{"id":"https://openalex.org/W594373360","doi":null,"title":"Reliability Engineering Handbook","display_name":"Reliability Engineering Handbook","publication_year":1999,"publication_date":"1999-10-27","ids":{"openalex":"https://openalex.org/W594373360","mag":"594373360"},"language":"en","primary_location":{"id":"mag:594373360","doi":null,"is_oa":false,"landing_page_url":"http://ci.nii.ac.jp/ncid/BA47068894","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"volume":null,"type":"book","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039948237","display_name":"Bryan L. Dodson","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bryan Dodson","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5075683943","display_name":"Dennis P. Nolan","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Dennis P. Nolan","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":70,"citation_normalized_percentile":{"value":0.11046512,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":99},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.002300000051036477,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"reliability engineering","score":0.9980000257492065},{"id":"https://openalex.org/keywords/reliability-testing","display_name":"reliability testing","score":0.8539999723434448},{"id":"https://openalex.org/keywords/maintainability","display_name":"maintainability","score":0.8939999938011169},{"id":"https://openalex.org/keywords/availability","display_name":"availability","score":0.9120000004768372},{"id":"https://openalex.org/keywords/fmeca","display_name":"FMECA","score":0.9440000057220459},{"id":"https://openalex.org/keywords/component-selection","display_name":"component selection","score":0.656000018119812},{"id":"https://openalex.org/keywords/derating","display_name":"derating","score":0.9190000295639038},{"id":"https://openalex.org/keywords/reliability-based-design","display_name":"reliability-based design","score":0.9919999837875366},{"id":"https://openalex.org/keywords/reliability-management","display_name":"reliability management","score":0.7429999709129333},{"id":"https://openalex.org/keywords/product-safety","display_name":"product safety","score":0.9800000190734863},{"id":"https://openalex.org/keywords/human-factors","display_name":"human factors","score":0.8519999980926514},{"id":"https://openalex.org/keywords/probability-distributions","display_name":"probability distributions","score":0.6359999775886536},{"id":"https://openalex.org/keywords/tolerance-intervals","display_name":"tolerance intervals","score":0.6669999957084656},{"id":"https://openalex.org/keywords/gamma-function","display_name":"gamma function","score":0.4690000116825104},{"id":"https://openalex.org/keywords/f-distribution","display_name":"F distribution","score":0.5059999823570251},{"id":"https://openalex.org/keywords/chi-square-distribution","display_name":"chi-square distribution","score":0.8360000252723694},{"id":"https://openalex.org/keywords/student-s-t-distribution","display_name":"t-distribution","score":0.8330000042915344}],"concepts":[{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.6128230094909668},{"id":"https://openalex.org/C2776364125","wikidata":"https://www.wikidata.org/wiki/Q9656","display_name":"Appendix","level":2,"score":0.5708103775978088},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.5167190432548523},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.468786358833313},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.43529778718948364},{"id":"https://openalex.org/C100906024","wikidata":"https://www.wikidata.org/wiki/Q205692","display_name":"Poisson distribution","level":2,"score":0.4166116714477539},{"id":"https://openalex.org/C2777686260","wikidata":"https://www.wikidata.org/wiki/Q144037","display_name":"Calculus (dental)","level":2,"score":0.32813823223114014},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2786704897880554},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C199343813","wikidata":"https://www.wikidata.org/wiki/Q12128","display_name":"Dentistry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:594373360","doi":null,"is_oa":false,"landing_page_url":"http://ci.nii.ac.jp/ncid/BA47068894","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W7028931078","https://openalex.org/W4240884433","https://openalex.org/W650322639","https://openalex.org/W2126432586","https://openalex.org/W1567558789","https://openalex.org/W586494090","https://openalex.org/W437401787","https://openalex.org/W595144629","https://openalex.org/W7005605939","https://openalex.org/W578754772"],"abstract_inverted_index":{"Data":[0],"collection,":[1],"analysis":[2,21],"and":[3,8,14,19,24,28],"reporting":[4],"distributions":[5],"prediction,":[6],"estimation":[7],"apportionment":[9],"methods":[10],"reliability":[11,26,36,37],"testing":[12],"maintainability":[13],"availability":[15],"failure":[16],"mode,":[17],"effects":[18],"criticality":[20],"part":[22],"selection":[23],"derating":[25],"design":[27],"management":[29],"control":[30],"product":[31],"safety":[32],"human":[33],"factors":[34,96],"in":[35],"tools":[38],"appendix":[39,48,54,59,64,70,78,84,92,97,102,107,112,118],"A":[40],"-":[41,50,56,61,66,72,80,99,104,109,114],"area":[42],"under":[43],"the":[44,51,67,76,89],"standard":[45],"normal":[46],"curve":[47],"B":[49],"gamma":[52],"function":[53],"C":[55],"rank":[57],"tables":[58],"D":[60],"beta":[62],"table":[63],"E":[65],"F":[68,71],"distribution":[69,91],"critical":[73],"values":[74,87],"on":[75],"t-distribution":[77],"G":[79],"Poisson":[81],"probability":[82],"sums":[83],"H":[85],"-critical":[86],"of":[88],"chi-square":[90],"I":[93],"-tolerance":[94],"interval":[95],"J":[98],"useful":[100],"integrals":[101],"K":[103],"government":[105],"documents":[106],"L":[108],"financial":[110],"formulas":[111],"M":[113],"for":[115],"further":[116],"information":[117],"N":[119],"-glossary.":[120]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":8},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":7}],"updated_date":"2026-11-03T10:50:19.383937","created_date":"2016-06-24T00:00:00"}