{"id":"https://openalex.org/W7095679019","doi":null,"title":"DEFECT DETECTION AND CLASSIFICATION USING MACHINE LEARNING CLASSIFIER","display_name":"DEFECT DETECTION AND CLASSIFICATION USING MACHINE LEARNING CLASSIFIER","publication_year":2008,"publication_date":"2008-12-29","ids":{"openalex":"https://openalex.org/W7095679019"},"language":"en","primary_location":{"id":"pmh:oai:CiteSeerX.psu:10.1.1.128.6342","doi":null,"is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.128.6342","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ndt.net/article/wcndt2004/pdf/in-process_ndt-nde/788_popat.pdf","raw_type":"text"},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Mitesh Popat","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mitesh Popat","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":null,"display_name":"S V Barai","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S V Barai","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.73126695,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":true,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.0017000000225380063,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/defect-detection","display_name":"defect detection","score":0.9089999794960022},{"id":"https://openalex.org/keywords/defect-classification","display_name":"defect classification","score":0.9639999866485596},{"id":"https://openalex.org/keywords/hot-rolled-strip","display_name":"hot-rolled strip","score":0.6840000152587891},{"id":"https://openalex.org/keywords/automatic-surface-inspection","display_name":"automatic surface inspection","score":0.718999981880188},{"id":"https://openalex.org/keywords/hot-strip-mill","display_name":"hot strip mill","score":0.718999981880188},{"id":"https://openalex.org/keywords/neural-network","display_name":"artificial neural networks","score":0.8550000190734863},{"id":"https://openalex.org/keywords/steelmaking","display_name":"steel industry","score":0.5699999928474426},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"visual inspection","score":0.652999997138977},{"id":"https://openalex.org/keywords/model-reliability","display_name":"model reliability","score":0.515999972820282}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7271000146865845},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.722000002861023},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.6133000254631042},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5633999705314636},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5619000196456909},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.534600019454956},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4523000121116638},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.43959999084472656},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.375900000333786},{"id":"https://openalex.org/C36464697","wikidata":"https://www.wikidata.org/wiki/Q451553","display_name":"Visualization","level":2,"score":0.3652999997138977},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.3433000147342682},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.33980000019073486},{"id":"https://openalex.org/C2984842247","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep neural networks","level":3,"score":0.3375000059604645},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.32249999046325684},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.3059999942779541},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2897999882698059},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.26669999957084656},{"id":"https://openalex.org/C3019060180","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automated method","level":2,"score":0.2628999948501587},{"id":"https://openalex.org/C199672914","wikidata":"https://www.wikidata.org/wiki/Q4241353","display_name":"Hot spot (computer programming)","level":2,"score":0.26269999146461487},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.2508000135421753}],"mesh":[],"locations_count":1,"locations":[{"id":"pmh:oai:CiteSeerX.psu:10.1.1.128.6342","doi":null,"is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.128.6342","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ndt.net/article/wcndt2004/pdf/in-process_ndt-nde/788_popat.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W798995433","https://openalex.org/W2546194490","https://openalex.org/W2972891510","https://openalex.org/W4386067141","https://openalex.org/W2386468718","https://openalex.org/W4210657921","https://openalex.org/W2948698927","https://openalex.org/W2050947171","https://openalex.org/W2139963745","https://openalex.org/W4385729659"],"abstract_inverted_index":{"Abstract:":[0],"In":[1,75,102,124],"most":[2,89],"cases":[3,90],"visual":[4,78,141],"inspection":[5,69,79,142],"of":[6,41,49,51,80,94,130,151],"the":[7,81,95,131],"hot":[8,52,71,82],"strip":[9,72,83],"by":[10,84],"an":[11,85],"inspector":[12,86],"(in":[13],"real":[14],"time":[15],"or":[16,118,134],"videotaped)":[17],"is":[18,143],"a":[19,148],"difficult":[20],"task.":[21],"The":[22,54],"issues":[23],"in":[24,88],"this":[25,125,140],"project":[26],"study":[27,56],"are":[28,137],"data":[29],"modeling,":[30],"Machine":[31],"Learning":[32],"(ML)":[33],"model-":[34],"neural":[35],"networks":[36],"(NN)":[37],"modeling":[38],"and":[39,47,98,108,145],"reliability":[40],"such":[42],"models":[43],"for":[44,62,66,70,122],"automatic":[45,67],"detection":[46],"classification":[48],"defects":[50],"strips.":[53],"proposed":[55],"intends":[57],"to":[58],"develop":[59],"general":[60],"guidelines":[61],"developing":[63],"NN":[64],"model":[65],"surface":[68],"mills.":[73],"Introduction:":[74],"steel":[76],"industry,":[77],"is,":[87],"not":[91],"possible":[92],"because":[93],"high":[96,99],"speeds":[97],"temperature":[100],"involved.":[101],"recent":[103],"times,":[104],"only":[105,127],"video":[106,109,120],"monitors":[107],"recorders":[110],"have":[111],"been":[112],"used":[113],"where":[114],"inspectors":[115],"check":[116],"on-line":[117],"taped":[119],"sequences":[121],"defects.":[123],"way,":[126],"small":[128],"parts":[129],"strip\u2019s":[132],"top":[133],"bottom":[135],"side":[136],"viewed.":[138],"Additionally,":[139],"subjective":[144],"dependent":[146],"on":[147],"large":[149],"number":[150],"human":[152]},"counts_by_year":[],"updated_date":"2026-08-26T07:47:46.906454","created_date":"2025-10-27T00:00:00"}