{"id":"https://openalex.org/W4416799778","doi":"https://doi.org/10.1109/ppps56198.2025.11248162","title":"Electro-Optic Testing of Flashlamps for a Laser Amplification System","display_name":"Electro-Optic Testing of Flashlamps for a Laser Amplification System","publication_year":2025,"publication_date":"2025-06-15","ids":{"openalex":"https://openalex.org/W4416799778","doi":"https://doi.org/10.1109/ppps56198.2025.11248162"},"language":"en","primary_location":{"id":"doi:10.1109/ppps56198.2025.11248162","doi":"https://doi.org/10.1109/ppps56198.2025.11248162","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ppps56198.2025.11248162","pdf_url":null,"source":{"id":"https://openalex.org/S4363607929","display_name":"IEEE International Conference on Plasma Science (ICOPS)","issn_l":"0730-9244","issn":["0730-9244","2576-7208"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE Pulsed Power & Plasma Science (PPPS)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Benedict A. Land","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Benedict A. Land","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5044362918","display_name":"Matthew Woodyard","orcid":"https://orcid.org/0000-0002-0926-135X","observed_orcids":["https://orcid.org/0000-0002-0926-135X"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Matthew Woodyard","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.27079999446868896,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.27079999446868896,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12760","display_name":"Laser Design and Applications","score":0.16979999840259552,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.1476999968290329,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flash-lamp","display_name":"flash lamp","score":0.9739999771118164},{"id":"https://openalex.org/keywords/laser-amplification","display_name":"laser amplification","score":0.7149999737739563},{"id":"https://openalex.org/keywords/non-invasive-testing","display_name":"non-invasive testing","score":0.8130000233650208},{"id":"https://openalex.org/keywords/lamp-replacement","display_name":"lamp replacement","score":0.3400000035762787}],"concepts":[{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.6717000007629395},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6101999878883362},{"id":"https://openalex.org/C98375054","wikidata":"https://www.wikidata.org/wiki/Q442709","display_name":"Enclosure","level":2,"score":0.6083999872207642},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.542900025844574},{"id":"https://openalex.org/C2777472991","wikidata":"https://www.wikidata.org/wiki/Q2577226","display_name":"Flash-lamp","level":2,"score":0.5116000175476074},{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.44269999861717224},{"id":"https://openalex.org/C2984025587","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser beams","level":3,"score":0.43860000371932983},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4341999888420105},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.3779999911785126},{"id":"https://openalex.org/C107430045","wikidata":"https://www.wikidata.org/wiki/Q1364409","display_name":"Inertial confinement fusion","level":3,"score":0.36000001430511475},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29760000109672546},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.2946999967098236},{"id":"https://openalex.org/C86171150","wikidata":"https://www.wikidata.org/wiki/Q13389141","display_name":"Brazing","level":3,"score":0.2863999903202057},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.26660001277923584},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2538999915122986}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ppps56198.2025.11248162","doi":"https://doi.org/10.1109/ppps56198.2025.11248162","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ppps56198.2025.11248162","pdf_url":null,"source":{"id":"https://openalex.org/S4363607929","display_name":"IEEE International Conference on Plasma Science (ICOPS)","issn_l":"0730-9244","issn":["0730-9244","2576-7208"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE Pulsed Power & Plasma Science (PPPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W995489505","https://openalex.org/W2018640145","https://openalex.org/W2081528342"],"related_works":["https://openalex.org/W2403845975","https://openalex.org/W1982727632","https://openalex.org/W4244249622","https://openalex.org/W2059345693","https://openalex.org/W2369019033","https://openalex.org/W2071218517","https://openalex.org/W2013391826","https://openalex.org/W2064486094","https://openalex.org/W2965194685","https://openalex.org/W1550720625"],"abstract_inverted_index":{"The":[0],"Orion":[1],"Laser":[2],"Facility":[3],"requires":[4],"the":[5,10],"use":[6],"of":[7,12],"flashlamps":[8],"for":[9],"purposes":[11],"laser":[13],"beam":[14],"amplification.":[15],"Flashlamps":[16],"are":[17,38],"typically":[18],"constructed":[19],"from":[20,74],"a":[21,34,62],"glass":[22],"enclosure":[23],"brazed":[24],"to":[25,42],"metallic":[26],"electrodes":[27],"at":[28],"either":[29],"end":[30],"and":[31,46,57,72],"filled":[32],"with":[33],"low-pressure":[35],"gas.":[36],"There":[37],"many":[39],"reasons":[40],"attributed":[41],"flash":[43],"lamp":[44],"failure":[45],"replacing":[47],"failed":[48],"lamps":[49,68],"in":[50],"an":[51],"operational":[52],"system":[53],"is":[54,61],"both":[55],"timely":[56],"expensive,":[58],"presented":[59],"here":[60],"non-invasive":[63],"method":[64],"through":[65],"which":[66],"faulty":[67],"can":[69],"be":[70],"identified":[71],"removed":[73],"circulation.":[75]},"counts_by_year":[],"updated_date":"2026-10-28T10:33:24.094632","created_date":"2025-11-28T00:00:00"}