{"id":"https://openalex.org/W4414538457","doi":"https://doi.org/10.1109/tim.2025.3614852","title":"High Impedance Fault Detection in Resonant-Grounded Distribution Networks Using Continuous Wavelet Transform and Deep Residual Networks","display_name":"High Impedance Fault Detection in Resonant-Grounded Distribution Networks Using Continuous Wavelet Transform and Deep Residual Networks","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4414538457","doi":"https://doi.org/10.1109/tim.2025.3614852"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3614852","doi":"https://doi.org/10.1109/tim.2025.3614852","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3614852","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-3","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067727319","display_name":"Kai Liao","orcid":"https://orcid.org/0000-0001-7954-4139","observed_orcids":["https://orcid.org/0000-0001-7954-4139"]},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai Liao","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","School of Electrical and Electronic Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-7954-4139","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109454835","display_name":"Yunyao Tan","orcid":"https://orcid.org/0009-0006-9396-378X","observed_orcids":["https://orcid.org/0009-0006-9396-378X"]},"institutions":[{"id":"https://openalex.org/I17442442","display_name":"State Grid Corporation of China (China)","ror":"https://ror.org/05twwhs70","country_code":"CN","type":"company","lineage":["https://openalex.org/I17442442"]},{"id":"https://openalex.org/I4405282075","display_name":"State Grid Sichuan Electric Power Corporation (China)","ror":"https://ror.org/059k2yd77","country_code":"CN","type":"company","lineage":["https://openalex.org/I17442442","https://openalex.org/I4405282075"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunyao Tan","raw_affiliation_strings":["State Grid Sichuan Electric Power Company, Chengdu, China","State Grid Sichuan Electrical Power Compaly, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0006-9396-378X","affiliations":[{"raw_affiliation_string":"State Grid Sichuan Electric Power Company, Chengdu, China","institution_ids":["https://openalex.org/I4405282075"]},{"raw_affiliation_string":"State Grid Sichuan Electrical Power Compaly, Chengdu, China","institution_ids":["https://openalex.org/I17442442","https://openalex.org/I4405282075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100705283","display_name":"Bo Li","orcid":"https://orcid.org/0000-0002-6890-5602","observed_orcids":["https://orcid.org/0000-0002-6890-5602"]},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Li","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","School of Electrical and Electronic Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-6890-5602","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073150284","display_name":"Zhengyou Y. He","orcid":"https://orcid.org/0000-0002-0339-7782","observed_orcids":["https://orcid.org/0000-0002-0339-7782","https://orcid.org/0000-0002-6252-2440"]},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengyou He","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","School of Electrical and Electronic Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-0339-7782","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":4.6921,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.95686549,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"16"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/high-impedance-fault-detection","display_name":"high impedance fault detection","score":0.9800000190734863},{"id":"https://openalex.org/keywords/resonant-grounding","display_name":"resonant grounding","score":0.7850000262260437},{"id":"https://openalex.org/keywords/distribution-networks","display_name":"distribution networks","score":0.9739999771118164},{"id":"https://openalex.org/keywords/zero-sequence-current","display_name":"zero-sequence current","score":0.8899999856948853},{"id":"https://openalex.org/keywords/continuous-wavelet-transform","display_name":"continuous wavelet transform","score":0.9919999837875366},{"id":"https://openalex.org/keywords/resnet","display_name":"ResNet","score":0.9319999814033508},{"id":"https://openalex.org/keywords/time-frequency-features","display_name":"time-frequency features","score":0.6389999985694885},{"id":"https://openalex.org/keywords/power-system-protection","display_name":"power system protection","score":0.7860000133514404},{"id":"https://openalex.org/keywords/vanishing-gradient","display_name":"gradient vanishing","score":0.7379999756813049}],"concepts":[{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.6040999889373779},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5995000004768372},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5986999869346619},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5284000039100647},{"id":"https://openalex.org/C174268685","wikidata":"https://www.wikidata.org/wiki/Q769127","display_name":"High impedance","level":3,"score":0.5275999903678894},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.511900007724762},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.48500001430511475},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.46630001068115234},{"id":"https://openalex.org/C177606310","wikidata":"https://www.wikidata.org/wiki/Q5674297","display_name":"Adaptability","level":2,"score":0.45680001378059387},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.4551999866962433},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4268999993801117},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4198000133037567},{"id":"https://openalex.org/C95722684","wikidata":"https://www.wikidata.org/wiki/Q2622756","display_name":"Continuous wavelet transform","level":5,"score":0.4099999964237213},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.38359999656677246},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37560001015663147},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.367000013589859},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3578000068664551},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.35589998960494995},{"id":"https://openalex.org/C46286280","wikidata":"https://www.wikidata.org/wiki/Q2414958","display_name":"Discrete wavelet transform","level":4,"score":0.35499998927116394},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.3515999913215637},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.3294000029563904},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.328000009059906},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.3179999887943268},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.30959999561309814},{"id":"https://openalex.org/C3019722297","wikidata":"https://www.wikidata.org/wiki/Q4440864","display_name":"High dimensional","level":2,"score":0.29019999504089355},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.27970001101493835},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2770000100135803},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.27140000462532043},{"id":"https://openalex.org/C83665646","wikidata":"https://www.wikidata.org/wiki/Q42139305","display_name":"Feature vector","level":2,"score":0.2574000060558319},{"id":"https://openalex.org/C142433447","wikidata":"https://www.wikidata.org/wiki/Q7806653","display_name":"Time\u2013frequency analysis","level":3,"score":0.2574000060558319},{"id":"https://openalex.org/C110121322","wikidata":"https://www.wikidata.org/wiki/Q865811","display_name":"Distribution (mathematics)","level":2,"score":0.25440001487731934},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.2515999972820282},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.2506999969482422}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3614852","doi":"https://doi.org/10.1109/tim.2025.3614852","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3614852","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-3","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5378999710083008}],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G7685492957","display_name":null,"funder_award_id":"5400-202355767A-3-5-YS","funder_id":"https://openalex.org/F4320335967","funder_display_name":"Science and Technology Project of State Grid"}],"funders":[{"id":"https://openalex.org/F4320335967","display_name":"Science and Technology Project of State Grid","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1829376396","https://openalex.org/W1997824679","https://openalex.org/W2110073318","https://openalex.org/W2122634891","https://openalex.org/W2157948857","https://openalex.org/W2320936718","https://openalex.org/W2471159162","https://openalex.org/W2729249418","https://openalex.org/W2754811822","https://openalex.org/W2765993873","https://openalex.org/W2780688403","https://openalex.org/W2782655338","https://openalex.org/W2790561973","https://openalex.org/W2899914588","https://openalex.org/W2911897023","https://openalex.org/W2947101580","https://openalex.org/W2955955770","https://openalex.org/W3008261766","https://openalex.org/W3010981032","https://openalex.org/W3111453021","https://openalex.org/W3160377768","https://openalex.org/W3160808865","https://openalex.org/W3203203917","https://openalex.org/W4229034549","https://openalex.org/W4315776735","https://openalex.org/W4320001385","https://openalex.org/W4323797675","https://openalex.org/W4387647307","https://openalex.org/W4387934938","https://openalex.org/W4392251646","https://openalex.org/W4401028406","https://openalex.org/W4401858108","https://openalex.org/W4402125067","https://openalex.org/W4402968256","https://openalex.org/W4403279360","https://openalex.org/W4409348079"],"related_works":[],"abstract_inverted_index":{"In":[0],"the":[1,62,69,79,115,146,162,169,184],"resonant":[2],"grounded":[3],"distribution":[4,72],"network,":[5],"High":[6],"Impedance":[7],"Fault":[8],"(HIF)":[9],"exhibits":[10],"subtle":[11],"and":[12,52,127,139,159],"fragile":[13],"features":[14,81],"that":[15,37,68,111,145],"are":[16],"often":[17],"obscured":[18],"by":[19],"normal":[20],"disturbances,":[21],"making":[22],"them":[23],"difficult":[24],"to":[25,48,95,183],"detect":[26],"accurately.":[27],"Thus,":[28],"this":[29,86],"paper":[30],"presents":[31],"an":[32,105],"innovative":[33],"HIF":[34,108,148],"detection":[35,50,149],"method":[36,150],"combines":[38],"Continuous":[39],"Wavelet":[40],"Transform":[41],"(CWT)":[42],"with":[43],"Deep":[44],"Residual":[45],"Networks":[46],"(DRN)":[47],"enhance":[49],"accuracy":[51,158],"adaptability":[53],"based":[54],"on":[55,85],"measuring":[56],"zero-sequence":[57,63],"current.":[58],"By":[59],"thoroughly":[60],"analyzing":[61],"current":[64],"characteristics,":[65],"we":[66,88,103],"discover":[67],"time-frequency":[70],"domain":[71],"of":[73,82,118,124,157,164,171,186],"these":[74,97],"currents":[75],"more":[76],"effectively":[77],"captures":[78],"deep":[80,116],"HIFs.":[83],"Based":[84],"insight,":[87],"propose":[89],"a":[90,180],"CWT-based":[91],"feature":[92],"extraction":[93],"technique":[94],"highlight":[96],"distinguishing":[98],"features.":[99],"Building":[100],"upon":[101],"this,":[102],"develop":[104],"improved":[106],"DRN-based":[107],"identification":[109],"model":[110],"not":[112],"only":[113],"explores":[114],"properties":[117],"HIFs":[119],"but":[120],"also":[121],"addresses":[122],"issues":[123],"gradient":[125],"vanishing":[126],"performance":[128],"degradation":[129],"commonly":[130],"found":[131],"in":[132,155,174],"traditional":[133],"CNNs.":[134],"Extensive":[135],"numerical":[136],"simulation":[137],"testing":[138,167],"comparison":[140],"conducted":[141],"using":[142],"PSCAD":[143],"demonstrate":[144],"proposed":[147],"significantly":[151],"outperforms":[152],"existing":[153],"techniques":[154],"terms":[156],"adaptability.":[160],"And":[161],"results":[163],"hardware-in-the-loop":[165],"experimental":[166],"validate":[168],"effectiveness":[170],"our":[172],"approach":[173],"reliably":[175],"detecting":[176],"HIFs,":[177],"thereby":[178],"contributing":[179],"valuable":[181],"advancement":[182],"field":[185],"power":[187],"system":[188],"protection.":[189]},"counts_by_year":[{"year":2026,"cited_by_count":11},{"year":2025,"cited_by_count":1}],"updated_date":"2026-10-08T09:06:37.294493","created_date":"2025-10-10T00:00:00"}