{"id":"https://openalex.org/W565794827","doi":"https://doi.org/10.1016/j.sse.2015.06.002","title":"Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction","display_name":"Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction","publication_year":2015,"publication_date":"2015-06-14","ids":{"openalex":"https://openalex.org/W565794827","doi":"https://doi.org/10.1016/j.sse.2015.06.002","mag":"565794827"},"language":"en","primary_location":{"id":"doi:10.1016/j.sse.2015.06.002","doi":"https://doi.org/10.1016/j.sse.2015.06.002","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.sse.2015.06.002","pdf_url":null,"source":{"id":"https://openalex.org/S77418581","display_name":"Solid-State Electronics","issn_l":"0038-1101","issn":["0038-1101","1879-2405"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Solid-State Electronics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032246648","display_name":"Theano A. Karatsori","orcid":"https://orcid.org/0000-0001-7518-3452","observed_orcids":["https://orcid.org/0000-0001-7518-3452"]},"institutions":[{"id":"https://openalex.org/I21370196","display_name":"Aristotle University of Thessaloniki","ror":"https://ror.org/02j61yw88","country_code":"GR","type":"education","lineage":["https://openalex.org/I21370196"]},{"id":"https://openalex.org/I4210139715","display_name":"Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique","ror":"https://ror.org/03taa9n66","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210095849","https://openalex.org/I4210139715","https://openalex.org/I70900168","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4400573202","display_name":"Centre de Radiofr\u00e9quences, Optique et Micro-nano\u00e9lectronique des Alpes","ror":"https://ror.org/050rs7291","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4400573202","https://openalex.org/I70900168","https://openalex.org/I899635006"]}],"countries":["FR","GR"],"is_corresponding":true,"raw_author_name":"T.A. Karatsori","raw_affiliation_strings":["Department of Physics, Aristotle University of Thessaloniki, Thessaloniki 54124, Greece","IMEP-LAHC, INPG \u2013 Minatec, 3 Parvis Louis N\u00e9el, CS 50257, 38016 Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Aristotle University of Thessaloniki, Thessaloniki 54124, Greece","institution_ids":["https://openalex.org/I21370196"]},{"raw_affiliation_string":"IMEP-LAHC, INPG \u2013 Minatec, 3 Parvis Louis N\u00e9el, CS 50257, 38016 Grenoble, France","institution_ids":["https://openalex.org/I4210139715","https://openalex.org/I4400573202"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041967838","display_name":"Christoforos  G. Theodorou","orcid":"https://orcid.org/0000-0001-5120-2233","observed_orcids":["https://orcid.org/0000-0001-5120-2233"]},"institutions":[{"id":"https://openalex.org/I4210139715","display_name":"Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique","ror":"https://ror.org/03taa9n66","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210095849","https://openalex.org/I4210139715","https://openalex.org/I70900168","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4400573202","display_name":"Centre de Radiofr\u00e9quences, Optique et Micro-nano\u00e9lectronique des Alpes","ror":"https://ror.org/050rs7291","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4400573202","https://openalex.org/I70900168","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"C.G. Theodorou","raw_affiliation_strings":["IMEP-LAHC, INPG \u2013 Minatec, 3 Parvis Louis N\u00e9el, CS 50257, 38016 Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEP-LAHC, INPG \u2013 Minatec, 3 Parvis Louis N\u00e9el, CS 50257, 38016 Grenoble, France","institution_ids":["https://openalex.org/I4210139715","https://openalex.org/I4400573202"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084749665","display_name":"Eleftherios G. Ioannidis","orcid":"https://orcid.org/0000-0002-1090-2070","observed_orcids":["https://orcid.org/0000-0002-1090-2070"]},"institutions":[{"id":"https://openalex.org/I4210139715","display_name":"Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique","ror":"https://ror.org/03taa9n66","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210095849","https://openalex.org/I4210139715","https://openalex.org/I70900168","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4400573202","display_name":"Centre de Radiofr\u00e9quences, Optique et Micro-nano\u00e9lectronique des Alpes","ror":"https://ror.org/050rs7291","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4400573202","https://openalex.org/I70900168","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"E.G. Ioannidis","raw_affiliation_strings":["IMEP-LAHC, INPG \u2013 Minatec, 3 Parvis Louis N\u00e9el, CS 50257, 38016 Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEP-LAHC, INPG \u2013 Minatec, 3 Parvis Louis N\u00e9el, CS 50257, 38016 Grenoble, France","institution_ids":["https://openalex.org/I4210139715","https://openalex.org/I4400573202"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051158092","display_name":"S. Haendler","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"S. Haendler","raw_affiliation_strings":["STMicroelectronics, BP16, 38921 Crolles, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, BP16, 38921 Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003407526","display_name":"Emmanuelle Josse","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"E. Josse","raw_affiliation_strings":["STMicroelectronics, BP16, 38921 Crolles, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, BP16, 38921 Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031042245","display_name":"C.A. Dimitriadis","orcid":"https://orcid.org/0000-0001-7924-5278","observed_orcids":["https://orcid.org/0000-0001-7924-5278"]},"institutions":[{"id":"https://openalex.org/I21370196","display_name":"Aristotle University of Thessaloniki","ror":"https://ror.org/02j61yw88","country_code":"GR","type":"education","lineage":["https://openalex.org/I21370196"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"C.A. Dimitriadis","raw_affiliation_strings":["Department of Physics, Aristotle University of Thessaloniki, Thessaloniki 54124, Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Aristotle University of Thessaloniki, Thessaloniki 54124, Greece","institution_ids":["https://openalex.org/I21370196"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011270757","display_name":"G. Ghibaudo","orcid":"https://orcid.org/0000-0001-9901-0679","observed_orcids":["https://orcid.org/0000-0001-9901-0679"]},"institutions":[{"id":"https://openalex.org/I4210139715","display_name":"Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique","ror":"https://ror.org/03taa9n66","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210095849","https://openalex.org/I4210139715","https://openalex.org/I70900168","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4400573202","display_name":"Centre de Radiofr\u00e9quences, Optique et Micro-nano\u00e9lectronique des Alpes","ror":"https://ror.org/050rs7291","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4400573202","https://openalex.org/I70900168","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"G. Ghibaudo","raw_affiliation_strings":["IMEP-LAHC, INPG \u2013 Minatec, 3 Parvis Louis N\u00e9el, CS 50257, 38016 Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEP-LAHC, INPG \u2013 Minatec, 3 Parvis Louis N\u00e9el, CS 50257, 38016 Grenoble, France","institution_ids":["https://openalex.org/I4210139715","https://openalex.org/I4400573202"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5032246648"],"corresponding_institution_ids":["https://openalex.org/I21370196","https://openalex.org/I4210139715","https://openalex.org/I4400573202"],"apc_list":{"value":2410,"currency":"USD","value_usd":2410},"apc_paid":null,"fwci":3.7768,"has_fulltext":false,"cited_by_count":73,"citation_normalized_percentile":{"value":0.93539278,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"111","issue":null,"first_page":"123","last_page":"128"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.007400000002235174,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fd-soi-mosfet","display_name":"FD-SOI MOSFET","score":0.9359999895095825},{"id":"https://openalex.org/keywords/parameter-extraction","display_name":"parameter extraction","score":0.7609999775886536},{"id":"https://openalex.org/keywords/lambert-w-function","display_name":"Lambert W function","score":0.9959999918937683},{"id":"https://openalex.org/keywords/capacitance-voltage-measurements","display_name":"capacitance-voltage measurements","score":0.7549999952316284},{"id":"https://openalex.org/keywords/low-field-mobility","display_name":"low-field mobility","score":0.7200000286102295},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"threshold voltage","score":0.7390000224113464},{"id":"https://openalex.org/keywords/ideality-factor","display_name":"ideality factor","score":0.9950000047683716},{"id":"https://openalex.org/keywords/nanoscale-mosfets","display_name":"nanoscale MOSFETs","score":0.7979999780654907},{"id":"https://openalex.org/keywords/y-function","display_name":"Y-function","score":0.531000018119812}],"concepts":[{"id":"https://openalex.org/C130924491","wikidata":"https://www.wikidata.org/wiki/Q429331","display_name":"Lambert W function","level":2,"score":0.7068190574645996},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.7020638585090637},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5409224629402161},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.48821428418159485},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.4505477845668793},{"id":"https://openalex.org/C171291426","wikidata":"https://www.wikidata.org/wiki/Q5072499","display_name":"Channel length modulation","level":5,"score":0.4495009481906891},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.44621896743774414},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4389714300632477},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4263862073421478},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42541176080703735},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22401800751686096},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20221033692359924},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.18696793913841248},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14081576466560364},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.10169044137001038},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.08067062497138977},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.sse.2015.06.002","doi":"https://doi.org/10.1016/j.sse.2015.06.002","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.sse.2015.06.002","pdf_url":null,"source":{"id":"https://openalex.org/S77418581","display_name":"Solid-State Electronics","issn_l":"0038-1101","issn":["0038-1101","1879-2405"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Solid-State Electronics","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-01947652v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.science/hal-01947652","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Solid-State Electronics, 2015, 111, pp.123-128. ⟨10.1016/j.sse.2015.06.002⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320338080","display_name":"European Social Fund","ror":"https://ror.org/00k4n6c32"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W139371834","https://openalex.org/W631317861","https://openalex.org/W1848356887","https://openalex.org/W1992068865","https://openalex.org/W2009894796","https://openalex.org/W2020330572","https://openalex.org/W2028568402","https://openalex.org/W2042399226","https://openalex.org/W2045633792","https://openalex.org/W2055366235","https://openalex.org/W2081421305","https://openalex.org/W2085812715","https://openalex.org/W2086656425","https://openalex.org/W2090734667","https://openalex.org/W2091071036","https://openalex.org/W2096652287","https://openalex.org/W2104584809","https://openalex.org/W2119082652","https://openalex.org/W2144765907","https://openalex.org/W2164759576","https://openalex.org/W2165044911","https://openalex.org/W2170728807","https://openalex.org/W2301574774","https://openalex.org/W2544630875"],"related_works":["https://openalex.org/W3199520251","https://openalex.org/W1520245593","https://openalex.org/W2042399226","https://openalex.org/W3207085443","https://openalex.org/W1998612149","https://openalex.org/W2045633792","https://openalex.org/W4401349775","https://openalex.org/W2111788192","https://openalex.org/W2906198606","https://openalex.org/W2737345241"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":8},{"year":2017,"cited_by_count":13},{"year":2016,"cited_by_count":6}],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2016-06-24T00:00:00"}