Jakarta,Indonesia","institution_ids":["https://openalex.org/I166073570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016075689","display_name":"Andry Chowanda","orcid":"https://orcid.org/0000-0002-2150-414X","observed_orcids":["https://orcid.org/0000-0002-2150-414X"]},"institutions":[{"id":"https://openalex.org/I166073570","display_name":"Binus University","ror":"https://ror.org/03zmf4s77","country_code":"ID","type":"education","lineage":["https://openalex.org/I166073570"]}],"countries":["ID"],"is_corresponding":false,"raw_author_name":"Andry Chowanda","raw_affiliation_strings":["Bina Nusantara University,School of Computer Science,Department of Computer Science,Jakarta,Indonesia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bina Nusantara University,School of Computer Science,Department of Computer Science,Jakarta,Indonesia","institution_ids":["https://openalex.org/I166073570"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000614683","display_name":"Widodo Budiharto","orcid":"https://orcid.org/0000-0003-2681-0901","observed_orcids":["https://orcid.org/0000-0003-2681-0901"]},"institutions":[{"id":"https://openalex.org/I166073570","display_name":"Binus University","ror":"https://ror.org/03zmf4s77","country_code":"ID","type":"education","lineage":["https://openalex.org/I166073570"]}],"countries":["ID"],"is_corresponding":false,"raw_author_name":"Widodo Budiharto","raw_affiliation_strings":["Bina Nusantara University,School of Computer Science,Computer Science Department,Jakarta,Indonesia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bina Nusantara University,School of Computer Science,Computer Science Department,Jakarta,Indonesia","institution_ids":["https://openalex.org/I166073570"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I166073570"],"apc_list":null,"apc_paid":null,"fwci":7.2059,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.97640187,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"77","last_page":"83"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.0005000000237487257,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/weld-defect-detection","display_name":"weld defect detection","score":0.984000027179718},{"id":"https://openalex.org/keywords/low-light-image-enhancement","display_name":"low-light image enhancement","score":0.8130000233650208},{"id":"https://openalex.org/keywords/retinex","display_name":"Retinex","score":0.9819999933242798},{"id":"https://openalex.org/keywords/yolo11","display_name":"YOLOv11","score":0.9900000095367432},{"id":"https://openalex.org/keywords/illumination-enhancement","display_name":"illumination enhancement","score":0.6019999980926514},{"id":"https://openalex.org/keywords/weld-seam-detection","display_name":"weld seam detection","score":0.5199999809265137},{"id":"https://openalex.org/keywords/industrial-visual-inspection","display_name":"industrial visual inspection","score":0.6650000214576721},{"id":"https://openalex.org/keywords/knowledge-distillation","display_name":"knowledge distillation","score":0.6880000233650208}],"concepts":[{"id":"https://openalex.org/C19474535","wikidata":"https://www.wikidata.org/wiki/Q131172","display_name":"Welding","level":2,"score":0.6205000281333923},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5806999802589417},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.558899998664856},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.5468000173568726},{"id":"https://openalex.org/C34736171","wikidata":"https://www.wikidata.org/wiki/Q918333","display_name":"Preprocessor","level":2,"score":0.4925000071525574},{"id":"https://openalex.org/C123403432","wikidata":"https://www.wikidata.org/wiki/Q654068","display_name":"Visibility","level":2,"score":0.44279998540878296},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.43140000104904175},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.41200000047683716},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.3691999912261963},{"id":"https://openalex.org/C10551718","wikidata":"https://www.wikidata.org/wiki/Q5227332","display_name":"Data pre-processing","level":2,"score":0.36059999465942383},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.35089999437332153},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.3366999924182892},{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.326200008392334},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.3212999999523163},{"id":"https://openalex.org/C40149104","wikidata":"https://www.wikidata.org/wiki/Q5620977","display_name":"Factory (object-oriented programming)","level":2,"score":0.29510000348091125},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.2842999994754791},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.28380000591278076},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.28060001134872437},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.26829999685287476},{"id":"https://openalex.org/C154020017","wikidata":"https://www.wikidata.org/wiki/Q520171","display_name":"Repeatability","level":2,"score":0.26829999685287476},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.25999999046325684}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/comnetsat68601.2025.11324576","doi":"https://doi.org/10.1109/comnetsat68601.2025.11324576","is_oa":false,"landing_page_url":"https://doi.org/10.1109/comnetsat68601.2025.11324576","pdf_url":null,"source":{"id":"https://openalex.org/S7407087273","display_name":"IEEE International Conference on Communication, Networks and Satellite (COMNETSAT)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Conference on Communication, Networks and Satellite (COMNETSAT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5378999710083008,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W3160325901","https://openalex.org/W3185239243","https://openalex.org/W4281393542","https://openalex.org/W4308787184","https://openalex.org/W4313892626","https://openalex.org/W4327972770","https://openalex.org/W4384341595","https://openalex.org/W4386251673","https://openalex.org/W4401133507","https://openalex.org/W4402569281","https://openalex.org/W4404036305","https://openalex.org/W4405851346","https://openalex.org/W4406783308","https://openalex.org/W4407214915","https://openalex.org/W4408183129","https://openalex.org/W4414038557"],"related_works":["https://openalex.org/W7124469490","https://openalex.org/W7215879181","https://openalex.org/W4413271655","https://openalex.org/W7160172371","https://openalex.org/W4413402292","https://openalex.org/W7140286772","https://openalex.org/W4417494984","https://openalex.org/W7127039026","https://openalex.org/W7132824970","https://openalex.org/W4412191769"],"abstract_inverted_index":{"Welding":[0],"defect":[1,62],"detection":[2,50,78],"in":[3,77,131,168],"low-light":[4],"industrial":[5,133],"environments":[6,134],"remains":[7],"a":[8,37],"challenging":[9,124],"task":[10],"due":[11],"to":[12,88,151],"poor":[13],"brightness,":[14],"low":[15],"contrast,":[16],"and":[17,25,61,68,84,96,114,129],"high":[18,159],"noise":[19],"levels":[20],"that":[21],"degrade":[22],"image":[23],"quality":[24],"hinder":[26],"reliable":[27],"feature":[28],"extraction.":[29],"To":[30],"address":[31],"this":[32,34],"limitation,":[33],"study":[35],"integrates":[36],"Retinex-based":[38],"adaptive":[39],"illumination":[40,66],"enhancement":[41,105],"module":[42],"into":[43],"the":[44,48,56,89,100,103,118],"preprocessing":[45],"stage":[46],"of":[47,58,102,157],"YOLOv11":[49],"framework.":[51],"The":[52],"proposed":[53,104],"method":[54],"improves":[55],"visibility":[57],"weld":[59],"seams":[60],"textures":[63],"by":[64],"restoring":[65],"balance":[67],"preserving":[69],"structural":[70],"details.":[71],"Experimental":[72],"results":[73],"demonstrate":[74],"significant":[75],"gains":[76],"performance,":[79],"with":[80,161],"increased":[81],"precision,":[82],"recall,":[83],"mAP":[85],"metrics":[86],"compared":[87],"baseline":[90],"model.":[91],"Quantitative":[92],"evaluations":[93],"using":[94],"PSNR":[95],"SSIM":[97],"further":[98],"confirm":[99],"superiority":[101],"technique":[106],"over":[107],"classical":[108],"methods":[109],"such":[110],"as":[111],"Gamma,":[112],"LIME,":[113],"Retinex":[115],"SSR.":[116],"Although":[117],"approach":[119],"effectively":[120],"enhances":[121],"performance":[122],"under":[123],"lighting":[125],"conditions,":[126],"real-time":[127],"efficiency":[128],"robustness":[130],"uncontrolled":[132],"remain":[135],"open":[136],"issues.":[137],"Future":[138],"work":[139],"will":[140],"focus":[141],"on":[142],"optimizing":[143],"high-capacity":[144],"YOLO":[145],"architectures":[146],"through":[147],"Knowledge":[148],"Distillation":[149],"(KD)":[150],"develop":[152],"lightweight":[153],"student":[154],"models":[155],"capable":[156],"achieving":[158],"accuracy":[160],"reduced":[162],"computational":[163],"cost,":[164],"enabling":[165],"practical":[166],"deployment":[167],"real-world":[169],"welding":[170],"inspection":[171],"systems":[172]},"counts_by_year":[{"year":2026,"cited_by_count":4}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2026-01-14T00:00:00"}