{"id":"https://openalex.org/W4417455298","doi":"https://doi.org/10.1049/icp.2025.3435","title":"A reliability assessment method for harmonic reducer based on grey theory using small sample data","display_name":"A reliability assessment method for harmonic reducer based on grey theory using small sample data","publication_year":2025,"publication_date":"2025-12-01","ids":{"openalex":"https://openalex.org/W4417455298","doi":"https://doi.org/10.1049/icp.2025.3435"},"language":"en","primary_location":{"id":"doi:10.1049/icp.2025.3435","doi":"https://doi.org/10.1049/icp.2025.3435","is_oa":false,"landing_page_url":"https://doi.org/10.1049/icp.2025.3435","pdf_url":null,"source":{"id":"https://openalex.org/S4404663355","display_name":"IET conference proceedings.","issn_l":"2732-4494","issn":["2732-4494"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Conference Proceedings","raw_type":"journal-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015384263","display_name":"Yi-Chao Yin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I168337820","display_name":"Chongqing University of Science and Technology","ror":"https://ror.org/03n3v6d52","country_code":"CN","type":"education","lineage":["https://openalex.org/I168337820"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yichao Yin","raw_affiliation_strings":["School of Safety Engineering, Chongqing University of Science and Technology, Chongqing, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Safety Engineering, Chongqing University of Science and Technology, Chongqing, People's Republic of China","institution_ids":["https://openalex.org/I168337820"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yang Wu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I168337820","display_name":"Chongqing University of Science and Technology","ror":"https://ror.org/03n3v6d52","country_code":"CN","type":"education","lineage":["https://openalex.org/I168337820"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Wu","raw_affiliation_strings":["School of Mechanical and Intelligent Manufacturing, Chongqing University of Science and Technology, Chongqing, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical and Intelligent Manufacturing, Chongqing University of Science and Technology, Chongqing, People's Republic of China","institution_ids":["https://openalex.org/I168337820"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055714653","display_name":"Yu Zhou","orcid":"https://orcid.org/0000-0002-3469-0906","observed_orcids":["https://orcid.org/0000-0002-3469-0906"]},"institutions":[{"id":"https://openalex.org/I168337820","display_name":"Chongqing University of Science and Technology","ror":"https://ror.org/03n3v6d52","country_code":"CN","type":"education","lineage":["https://openalex.org/I168337820"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Zhou","raw_affiliation_strings":["School of Mechanical and Intelligent Manufacturing, Chongqing University of Science and Technology, Chongqing, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical and Intelligent Manufacturing, Chongqing University of Science and Technology, Chongqing, People's Republic of China","institution_ids":["https://openalex.org/I168337820"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I168337820"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.50126944,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"2025","issue":"35","first_page":"380","last_page":"386"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.7631999850273132,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.7631999850273132,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12368","display_name":"Grey System Theory Applications","score":0.2257000058889389,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.002199999988079071,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/harmonic-reducer","display_name":"harmonic reducer","score":0.800000011920929},{"id":"https://openalex.org/keywords/reliability-analysis","display_name":"reliability analysis","score":0.9670000076293945},{"id":"https://openalex.org/keywords/small-datasets","display_name":"small datasets","score":0.7960000038146973},{"id":"https://openalex.org/keywords/grey-system-theory","display_name":"grey system theory","score":0.9850000143051147},{"id":"https://openalex.org/keywords/gm-1-1-model","display_name":"GM(1,1) model","score":0.9950000047683716},{"id":"https://openalex.org/keywords/power-law-model","display_name":"power law model","score":0.949999988079071},{"id":"https://openalex.org/keywords/lifetime-prediction","display_name":"lifetime prediction","score":0.8980000019073486},{"id":"https://openalex.org/keywords/stress-conditions","display_name":"stress conditions","score":0.3790000081062317},{"id":"https://openalex.org/keywords/hypothesis-testing","display_name":"hypothesis testing","score":0.7649999856948853}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6572999954223633},{"id":"https://openalex.org/C158245278","wikidata":"https://www.wikidata.org/wiki/Q4386982","display_name":"Equidistant","level":2,"score":0.6039000153541565},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6000000238418579},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.5827000141143799},{"id":"https://openalex.org/C203858083","wikidata":"https://www.wikidata.org/wiki/Q188347","display_name":"Harmonic mean","level":2,"score":0.534500002861023},{"id":"https://openalex.org/C127934551","wikidata":"https://www.wikidata.org/wiki/Q1148098","display_name":"Harmonic","level":2,"score":0.4952999949455261},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.48399999737739563},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.47679999470710754},{"id":"https://openalex.org/C131770355","wikidata":"https://www.wikidata.org/wiki/Q876215","display_name":"Harmonic analysis","level":2,"score":0.3391000032424927},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.33090001344680786},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.32519999146461487},{"id":"https://openalex.org/C2778067643","wikidata":"https://www.wikidata.org/wiki/Q166507","display_name":"Interval (graph theory)","level":2,"score":0.32170000672340393},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.31470000743865967},{"id":"https://openalex.org/C2776985865","wikidata":"https://www.wikidata.org/wiki/Q26820931","display_name":"Reducer","level":2,"score":0.30480000376701355},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.2890999913215637},{"id":"https://openalex.org/C87007009","wikidata":"https://www.wikidata.org/wiki/Q210832","display_name":"Statistical hypothesis testing","level":2,"score":0.2694999873638153},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.2605000138282776},{"id":"https://openalex.org/C129848803","wikidata":"https://www.wikidata.org/wiki/Q2564360","display_name":"Sample size determination","level":2,"score":0.25699999928474426},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.25450000166893005}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1049/icp.2025.3435","doi":"https://doi.org/10.1049/icp.2025.3435","is_oa":false,"landing_page_url":"https://doi.org/10.1049/icp.2025.3435","pdf_url":null,"source":{"id":"https://openalex.org/S4404663355","display_name":"IET conference proceedings.","issn_l":"2732-4494","issn":["2732-4494"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Conference Proceedings","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.428600013256073}],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"A":[0],"small-sample":[1,149],"reliability":[2,143],"evaluation":[3],"method":[4,140],"for":[5,69,97,129],"harmonic":[6,117,146],"reducers":[7,118,147],"is":[8,19,38,84,126],"developed":[9],"based":[10],"on":[11,86],"grey":[12],"system":[13],"theory.":[14],"Initially,":[15],"a":[16],"power-law":[17,78,136],"model":[18,37],"employed":[20],"to":[21,41,63,93],"construct":[22],"two":[23,48],"original":[24,72,132],"data":[25],"sequences":[26],"under":[27,148],"equidistant":[28],"stress":[29,33,124],"and":[30,56,105,151,155],"equal":[31,122],"proportional":[32,123],"conditions.":[34],"The":[35,138],"GM(1,1)":[36],"subsequently":[39],"applied":[40],"predict":[42],"each":[43],"sequence":[44,73,92,133],"independently,":[45],"resulting":[46],"in":[47,157],"sets":[49],"of":[50,108,134,145],"life":[51],"prediction":[52,111],"data.":[53,112],"Hypothesis":[54],"testing":[55,83],"fitting":[57],"error":[58],"analysis":[59],"are":[60],"then":[61],"conducted":[62],"determine":[64],"the":[65,71,77,87,90,95,98,103,109,121,131,135],"most":[66],"appropriate":[67],"approach":[68],"constructing":[70,130],"that":[74,120],"aligns":[75],"with":[76],"model.":[79,137],"Following":[80],"this,":[81],"hypothesis":[82],"performed":[85],"parameters":[88],"within":[89],"weight":[91,99],"derive":[94],"interval":[96],"parameter,":[100],"thereby":[101],"establishing":[102],"upper":[104],"lower":[106],"bounds":[107],"GM-based":[110],"Case":[113],"study":[114],"results":[115],"involving":[116],"confirm":[119],"condition":[125],"better":[127],"suited":[128],"proposed":[139],"effectively":[141],"facilitates":[142],"assessment":[144],"conditions":[150],"exhibits":[152],"strong":[153],"applicability":[154],"robustness":[156],"practical":[158],"engineering":[159],"contexts.":[160]},"counts_by_year":[],"updated_date":"2026-09-27T08:07:27.782135","created_date":"2025-12-18T00:00:00"}