{"id":"https://openalex.org/W4417455485","doi":"https://doi.org/10.1049/icp.2025.3728","title":"A new part-oriented test equipment for electrical contact reliability evaluation in high-speed connectors under vibration environments","display_name":"A new part-oriented test equipment for electrical contact reliability evaluation in high-speed connectors under vibration environments","publication_year":2025,"publication_date":"2025-12-01","ids":{"openalex":"https://openalex.org/W4417455485","doi":"https://doi.org/10.1049/icp.2025.3728"},"language":"en","primary_location":{"id":"doi:10.1049/icp.2025.3728","doi":"https://doi.org/10.1049/icp.2025.3728","is_oa":false,"landing_page_url":"https://doi.org/10.1049/icp.2025.3728","pdf_url":null,"source":{"id":"https://openalex.org/S4404663355","display_name":"IET conference proceedings.","issn_l":"2732-4494","issn":["2732-4494"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Conference Proceedings","raw_type":"journal-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112878623","display_name":"Ming Li","orcid":"https://orcid.org/0000-0002-1045-4669","observed_orcids":["https://orcid.org/0000-0002-1045-4669"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ming Li","raw_affiliation_strings":["Aviation Key Laboratory of Science and Technology on Aero Combined Environment, China Aero-Polytechnology Establishment, Beijing, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Aviation Key Laboratory of Science and Technology on Aero Combined Environment, China Aero-Polytechnology Establishment, Beijing, People's Republic of China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100460285","display_name":"Chao Zhang","orcid":"https://orcid.org/0000-0003-4377-8376","observed_orcids":["https://orcid.org/0000-0003-4377-8376"]},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Zhang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, People's Republic of China","School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, People's Republic of China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin, People's Republic of China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080769371","display_name":"Zhaojun Yang","orcid":"https://orcid.org/0000-0002-0164-1577","observed_orcids":["https://orcid.org/0000-0002-0164-1577","https://orcid.org/0000-0002-2591-7283"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Zhaojun Yang","raw_affiliation_strings":["Aviation Key Laboratory of Science and Technology on Aero Combined Environment, China Aero-Polytechnology Establishment, Beijing, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Aviation Key Laboratory of Science and Technology on Aero Combined Environment, China Aero-Polytechnology Establishment, Beijing, People's Republic of China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026639924","display_name":"Yinnan Zhang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yinnan Zhang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, People's Republic of China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041377396","display_name":"Wanbin Ren","orcid":"https://orcid.org/0000-0002-8319-1740","observed_orcids":["https://orcid.org/0000-0002-8319-1740"]},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wanbin Ren","raw_affiliation_strings":["School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, People's Republic of China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.8901,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.94339464,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":93,"max":96},"biblio":{"volume":"2025","issue":"35","first_page":"1542","last_page":"1548"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-contact-reliability","display_name":"electrical contact reliability","score":0.9610000252723694},{"id":"https://openalex.org/keywords/vibration","display_name":"vibration","score":0.5139999985694885},{"id":"https://openalex.org/keywords/interruption-duration","display_name":"interruption duration","score":0.9020000100135803},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"signal integrity","score":0.7459999918937683},{"id":"https://openalex.org/keywords/vibration-amplitude","display_name":"vibration amplitude","score":0.9869999885559082}],"concepts":[{"id":"https://openalex.org/C198394728","wikidata":"https://www.wikidata.org/wiki/Q3695508","display_name":"Vibration","level":2,"score":0.7315999865531921},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7109000086784363},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6769999861717224},{"id":"https://openalex.org/C132235601","wikidata":"https://www.wikidata.org/wiki/Q394001","display_name":"Electrical contacts","level":2,"score":0.5759000182151794},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5570999979972839},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5090000033378601},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.47450000047683716},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.44589999318122864},{"id":"https://openalex.org/C123671423","wikidata":"https://www.wikidata.org/wiki/Q332329","display_name":"Contact resistance","level":3,"score":0.4124999940395355},{"id":"https://openalex.org/C81302111","wikidata":"https://www.wikidata.org/wiki/Q2916417","display_name":"Contact force","level":2,"score":0.3968000113964081},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3840000033378601},{"id":"https://openalex.org/C2983725658","wikidata":"https://www.wikidata.org/wiki/Q7705768","display_name":"Test equipment","level":2,"score":0.38350000977516174},{"id":"https://openalex.org/C2989044035","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronic equipment","level":2,"score":0.38040000200271606},{"id":"https://openalex.org/C198824145","wikidata":"https://www.wikidata.org/wiki/Q442770","display_name":"Dynamic testing","level":2,"score":0.3411000072956085},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.33880001306533813},{"id":"https://openalex.org/C162175671","wikidata":"https://www.wikidata.org/wiki/Q3749263","display_name":"Electrical equipment","level":2,"score":0.33649998903274536},{"id":"https://openalex.org/C2983266536","wikidata":"https://www.wikidata.org/wiki/Q3509543","display_name":"Electronic systems","level":2,"score":0.31869998574256897},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.31529998779296875},{"id":"https://openalex.org/C89611455","wikidata":"https://www.wikidata.org/wiki/Q6804646","display_name":"Mechanism (biology)","level":2,"score":0.2671000063419342},{"id":"https://openalex.org/C112987892","wikidata":"https://www.wikidata.org/wiki/Q5051574","display_name":"Catastrophic failure","level":2,"score":0.2651999890804291},{"id":"https://openalex.org/C3018344627","wikidata":"https://www.wikidata.org/wiki/Q1925224","display_name":"Failure mechanism","level":2,"score":0.26100000739097595},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.26089999079704285},{"id":"https://openalex.org/C199310239","wikidata":"https://www.wikidata.org/wiki/Q4115667","display_name":"Impact","level":2,"score":0.2572999894618988},{"id":"https://openalex.org/C57918735","wikidata":"https://www.wikidata.org/wiki/Q3305953","display_name":"Dynamic Vibration Absorber","level":3,"score":0.2524000108242035},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.2524000108242035}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1049/icp.2025.3728","doi":"https://doi.org/10.1049/icp.2025.3728","is_oa":false,"landing_page_url":"https://doi.org/10.1049/icp.2025.3728","pdf_url":null,"source":{"id":"https://openalex.org/S4404663355","display_name":"IET conference proceedings.","issn_l":"2732-4494","issn":["2732-4494"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Conference Proceedings","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7207000255584717,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"Transient":[0],"interruption":[1,67,72],"failures":[2],"in":[3,102],"signal":[4,14],"electrical":[5,96],"connectors":[6,53,101],"under":[7,54],"external":[8],"vibration":[9,55,85],"conditions":[10],"can":[11],"significantly":[12],"degrade":[13],"integrity":[15],"and":[16,26,66,77,84],"compromise":[17],"the":[18,47,60,70,78,94],"reliability":[19,98],"of":[20,51,62,80,99],"electronic":[21],"systems.":[22],"However,":[23],"reliably":[24],"reproducing":[25],"capturing":[27],"such":[28],"failure":[29,73],"events":[30],"remains":[31],"a":[32,39],"significant":[33],"technical":[34],"challenge.":[35],"This":[36],"paper":[37],"presents":[38],"novel":[40],"part-oriented":[41],"test":[42],"system":[43,58],"designed":[44],"to":[45,92],"monitor":[46],"dynamic":[48,63,95],"contact":[49,64,82,97],"performance":[50],"high-speed":[52,100],"conditions.":[56],"The":[57],"facilitates":[59],"measurement":[61],"resistance":[65],"duration.":[68],"Additionally,":[69],"momentary":[71],"phenomenon":[74],"is":[75],"reproduced,":[76],"effects":[79],"initial":[81],"force":[83],"amplitude":[86],"are":[87],"investigated.":[88],"These":[89],"findings":[90],"contribute":[91],"enhancing":[93],"vibrational":[103],"environments.":[104]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-10-13T10:08:12.033832","created_date":"2025-12-18T00:00:00"}