{"id":"https://openalex.org/W4409475153","doi":"https://doi.org/10.1109/iceaai64185.2025.10956796","title":"Electrical Fast Transient/Burst (EFT/B) for Outdoor Mobile Power","display_name":"Electrical Fast Transient/Burst (EFT/B) for Outdoor Mobile Power","publication_year":2025,"publication_date":"2025-01-10","ids":{"openalex":"https://openalex.org/W4409475153","doi":"https://doi.org/10.1109/iceaai64185.2025.10956796"},"language":"en","primary_location":{"id":"doi:10.1109/iceaai64185.2025.10956796","doi":"https://doi.org/10.1109/iceaai64185.2025.10956796","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iceaai64185.2025.10956796","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 International Conference on Electrical Automation and Artificial Intelligence (ICEAAI)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010552559","display_name":"Shujun Tan","orcid":"https://orcid.org/0000-0001-8065-7819","observed_orcids":["https://orcid.org/0000-0001-8065-7819"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shujun Tan","raw_affiliation_strings":["Chongqing CEPREI Industrial Technology Research Institution,Shapingba,Chongqing,China,401332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chongqing CEPREI Industrial Technology Research Institution,Shapingba,Chongqing,China,401332","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101907333","display_name":"Sheng Fu","orcid":"https://orcid.org/0009-0008-5912-1145","observed_orcids":["https://orcid.org/0009-0008-5912-1145"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shenyao Fu","raw_affiliation_strings":["Baicheng Ordnance Test Center of China,Baicheng,Jilin,China,137000"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Baicheng Ordnance Test Center of China,Baicheng,Jilin,China,137000","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100603756","display_name":"Li He","orcid":"https://orcid.org/0000-0003-2761-9404","observed_orcids":["https://orcid.org/0000-0003-2761-9404"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"He Li","raw_affiliation_strings":["Chongqing CEPREI Industrial Technology Research Institution,Shapingba,Chongqing,China,401332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chongqing CEPREI Industrial Technology Research Institution,Shapingba,Chongqing,China,401332","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05586716,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"767","last_page":"772"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.875,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.875,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.12129999697208405,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/radiated-emission-testing","display_name":"radiated emission testing","score":0.8539999723434448},{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"electromagnetic compatibility","score":0.9800000190734863},{"id":"https://openalex.org/keywords/soft-magnetic-materials","display_name":"soft magnetic materials","score":0.9440000057220459},{"id":"https://openalex.org/keywords/magnetic-permeability","display_name":"magnetic permeability","score":0.6629999876022339}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6982542872428894},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.42811524868011475},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39997047185897827},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3901991844177246},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17242440581321716},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16418731212615967},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iceaai64185.2025.10956796","doi":"https://doi.org/10.1109/iceaai64185.2025.10956796","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iceaai64185.2025.10956796","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 International Conference on Electrical Automation and Artificial Intelligence (ICEAAI)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[{"score":0.6899999976158142,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1673248568","https://openalex.org/W1996282429","https://openalex.org/W2062306649","https://openalex.org/W2169149042","https://openalex.org/W2910563852","https://openalex.org/W2984436036","https://openalex.org/W3112109831","https://openalex.org/W3156418196","https://openalex.org/W4391274697"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"Radiated":[0],"emission":[1,55,69],"testing":[2,70,89],"is":[3],"vital":[4],"for":[5,23],"ensuring":[6],"electromagnetic":[7,95],"compatibility":[8,96],"(EMC)":[9],"of":[10,49,67,83],"electronic":[11],"devices.":[12],"Amorphous":[13],"magnetic":[14,35,42,51,73],"rings":[15,27,52],"possess":[16],"unique":[17],"properties":[18],"that":[19],"make":[20],"them":[21],"well-suited":[22],"this":[24,75],"testing.":[25],"These":[26],"lack":[28],"long-range":[29],"atomic":[30],"order,":[31],"resulting":[32],"in":[33,53,97],"high":[34],"permeability,":[36],"low":[37],"coercivity,":[38],"and":[39,71,86],"improved":[40],"soft":[41],"properties.":[43],"This":[44],"research":[45],"investigates":[46],"the":[47,65,81],"application":[48],"amorphous":[50,72],"radiated":[54,68],"testing,":[56],"exploring":[57],"their":[58],"advantages":[59],"over":[60],"conventional":[61],"materials.":[62],"By":[63],"bridging":[64],"fields":[66],"materials,":[74],"thesis":[76],"aims":[77],"to":[78,80,93],"contribute":[79],"development":[82],"more":[84],"efficient":[85],"accurate":[87],"EMC":[88],"methodologies.":[90],"It":[91],"strives":[92],"enhance":[94],"our":[98],"interconnected":[99],"world.":[100]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}