{"id":"https://openalex.org/W4413096092","doi":"https://doi.org/10.1109/smacd65553.2025.11091921","title":"Efficient Parameter Reduction for Statistical Behavioral Modeling","display_name":"Efficient Parameter Reduction for Statistical Behavioral Modeling","publication_year":2025,"publication_date":"2025-07-07","ids":{"openalex":"https://openalex.org/W4413096092","doi":"https://doi.org/10.1109/smacd65553.2025.11091921"},"language":"en","primary_location":{"id":"doi:10.1109/smacd65553.2025.11091921","doi":"https://doi.org/10.1109/smacd65553.2025.11091921","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd65553.2025.11091921","pdf_url":null,"source":{"id":"https://openalex.org/S4306419861","display_name":"International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Jan R\u00f6del","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jan R\u00f6del","raw_affiliation_strings":["NXP Semiconductors Germany GmbH,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors Germany GmbH,Germany","institution_ids":["https://openalex.org/I4210123704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048393964","display_name":"Carna Zivkovic","orcid":"https://orcid.org/0000-0002-5358-739X","observed_orcids":["https://orcid.org/0000-0002-5358-739X"]},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Carna Zivkovic","raw_affiliation_strings":["NXP Semiconductors Germany GmbH,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors Germany GmbH,Germany","institution_ids":["https://openalex.org/I4210123704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5118664197","display_name":"Neha Chavan","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Neha Chavan","raw_affiliation_strings":["NXP Semiconductors Germany GmbH,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors Germany GmbH,Germany","institution_ids":["https://openalex.org/I4210123704"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103027575","display_name":"Christoph Grimm","orcid":"https://orcid.org/0000-0002-5930-7563","observed_orcids":["https://orcid.org/0000-0002-5930-7563"]},"institutions":[{"id":"https://openalex.org/I4387152675","display_name":"Rheinland-Pf\u00e4lzische Technische Universit\u00e4t Kaiserslautern-Landau","ror":"https://ror.org/01qrts582","country_code":"DE","type":"education","lineage":["https://openalex.org/I4387152675"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Christoph Grimm","raw_affiliation_strings":["Rheinland-Pf\u00e4lzische Technische Universit\u00e4t Kaiserslautern-Landau,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rheinland-Pf\u00e4lzische Technische Universit\u00e4t Kaiserslautern-Landau,Germany","institution_ids":["https://openalex.org/I4387152675"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.8988999724388123,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.8988999724388123,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.04639999940991402,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.01940000057220459,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parameter-reduction","display_name":"parameter reduction","score":0.9660000205039978},{"id":"https://openalex.org/keywords/statistical-validation","display_name":"statistical validation","score":0.7749999761581421},{"id":"https://openalex.org/keywords/feature-selection","display_name":"feature selection","score":0.7820000052452087},{"id":"https://openalex.org/keywords/spearman-s-rank-correlation","display_name":"Spearman correlation","score":0.9909999966621399},{"id":"https://openalex.org/keywords/dbscan","display_name":"DBSCAN","score":0.9670000076293945},{"id":"https://openalex.org/keywords/inter-block-correlation","display_name":"inter-block correlation","score":0.6129999756813049},{"id":"https://openalex.org/keywords/statistical-accuracy","display_name":"statistical accuracy","score":0.574999988079071}],"concepts":[{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.715175986289978},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5732244253158569},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18344542384147644},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/smacd65553.2025.11091921","doi":"https://doi.org/10.1109/smacd65553.2025.11091921","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd65553.2025.11091921","pdf_url":null,"source":{"id":"https://openalex.org/S4306419861","display_name":"International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1673310716","https://openalex.org/W1731508883","https://openalex.org/W1998752433","https://openalex.org/W2036887984","https://openalex.org/W2078483536","https://openalex.org/W2083782718","https://openalex.org/W2123419613","https://openalex.org/W2146950091","https://openalex.org/W2153579905","https://openalex.org/W2160784239","https://openalex.org/W2186373062","https://openalex.org/W2319435817","https://openalex.org/W3152098520","https://openalex.org/W4243367687","https://openalex.org/W4250857377","https://openalex.org/W4411726283"],"related_works":["https://openalex.org/W4236959331","https://openalex.org/W1503415151","https://openalex.org/W2125053991","https://openalex.org/W75309938","https://openalex.org/W1846979026","https://openalex.org/W1573884682","https://openalex.org/W2135678495","https://openalex.org/W2099747625","https://openalex.org/W2187155324","https://openalex.org/W1894472977"],"abstract_inverted_index":{"Statistical":[0],"verification":[1],"is":[2],"crucial":[3],"for":[4,17],"high-quality":[5],"circuits":[6],"in":[7,42,94],"the":[8,14,44,47,53,72,97],"presence":[9],"of":[10,46,55,74],"variations.":[11],"To":[12,61,83],"reduce":[13],"computational":[15,29],"effort":[16],"large-scale":[18],"circuits,":[19],"individual":[20],"subblocks":[21],"are":[22,59],"often":[23],"abstracted":[24],"by":[25],"behavioral":[26],"models.":[27],"The":[28],"cost":[30],"to":[31,70],"build":[32],"and":[33,80],"evaluate":[34],"these":[35],"models,":[36],"as":[37,39],"well":[38],"their":[40],"accuracy":[41,79],"predicting":[43],"behavior":[45],"physical":[48],"circuit,":[49],"depends":[50],"strongly":[51],"on":[52,91],"number":[54,73],"statistical":[56,78],"parameters":[57,75],"that":[58],"considered.":[60],"cope":[62],"with":[63,96],"this":[64,84],"problem,":[65],"we":[66,86],"propose":[67],"an":[68],"approach":[69],"minimize":[71],"without":[76],"sacrificing":[77],"inter-block":[81],"correlations.":[82],"end,":[85],"perform":[87],"feature":[88],"selection":[89],"based":[90],"Spearman":[92],"correlation":[93],"combination":[95],"DBSCAN":[98],"algorithm.":[99]},"counts_by_year":[],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2025-10-10T00:00:00"}