{"id":"https://openalex.org/W4411064461","doi":"https://doi.org/10.1088/1742-6596/3007/1/012038","title":"Intelligent matching design of characteristic curves for semiconductor characteristic testing in oceanographic instruments","display_name":"Intelligent matching design of characteristic curves for semiconductor characteristic testing in oceanographic instruments","publication_year":2025,"publication_date":"2025-05-01","ids":{"openalex":"https://openalex.org/W4411064461","doi":"https://doi.org/10.1088/1742-6596/3007/1/012038"},"language":"en","primary_location":{"id":"doi:10.1088/1742-6596/3007/1/012038","doi":"https://doi.org/10.1088/1742-6596/3007/1/012038","is_oa":true,"landing_page_url":"https://doi.org/10.1088/1742-6596/3007/1/012038","pdf_url":null,"source":{"id":"https://openalex.org/S4210187594","display_name":"Journal of Physics Conference Series","issn_l":"1742-6588","issn":["1742-6588","1742-6596"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Physics: Conference Series","raw_type":"journal-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://doi.org/10.1088/1742-6596/3007/1/012038","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Gensu Jia","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gensu Jia","raw_affiliation_strings":["College of Metearology and Oceanography, National University of Defense Technology, Changsha, Hunan 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Metearology and Oceanography, National University of Defense Technology, Changsha, Hunan 410073, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"last","author":{"id":null,"display_name":"Kaifeng Han","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kaifeng Han","raw_affiliation_strings":["College of Metearology and Oceanography, National University of Defense Technology, Changsha, Hunan 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Metearology and Oceanography, National University of Defense Technology, Changsha, Hunan 410073, China","institution_ids":["https://openalex.org/I170215575"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I170215575"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09954982,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"3007","issue":"1","first_page":"012038","last_page":"012038"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13373","display_name":"Data Mining and Machine Learning Applications","score":0.2632000148296356,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13373","display_name":"Data Mining and Machine Learning Applications","score":0.2632000148296356,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.14640000462532043,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.06379999965429306,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wide-bandgap-semiconductors","display_name":"wide bandgap semiconductors","score":0.9129999876022339},{"id":"https://openalex.org/keywords/oceanographic-instrumentation","display_name":"oceanographic instrumentation","score":0.8410000205039978},{"id":"https://openalex.org/keywords/clustering","display_name":"clustering","score":0.6589999794960022},{"id":"https://openalex.org/keywords/linear-regression","display_name":"linear regression","score":0.7919999957084656},{"id":"https://openalex.org/keywords/polynomial-fitting","display_name":"polynomial fitting","score":0.9990000128746033},{"id":"https://openalex.org/keywords/quality-control","display_name":"quality control","score":0.6620000004768372}],"concepts":[{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.728116512298584},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.4786721169948578},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3729282021522522},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3257599174976349},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3170868754386902},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.25550130009651184},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23569458723068237},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2181762456893921}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1088/1742-6596/3007/1/012038","doi":"https://doi.org/10.1088/1742-6596/3007/1/012038","is_oa":true,"landing_page_url":"https://doi.org/10.1088/1742-6596/3007/1/012038","pdf_url":null,"source":{"id":"https://openalex.org/S4210187594","display_name":"Journal of Physics Conference Series","issn_l":"1742-6588","issn":["1742-6588","1742-6596"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Physics: Conference Series","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1088/1742-6596/3007/1/012038","doi":"https://doi.org/10.1088/1742-6596/3007/1/012038","is_oa":true,"landing_page_url":"https://doi.org/10.1088/1742-6596/3007/1/012038","pdf_url":null,"source":{"id":"https://openalex.org/S4210187594","display_name":"Journal of Physics Conference Series","issn_l":"1742-6588","issn":["1742-6588","1742-6596"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Physics: Conference Series","raw_type":"journal-article"},"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2348438863","https://openalex.org/W2376136157","https://openalex.org/W2964573196","https://openalex.org/W2980921441","https://openalex.org/W3187389359","https://openalex.org/W4391470333","https://openalex.org/W4395663711","https://openalex.org/W6769311087","https://openalex.org/W7015241841"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"Abstract":[0],"Wide":[1],"band":[2,42,50,79,88,182],"gap":[3,43,51,80,89,97,159,183],"devices":[4],"have":[5],"a":[6,130],"wide":[7,41,49,78,87,181],"application":[8],"prospect":[9],"in":[10,109,129,186,197],"Oceanographic":[11,187],"instruments,":[12,188],"and":[13,20,68,84,112,117,139,152,168,173,201],"the":[14,46,94,105,113,118,125,133,150,153,157],"demand":[15],"for":[16,34,70,177],"their":[17],"performance":[18,199],"evaluation":[19,200],"characteristic":[21,53,82,91,99,154,178],"testing":[22,35,179],"is":[23,31,101,115,121,135,146,161,190],"becoming":[24],"increasingly":[25],"prominent.":[26],"The":[27],"traditional":[28],"device":[29,52,81,90,98,106,160,198],"tester":[30,54],"not":[32],"ideal":[33],"some":[36],"unique":[37],"electrical":[38],"characteristics":[39],"of":[40,48,74,156,180],"devices.":[44],"Therefore,":[45],"design":[47],"has":[55],"practical":[56],"technical":[57],"significance.":[58],"This":[59,163],"paper":[60,164],"focuses":[61],"on":[62,104],"designing":[63],"an":[64,166,194],"intelligent":[65,174],"matching":[66,175],"algorithm":[67],"scheme":[69,176],"processing":[71,171],"large":[72],"amounts":[73],"data":[75,119,134,170],"measured":[76],"by":[77],"testers":[83],"fitting":[85,145],"standard":[86,95],"curves.":[92],"Firstly,":[93],"wideband":[96],"curve":[100,155],"generated":[102],"based":[103],"model":[107],"equation":[108],"MATLAB":[110],"environment,":[111,132],"error":[114],"added":[116],"set":[120],"extended":[122],"to":[123,149,192],"simulate":[124],"real":[126],"environment.":[127],"Then,":[128],"Python":[131],"processed":[136],"using":[137],"clustering":[138],"linear":[140],"regression":[141],"methods.":[142],"Finally,":[143],"polynomial":[144],"carried":[147],"out":[148],"data,":[151],"wide-band":[158],"drawn.":[162],"provides":[165],"efficient":[167],"accurate":[169],"method":[172],"semiconductors":[184],"used":[185],"which":[189],"expected":[191],"play":[193],"important":[195],"role":[196],"production":[202],"quality":[203],"control.":[204]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}