{"id":"https://openalex.org/W4409401516","doi":"https://doi.org/10.5302/j.icros.2025.24.0280","title":"Anomaly Detection Control Through One-class Learning in Defect Inspection Systems","display_name":"Anomaly Detection Control Through One-class Learning in Defect Inspection Systems","publication_year":2025,"publication_date":"2025-04-13","ids":{"openalex":"https://openalex.org/W4409401516","doi":"https://doi.org/10.5302/j.icros.2025.24.0280"},"language":"en","primary_location":{"id":"doi:10.5302/j.icros.2025.24.0280","doi":"https://doi.org/10.5302/j.icros.2025.24.0280","is_oa":false,"landing_page_url":"https://doi.org/10.5302/j.icros.2025.24.0280","pdf_url":null,"source":{"id":"https://openalex.org/S4210183236","display_name":"Journal of Institute of Control Robotics and Systems","issn_l":"1976-5622","issn":["1976-5622","2233-4335"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4323366859","host_organization_name":"Institute of Control, Robotics and Systems","host_organization_lineage":["https://openalex.org/P4323366859"],"host_organization_lineage_names":["Institute of Control, Robotics and Systems"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Institute of Control, Robotics and Systems","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5104285947","display_name":"Janggun Jeon","orcid":"https://orcid.org/0009-0001-6839-7337","observed_orcids":["https://orcid.org/0009-0001-6839-7337"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Janggun Jeon","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5024597373","display_name":"Namgi Kim","orcid":"https://orcid.org/0000-0002-0077-6576","observed_orcids":["https://orcid.org/0000-0002-0077-6576"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Namgi Kim","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05369412,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"31","issue":"4","first_page":"328","last_page":"333"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9603999853134155,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9603999853134155,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.03739999979734421,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/anomaly-detection","display_name":"anomaly detection","score":0.9290000200271606},{"id":"https://openalex.org/keywords/defect-detection","display_name":"defect detection","score":0.8790000081062317},{"id":"https://openalex.org/keywords/one-class-learning","display_name":"one-class learning","score":0.8690000176429749},{"id":"https://openalex.org/keywords/deep-svdd","display_name":"Deep SVDD","score":0.9779999852180481},{"id":"https://openalex.org/keywords/latent-space","display_name":"latent space","score":0.5759999752044678},{"id":"https://openalex.org/keywords/mvtec-ad","display_name":"MVTec AD","score":0.8579999804496765},{"id":"https://openalex.org/keywords/manufacturing-quality-control","display_name":"manufacturing quality control","score":0.640999972820282}],"concepts":[{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.7753713726997375},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.5848701000213623},{"id":"https://openalex.org/C12997251","wikidata":"https://www.wikidata.org/wiki/Q567560","display_name":"Anomaly (physics)","level":2,"score":0.5741373300552368},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4802446663379669},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4516134560108185},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.42842116951942444},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08237099647521973},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.5302/j.icros.2025.24.0280","doi":"https://doi.org/10.5302/j.icros.2025.24.0280","is_oa":false,"landing_page_url":"https://doi.org/10.5302/j.icros.2025.24.0280","pdf_url":null,"source":{"id":"https://openalex.org/S4210183236","display_name":"Journal of Institute of Control Robotics and Systems","issn_l":"1976-5622","issn":["1976-5622","2233-4335"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4323366859","host_organization_name":"Institute of Control, Robotics and Systems","host_organization_lineage":["https://openalex.org/P4323366859"],"host_organization_lineage_names":["Institute of Control, Robotics and Systems"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Institute of Control, Robotics and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2806741695","https://openalex.org/W4290647774","https://openalex.org/W3189286258","https://openalex.org/W3207797160","https://openalex.org/W3210364259","https://openalex.org/W4300558037","https://openalex.org/W2667207928","https://openalex.org/W2912112202","https://openalex.org/W4377864969","https://openalex.org/W3120251014"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,64,148,176],"novel":[4],"image-level":[5],"anomaly":[6],"detection":[7],"control":[8],"method":[9,150,193],"for":[10,54,97,180],"defect":[11,71,177],"inspection,":[12],"which":[13,112],"comprises":[14],"feature-":[15],"extraction":[16],"from":[17,40],"high-dimensional":[18],"data":[19],"and":[20,83,156],"feature-learning":[21,31],"to":[22,45,79,151],"analyze":[23],"the":[24,30,51,55,60,70,80,89,94,110,114,118,127,137,141,153,158,165,168,184,189,191,195,203,208],"observed":[25,90],"patterns.":[26],"we":[27,146,171],"focus":[28],"on":[29,87,109,174,188],"step,":[32],"especially":[33],"in":[34,59,183,200,207],"Deep":[35,48,74,104,132,161,198],"SVDD.":[36,133,162],"To":[37,163],"determine":[38],"anomalies":[39,85],"images":[41],"of":[42,103,117,129,131,139,160,167,197,202],"object":[43],"suspected":[44],"be":[46],"defective,":[47],"SVDD":[49,75,105,199],"learns":[50],"decision":[52,95,101,119,143],"boundaries":[53,96],"normal":[56,98],"feature":[57],"distribution":[58],"latent":[61,81],"space.":[62],"When":[63],"new":[65],"image":[66],"is":[67,106,113,123],"received":[68],"by":[69],"inspection":[72,178],"system,":[73],"maps":[76],"its":[77],"features":[78,91],"space":[82],"detects":[84],"based":[86,108],"whether":[88],"fall":[92],"within":[93],"features.":[99],"The":[100,121],"boundary":[102],"determined":[107],"center-point,":[111],"center":[115],"position":[116],"boundary.":[120,144],"center-point":[122,154],"randomly":[124],"fixed":[125],"at":[126],"beginning":[128],"training":[130],"However,":[134],"this":[135],"limits":[136],"possibility":[138],"finding":[140],"optimal":[142],"Therefore,":[145],"propose":[147],"center-point-moving":[149],"optimize":[152],"location":[155],"improve":[157],"performance":[159,196],"confirm":[164],"suitability":[166],"proposed":[169,192],"method,":[170],"conducted":[172],"experiments":[173],"MVTec-AD,":[175],"dataset":[179],"several":[181],"products":[182],"manufacturing":[185],"industry.":[186],"Based":[187],"results,":[190],"improved":[194],"11":[201],"15":[204],"class":[205],"domains":[206],"MVTec-AD":[209],"dataset.":[210]},"counts_by_year":[],"updated_date":"2026-09-21T07:43:02.447757","created_date":"2025-10-10T00:00:00"}