{"id":"https://openalex.org/W4408400902","doi":"https://doi.org/10.1016/j.microrel.2025.115697","title":"Fast reverse engineering of chips using lasers, Focused Ion Beams, and confocal and scanning electron microscopy","display_name":"Fast reverse engineering of chips using lasers, Focused Ion Beams, and confocal and scanning electron microscopy","publication_year":2025,"publication_date":"2025-03-13","ids":{"openalex":"https://openalex.org/W4408400902","doi":"https://doi.org/10.1016/j.microrel.2025.115697"},"language":"en","primary_location":{"id":"doi:10.1016/j.microrel.2025.115697","doi":"https://doi.org/10.1016/j.microrel.2025.115697","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2025.115697","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033582513","display_name":"Matthew P. Maniscalco","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matthew Maniscalco","raw_affiliation_strings":["University of Connecticut, Storrs, CT 06269, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Connecticut, Storrs, CT 06269, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045221874","display_name":"Hongbin Choi","orcid":"https://orcid.org/0000-0001-7063-7566","observed_orcids":["https://orcid.org/0000-0001-7063-7566"]},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hongbin Choi","raw_affiliation_strings":["University of Connecticut, Storrs, CT 06269, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Connecticut, Storrs, CT 06269, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025161772","display_name":"Adrian Phoulady","orcid":"https://orcid.org/0000-0002-4979-5751","observed_orcids":["https://orcid.org/0000-0002-4979-5751"]},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Adrian Phoulady","raw_affiliation_strings":["University of Connecticut, Storrs, CT 06269, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Connecticut, Storrs, CT 06269, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104879120","display_name":"Alexander Blagojevic","orcid":"https://orcid.org/0009-0004-9081-5381","observed_orcids":["https://orcid.org/0009-0004-9081-5381"]},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alexander Blagojevic","raw_affiliation_strings":["University of Connecticut, Storrs, CT 06269, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Connecticut, Storrs, CT 06269, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113305388","display_name":"Toni Moore","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Toni Moore","raw_affiliation_strings":["University of Connecticut, Storrs, CT 06269, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Connecticut, Storrs, CT 06269, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5116021424","display_name":"Mohammad Taghi Mohammadi Anaei","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammad Taghi Mohammadi Anaei","raw_affiliation_strings":["University of Connecticut, Storrs, CT 06269, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Connecticut, Storrs, CT 06269, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5116021422","display_name":"Parisa Mahyari","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Parisa Mahyari","raw_affiliation_strings":["University of Connecticut, Storrs, CT 06269, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Connecticut, Storrs, CT 06269, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088042175","display_name":"Nicholas May","orcid":"https://orcid.org/0000-0002-8662-2091","observed_orcids":["https://orcid.org/0000-0002-8662-2091"]},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]},{"id":"https://openalex.org/I55707380","display_name":"Manhattan University","ror":"https://ror.org/02xhnzg94","country_code":"US","type":"education","lineage":["https://openalex.org/I55707380"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nicholas May","raw_affiliation_strings":["Manhattan College, Riverdale, NY 10471, USA","University of Connecticut, Storrs, CT 06269, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Manhattan College, Riverdale, NY 10471, USA","institution_ids":["https://openalex.org/I55707380"]},{"raw_affiliation_string":"University of Connecticut, Storrs, CT 06269, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024420521","display_name":"Sina Shahbazmohamadi","orcid":"https://orcid.org/0000-0002-7268-5999","observed_orcids":["https://orcid.org/0000-0002-7268-5999"]},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sina Shahbazmohamadi","raw_affiliation_strings":["University of Connecticut, Storrs, CT 06269, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Connecticut, Storrs, CT 06269, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087435020","display_name":"Pouya Tavousi","orcid":"https://orcid.org/0000-0002-5023-5890","observed_orcids":["https://orcid.org/0000-0002-5023-5890"]},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Pouya Tavousi","raw_affiliation_strings":["University of Connecticut, Storrs, CT 06269, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Connecticut, Storrs, CT 06269, USA","institution_ids":["https://openalex.org/I140172145"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5024420521","https://openalex.org/A5087435020"],"corresponding_institution_ids":["https://openalex.org/I140172145"],"apc_list":{"value":2280,"currency":"USD","value_usd":2280},"apc_paid":null,"fwci":0.9894,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.70260857,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":"168","issue":null,"first_page":"115697","last_page":"115697"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.0015999999595806003,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.0013000000035390258,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/failure-analysis","display_name":"failure analysis","score":0.8759999871253967},{"id":"https://openalex.org/keywords/3d-reconstruction","display_name":"3D reconstruction","score":0.8169999718666077},{"id":"https://openalex.org/keywords/volumetric-imaging","display_name":"volumetric imaging","score":0.8610000014305115}],"concepts":[{"id":"https://openalex.org/C136009344","wikidata":"https://www.wikidata.org/wiki/Q336201","display_name":"Confocal","level":2,"score":0.6123669147491455},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.5828607082366943},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5705453753471375},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.5653137564659119},{"id":"https://openalex.org/C88412794","wikidata":"https://www.wikidata.org/wiki/Q902045","display_name":"Confocal laser scanning microscopy","level":2,"score":0.5446280241012573},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.5378434062004089},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4953121244907379},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4915214478969574},{"id":"https://openalex.org/C187921700","wikidata":"https://www.wikidata.org/wiki/Q7430074","display_name":"Scanning confocal electron microscopy","level":3,"score":0.4506152868270874},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.43207603693008423},{"id":"https://openalex.org/C93877712","wikidata":"https://www.wikidata.org/wiki/Q132560","display_name":"Electron microscope","level":2,"score":0.43177908658981323},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.4201941192150116},{"id":"https://openalex.org/C2779178360","wikidata":"https://www.wikidata.org/wiki/Q902045","display_name":"Confocal microscopy","level":2,"score":0.41495466232299805},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.27355635166168213},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18226882815361023},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1680741012096405},{"id":"https://openalex.org/C136229726","wikidata":"https://www.wikidata.org/wiki/Q327092","display_name":"Biomedical engineering","level":1,"score":0.12535452842712402},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.04868850111961365},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.microrel.2025.115697","doi":"https://doi.org/10.1016/j.microrel.2025.115697","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2025.115697","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320338294","display_name":"Air Force Research Laboratory","ror":"https://ror.org/02e2egq70"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W2185002567","https://openalex.org/W2996913104","https://openalex.org/W3045660897","https://openalex.org/W3097081034","https://openalex.org/W3132077904","https://openalex.org/W3207491115","https://openalex.org/W4285793196","https://openalex.org/W4286461970","https://openalex.org/W4291927144","https://openalex.org/W4292258469","https://openalex.org/W4297200690","https://openalex.org/W4297201165","https://openalex.org/W4367833814","https://openalex.org/W4385073131","https://openalex.org/W4385454779","https://openalex.org/W4387231660","https://openalex.org/W4387233771","https://openalex.org/W4390831443","https://openalex.org/W6744521881"],"related_works":["https://openalex.org/W4413328979","https://openalex.org/W3126220818","https://openalex.org/W7124885153","https://openalex.org/W4403685159","https://openalex.org/W4391639527","https://openalex.org/W2065748188","https://openalex.org/W3108676422","https://openalex.org/W4415990344","https://openalex.org/W2520984606","https://openalex.org/W3209773831"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":5}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2025-03-14T00:00:00"}