{"id":"https://openalex.org/W69645247","doi":"https://doi.org/10.1016/j.icheatmasstransfer.2004.10.015","title":"Electrical impedance imaging of two-phase flows undergoing rapid transient","display_name":"Electrical impedance imaging of two-phase flows undergoing rapid transient","publication_year":2005,"publication_date":"2005-03-19","ids":{"openalex":"https://openalex.org/W69645247","doi":"https://doi.org/10.1016/j.icheatmasstransfer.2004.10.015","mag":"69645247"},"language":"en","primary_location":{"id":"doi:10.1016/j.icheatmasstransfer.2004.10.015","doi":"https://doi.org/10.1016/j.icheatmasstransfer.2004.10.015","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.icheatmasstransfer.2004.10.015","pdf_url":null,"source":{"id":"https://openalex.org/S118246204","display_name":"International Communications in Heat and Mass Transfer","issn_l":"0735-1933","issn":["0735-1933","1879-0178"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Communications in Heat and Mass Transfer","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069385457","display_name":"Kyung Youn Kim","orcid":"https://orcid.org/0000-0002-1814-9546","observed_orcids":["https://orcid.org/0000-0002-1814-9546"]},"institutions":[{"id":"https://openalex.org/I83202590","display_name":"Jeju National University","ror":"https://ror.org/05hnb4n85","country_code":"KR","type":"education","lineage":["https://openalex.org/I83202590"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyung Youn Kim","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Cheju National University, Cheju, 690-756, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Cheju National University, Cheju, 690-756, South Korea","institution_ids":["https://openalex.org/I83202590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110430954","display_name":"Bong Seok Kim","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I83202590","display_name":"Jeju National University","ror":"https://ror.org/05hnb4n85","country_code":"KR","type":"education","lineage":["https://openalex.org/I83202590"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Bong Seok Kim","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Cheju National University, Cheju, 690-756, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Cheju National University, Cheju, 690-756, South Korea","institution_ids":["https://openalex.org/I83202590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067039251","display_name":"Min Chan Kim","orcid":"https://orcid.org/0000-0002-4571-8767","observed_orcids":["https://orcid.org/0000-0002-4571-8767","https://orcid.org/0009-0002-7436-5689"]},"institutions":[{"id":"https://openalex.org/I83202590","display_name":"Jeju National University","ror":"https://ror.org/05hnb4n85","country_code":"KR","type":"education","lineage":["https://openalex.org/I83202590"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Min Chan Kim","raw_affiliation_strings":["Department of Chemical Engineering, Cheju National University, Cheju, 690-756, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemical Engineering, Cheju National University, Cheju, 690-756, South Korea","institution_ids":["https://openalex.org/I83202590"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Kyung Jin Lee","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I83202590","display_name":"Jeju National University","ror":"https://ror.org/05hnb4n85","country_code":"KR","type":"education","lineage":["https://openalex.org/I83202590"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyung Jin Lee","raw_affiliation_strings":["Department of Nuclear and Energy Engineering, Cheju National University, Cheju, 690-756, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Nuclear and Energy Engineering, Cheju National University, Cheju, 690-756, South Korea","institution_ids":["https://openalex.org/I83202590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000735899","display_name":"Yung Joo Ko","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I83202590","display_name":"Jeju National University","ror":"https://ror.org/05hnb4n85","country_code":"KR","type":"education","lineage":["https://openalex.org/I83202590"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yung Joo Ko","raw_affiliation_strings":["Department of Nuclear and Energy Engineering, Cheju National University, Cheju, 690-756, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Nuclear and Energy Engineering, Cheju National University, Cheju, 690-756, South Korea","institution_ids":["https://openalex.org/I83202590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027804835","display_name":"Sin Kim","orcid":"https://orcid.org/0000-0002-7600-9584","observed_orcids":["https://orcid.org/0000-0002-7600-9584","https://orcid.org/0000-0003-4652-3758"]},"institutions":[{"id":"https://openalex.org/I83202590","display_name":"Jeju National University","ror":"https://ror.org/05hnb4n85","country_code":"KR","type":"education","lineage":["https://openalex.org/I83202590"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sin Kim","raw_affiliation_strings":["Department of Nuclear and Energy Engineering, Cheju National University, Cheju, 690-756, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Nuclear and Energy Engineering, Cheju National University, Cheju, 690-756, South Korea","institution_ids":["https://openalex.org/I83202590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5027804835"],"corresponding_institution_ids":["https://openalex.org/I83202590"],"apc_list":{"value":3560,"currency":"USD","value_usd":3560},"apc_paid":null,"fwci":0.9222,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.75197426,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"32","issue":"5","first_page":"648","last_page":"656"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11205","display_name":"Numerical methods in inverse problems","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2610","display_name":"Mathematical Physics"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"electrical impedance tomography","score":0.8700000047683716},{"id":"https://openalex.org/keywords/two-phase-flow","display_name":"two-phase flow","score":0.9589999914169312},{"id":"https://openalex.org/keywords/transient-imaging","display_name":"transient imaging","score":0.6819999814033508},{"id":"https://openalex.org/keywords/current-patterns","display_name":"current patterns","score":0.6539999842643738},{"id":"https://openalex.org/keywords/image-reconstruction","display_name":"image reconstruction","score":0.984000027179718},{"id":"https://openalex.org/keywords/dynamic-imaging","display_name":"dynamic imaging","score":0.5189999938011169},{"id":"https://openalex.org/keywords/multiphase-flow-imaging","display_name":"multiphase flow imaging","score":0.6019999980926514}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.7940206527709961},{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.7619713544845581},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.70966637134552},{"id":"https://openalex.org/C29001434","wikidata":"https://www.wikidata.org/wiki/Q8084","display_name":"Trigonometry","level":2,"score":0.5854235887527466},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5750777125358582},{"id":"https://openalex.org/C2988004515","wikidata":"https://www.wikidata.org/wiki/Q11651","display_name":"Electrical current","level":2,"score":0.49495190382003784},{"id":"https://openalex.org/C177454536","wikidata":"https://www.wikidata.org/wiki/Q578290","display_name":"Emphasis (telecommunications)","level":2,"score":0.4910557270050049},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4789503216743469},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.4695969820022583},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.46752217411994934},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.4427223801612854},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.4327007532119751},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.43086281418800354},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.36409544944763184},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19065722823143005},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.171548992395401},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1545323133468628},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10415822267532349},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08702361583709717},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.08563390374183655},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.icheatmasstransfer.2004.10.015","doi":"https://doi.org/10.1016/j.icheatmasstransfer.2004.10.015","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.icheatmasstransfer.2004.10.015","pdf_url":null,"source":{"id":"https://openalex.org/S118246204","display_name":"International Communications in Heat and Mass Transfer","issn_l":"0735-1933","issn":["0735-1933","1879-0178"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Communications in Heat and Mass Transfer","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1968797734","https://openalex.org/W2000144389","https://openalex.org/W2070314539","https://openalex.org/W2103520741","https://openalex.org/W4300851040"],"related_works":["https://openalex.org/W2211855468","https://openalex.org/W2058462060","https://openalex.org/W20432420","https://openalex.org/W2111931958","https://openalex.org/W3216901861","https://openalex.org/W1980337677","https://openalex.org/W2145870225","https://openalex.org/W4253673012","https://openalex.org/W7034464936","https://openalex.org/W2105939543"],"abstract_inverted_index":null,"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}