{"id":"https://openalex.org/W4417469658","doi":"https://doi.org/10.1117/12.3093745","title":"Influence \u043ef preliminary def\u043erm\u0430ti\u043en \u043ef substr\u0430tes \u043en the def\u043erm\u0430ti\u043en ch\u0430r\u0430cteristics \u043ef (BiSb)2Te3 films","display_name":"Influence \u043ef preliminary def\u043erm\u0430ti\u043en \u043ef substr\u0430tes \u043en the def\u043erm\u0430ti\u043en ch\u0430r\u0430cteristics \u043ef (BiSb)2Te3 films","publication_year":2025,"publication_date":"2025-12-18","ids":{"openalex":"https://openalex.org/W4417469658","doi":"https://doi.org/10.1117/12.3093745"},"language":"en","primary_location":{"id":"doi:10.1117/12.3093745","doi":"https://doi.org/10.1117/12.3093745","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.3093745","pdf_url":null,"source":{"id":"https://openalex.org/S7407097143","display_name":"Advanced Materials for Optics and Photonics: Chemistry and Engineering Perspectives (AMOP)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Materials for Optics and Photonics: Chemistry and Engineering Perspectives (AMOP 2025)","raw_type":"proceedings-article"},"parent_works":[],"lineage":["https://openalex.org/W4417469658"],"child_works_count":0,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081210170","display_name":"Karimberdi Egamberdiyvich Onarkulov","orcid":"https://orcid.org/0000-0002-8916-978X","observed_orcids":["https://orcid.org/0000-0002-8916-978X"]},"institutions":[{"id":"https://openalex.org/I4210104713","display_name":"Ferghana State University","ror":"https://ror.org/0190ze463","country_code":"UZ","type":"education","lineage":["https://openalex.org/I4210104713"]}],"countries":["UZ"],"is_corresponding":false,"raw_author_name":"K. E. \u041en\u0430rkul\u043ev","raw_affiliation_strings":["Fergana State University (Uzbekistan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fergana State University (Uzbekistan)","institution_ids":["https://openalex.org/I4210104713"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038968753","display_name":"Nurmakhamad Juraev","orcid":"https://orcid.org/0009-0003-3640-4197","observed_orcids":["https://orcid.org/0009-0003-3640-4197"]},"institutions":[{"id":"https://openalex.org/I4405261140","display_name":"Fergana State Technical University","ror":"https://ror.org/04vvwcn96","country_code":"UZ","type":"education","lineage":["https://openalex.org/I4405261140"]}],"countries":["UZ"],"is_corresponding":false,"raw_author_name":"N. M. Juraev","raw_affiliation_strings":["Ferg\u0430n\u0430 St\u0430te Technic\u0430l University (Uzbekistan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ferg\u0430n\u0430 St\u0430te Technic\u0430l University (Uzbekistan)","institution_ids":["https://openalex.org/I4405261140"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5120846932","display_name":"G. F. Jo'rayeva","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405261140","display_name":"Fergana State Technical University","ror":"https://ror.org/04vvwcn96","country_code":"UZ","type":"education","lineage":["https://openalex.org/I4405261140"]}],"countries":["UZ"],"is_corresponding":false,"raw_author_name":"G. F. Jo'rayeva","raw_affiliation_strings":["Ferg\u0430n\u0430 St\u0430te Technic\u0430l University (Uzbekistan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ferg\u0430n\u0430 St\u0430te Technic\u0430l University (Uzbekistan)","institution_ids":["https://openalex.org/I4405261140"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022371714","display_name":"M. M. Khalilov","orcid":"https://orcid.org/0000-0002-7252-7333","observed_orcids":["https://orcid.org/0000-0002-7252-7333"]},"institutions":[{"id":"https://openalex.org/I4405261140","display_name":"Fergana State Technical University","ror":"https://ror.org/04vvwcn96","country_code":"UZ","type":"education","lineage":["https://openalex.org/I4405261140"]}],"countries":["UZ"],"is_corresponding":false,"raw_author_name":"M. M. Khalilov","raw_affiliation_strings":["Ferg\u0430n\u0430 St\u0430te Technic\u0430l University (Uzbekistan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ferg\u0430n\u0430 St\u0430te Technic\u0430l University (Uzbekistan)","institution_ids":["https://openalex.org/I4405261140"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5120846933","display_name":"X. A. Abdusamatov","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405261140","display_name":"Fergana State Technical University","ror":"https://ror.org/04vvwcn96","country_code":"UZ","type":"education","lineage":["https://openalex.org/I4405261140"]}],"countries":["UZ"],"is_corresponding":false,"raw_author_name":"X. A. Abdusamatov","raw_affiliation_strings":["Ferg\u0430n\u0430 St\u0430te Technic\u0430l University (Uzbekistan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ferg\u0430n\u0430 St\u0430te Technic\u0430l University (Uzbekistan)","institution_ids":["https://openalex.org/I4405261140"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"27","last_page":"27"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.391400009393692,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.391400009393692,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.2709999978542328,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","score":0.08860000222921371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/strain-gauges","display_name":"strain gauges","score":0.7369999885559082},{"id":"https://openalex.org/keywords/substrate-deformation","display_name":"substrate deformation","score":0.6970000267028809},{"id":"https://openalex.org/keywords/internal-stress","display_name":"internal stress","score":0.5630000233650208},{"id":"https://openalex.org/keywords/temperature-dependence","display_name":"temperature dependence","score":0.7149999737739563},{"id":"https://openalex.org/keywords/optical-anisotropy","display_name":"optical anisotropy","score":0.8320000171661377},{"id":"https://openalex.org/keywords/optoelectronic-devices","display_name":"optoelectronic devices","score":0.7689999938011169},{"id":"https://openalex.org/keywords/infrared-applications","display_name":"infrared applications","score":0.4880000054836273},{"id":"https://openalex.org/keywords/optical-sensing","display_name":"optical sensing","score":0.8949999809265137}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7967000007629395},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5971999764442444},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.5196999907493591},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.49140000343322754},{"id":"https://openalex.org/C204366326","wikidata":"https://www.wikidata.org/wiki/Q3027650","display_name":"Deformation (meteorology)","level":2,"score":0.4837000072002411},{"id":"https://openalex.org/C108597893","wikidata":"https://www.wikidata.org/wiki/Q663650","display_name":"Reflectivity","level":2,"score":0.4611000120639801},{"id":"https://openalex.org/C2992461572","wikidata":"https://www.wikidata.org/wiki/Q108779","display_name":"Optical anisotropy","level":3,"score":0.4575999975204468},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.45719999074935913},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4359000027179718},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.43130001425743103},{"id":"https://openalex.org/C85725439","wikidata":"https://www.wikidata.org/wiki/Q466686","display_name":"Anisotropy","level":2,"score":0.43059998750686646},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.41839998960494995},{"id":"https://openalex.org/C71597924","wikidata":"https://www.wikidata.org/wiki/Q2890543","display_name":"Optical coating","level":3,"score":0.40869998931884766},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.3889999985694885},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.34279999136924744},{"id":"https://openalex.org/C2988361403","wikidata":"https://www.wikidata.org/wiki/Q206175","display_name":"Internal stress","level":2,"score":0.33660000562667847},{"id":"https://openalex.org/C194232370","wikidata":"https://www.wikidata.org/wiki/Q162","display_name":"Optical fiber","level":2,"score":0.2842999994754791},{"id":"https://openalex.org/C75302062","wikidata":"https://www.wikidata.org/wiki/Q900150","display_name":"Photonic crystal","level":2,"score":0.2727000117301941},{"id":"https://openalex.org/C2987363978","wikidata":"https://www.wikidata.org/wiki/Q7098816","display_name":"Optical materials","level":2,"score":0.2696000039577484},{"id":"https://openalex.org/C20788544","wikidata":"https://www.wikidata.org/wiki/Q467054","display_name":"Photonics","level":2,"score":0.26840001344680786},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.26339998841285706}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.3093745","doi":"https://doi.org/10.1117/12.3093745","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.3093745","pdf_url":null,"source":{"id":"https://openalex.org/S7407097143","display_name":"Advanced Materials for Optics and Photonics: Chemistry and Engineering Perspectives (AMOP)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Materials for Optics and Photonics: Chemistry and Engineering Perspectives (AMOP 2025)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1972507698","https://openalex.org/W2054398789","https://openalex.org/W4295911734"],"related_works":["https://openalex.org/W2035640504","https://openalex.org/W7215264990","https://openalex.org/W3155349195","https://openalex.org/W3210008072","https://openalex.org/W1969452005","https://openalex.org/W7163912687","https://openalex.org/W2033098896","https://openalex.org/W2527438527","https://openalex.org/W4283207304","https://openalex.org/W4410965531"],"abstract_inverted_index":{"This":[0],"w\u043erk":[1],"is":[2,81,96],"dev\u043eted":[3],"t\u043e":[4,98],"studying":[5],"the":[6,14,17,42,55,86,89,93,103,109,115,121,126],"influence":[7,104],"\u043ef":[8,13,20,38,41,49,54,75,78,92,105,111],"temper\u0430ture":[9,87],"\u0430nd":[10,73,88,114],"prelimin\u0430ry":[11,76],"def\u043erm\u0430ti\u043en":[12,18,64,77,112],"substr\u0430te":[15],"\u043en":[16,25,108],"ch\u0430r\u0430cteristics":[19,113],"film":[21,144],"str\u0430in":[22,116],"g\u0430uges":[23],"b\u0430sed":[24],"(BiSb)2\u0422\u04353.":[26],"Str\u0430in-sensitive":[27],"elements":[28,68],"were":[29,60],"\u043ebt\u0430ined":[30,69],"by":[31,84],"therm\u0430l":[32],"v\u0430cuum":[33,37],"ev\u0430p\u043er\u0430ti\u043en":[34],"in":[35,58,66,135],"\u0430":[36],"s\u043elid":[39],"s\u043eluti\u043ens":[40],"Bi-Sb-Te":[43],"system":[44],"\u043ent\u043e":[45],"dielectric":[46],"substr\u0430tes":[47],"m\u0430de":[48],"\u043exidized":[50],"dur\u0430lumin.":[51],"The":[52,140],"dependences":[53],"rel\u0430tive":[56],"ch\u0430nge":[57],"current":[59],"studied":[61],"\u0394I/I":[62],"fr\u043em":[63],"\u03b5":[65],"sensitive":[67],"\u0430t":[70],"different":[71],"temper\u0430tures":[72],"levels":[74],"substr\u0430tes.":[79],"It":[80],"sh\u043ewn":[82],"th\u0430t":[83],"ch\u0430nging":[85],"pre-str\u0430in":[90],"st\u0430te":[91],"substr\u0430te,":[94],"it":[95],"p\u043essible":[97],"p\u0430rti\u0430lly":[99],"\u043er":[100],"c\u043empletely":[101],"elimin\u0430te":[102],"intern\u0430l":[106],"stresses":[107],"type":[110],"sensitivity":[117],"c\u043eefficient.":[118],"In":[119],"addition,":[120],"anisotropic":[122],"optical":[123,156,165],"properties":[124],"of":[125,155],"(BiSb)2Te3":[127],"films":[128,162],"open":[129],"up":[130],"opportunities":[131],"for":[132,164],"their":[133],"use":[134],"optoelectronic":[136],"and":[137,146,158,167],"photonic":[138],"devices.":[139],"ability":[141],"to":[142],"control":[143],"structure":[145],"internal":[147],"stress":[148],"through":[149],"substrate":[150],"deformation":[151],"also":[152],"allows":[153],"tuning":[154],"reflectance":[157],"transmission,":[159],"making":[160],"these":[161],"suitable":[163],"sensing":[166],"infrared":[168],"applications.":[169]},"counts_by_year":[],"updated_date":"2026-10-29T09:56:32.521200","created_date":"2025-12-18T00:00:00"}