{"id":"https://openalex.org/W57560050","doi":null,"title":"Laws based Quality Inspection of Steel Products using Scanning Electron Microscopy (SEM) Images","display_name":"Laws based Quality Inspection of Steel Products using Scanning Electron Microscopy (SEM) Images","publication_year":2012,"publication_date":"2012-11-05","ids":{"openalex":"https://openalex.org/W57560050","mag":"57560050"},"language":"en","primary_location":{"id":"mag:57560050","doi":null,"is_oa":false,"landing_page_url":"https://research.ijcaonline.org/ncacsa/number5/ncacsa1034.pdf","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077260266","display_name":"B. Sathya Bama","orcid":"https://orcid.org/0000-0003-2670-4340","observed_orcids":["https://orcid.org/0000-0003-2670-4340"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"B. Sathya Bama","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070632211","display_name":"S. Ramabai","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Ramabai","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5017394757","display_name":"R. Santhanadevi","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R. Santhanadevi","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.00886684,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":"5","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","score":0.0013000000035390258,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.0012000000569969416,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/steel-surface-defects","display_name":"steel surface defects","score":0.7820000052452087},{"id":"https://openalex.org/keywords/defect-classification","display_name":"defect classification","score":0.8429999947547913},{"id":"https://openalex.org/keywords/scanning-electron-microscopy-images","display_name":"scanning electron microscopy images","score":0.824999988079071},{"id":"https://openalex.org/keywords/discrete-wavelet-transform","display_name":"discrete wavelet transform","score":0.8999999761581421},{"id":"https://openalex.org/keywords/texture-features","display_name":"texture features","score":0.9089999794960022},{"id":"https://openalex.org/keywords/quality-inspection","display_name":"quality inspection","score":0.6119999885559082},{"id":"https://openalex.org/keywords/steel-products","display_name":"steel products","score":0.5860000252723694},{"id":"https://openalex.org/keywords/tamura-features","display_name":"Tamura features","score":0.7039999961853027},{"id":"https://openalex.org/keywords/gray-level-co-occurrence-matrix","display_name":"gray level co-occurrence matrix","score":0.984000027179718}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7228610515594482},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.6147714853286743},{"id":"https://openalex.org/C166963901","wikidata":"https://www.wikidata.org/wiki/Q287251","display_name":"Kurtosis","level":2,"score":0.5954135060310364},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5878472328186035},{"id":"https://openalex.org/C37672646","wikidata":"https://www.wikidata.org/wiki/Q6002283","display_name":"Image subtraction","level":5,"score":0.4598269462585449},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4253832995891571},{"id":"https://openalex.org/C46286280","wikidata":"https://www.wikidata.org/wiki/Q2414958","display_name":"Discrete wavelet transform","level":4,"score":0.4233190417289734},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.41056588292121887},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4060148596763611},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3863769769668579},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.3846394419670105},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.3261534571647644},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.3135400414466858},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.19917607307434082},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.139778733253479},{"id":"https://openalex.org/C193828747","wikidata":"https://www.wikidata.org/wiki/Q864118","display_name":"Binary image","level":4,"score":0.08011198043823242},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:57560050","doi":null,"is_oa":false,"landing_page_url":"https://research.ijcaonline.org/ncacsa/number5/ncacsa1034.pdf","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1968192660","https://openalex.org/W1988445395","https://openalex.org/W1989494461","https://openalex.org/W2000217132","https://openalex.org/W2019483202","https://openalex.org/W2022681695","https://openalex.org/W2027826399","https://openalex.org/W2053859880","https://openalex.org/W2059432853","https://openalex.org/W2132984323","https://openalex.org/W2161682233"],"related_works":["https://openalex.org/W3137139253","https://openalex.org/W4379620560","https://openalex.org/W4404960508","https://openalex.org/W4390577816","https://openalex.org/W4212972648","https://openalex.org/W2187434425","https://openalex.org/W2331339334","https://openalex.org/W3207769106","https://openalex.org/W4400411066","https://openalex.org/W2544831403"],"abstract_inverted_index":{"Since":[0],"steel":[1,30,43],"is":[2,12,34,66,71,137,157,182,193],"an":[3,13],"essential":[4],"industry":[5],"raw":[6],"material":[7],"and":[8,26,37,78,93,103,116,127,173],"its":[9],"surface":[10],"quality":[11,21],"important":[14],"evaluation":[15],"indicator,":[16],"this":[17],"paper":[18],"proposes":[19],"a":[20],"inspection":[22],"method":[23,65,156,181,197],"for":[24,125,132],"detecting":[25],"characterizing":[27],"defects":[28,40,192],"on":[29,140],"surfaces.":[31],"The":[32,107,152,176,184],"objective":[33],"to":[35,53,73],"detect":[36],"classify":[38],"the":[39,42,74,79,133,141,160],"in":[41],"products":[44],"using":[45],"Scanning":[46],"Electron":[47,205],"Microscopy":[48,206],"(SEM)":[49],"images.":[50],"In":[51],"order":[52],"obtain":[54],"better":[55,189],"classification":[56,190],"accuracy,":[57],"Discrete":[58],"Wavelet":[59],"Transform":[60],"(DWT)":[61],"based":[62,139,201],"laws":[63,86,114,202],"mask":[64],"proposed.":[67],"Initially,":[68],"wavelet":[69],"transform":[70],"applied":[72,83,111],"input":[75],"training":[76,128],"images":[77,109,129],"resultant":[80],"sub-images":[81],"are":[82,105,110,119,130],"with":[84,112,159],"different":[85,113],"masks":[87,115],"like":[88,97],"ripple,":[89],"wave,":[90],"level,":[91],"edge":[92],"spot.":[94],"Texture":[95],"features":[96],"mean,":[98],"entropy,":[99],"standard":[100],"deviation,":[101],"kurtosis":[102],"skewness":[104],"extracted.":[106],"test":[108,126],"feature":[117,122,208],"values":[118,123],"calculated.":[120],"These":[121],"obtained":[124,144,186],"considered":[131],"accuracy":[134,153,178,212],"assessment":[135],"which":[136],"done":[138],"minimum":[142],"distance":[143],"by":[145,195],"taking":[146],"Sum":[147],"of":[148,154,162,179,191,198],"Squared":[149],"Distance":[150],"(SSD).":[151],"proposed":[155,180,196],"compared":[158],"performance":[161],"classical":[163],"methods":[164],"namely":[165],"Tamura":[166],"features,":[167],"Gray":[168],"Level":[169],"Co-occurrence":[170],"Matrix":[171],"(GLCM)":[172],"Laws":[174],"Masks.":[175],"overall":[177],"82.5%.":[183],"results":[185],"indicate":[187],"that":[188],"possible":[194],"applying":[199],"DWT":[200],"masks.":[203],"KeywordsScanning":[204],"(SEM),":[207],"extraction,":[209],"defect":[210],"classification,":[211],"assessment.":[213]},"counts_by_year":[],"updated_date":"2025-11-06T04:12:42.849631","created_date":"2016-06-24T00:00:00"}