{"id":"https://openalex.org/W4411488361","doi":"https://doi.org/10.1016/j.ceramint.2025.06.302","title":"High-sensitivity room-temperature ammonia sensor based on a ZnO@MXene heterojunction","display_name":"High-sensitivity room-temperature ammonia sensor based on a ZnO@MXene heterojunction","publication_year":2025,"publication_date":"2025-06-20","ids":{"openalex":"https://openalex.org/W4411488361","doi":"https://doi.org/10.1016/j.ceramint.2025.06.302"},"language":"en","primary_location":{"id":"doi:10.1016/j.ceramint.2025.06.302","doi":"https://doi.org/10.1016/j.ceramint.2025.06.302","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.ceramint.2025.06.302","pdf_url":null,"source":{"id":"https://openalex.org/S106928643","display_name":"Ceramics International","issn_l":"0272-8842","issn":["0272-8842","1873-3956"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ceramics International","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049565864","display_name":"Zhicheng Cai","orcid":"https://orcid.org/0000-0002-1430-1985","observed_orcids":["https://orcid.org/0000-0002-1430-1985"]},"institutions":[{"id":"https://openalex.org/I28777354","display_name":"Sejong University","ror":"https://ror.org/00aft1q37","country_code":"KR","type":"education","lineage":["https://openalex.org/I28777354"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Zhicheng Cai","raw_affiliation_strings":["Department of Semiconductor System Engineering, Sejong University, 209 Neungdong-ro, Gwangjin-gu, Seoul 05006, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0002-1430-1985","affiliations":[{"raw_affiliation_string":"Department of Semiconductor System Engineering, Sejong University, 209 Neungdong-ro, Gwangjin-gu, Seoul 05006, Republic of Korea","institution_ids":["https://openalex.org/I28777354"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052662047","display_name":"Jian Hou","orcid":"https://orcid.org/0000-0002-4950-7676","observed_orcids":["https://orcid.org/0000-0002-4950-7676"]},"institutions":[{"id":"https://openalex.org/I72565114","display_name":"Luoyang Institute of Science and Technology","ror":"https://ror.org/04nraex26","country_code":"CN","type":"education","lineage":["https://openalex.org/I72565114"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jian Hou","raw_affiliation_strings":["School of Intelligent Manufacturing, Luoyang Institute of Science and Technology, Luoyang 471023, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Intelligent Manufacturing, Luoyang Institute of Science and Technology, Luoyang 471023, China","institution_ids":["https://openalex.org/I72565114"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049872167","display_name":"Jun\u2010Hyun Kim","orcid":"https://orcid.org/0000-0001-8145-6269","observed_orcids":["https://orcid.org/0000-0001-8145-6269"]},"institutions":[{"id":"https://openalex.org/I28777354","display_name":"Sejong University","ror":"https://ror.org/00aft1q37","country_code":"KR","type":"education","lineage":["https://openalex.org/I28777354"]},{"id":"https://openalex.org/I47301684","display_name":"Illinois State University","ror":"https://ror.org/050kcr883","country_code":"US","type":"education","lineage":["https://openalex.org/I47301684"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Jun-Hyun Kim","raw_affiliation_strings":["Department of Chemistry, Illinois State University, Normal, IL 61790-4160, USA","Department of Semiconductor System Engineering, Sejong University, 209 Neungdong-ro, Gwangjin-gu, Seoul 05006, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemistry, Illinois State University, Normal, IL 61790-4160, USA","institution_ids":["https://openalex.org/I47301684"]},{"raw_affiliation_string":"Department of Semiconductor System Engineering, Sejong University, 209 Neungdong-ro, Gwangjin-gu, Seoul 05006, Republic of Korea","institution_ids":["https://openalex.org/I28777354"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Gen Li","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210125143","display_name":"Chengdu University","ror":"https://ror.org/034z67559","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210125143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gen Li","raw_affiliation_strings":["College of Computer Science, Chengdu University, Chengdu 610106, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computer Science, Chengdu University, Chengdu 610106, China","institution_ids":["https://openalex.org/I4210125143"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Chang Hyun Lee","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I89015989","display_name":"Dankook University","ror":"https://ror.org/058pdbn81","country_code":"KR","type":"education","lineage":["https://openalex.org/I89015989"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chang Hyun Lee","raw_affiliation_strings":["Department of Energy Engineering, Dankook University, Cheonan 31116, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Energy Engineering, Dankook University, Cheonan 31116, Republic of Korea","institution_ids":["https://openalex.org/I89015989"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056779729","display_name":"Hyojung Kim","orcid":"https://orcid.org/0009-0002-7120-2243","observed_orcids":["https://orcid.org/0009-0002-7120-2243"]},"institutions":[{"id":"https://openalex.org/I28777354","display_name":"Sejong University","ror":"https://ror.org/00aft1q37","country_code":"KR","type":"education","lineage":["https://openalex.org/I28777354"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyojung Kim","raw_affiliation_strings":["Department of Semiconductor System Engineering, Sejong University, 209 Neungdong-ro, Gwangjin-gu, Seoul 05006, Republic of Korea"],"raw_orcid":"https://orcid.org/0009-0002-7120-2243","affiliations":[{"raw_affiliation_string":"Department of Semiconductor System Engineering, Sejong University, 209 Neungdong-ro, Gwangjin-gu, Seoul 05006, Republic of Korea","institution_ids":["https://openalex.org/I28777354"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030874700","display_name":"Muhammad Hilal","orcid":"https://orcid.org/0000-0003-2216-8069","observed_orcids":["https://orcid.org/0000-0003-2216-8069","https://orcid.org/0009-0002-2382-7468"]},"institutions":[{"id":"https://openalex.org/I28777354","display_name":"Sejong University","ror":"https://ror.org/00aft1q37","country_code":"KR","type":"education","lineage":["https://openalex.org/I28777354"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Muhammad Hilal","raw_affiliation_strings":["Department of Semiconductor System Engineering, Sejong University, 209 Neungdong-ro, Gwangjin-gu, Seoul 05006, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Semiconductor System Engineering, Sejong University, 209 Neungdong-ro, Gwangjin-gu, Seoul 05006, Republic of Korea","institution_ids":["https://openalex.org/I28777354"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5049565864","https://openalex.org/A5052662047"],"corresponding_institution_ids":["https://openalex.org/I28777354","https://openalex.org/I72565114"],"apc_list":{"value":3830,"currency":"USD","value_usd":3830},"apc_paid":null,"fwci":4.5587,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.95952293,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":100},"biblio":{"volume":"51","issue":"23","first_page":"40637","last_page":"40647"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12120","display_name":"Air Quality Monitoring and Forecasting","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ammonia-sensor","display_name":"ammonia gas sensor","score":0.8510000109672546},{"id":"https://openalex.org/keywords/room-temperature-gas-sensing","display_name":"room-temperature gas sensing","score":0.8970000147819519},{"id":"https://openalex.org/keywords/zinc-oxide-nanoparticles","display_name":"zinc oxide nanoparticles","score":0.8510000109672546},{"id":"https://openalex.org/keywords/ti3c2tx-mxene","display_name":"Ti3C2Tx MXene","score":0.9520000219345093},{"id":"https://openalex.org/keywords/heterojunction","display_name":"heterojunction","score":0.8009999990463257},{"id":"https://openalex.org/keywords/uv-illumination","display_name":"UV illumination","score":0.8140000104904175},{"id":"https://openalex.org/keywords/photogenerated-carriers","display_name":"photoexcited carriers","score":0.5350000262260437},{"id":"https://openalex.org/keywords/gas-adsorption","display_name":"gas adsorption","score":0.8029999732971191},{"id":"https://openalex.org/keywords/moisture-tolerance","display_name":"humidity tolerance","score":0.6159999966621399},{"id":"https://openalex.org/keywords/sensor-selectivity","display_name":"sensor selectivity","score":0.7889999747276306},{"id":"https://openalex.org/keywords/hydrothermal-synthesis","display_name":"hydrothermal synthesis","score":0.7170000076293945}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8989839553833008},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.8698668479919434},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.7091177105903625},{"id":"https://openalex.org/C2776382133","wikidata":"https://www.wikidata.org/wiki/Q4087","display_name":"Ammonia","level":2,"score":0.691243588924408},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6136260032653809},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3797985911369324},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.09773704409599304},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.ceramint.2025.06.302","doi":"https://doi.org/10.1016/j.ceramint.2025.06.302","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.ceramint.2025.06.302","pdf_url":null,"source":{"id":"https://openalex.org/S106928643","display_name":"Ceramics International","issn_l":"0272-8842","issn":["0272-8842","1873-3956"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ceramics International","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G2068229429","display_name":null,"funder_award_id":"1415173356 / 20012133","funder_id":"https://openalex.org/F4320334879","funder_display_name":"Korea Evaluation Institute of Industrial Technology"},{"id":"https://openalex.org/G4077875675","display_name":null,"funder_award_id":"RS-2024-00444986","funder_id":"https://openalex.org/F4320328359","funder_display_name":"Ministry of Science and ICT, South Korea"}],"funders":[{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320328359","display_name":"Ministry of Science and ICT, South Korea","ror":"https://ror.org/01wpjm123"},{"id":"https://openalex.org/F4320334879","display_name":"Korea Evaluation Institute of Industrial Technology","ror":"https://ror.org/03z9cwa38"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":65,"referenced_works":["https://openalex.org/W757425263","https://openalex.org/W1446544228","https://openalex.org/W2022314474","https://openalex.org/W2026495324","https://openalex.org/W2736259563","https://openalex.org/W2760568872","https://openalex.org/W2770191927","https://openalex.org/W2791397679","https://openalex.org/W2804112988","https://openalex.org/W2883061794","https://openalex.org/W2916413146","https://openalex.org/W2920884389","https://openalex.org/W2945328270","https://openalex.org/W2963737154","https://openalex.org/W2977702167","https://openalex.org/W2981265052","https://openalex.org/W2985837512","https://openalex.org/W2988808709","https://openalex.org/W3006214174","https://openalex.org/W3009634276","https://openalex.org/W3019732148","https://openalex.org/W3021562270","https://openalex.org/W3046663727","https://openalex.org/W3047625527","https://openalex.org/W3082420041","https://openalex.org/W3089378988","https://openalex.org/W3089623059","https://openalex.org/W3107947827","https://openalex.org/W3112672125","https://openalex.org/W3114332577","https://openalex.org/W3125184329","https://openalex.org/W3152626856","https://openalex.org/W3162591232","https://openalex.org/W3188079525","https://openalex.org/W4205640746","https://openalex.org/W4220697052","https://openalex.org/W4281788845","https://openalex.org/W4282823848","https://openalex.org/W4289778965","https://openalex.org/W4289933198","https://openalex.org/W4308459814","https://openalex.org/W4317889122","https://openalex.org/W4321480457","https://openalex.org/W4378839906","https://openalex.org/W4384207979","https://openalex.org/W4385077736","https://openalex.org/W4385834450","https://openalex.org/W4386541954","https://openalex.org/W4387095922","https://openalex.org/W4389396287","https://openalex.org/W4391234361","https://openalex.org/W4392128239","https://openalex.org/W4392246997","https://openalex.org/W4392456495","https://openalex.org/W4392671441","https://openalex.org/W4393132416","https://openalex.org/W4399392422","https://openalex.org/W4401733111","https://openalex.org/W4401921784","https://openalex.org/W4402308309","https://openalex.org/W4404522807","https://openalex.org/W4405686230","https://openalex.org/W4405989719","https://openalex.org/W4406999734","https://openalex.org/W4407302468"],"related_works":["https://openalex.org/W7133323486","https://openalex.org/W4386285167","https://openalex.org/W7125748513","https://openalex.org/W7212310316","https://openalex.org/W4376618059","https://openalex.org/W4409581097","https://openalex.org/W4308266154","https://openalex.org/W4327704782","https://openalex.org/W4411276810","https://openalex.org/W4393132416"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":20},{"year":2025,"cited_by_count":3}],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2025-10-10T00:00:00"}