{"id":"https://openalex.org/W4403873589","doi":"https://doi.org/10.3390/cryst14110935","title":"Characterization of Crystal Properties and Defects in CdZnTe Radiation Detectors","display_name":"Characterization of Crystal Properties and Defects in CdZnTe Radiation Detectors","publication_year":2024,"publication_date":"2024-10-29","ids":{"openalex":"https://openalex.org/W4403873589","doi":"https://doi.org/10.3390/cryst14110935"},"language":"en","primary_location":{"id":"doi:10.3390/cryst14110935","doi":"https://doi.org/10.3390/cryst14110935","is_oa":true,"landing_page_url":"https://doi.org/10.3390/cryst14110935","pdf_url":null,"source":{"id":"https://openalex.org/S4210196485","display_name":"Crystals","issn_l":"2073-4352","issn":["2073-4352"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Crystals","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["arxiv","crossref","datacite","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.3390/cryst14110935","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Manuel Ballester","orcid":"https://orcid.org/0000-0001-9135-6421","observed_orcids":["https://orcid.org/0000-0001-9135-6421"]},"institutions":[{"id":"https://openalex.org/I111979921","display_name":"Northwestern University","ror":"https://ror.org/000e0be47","country_code":"US","type":"education","lineage":["https://openalex.org/I111979921"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Manuel Ballester","raw_affiliation_strings":["Department of Computer Sciences, Northwestern University, Evanston, IL 60208, USA"],"raw_orcid":"https://orcid.org/0000-0001-9135-6421","affiliations":[{"raw_affiliation_string":"Department of Computer Sciences, Northwestern University, Evanston, IL 60208, USA","institution_ids":["https://openalex.org/I111979921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069485014","display_name":"Jaromir Kaspar","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210151799","display_name":"Siemens Healthcare (United States)","ror":"https://ror.org/054962n91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210151799"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jaromir Kaspar","raw_affiliation_strings":["Siemens Medical Solutions USA Inc., Hoffman Estates, Chicago, IL 60192, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens Medical Solutions USA Inc., Hoffman Estates, Chicago, IL 60192, USA","institution_ids":["https://openalex.org/I4210151799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037522903","display_name":"Francesc Massan\u00e9s","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210151799","display_name":"Siemens Healthcare (United States)","ror":"https://ror.org/054962n91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210151799"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Francesc Massan\u00e9s","raw_affiliation_strings":["Siemens Medical Solutions USA Inc., Hoffman Estates, Chicago, IL 60192, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens Medical Solutions USA Inc., Hoffman Estates, Chicago, IL 60192, USA","institution_ids":["https://openalex.org/I4210151799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057599971","display_name":"Srutarshi Banerjee","orcid":"https://orcid.org/0000-0002-9365-5529","observed_orcids":["https://orcid.org/0000-0002-9365-5529"]},"institutions":[{"id":"https://openalex.org/I1282105669","display_name":"Argonne National Laboratory","ror":"https://ror.org/05gvnxz63","country_code":"US","type":"facility","lineage":["https://openalex.org/I1282105669","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I40347166"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Srutarshi Banerjee","raw_affiliation_strings":["X-ray Science Division, Argonne National Laboratory, Lemont, IL 60439, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"X-ray Science Division, Argonne National Laboratory, Lemont, IL 60439, USA","institution_ids":["https://openalex.org/I1282105669"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011928112","display_name":"Alexander Hans Vija","orcid":"https://orcid.org/0000-0002-5562-7922","observed_orcids":["https://orcid.org/0000-0002-5562-7922"]},"institutions":[{"id":"https://openalex.org/I4210151799","display_name":"Siemens Healthcare (United States)","ror":"https://ror.org/054962n91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210151799"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alexander Hans Vija","raw_affiliation_strings":["Siemens Medical Solutions USA Inc., Hoffman Estates, Chicago, IL 60192, USA"],"raw_orcid":"https://orcid.org/0000-0002-5562-7922","affiliations":[{"raw_affiliation_string":"Siemens Medical Solutions USA Inc., Hoffman Estates, Chicago, IL 60192, USA","institution_ids":["https://openalex.org/I4210151799"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048650003","display_name":"Aggelos K. Katsaggelos","orcid":"https://orcid.org/0000-0003-4554-0070","observed_orcids":["https://orcid.org/0000-0003-4554-0070"]},"institutions":[{"id":"https://openalex.org/I111979921","display_name":"Northwestern University","ror":"https://ror.org/000e0be47","country_code":"US","type":"education","lineage":["https://openalex.org/I111979921"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aggelos K. Katsaggelos","raw_affiliation_strings":["Department of Computer Sciences, Northwestern University, Evanston, IL 60208, USA","Department of Electrical and Computer Engineering, Northwestern University, Evanston, IL 60208, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Sciences, Northwestern University, Evanston, IL 60208, USA","institution_ids":["https://openalex.org/I111979921"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Northwestern University, Evanston, IL 60208, USA","institution_ids":["https://openalex.org/I111979921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I111979921"],"apc_list":{"value":2600,"currency":"CHF","value_usd":2955},"apc_paid":{"value":2600,"currency":"CHF","value_usd":2955},"fwci":1.0372,"has_fulltext":true,"cited_by_count":10,"citation_normalized_percentile":{"value":0.73444711,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"14","issue":"11","first_page":"935","last_page":"935"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11216","display_name":"Radiation Detection and Scintillator Technologies","score":0.00279999990016222,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cdznte","display_name":"CdZnTe","score":0.9810000061988831},{"id":"https://openalex.org/keywords/radiation-detectors","display_name":"radiation detectors","score":0.9139999747276306},{"id":"https://openalex.org/keywords/crystal-defects","display_name":"crystal defects","score":0.7699999809265137},{"id":"https://openalex.org/keywords/bulk-properties","display_name":"bulk properties","score":0.45899999141693115},{"id":"https://openalex.org/keywords/spectral-resolution","display_name":"spectral resolution","score":0.7770000100135803},{"id":"https://openalex.org/keywords/nuclear-medical-imaging","display_name":"nuclear medical imaging","score":0.7919999957084656},{"id":"https://openalex.org/keywords/crystal-impurities","display_name":"crystal impurities","score":0.7210000157356262},{"id":"https://openalex.org/keywords/semiconductor-detectors","display_name":"semiconductor detectors","score":0.4359999895095825}],"concepts":[{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.8192428350448608},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.610125720500946},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.559770941734314},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.510021984577179},{"id":"https://openalex.org/C2781285689","wikidata":"https://www.wikidata.org/wiki/Q21921428","display_name":"Crystal (programming language)","level":2,"score":0.49242815375328064},{"id":"https://openalex.org/C183680338","wikidata":"https://www.wikidata.org/wiki/Q736634","display_name":"Particle detector","level":3,"score":0.4558691680431366},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4077025055885315},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3415955901145935},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.3250347673892975},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.31406331062316895},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.22454193234443665},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.16062068939208984},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.10561111569404602},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/cryst14110935","doi":"https://doi.org/10.3390/cryst14110935","is_oa":true,"landing_page_url":"https://doi.org/10.3390/cryst14110935","pdf_url":null,"source":{"id":"https://openalex.org/S4210196485","display_name":"Crystals","issn_l":"2073-4352","issn":["2073-4352"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Crystals","raw_type":"journal-article"},{"id":"pmh:oai:arXiv.org:2409.06738","doi":null,"is_oa":true,"landing_page_url":"http://arxiv.org/abs/2409.06738","pdf_url":"https://arxiv.org/pdf/2409.06738","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},{"id":"pmh:oai:osti.gov:2545901","doi":null,"is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/2545901","pdf_url":"https://www.mdpi.com/2073-4352/14/11/935/pdf?version=1730187034","source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},{"id":"pmh:oai:doaj.org/article:2c486b78471a40428ef5830d5f8712e3","doi":null,"is_oa":false,"landing_page_url":"https://doaj.org/article/2c486b78471a40428ef5830d5f8712e3","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Crystals, Vol 14, Iss 11, p 935 (2024)","raw_type":"article"},{"id":"doi:10.48550/arxiv.2409.06738","doi":"https://doi.org/10.48550/arxiv.2409.06738","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2409.06738","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Preprint"}],"best_oa_location":{"id":"doi:10.3390/cryst14110935","doi":"https://doi.org/10.3390/cryst14110935","is_oa":true,"landing_page_url":"https://doi.org/10.3390/cryst14110935","pdf_url":null,"source":{"id":"https://openalex.org/S4210196485","display_name":"Crystals","issn_l":"2073-4352","issn":["2073-4352"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Crystals","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320316012","display_name":"Siemens Medical Solutions USA","ror":"https://ror.org/054962n91"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W1557465387","https://openalex.org/W1842376371","https://openalex.org/W1972938010","https://openalex.org/W1987019762","https://openalex.org/W1989118566","https://openalex.org/W2004863293","https://openalex.org/W2008555988","https://openalex.org/W2014300217","https://openalex.org/W2014848987","https://openalex.org/W2015271682","https://openalex.org/W2020213872","https://openalex.org/W2022665591","https://openalex.org/W2028187365","https://openalex.org/W2030184141","https://openalex.org/W2038371216","https://openalex.org/W2058531517","https://openalex.org/W2061252026","https://openalex.org/W2067547308","https://openalex.org/W2071159068","https://openalex.org/W2080886952","https://openalex.org/W2081716639","https://openalex.org/W2082484161","https://openalex.org/W2089256614","https://openalex.org/W2106447250","https://openalex.org/W2112250215","https://openalex.org/W2128158076","https://openalex.org/W2129248518","https://openalex.org/W2152474941","https://openalex.org/W2296319761","https://openalex.org/W2488809410","https://openalex.org/W2922415786","https://openalex.org/W2946611002","https://openalex.org/W2990346675","https://openalex.org/W4211261807","https://openalex.org/W4212867697","https://openalex.org/W4230942370","https://openalex.org/W4231239211","https://openalex.org/W4280602001","https://openalex.org/W4313544678","https://openalex.org/W4387616651","https://openalex.org/W4390176588","https://openalex.org/W4391249431","https://openalex.org/W4393405175","https://openalex.org/W6652505946"],"related_works":["https://openalex.org/W2018315474","https://openalex.org/W2086591882","https://openalex.org/W2999535303","https://openalex.org/W4285234055","https://openalex.org/W4406465567","https://openalex.org/W2372784711","https://openalex.org/W1990545062","https://openalex.org/W2063166447","https://openalex.org/W2528519356","https://openalex.org/W2605901787"],"abstract_inverted_index":{"CdZnTe-based":[0],"detectors":[1],"are":[2,27],"highly":[3],"valued":[4],"because":[5],"of":[6,88,110,116],"their":[7],"high":[8],"spectral":[9],"resolution,":[10],"which":[11],"is":[12,23],"an":[13,85],"essential":[14],"feature":[15],"for":[16,62],"nuclear":[17],"medical":[18],"imaging.":[19],"However,":[20],"this":[21,35],"resolution":[22],"compromised":[24],"when":[25],"there":[26],"substantial":[28],"defects":[29,50],"in":[30,51],"the":[31,44,63,91,94,108,114,117],"CdZnTe":[32],"crystals.":[33],"In":[34,99],"study,":[36],"we":[37],"present":[38],"a":[39,101],"learning-based":[40],"approach":[41],"to":[42,58,106],"determine":[43,107],"spatially":[45],"dependent":[46],"bulk":[47],"properties":[48],"and":[49,60,93],"semiconductor":[52],"detectors.":[53],"This":[54],"characterization":[55],"allows":[56],"us":[57],"mitigate":[59],"compensate":[61],"undesired":[64],"effects":[65],"caused":[66],"by":[67],"crystal":[68,97],"impurities.":[69],"We":[70],"tested":[71],"our":[72],"model":[73],"with":[74],"computer-generated":[75],"noise-free":[76],"input":[77],"data,":[78],"where":[79],"it":[80],"showed":[81],"excellent":[82],"accuracy,":[83],"achieving":[84],"average":[86],"RMSE":[87],"0.43%":[89],"between":[90],"predicted":[92],"ground":[95],"truth":[96],"properties.":[98],"addition,":[100],"sensitivity":[102],"analysis":[103],"was":[104],"performed":[105],"effect":[109],"noisy":[111],"data":[112],"on":[113],"accuracy":[115],"model.":[118]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":1}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2024-10-30T00:00:00"}