{"id":"https://openalex.org/W4413457068","doi":"https://doi.org/10.1109/cleo/europe-eqec65582.2025.11109550","title":"Dielectric Grating Technology for High Power Ultrashort Laser Source","display_name":"Dielectric Grating Technology for High Power Ultrashort Laser Source","publication_year":2025,"publication_date":"2025-06-23","ids":{"openalex":"https://openalex.org/W4413457068","doi":"https://doi.org/10.1109/cleo/europe-eqec65582.2025.11109550"},"language":"en","primary_location":{"id":"doi:10.1109/cleo/europe-eqec65582.2025.11109550","doi":"https://doi.org/10.1109/cleo/europe-eqec65582.2025.11109550","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cleo/europe-eqec65582.2025.11109550","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 Conference on Lasers and Electro-Optics Europe &amp;amp; European Quantum Electronics Conference (CLEO/Europe-EQEC)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5119399571","display_name":"Samy Ferhat","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210140930","display_name":"Thales (France)","ror":"https://ror.org/04emwm605","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210140930"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Samy Ferhat","raw_affiliation_strings":["Thales LAS France,Elancourt,France,78990"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales LAS France,Elancourt,France,78990","institution_ids":["https://openalex.org/I4210140930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084531417","display_name":"Doriane Jussey","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210140930","display_name":"Thales (France)","ror":"https://ror.org/04emwm605","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210140930"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Doriane Jussey","raw_affiliation_strings":["Thales Research &#x0026; Technology,,Palaiseau,France,91767"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales Research &#x0026; Technology,,Palaiseau,France,91767","institution_ids":["https://openalex.org/I4210140930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107523611","display_name":"Guillaume Croizier","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210140930","display_name":"Thales (France)","ror":"https://ror.org/04emwm605","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210140930"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Guillaume Croizier","raw_affiliation_strings":["Thales LAS France,Elancourt,France,78990"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales LAS France,Elancourt,France,78990","institution_ids":["https://openalex.org/I4210140930"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Justin Rouxel","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210140930","display_name":"Thales (France)","ror":"https://ror.org/04emwm605","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210140930"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Justin Rouxel","raw_affiliation_strings":["Thales Research &#x0026; Technology,,Palaiseau,France,91767"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales Research &#x0026; Technology,,Palaiseau,France,91767","institution_ids":["https://openalex.org/I4210140930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013938320","display_name":"R. Guillemet","orcid":"https://orcid.org/0000-0001-7745-4519","observed_orcids":["https://orcid.org/0000-0001-7745-4519"]},"institutions":[{"id":"https://openalex.org/I4210140930","display_name":"Thales (France)","ror":"https://ror.org/04emwm605","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210140930"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Raphael Guillemet","raw_affiliation_strings":["Thales Research &#x0026; Technology,,Palaiseau,France,91767"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales Research &#x0026; Technology,,Palaiseau,France,91767","institution_ids":["https://openalex.org/I4210140930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084347309","display_name":"Sandrine Ricaud","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210140930","display_name":"Thales (France)","ror":"https://ror.org/04emwm605","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210140930"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Sandrine Ricaud","raw_affiliation_strings":["Thales LAS France,Elancourt,France,78990"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales LAS France,Elancourt,France,78990","institution_ids":["https://openalex.org/I4210140930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064277401","display_name":"Olivier Chalus","orcid":"https://orcid.org/0000-0002-9552-1903","observed_orcids":["https://orcid.org/0000-0002-9552-1903"]},"institutions":[{"id":"https://openalex.org/I4210140930","display_name":"Thales (France)","ror":"https://ror.org/04emwm605","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210140930"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Olivier Chalus","raw_affiliation_strings":["Thales LAS France,Elancourt,France,78990"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales LAS France,Elancourt,France,78990","institution_ids":["https://openalex.org/I4210140930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069240815","display_name":"Mane\u2010Si Laure Lee","orcid":"https://orcid.org/0000-0003-2888-8147","observed_orcids":["https://orcid.org/0000-0003-2888-8147"]},"institutions":[{"id":"https://openalex.org/I4210140930","display_name":"Thales (France)","ror":"https://ror.org/04emwm605","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210140930"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Mane-Si Laure Lee","raw_affiliation_strings":["Thales Research &#x0026; Technology,,Palaiseau,France,91767"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales Research &#x0026; Technology,,Palaiseau,France,91767","institution_ids":["https://openalex.org/I4210140930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087653599","display_name":"Brigitte Loiseaux","orcid":"https://orcid.org/0000-0001-6679-2934","observed_orcids":["https://orcid.org/0000-0001-6679-2934"]},"institutions":[{"id":"https://openalex.org/I4210140930","display_name":"Thales (France)","ror":"https://ror.org/04emwm605","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210140930"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Brigitte Loiseaux","raw_affiliation_strings":["Thales Research &#x0026; Technology,,Palaiseau,France,91767"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales Research &#x0026; Technology,,Palaiseau,France,91767","institution_ids":["https://openalex.org/I4210140930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210140930"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.36034483,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.6371999979019165,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.6371999979019165,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","score":0.16220000386238098,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10566","display_name":"Laser-Matter Interactions and Applications","score":0.12880000472068787,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/chirped-pulse-amplification","display_name":"chirped pulse amplification","score":0.8510000109672546},{"id":"https://openalex.org/keywords/femtosecond-pulses","display_name":"femtosecond pulses","score":0.8560000061988831},{"id":"https://openalex.org/keywords/laser-induced-damage-threshold","display_name":"laser-induced damage threshold","score":0.7160000205039978},{"id":"https://openalex.org/keywords/dielectric-multilayers","display_name":"dielectric multilayers","score":0.8040000200271606},{"id":"https://openalex.org/keywords/nanoimprint-lithography","display_name":"nanoimprint lithography","score":0.8479999899864197},{"id":"https://openalex.org/keywords/high-density-plasma-etching","display_name":"high density plasma etching","score":0.8619999885559082},{"id":"https://openalex.org/keywords/te-polarization","display_name":"TE polarization","score":0.5839999914169312},{"id":"https://openalex.org/keywords/rigorous-coupled-wave-analysis","display_name":"rigorous coupled-wave analysis","score":0.6399999856948853},{"id":"https://openalex.org/keywords/grating-fabrication","display_name":"grating fabrication","score":0.49900001287460327}],"concepts":[{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6833076477050781},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6409909725189209},{"id":"https://openalex.org/C2777813233","wikidata":"https://www.wikidata.org/wiki/Q1527816","display_name":"Grating","level":2,"score":0.5187302231788635},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4991872310638428},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.48573118448257446},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.47443974018096924},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4683702886104584},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1679326593875885},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cleo/europe-eqec65582.2025.11109550","doi":"https://doi.org/10.1109/cleo/europe-eqec65582.2025.11109550","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cleo/europe-eqec65582.2025.11109550","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 Conference on Lasers and Electro-Optics Europe &amp;amp; European Quantum Electronics Conference (CLEO/Europe-EQEC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7799999713897705}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1495727136","https://openalex.org/W2028602705","https://openalex.org/W2809942706"],"related_works":["https://openalex.org/W3098802023","https://openalex.org/W2034661077","https://openalex.org/W2806184111","https://openalex.org/W4229009453","https://openalex.org/W2068704238","https://openalex.org/W4368342639","https://openalex.org/W2134650954","https://openalex.org/W2053668343","https://openalex.org/W2067321896","https://openalex.org/W4321259293"],"abstract_inverted_index":{"High-power":[0],"lasers":[1],"operating":[2],"at":[3,139,162],"high":[4,71,121,128,142],"operation":[5,161],"rates":[6],"based":[7],"on":[8,49,134,235,250],"gold-coated":[9],"grating":[10,154,278],"compressors":[11,119],"are":[12,215],"limited":[13,84],"by":[14,200,228],"the":[15,18,39,61,65,94,174,178,182,244,263,277,280,285,288],"absorption":[16,37],"of":[17,29,41,64,70,156,177,181,219,243,269,276,287],"gold":[19],"coating":[20],"[1],":[21],"[2]":[22],"that":[23,44],"leads":[24],"to":[25,35,110],"heating":[26],"and":[27,87,104,141,158,164,212,221,226,231,284],"deformation":[28],"gratings":[30,43,76,248],"under":[31],"vacuum.":[32],"An":[33],"alternative":[34],"decrease":[36],"is":[38,255],"use":[40],"all-dielectric":[42,118],"consists":[45],"in":[46,168,187,217,257],"dielectric":[47,52,238,282],"ridges":[48,286],"a":[50,83,101,191,236,251,270],"reflective":[51,213,239],"multilayer":[53,237,281],"stack.":[54,240],"Such":[55],"approach":[56],"enables":[57],"broadband":[58,129],"acceptance":[59],"for":[60,93,120,196],"compression":[62],"step":[63],"chirp":[66],"pulse":[67,96],"amplification":[68],"[3]":[69],"power":[72,122],"femtosecond":[73],"pulses.":[74],"Dielectric":[75],"have":[77,82,150],"been":[78,151],"reported":[79],"but":[80],"can":[81],"spectral":[85,135],"bandwidth":[86,192],"requires":[88],"an":[89,172],"out-of-the":[90],"plane":[91],"layout":[92],"associated":[95],"compressor":[97],"design,":[98],"resulting":[99],"into":[100],"more":[102],"complex":[103],"higher":[105],"volume":[106],"architecture":[107],"as":[108],"compared":[109],"in-plane":[111],"layout.":[112],"In":[113],"this":[114],"paper,":[115],"we":[116],"propose":[117],"ultrashort":[123],"laser":[124,143],"source,":[125],"enabling":[126,160],"both":[127],"efficiency":[130,133,176,198,220],"(>":[131],"90%":[132,197],"bandwidth>":[136],"100nm":[137,195],"centered":[138],"800nm)":[140],"induced":[144],"damage":[145],"threshold":[146],"(LIDT).":[147],"Two":[148],"architectures":[149],"proposed":[152],"with":[153,208],"periods":[155],"610nm":[157],"560nm,":[159],"36\u00b0":[163],"55\u00b0":[165],"incidence":[166],"angle":[167],"TE":[169],"polarization.":[170],"As":[171],"example,":[173],"theoretical":[175],"-1stdiffraction":[179],"order":[180],"designed":[183],"560nm-period":[184],"grating,":[185],"given":[186,256],"Fig.":[188,258,261],"1a,":[189],"shows":[190,279],"larger":[193],"than":[194],"computed":[199],"RCWA":[201],"(Rigorous":[202],"Coupled":[203],"Wave":[204],"Analysis).":[205],"Several":[206],"components":[207],"different":[209],"ridge":[210],"profiles":[211],"stacks":[214],"simulated":[216],"terms":[218],"electric":[222],"field":[223],"intensity":[224],"distribution,":[225],"manufactured":[227,249],"nanoimprint":[229],"lithography":[230],"high-density":[232],"plasma":[233],"etching":[234],"A":[241],"picture":[242],"15mm":[245,247],"x":[246],"2":[252],"inch":[253],"wafer":[254],"1b.":[259],"On":[260],"1c,":[262],"Scanning":[264],"Electron":[265],"Microscope":[266],"(SEM)":[267],"image":[268],"FIB":[271],"(Focused":[272],"Ion":[273],"Beam)":[274],"cut":[275],"stack":[283],"gratings.":[289]},"counts_by_year":[],"updated_date":"2026-10-12T09:40:04.860316","created_date":"2025-10-10T00:00:00"}
