{"id":"https://openalex.org/W62188333","doi":null,"title":"\u00c9tude et caract\u00e9risation de la fiabilit\u00e9 de cellules m\u00e9moire non volatiles pour des technologies CMOS et BICMOS avanc\u00e9es","display_name":"\u00c9tude et caract\u00e9risation de la fiabilit\u00e9 de cellules m\u00e9moire non volatiles pour des technologies CMOS et BICMOS avanc\u00e9es","publication_year":2007,"publication_date":"2007-01-01","ids":{"openalex":"https://openalex.org/W62188333","mag":"62188333"},"language":"fr","primary_location":{"id":"pmh:hdl:10068/800515","doi":null,"is_oa":true,"landing_page_url":"http://hdl.handle.net/10068/800515","pdf_url":null,"source":{"id":"https://openalex.org/S4377196900","display_name":"OpenGrey (Institut de l'Information Scientifique et Technique)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1295345811","host_organization_name":"Institut de l'Information Scientifique et Technique","host_organization_lineage":["https://openalex.org/I1295345811"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"U - Thesis"},"volume":null,"type":"dissertation","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/10068/800515","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055085547","display_name":"Pascal Mora","orcid":"https://orcid.org/0000-0001-5047-2821","observed_orcids":["https://orcid.org/0000-0001-5047-2821"]},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Pascal Mora","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0001-5047-2821","affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5055085547"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.6601999998092651,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.6601999998092651,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.10209999978542328,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.06449999660253525,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"non-volatile memory","score":0.9350000023841858},{"id":"https://openalex.org/keywords/flash-memory","display_name":"flash memory","score":0.6660000085830688},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6480000019073486},{"id":"https://openalex.org/keywords/bicmos","display_name":"BiCMOS","score":0.9520000219345093},{"id":"https://openalex.org/keywords/memory-reliability","display_name":"memory reliability","score":0.6499999761581421},{"id":"https://openalex.org/keywords/failure-mechanisms","display_name":"failure mechanisms","score":0.824999988079071},{"id":"https://openalex.org/keywords/data-retention","display_name":"data retention","score":0.8190000057220459},{"id":"https://openalex.org/keywords/charge-loss","display_name":"charge loss","score":0.7329999804496765},{"id":"https://openalex.org/keywords/embedded-memory","display_name":"embedded memory","score":0.6330000162124634},{"id":"https://openalex.org/keywords/memory-cell-architecture","display_name":"memory cell architecture","score":0.6389999985694885}],"concepts":[{"id":"https://openalex.org/C15708023","wikidata":"https://www.wikidata.org/wiki/Q80083","display_name":"Humanities","level":1,"score":0.8283904790878296},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5804783701896667},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.40005379915237427}],"mesh":[],"locations_count":2,"locations":[{"id":"pmh:hdl:10068/800515","doi":null,"is_oa":true,"landing_page_url":"http://hdl.handle.net/10068/800515","pdf_url":null,"source":{"id":"https://openalex.org/S4377196900","display_name":"OpenGrey (Institut de l'Information Scientifique et Technique)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1295345811","host_organization_name":"Institut de l'Information Scientifique et Technique","host_organization_lineage":["https://openalex.org/I1295345811"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"U - Thesis"},{"id":"mag:62188333","doi":null,"is_oa":false,"landing_page_url":"https://www.theses.fr/2007INPG0065","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"pmh:hdl:10068/800515","doi":null,"is_oa":true,"landing_page_url":"http://hdl.handle.net/10068/800515","pdf_url":null,"source":{"id":"https://openalex.org/S4377196900","display_name":"OpenGrey (Institut de l'Information Scientifique et Technique)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1295345811","host_organization_name":"Institut de l'Information Scientifique et Technique","host_organization_lineage":["https://openalex.org/I1295345811"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"U - Thesis"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W7062680051","https://openalex.org/W7014961542","https://openalex.org/W658452051","https://openalex.org/W2280647211","https://openalex.org/W216450438","https://openalex.org/W7151844220","https://openalex.org/W7143458847","https://openalex.org/W7143945374","https://openalex.org/W6999223784","https://openalex.org/W2601084422"],"abstract_inverted_index":{"Aujourd'hui":[0],"les":[1,17,138],"solutions":[2,132],"m\u00e9moire":[3],"programmables":[4],"de":[5,31,40,49,55,67,74,77,82,94,107,114,117,125,136,140,142,145],"type":[6,48,144],"Flash":[7],"compatibles":[8],"CMOS":[9],"sont":[10,43,70],"tr\u00e8s":[11],"demand\u00e9es.":[12],"Cependant,":[13],"leur":[14],"int\u00e9gration":[15],"dans":[16,60],"technologies":[18],"logiques":[19],"se":[20],"heurte":[21],"\u00e0":[22,46],"des":[23,53,72,79,84,92,128],"barri\u00e8res":[24],"physiques":[25],"li\u00e9es":[26],"au":[27,109],"caract\u00e8re":[28],"non":[29],"volatile":[30],"la":[32,87,115,126],"structure.":[33],"En":[34],"effet,":[35],"certaines":[36],"\u00e9tapes":[37],"du":[38],"proc\u00e9d\u00e9":[39],"fabrication":[41],"ne":[42],"pas":[44],"adapt\u00e9es":[45],"ce":[47,61,143],"fonctionnement":[50],"et":[51,81,96],"induisent":[52],"probl\u00e8mes":[54],"fiabilit\u00e9.":[56],"La":[57],"th\u00e8se":[58],"s'inscrit":[59],"contexte":[62],"avec":[63],"trois":[64],"grands":[65],"axes":[66],"travail":[68],"qui":[69,120],"l'\u00e9tude":[71],"m\u00e9canismes":[73],"d\u00e9faillance,":[75],"l'\u00e9valuation":[76],"I'impact":[78],"proc\u00e9d\u00e9s":[80],"l'architecture":[83],"cellules":[85],"sur":[86,104],"fiabilit\u00e9":[88,127],"ainsi":[89],"que":[90],"l'optimisation":[91],"structures":[93],"test":[95],"m\u00e9thodes":[97],"d'analyse.":[98],"Une":[99],"attention":[100],"particuli\u00e8re":[101],"est":[102,121],"port\u00e9e":[103],"l'aspect":[105],"r\u00e9tention":[106],"donn\u00e9es":[108],"travers":[110],"d'une":[111],"\u00e9tude":[112],"approfondie":[113],"perte":[116],"charge":[118],"rapide":[119],"un":[122],"point":[123],"critique":[124],"m\u00e9moires":[129,146],"embarqu\u00e9es.":[130],"Les":[131],"technologiques":[133],"propos\u00e9es":[134],"permettent":[135],"repousser":[137],"limites":[139],"l'int\u00e9gration":[141]},"counts_by_year":[],"updated_date":"2026-11-08T12:12:28.789561","created_date":"2016-06-24T00:00:00"}