{"id":"https://openalex.org/W4415744209","doi":"https://doi.org/10.1109/qrs-c65679.2025.00045","title":"Research on Software Adaptive Testing Strategy Combined with Static Analysis","display_name":"Research on Software Adaptive Testing Strategy Combined with Static Analysis","publication_year":2025,"publication_date":"2025-07-16","ids":{"openalex":"https://openalex.org/W4415744209","doi":"https://doi.org/10.1109/qrs-c65679.2025.00045"},"language":"en","primary_location":{"id":"doi:10.1109/qrs-c65679.2025.00045","doi":"https://doi.org/10.1109/qrs-c65679.2025.00045","is_oa":false,"landing_page_url":"https://doi.org/10.1109/qrs-c65679.2025.00045","pdf_url":null,"source":{"id":"https://openalex.org/S4363608085","display_name":"IEEE International Conference on Software Quality, Reliability and Security Companion (QRS-C)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 25th International Conference on Software Quality, Reliability, and Security Companion (QRS-C)","raw_type":"proceedings-article"},"parent_works":[],"lineage":["https://openalex.org/W4415744209"],"child_works_count":0,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100682191","display_name":"Fang Liu","orcid":"https://orcid.org/0000-0003-0750-8344","observed_orcids":["https://orcid.org/0000-0003-0750-8344"]},"institutions":[{"id":"https://openalex.org/I4392738113","display_name":"China Electric Power Research Institute","ror":"https://ror.org/05ehpzy81","country_code":"CN","type":"facility","lineage":["https://openalex.org/I17442442","https://openalex.org/I4392738113"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fang Liu","raw_affiliation_strings":["China Electric Power Research Institute,Beijing Key Laboratory of Research and System Evaluation of Power Dispatching Automation Technology,Beijing,China,100192"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Electric Power Research Institute,Beijing Key Laboratory of Research and System Evaluation of Power Dispatching Automation Technology,Beijing,China,100192","institution_ids":["https://openalex.org/I4392738113"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Fuping Zeng","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fuping Zeng","raw_affiliation_strings":["Beihang University,School of Reliability and Systems Engineering,Beijing,China,100191"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beihang University,School of Reliability and Systems Engineering,Beijing,China,100191","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106526137","display_name":"Zeyu Wang","orcid":"https://orcid.org/0000-0003-1814-6940","observed_orcids":["https://orcid.org/0000-0003-1814-6940"]},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zeyu Wang","raw_affiliation_strings":["Beihang University,School of Reliability and Systems Engineering,Beijing,China,100191"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beihang University,School of Reliability and Systems Engineering,Beijing,China,100191","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100680672","display_name":"Yujia Li","orcid":"https://orcid.org/0000-0002-1024-9243","observed_orcids":["https://orcid.org/0000-0002-1024-9243","https://orcid.org/0000-0002-3199-5595"]},"institutions":[{"id":"https://openalex.org/I4392738113","display_name":"China Electric Power Research Institute","ror":"https://ror.org/05ehpzy81","country_code":"CN","type":"facility","lineage":["https://openalex.org/I17442442","https://openalex.org/I4392738113"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yujia Li","raw_affiliation_strings":["China Electric Power Research Institute,Beijing,China,100192"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Electric Power Research Institute,Beijing,China,100192","institution_ids":["https://openalex.org/I4392738113"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005366576","display_name":"Linglin Gong","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4392738113","display_name":"China Electric Power Research Institute","ror":"https://ror.org/05ehpzy81","country_code":"CN","type":"facility","lineage":["https://openalex.org/I17442442","https://openalex.org/I4392738113"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Linglin Gong","raw_affiliation_strings":["China Electric Power Research Institute,Beijing,China,100192"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Electric Power Research Institute,Beijing,China,100192","institution_ids":["https://openalex.org/I4392738113"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"304","last_page":"310"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.0,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/adaptive-random-testing","display_name":"adaptive random testing","score":0.9470000267028809},{"id":"https://openalex.org/keywords/test-case-selection","display_name":"test selection","score":0.8460000157356262},{"id":"https://openalex.org/keywords/static-analysis","display_name":"static analysis","score":0.8629999756813049},{"id":"https://openalex.org/keywords/software-testing-techniques","display_name":"software testing techniques","score":0.7009999752044678},{"id":"https://openalex.org/keywords/code-measurements","display_name":"code measurements","score":0.5339999794960022},{"id":"https://openalex.org/keywords/test-overhead-reduction","display_name":"test overhead reduction","score":0.4659999907016754}],"concepts":[{"id":"https://openalex.org/C97686452","wikidata":"https://www.wikidata.org/wiki/Q7604153","display_name":"Static analysis","level":2,"score":0.7141000032424927},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7063999772071838},{"id":"https://openalex.org/C106159264","wikidata":"https://www.wikidata.org/wiki/Q17146789","display_name":"Random testing","level":4,"score":0.6686000227928162},{"id":"https://openalex.org/C86469151","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Non-regression testing","level":5,"score":0.6643999814987183},{"id":"https://openalex.org/C188598960","wikidata":"https://www.wikidata.org/wiki/Q7705805","display_name":"Test strategy","level":3,"score":0.5827000141143799},{"id":"https://openalex.org/C162443782","wikidata":"https://www.wikidata.org/wiki/Q1066228","display_name":"White-box testing","level":5,"score":0.5631999969482422},{"id":"https://openalex.org/C161821725","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Regression testing","level":5,"score":0.5540000200271606},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.524399995803833},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.5063999891281128},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.49459999799728394},{"id":"https://openalex.org/C178059732","wikidata":"https://www.wikidata.org/wiki/Q1982529","display_name":"Software performance testing","level":5,"score":0.4779999852180481},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4758000075817108},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.4645000100135803},{"id":"https://openalex.org/C2984328558","wikidata":"https://www.wikidata.org/wiki/Q188522","display_name":"Software testing","level":3,"score":0.43869999051094055},{"id":"https://openalex.org/C144352353","wikidata":"https://www.wikidata.org/wiki/Q2920411","display_name":"Computerized adaptive testing","level":3,"score":0.41130000352859497},{"id":"https://openalex.org/C169168650","wikidata":"https://www.wikidata.org/wiki/Q1675637","display_name":"Keyword-driven testing","level":5,"score":0.41019999980926514},{"id":"https://openalex.org/C37945671","wikidata":"https://www.wikidata.org/wiki/Q7336207","display_name":"Risk-based testing","level":5,"score":0.4043999910354614},{"id":"https://openalex.org/C7435765","wikidata":"https://www.wikidata.org/wiki/Q7705776","display_name":"Test Management Approach","level":5,"score":0.4034999907016754},{"id":"https://openalex.org/C137287247","wikidata":"https://www.wikidata.org/wiki/Q1329550","display_name":"Static program analysis","level":4,"score":0.40130001306533813},{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.4009999930858612},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.3822999894618988},{"id":"https://openalex.org/C165825675","wikidata":"https://www.wikidata.org/wiki/Q1399743","display_name":"Model-based testing","level":4,"score":0.38019999861717224},{"id":"https://openalex.org/C107683887","wikidata":"https://www.wikidata.org/wiki/Q782466","display_name":"Integration testing","level":3,"score":0.36629998683929443},{"id":"https://openalex.org/C198824145","wikidata":"https://www.wikidata.org/wiki/Q442770","display_name":"Dynamic testing","level":2,"score":0.36070001125335693},{"id":"https://openalex.org/C182122060","wikidata":"https://www.wikidata.org/wiki/Q6752328","display_name":"Manual testing","level":5,"score":0.3603000044822693},{"id":"https://openalex.org/C140006998","wikidata":"https://www.wikidata.org/wiki/Q2499307","display_name":"Dynamic program analysis","level":3,"score":0.3601999878883362},{"id":"https://openalex.org/C63406617","wikidata":"https://www.wikidata.org/wiki/Q5266714","display_name":"Development testing","level":5,"score":0.3564999997615814},{"id":"https://openalex.org/C158324730","wikidata":"https://www.wikidata.org/wiki/Q54862604","display_name":"Orthogonal array testing","level":5,"score":0.33980000019073486},{"id":"https://openalex.org/C2776760102","wikidata":"https://www.wikidata.org/wiki/Q5139990","display_name":"Code (set theory)","level":3,"score":0.3366999924182892},{"id":"https://openalex.org/C148027188","wikidata":"https://www.wikidata.org/wiki/Q907375","display_name":"Unit testing","level":3,"score":0.3273000121116638},{"id":"https://openalex.org/C24169984","wikidata":"https://www.wikidata.org/wiki/Q879969","display_name":"Black-box testing","level":5,"score":0.3181999921798706},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.31769999861717224},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.314300000667572},{"id":"https://openalex.org/C98183937","wikidata":"https://www.wikidata.org/wiki/Q2112188","display_name":"Program analysis","level":2,"score":0.29919999837875366},{"id":"https://openalex.org/C7515471","wikidata":"https://www.wikidata.org/wiki/Q1936882","display_name":"Stress testing (software)","level":2,"score":0.2782000005245209},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.2775000035762787},{"id":"https://openalex.org/C48002344","wikidata":"https://www.wikidata.org/wiki/Q2919644","display_name":"Verification and validation","level":2,"score":0.275299996137619},{"id":"https://openalex.org/C139143892","wikidata":"https://www.wikidata.org/wiki/Q7441615","display_name":"Search-based software engineering","level":5,"score":0.27379998564720154},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.26510000228881836},{"id":"https://openalex.org/C131377759","wikidata":"https://www.wikidata.org/wiki/Q322514","display_name":"Acceptance testing","level":2,"score":0.26489999890327454}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/qrs-c65679.2025.00045","doi":"https://doi.org/10.1109/qrs-c65679.2025.00045","is_oa":false,"landing_page_url":"https://doi.org/10.1109/qrs-c65679.2025.00045","pdf_url":null,"source":{"id":"https://openalex.org/S4363608085","display_name":"IEEE International Conference on Software Quality, Reliability and Security Companion (QRS-C)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 25th International Conference on Software Quality, Reliability, and Security Companion (QRS-C)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2107252882","https://openalex.org/W2130274814","https://openalex.org/W2153649445"],"related_works":["https://openalex.org/W4416962783","https://openalex.org/W2802340306","https://openalex.org/W2383405993","https://openalex.org/W2293853683","https://openalex.org/W2070655751","https://openalex.org/W2157083801","https://openalex.org/W2118425062","https://openalex.org/W2138401407","https://openalex.org/W2372029843","https://openalex.org/W121187076"],"abstract_inverted_index":{"Software":[0],"testing":[1,20,30,48,100,137,201],"has":[2,56,199],"always":[3],"been":[4],"the":[5,28,35,76,79,86,117,132,160,164,175,180,183,187,197],"main":[6],"means":[7],"of":[8,37,78,85,88,134,155,167,182],"ensuring":[9],"software":[10,29,98],"quality.":[11],"It":[12],"is":[13,24,44],"impossible":[14],"to":[15,26,33,51,151],"exhaustively":[16],"test":[17,38,119,148,168],"with":[18,140],"limited":[19],"resources,":[21],"so":[22,170],"it":[23,55,171],"important":[25],"study":[27],"strategies":[31],"used":[32],"guide":[34],"selection":[36,109,121],"cases.":[39],"Adaptive":[40],"Random":[41],"Testing":[42],"(ART)":[43],"a":[45,97,141],"more":[46],"effective":[47,70],"strategy":[49,101],"compared":[50],"random":[52],"testing,":[53],"but":[54],"problems":[57,77],"such":[58],"as":[59,144],"being":[60,68],"oriented":[61],"towards":[62],"modules,":[63],"having":[64],"high":[65,72],"overhead,":[66],"and":[67,82,116,178,203],"less":[69],"in":[71,91,186,189],"dimensions.":[73],"Aiming":[74],"at":[75],"ART":[80],"algorithm":[81],"taking":[83],"advantage":[84],"advantages":[87],"static":[89,105,113],"analysis":[90,114],"code":[92,142],"measurement,":[93],"this":[94],"paper":[95],"introduces":[96],"adaptive":[99,118],"framework":[102],"that":[103,196],"integrates":[104],"analysis.":[106],"The":[107,192],"module":[108],"method":[110,122,198],"based":[111,123],"on":[112,124],"(STATIC-FUN)":[115],"case":[120],"hypercube":[125,156],"(CUBE-ART)":[126],"are":[127],"mainly":[128],"introduced.":[129],"STATIC-FUN":[130],"identifies":[131],"priority":[133],"modules":[135],"for":[136],"when":[138],"presented":[139],"file":[143],"input.":[145],"CUBE-ART":[146],"selects":[147],"cases":[149],"according":[150],"predefined":[152],"encoding":[153],"rules.":[154],"nodes,":[157],"directly":[158],"reducing":[159],"distance":[161],"calculations":[162],"between":[163],"vast":[165],"majority":[166],"cases,":[169],"can":[172],"greatly":[173],"improve":[174],"operational":[176,205],"efficiency":[177],"solve":[179],"problem":[181],"rapid":[184],"decrease":[185],"effectiveness":[188,202],"high-dimensional":[190],"conditions.":[191],"experimental":[193],"results":[194],"demonstrate":[195],"enhanced":[200],"reduced":[204],"costs.":[206]},"counts_by_year":[],"updated_date":"2026-11-14T11:04:58.165337","created_date":"2025-10-31T00:00:00"}