{"id":"https://openalex.org/W4414084792","doi":"https://doi.org/10.1021/acs.jpclett.5c01757","title":"Tuning the Electrical Property and Electronic Band Structures of Organic Semiconductors via Surface Tension","display_name":"Tuning the Electrical Property and Electronic Band Structures of Organic Semiconductors via Surface Tension","publication_year":2025,"publication_date":"2025-09-10","ids":{"openalex":"https://openalex.org/W4414084792","doi":"https://doi.org/10.1021/acs.jpclett.5c01757","pmid":"https://pubmed.ncbi.nlm.nih.gov/40928829"},"language":"en","primary_location":{"id":"doi:10.1021/acs.jpclett.5c01757","doi":"https://doi.org/10.1021/acs.jpclett.5c01757","is_oa":false,"landing_page_url":"https://doi.org/10.1021/acs.jpclett.5c01757","pdf_url":null,"source":{"id":"https://openalex.org/S123480357","display_name":"The Journal of Physical Chemistry Letters","issn_l":"1948-7185","issn":["1948-7185"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-3","ki-jl-1","medline","norway-1","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320006","host_organization_name":"American Chemical Society","host_organization_lineage":["https://openalex.org/P4310320006"],"host_organization_lineage_names":["American Chemical Society"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The Journal of Physical Chemistry Letters","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Zonghan Guo","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210140493","display_name":"Collaborative Innovation Center of Advanced Microstructures","ror":"https://ror.org/04ttadj76","country_code":"CN","type":"facility","lineage":["https://openalex.org/I126520041","https://openalex.org/I183067930","https://openalex.org/I19820366","https://openalex.org/I24943067","https://openalex.org/I2802624667","https://openalex.org/I4210140493","https://openalex.org/I76130692","https://openalex.org/I881766915"]},{"id":"https://openalex.org/I4391768004","display_name":"National Laboratory of Solid State Microstructures","ror":"https://ror.org/05ryc2b20","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768004","https://openalex.org/I881766915"]},{"id":"https://openalex.org/I881766915","display_name":"Nanjing University","ror":"https://ror.org/01rxvg760","country_code":"CN","type":"education","lineage":["https://openalex.org/I881766915"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zonghan Guo","raw_affiliation_strings":["Nanjing University","National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures","National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanjing University","institution_ids":["https://openalex.org/I881766915"]},{"raw_affiliation_string":"National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures","institution_ids":["https://openalex.org/I4210140493","https://openalex.org/I4391768004"]},{"raw_affiliation_string":"National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, P. R. China","institution_ids":["https://openalex.org/I4210140493","https://openalex.org/I4391768004","https://openalex.org/I881766915"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108128061","display_name":"Yunfei Tian","orcid":"https://orcid.org/0009-0001-6522-8706","observed_orcids":["https://orcid.org/0009-0001-6522-8706"]},"institutions":[{"id":"https://openalex.org/I881766915","display_name":"Nanjing University","ror":"https://ror.org/01rxvg760","country_code":"CN","type":"education","lineage":["https://openalex.org/I881766915"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunfei Tian","raw_affiliation_strings":["Nanjing University","School of Integrated Circuits","School of Integrated Circuits, Nanjing University, Suzhou 215163, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanjing University","institution_ids":["https://openalex.org/I881766915"]},{"raw_affiliation_string":"School of Integrated Circuits","institution_ids":[]},{"raw_affiliation_string":"School of Integrated Circuits, Nanjing University, Suzhou 215163, P. R. China","institution_ids":["https://openalex.org/I881766915"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100437975","display_name":"Kai Chen","orcid":"https://orcid.org/0000-0002-5395-3847","observed_orcids":["https://orcid.org/0000-0002-5395-3847","https://orcid.org/0009-0005-6212-998X"]},"institutions":[{"id":"https://openalex.org/I881766915","display_name":"Nanjing University","ror":"https://ror.org/01rxvg760","country_code":"CN","type":"education","lineage":["https://openalex.org/I881766915"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai Chen","raw_affiliation_strings":["Nanjing University","School of Integrated Circuits","School of Integrated Circuits, Nanjing University, Suzhou 215163, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanjing University","institution_ids":["https://openalex.org/I881766915"]},{"raw_affiliation_string":"School of Integrated Circuits","institution_ids":[]},{"raw_affiliation_string":"School of Integrated Circuits, Nanjing University, Suzhou 215163, P. R. China","institution_ids":["https://openalex.org/I881766915"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015424433","display_name":"Xianrong Yuan","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I881766915","display_name":"Nanjing University","ror":"https://ror.org/01rxvg760","country_code":"CN","type":"education","lineage":["https://openalex.org/I881766915"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xianrong Yuan","raw_affiliation_strings":["Nanjing University","School of Integrated Circuits","School of Integrated Circuits, Nanjing University, Suzhou 215163, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanjing University","institution_ids":["https://openalex.org/I881766915"]},{"raw_affiliation_string":"School of Integrated Circuits","institution_ids":[]},{"raw_affiliation_string":"School of Integrated Circuits, Nanjing University, Suzhou 215163, P. R. China","institution_ids":["https://openalex.org/I881766915"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024881226","display_name":"Zhonglin Zhang","orcid":"https://orcid.org/0000-0002-3548-8718","observed_orcids":["https://orcid.org/0000-0002-3548-8718"]},"institutions":[{"id":"https://openalex.org/I881766915","display_name":"Nanjing University","ror":"https://ror.org/01rxvg760","country_code":"CN","type":"education","lineage":["https://openalex.org/I881766915"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhonglin Zhang","raw_affiliation_strings":["Nanjing University","School of Integrated Circuits","School of Integrated Circuits, Nanjing University, Suzhou 215163, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanjing University","institution_ids":["https://openalex.org/I881766915"]},{"raw_affiliation_string":"School of Integrated Circuits","institution_ids":[]},{"raw_affiliation_string":"School of Integrated Circuits, Nanjing University, Suzhou 215163, P. R. China","institution_ids":["https://openalex.org/I881766915"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021816222","display_name":"Qijing Wang","orcid":"https://orcid.org/0000-0003-0115-5330","observed_orcids":["https://orcid.org/0000-0003-0115-5330"]},"institutions":[{"id":"https://openalex.org/I4210140493","display_name":"Collaborative Innovation Center of Advanced Microstructures","ror":"https://ror.org/04ttadj76","country_code":"CN","type":"facility","lineage":["https://openalex.org/I126520041","https://openalex.org/I183067930","https://openalex.org/I19820366","https://openalex.org/I24943067","https://openalex.org/I2802624667","https://openalex.org/I4210140493","https://openalex.org/I76130692","https://openalex.org/I881766915"]},{"id":"https://openalex.org/I4391768004","display_name":"National Laboratory of Solid State Microstructures","ror":"https://ror.org/05ryc2b20","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768004","https://openalex.org/I881766915"]},{"id":"https://openalex.org/I881766915","display_name":"Nanjing University","ror":"https://ror.org/01rxvg760","country_code":"CN","type":"education","lineage":["https://openalex.org/I881766915"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qijing Wang","raw_affiliation_strings":["Nanjing University","National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures","School of Integrated Circuits","National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, P. R. China","School of Integrated Circuits, Nanjing University, Suzhou 215163, P. R. China"],"raw_orcid":"https://orcid.org/0000-0003-0115-5330","affiliations":[{"raw_affiliation_string":"Nanjing University","institution_ids":["https://openalex.org/I881766915"]},{"raw_affiliation_string":"National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures","institution_ids":["https://openalex.org/I4210140493","https://openalex.org/I4391768004"]},{"raw_affiliation_string":"School of Integrated Circuits","institution_ids":[]},{"raw_affiliation_string":"National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, P. R. China","institution_ids":["https://openalex.org/I4210140493","https://openalex.org/I4391768004","https://openalex.org/I881766915"]},{"raw_affiliation_string":"School of Integrated Circuits, Nanjing University, Suzhou 215163, P. R. China","institution_ids":["https://openalex.org/I881766915"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012604520","display_name":"Yi Shi","orcid":"https://orcid.org/0000-0002-1082-0315","observed_orcids":["https://orcid.org/0000-0002-1082-0315","https://orcid.org/0000-0003-3575-4948","https://orcid.org/0000-0003-4453-5587"]},"institutions":[{"id":"https://openalex.org/I4210140493","display_name":"Collaborative Innovation Center of Advanced Microstructures","ror":"https://ror.org/04ttadj76","country_code":"CN","type":"facility","lineage":["https://openalex.org/I126520041","https://openalex.org/I183067930","https://openalex.org/I19820366","https://openalex.org/I24943067","https://openalex.org/I2802624667","https://openalex.org/I4210140493","https://openalex.org/I76130692","https://openalex.org/I881766915"]},{"id":"https://openalex.org/I4391768004","display_name":"National Laboratory of Solid State Microstructures","ror":"https://ror.org/05ryc2b20","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768004","https://openalex.org/I881766915"]},{"id":"https://openalex.org/I881766915","display_name":"Nanjing University","ror":"https://ror.org/01rxvg760","country_code":"CN","type":"education","lineage":["https://openalex.org/I881766915"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Shi","raw_affiliation_strings":["Nanjing University","National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures","National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, P. R. China"],"raw_orcid":"https://orcid.org/0000-0002-1082-0315","affiliations":[{"raw_affiliation_string":"Nanjing University","institution_ids":["https://openalex.org/I881766915"]},{"raw_affiliation_string":"National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures","institution_ids":["https://openalex.org/I4210140493","https://openalex.org/I4391768004"]},{"raw_affiliation_string":"National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, P. R. China","institution_ids":["https://openalex.org/I4210140493","https://openalex.org/I4391768004","https://openalex.org/I881766915"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100395668","display_name":"Yun Li","orcid":"https://orcid.org/0000-0003-1753-7317","observed_orcids":["https://orcid.org/0000-0003-1753-7317"]},"institutions":[{"id":"https://openalex.org/I4210140493","display_name":"Collaborative Innovation Center of Advanced Microstructures","ror":"https://ror.org/04ttadj76","country_code":"CN","type":"facility","lineage":["https://openalex.org/I126520041","https://openalex.org/I183067930","https://openalex.org/I19820366","https://openalex.org/I24943067","https://openalex.org/I2802624667","https://openalex.org/I4210140493","https://openalex.org/I76130692","https://openalex.org/I881766915"]},{"id":"https://openalex.org/I4391768004","display_name":"National Laboratory of Solid State Microstructures","ror":"https://ror.org/05ryc2b20","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768004","https://openalex.org/I881766915"]},{"id":"https://openalex.org/I881766915","display_name":"Nanjing University","ror":"https://ror.org/01rxvg760","country_code":"CN","type":"education","lineage":["https://openalex.org/I881766915"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yun Li","raw_affiliation_strings":["Nanjing University","National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures","National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, P. R. China"],"raw_orcid":"https://orcid.org/0000-0003-1753-7317","affiliations":[{"raw_affiliation_string":"Nanjing University","institution_ids":["https://openalex.org/I881766915"]},{"raw_affiliation_string":"National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures","institution_ids":["https://openalex.org/I4210140493","https://openalex.org/I4391768004"]},{"raw_affiliation_string":"National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, P. R. China","institution_ids":["https://openalex.org/I4210140493","https://openalex.org/I4391768004","https://openalex.org/I881766915"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5021816222","https://openalex.org/A5100395668"],"corresponding_institution_ids":["https://openalex.org/I4210140493","https://openalex.org/I4391768004","https://openalex.org/I881766915"],"apc_list":{"value":4500,"currency":"USD","value_usd":4500},"apc_paid":null,"fwci":0.452,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.56981579,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":"16","issue":"37","first_page":"9800","last_page":"9805"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10275","display_name":"2D Materials and Applications","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10611","display_name":"Organic Light-Emitting Diodes Research","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/organic-semiconductors","display_name":"organic semiconductors","score":0.9369999766349792},{"id":"https://openalex.org/keywords/stress-engineering","display_name":"stress engineering","score":0.8259999752044678},{"id":"https://openalex.org/keywords/compressive-strain","display_name":"compressive strain","score":0.9110000133514404},{"id":"https://openalex.org/keywords/surface-tension","display_name":"surface tension","score":0.7450000047683716},{"id":"https://openalex.org/keywords/water-treatment","display_name":"water treatment","score":0.8330000042915344},{"id":"https://openalex.org/keywords/work-function","display_name":"work function","score":0.593999981880188},{"id":"https://openalex.org/keywords/homo-energy-level","display_name":"HOMO energy level","score":0.9150000214576721},{"id":"https://openalex.org/keywords/band-structure","display_name":"electronic band structure","score":0.8190000057220459},{"id":"https://openalex.org/keywords/polycrystalline-thin-films","display_name":"polycrystalline thin films","score":0.8159999847412109},{"id":"https://openalex.org/keywords/vapor-deposition","display_name":"vapor deposition","score":0.6869999766349792},{"id":"https://openalex.org/keywords/annealing","display_name":"annealing","score":0.8180000185966492},{"id":"https://openalex.org/keywords/charge-carrier-mobility","display_name":"carrier mobility","score":0.6990000009536743},{"id":"https://openalex.org/keywords/organic-transistors","display_name":"organic transistors","score":0.8050000071525574},{"id":"https://openalex.org/keywords/device-stability","display_name":"device stability","score":0.6899999976158142},{"id":"https://openalex.org/keywords/intermolecular-coupling","display_name":"intermolecular coupling","score":0.7160000205039978}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7824000120162964},{"id":"https://openalex.org/C94003879","wikidata":"https://www.wikidata.org/wiki/Q1933714","display_name":"Organic semiconductor","level":2,"score":0.6851999759674072},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.6796000003814697},{"id":"https://openalex.org/C112950240","wikidata":"https://www.wikidata.org/wiki/Q76005","display_name":"Ultimate tensile strength","level":2,"score":0.4593999981880188},{"id":"https://openalex.org/C137637335","wikidata":"https://www.wikidata.org/wiki/Q899604","display_name":"Crystallite","level":2,"score":0.4408999979496002},{"id":"https://openalex.org/C37292000","wikidata":"https://www.wikidata.org/wiki/Q1257918","display_name":"Residual stress","level":2,"score":0.4348999857902527},{"id":"https://openalex.org/C80487327","wikidata":"https://www.wikidata.org/wiki/Q1262549","display_name":"Strain engineering","level":3,"score":0.4205999970436096},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.41620001196861267},{"id":"https://openalex.org/C115235246","wikidata":"https://www.wikidata.org/wiki/Q783800","display_name":"Work function","level":3,"score":0.41429999470710754},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.39329999685287476},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.375900000333786},{"id":"https://openalex.org/C30407753","wikidata":"https://www.wikidata.org/wiki/Q186191","display_name":"Compressive strength","level":2,"score":0.37389999628067017},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.3700000047683716},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.36730000376701355},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.3587999939918518},{"id":"https://openalex.org/C189278905","wikidata":"https://www.wikidata.org/wiki/Q2157708","display_name":"Wide-bandgap semiconductor","level":2,"score":0.32170000672340393},{"id":"https://openalex.org/C2781285689","wikidata":"https://www.wikidata.org/wiki/Q21921428","display_name":"Crystal (programming language)","level":2,"score":0.30320000648498535},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.3009999990463257},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.29580000042915344},{"id":"https://openalex.org/C2987888538","wikidata":"https://www.wikidata.org/wiki/Q2986369","display_name":"Semiconductor industry","level":2,"score":0.2955999970436096},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.2890999913215637},{"id":"https://openalex.org/C99903730","wikidata":"https://www.wikidata.org/wiki/Q1066726","display_name":"Organic field-effect transistor","level":5,"score":0.28529998660087585},{"id":"https://openalex.org/C2778022156","wikidata":"https://www.wikidata.org/wiki/Q576145","display_name":"Strain (injury)","level":2,"score":0.2621000111103058},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.25839999318122864}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1021/acs.jpclett.5c01757","doi":"https://doi.org/10.1021/acs.jpclett.5c01757","is_oa":false,"landing_page_url":"https://doi.org/10.1021/acs.jpclett.5c01757","pdf_url":null,"source":{"id":"https://openalex.org/S123480357","display_name":"The Journal of Physical Chemistry Letters","issn_l":"1948-7185","issn":["1948-7185"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-3","ki-jl-1","medline","norway-1","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320006","host_organization_name":"American Chemical Society","host_organization_lineage":["https://openalex.org/P4310320006"],"host_organization_lineage_names":["American Chemical Society"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The Journal of Physical Chemistry Letters","raw_type":"journal-article"},{"id":"pmid:40928829","doi":null,"is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/40928829","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The journal of physical chemistry letters","raw_type":"Journal Article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G1488892325","display_name":null,"funder_award_id":"62404095","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G1943929174","display_name":null,"funder_award_id":"BK20230779","funder_id":"https://openalex.org/F4320322769","funder_display_name":"Natural Science Foundation of Jiangsu Province"},{"id":"https://openalex.org/G3202350672","display_name":null,"funder_award_id":"2022YFA1203802","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G4325260170","display_name":null,"funder_award_id":"2021YFA0715600","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322769","display_name":"Natural Science Foundation of Jiangsu Province","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1968229321","https://openalex.org/W1978591785","https://openalex.org/W1984928868","https://openalex.org/W2011492753","https://openalex.org/W2018555308","https://openalex.org/W2100606224","https://openalex.org/W2255396362","https://openalex.org/W2338432521","https://openalex.org/W2790361149","https://openalex.org/W2806342289","https://openalex.org/W2894592043","https://openalex.org/W2996551815","https://openalex.org/W3044862898","https://openalex.org/W3118277323","https://openalex.org/W3128696437","https://openalex.org/W3135142832","https://openalex.org/W3204405332","https://openalex.org/W4221108718","https://openalex.org/W4289517978","https://openalex.org/W4310224720","https://openalex.org/W4383998736","https://openalex.org/W4384820155","https://openalex.org/W4392471659","https://openalex.org/W4400147203","https://openalex.org/W4402055040","https://openalex.org/W4402504129","https://openalex.org/W4402816269"],"related_works":["https://openalex.org/W2355862987","https://openalex.org/W2017747815","https://openalex.org/W2049757704","https://openalex.org/W2402697569","https://openalex.org/W1993098890","https://openalex.org/W2070141875","https://openalex.org/W2326185588","https://openalex.org/W1970838757","https://openalex.org/W2090247588","https://openalex.org/W2003387566"],"abstract_inverted_index":{"Stress":[0],"engineering":[1,59],"is":[2,49],"an":[3,141],"effective":[4],"way":[5],"to":[6,27,44,54,61,76,80,163],"tune":[7],"the":[8,17,28,31,36,69,81,85,98,116,168],"performance":[9],"of":[10,19,30,50,119,144,170],"semiconductors,":[11],"which":[12],"has":[13],"been":[14],"verified":[15],"in":[16,121],"work":[18,106,157],"inorganic":[20],"and":[21,74,83,93,109,131,152],"organic":[22,39,172],"single-crystal":[23],"semiconductors.":[24,63],"However,":[25],"due":[26],"limitations":[29],"vapor-phase":[32],"growth":[33],"preparation":[34],"conditions,":[35],"deposited":[37],"polycrystalline":[38],"semiconductors":[40,75,82],"are":[41],"more":[42],"susceptible":[43],"residual":[45],"stress.":[46],"Therefore,":[47],"it":[48],"great":[51],"research":[52],"significance":[53],"develop":[55],"a":[56,153,159],"low-cost":[57,161],"stress":[58],"applicable":[60],"vapor-deposited":[62],"In":[64],"this":[65],"work,":[66],"we":[67],"utilized":[68],"nonwetting":[70],"state":[71],"between":[72],"water":[73,138],"provide":[77],"compressive":[78,126,165],"strain":[79,87,120,127],"offset":[84],"tensile":[86],"generated":[88],"during":[89],"thermal":[90],"annealing.":[91],"XRD":[92],"UPS":[94],"measurements":[95],"revealed":[96],"that":[97,125],"water-treated":[99],"films":[100],"exhibited":[101],"better":[102,154],"crystal":[103],"quality,":[104],"lower":[105],"function":[107],"(WF),":[108],"higher":[110],"HOMO":[111],"levels.":[112],"These":[113],"results":[114],"highlighted":[115],"critical":[117],"role":[118],"modulating":[122],"WF,":[123],"demonstrating":[124],"alleviates":[128],"dynamic":[129],"disorder":[130],"enhances":[132],"intermolecular":[133],"coupling.":[134],"The":[135],"transistors":[136],"with":[137],"treatment":[139],"achieved":[140],"improved":[142],"mobility":[143],"6.11":[145],"cm":[146],"2":[147],"V":[148],"\u20131":[149,151],"s":[150],"stability.":[155],"This":[156],"provides":[158],"feasible,":[160],"approach":[162],"introduce":[164],"strain,":[166],"facilitating":[167],"building":[169],"high-performance":[171],"devices.":[173]},"counts_by_year":[{"year":2026,"cited_by_count":2}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2025-10-10T00:00:00"}