{"id":"https://openalex.org/W4403869726","doi":"https://doi.org/10.1595/205651325x17302083510551","title":"Mutual Connection Between Concentration of Charge Carriers and Seebeck Coefficient in Si0.96Ge0.04 Thermoelectric by Annealing in the Range 523\u2013673 K","display_name":"Mutual Connection Between Concentration of Charge Carriers and Seebeck Coefficient in Si0.96Ge0.04 Thermoelectric by Annealing in the Range 523\u2013673 K","publication_year":2024,"publication_date":"2024-10-29","ids":{"openalex":"https://openalex.org/W4403869726","doi":"https://doi.org/10.1595/205651325x17302083510551"},"language":"en","primary_location":{"id":"doi:10.1595/205651325x17302083510551","doi":"https://doi.org/10.1595/205651325x17302083510551","is_oa":true,"landing_page_url":"https://doi.org/10.1595/205651325x17302083510551","pdf_url":null,"source":{"id":"https://openalex.org/S2736604622","display_name":"Johnson Matthey Technology Review","issn_l":"2056-5135","issn":["2056-5135"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-c","jufo-1","norway-1","oarl","poland-40","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310311780","host_organization_name":"Johnson Matthey","host_organization_lineage":["https://openalex.org/P4310311780"],"host_organization_lineage_names":["Johnson Matthey"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Johnson Matthey Technology Review","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://doi.org/10.1595/205651325x17302083510551","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015235073","display_name":"Irakli Nakhutsrishvili","orcid":"https://orcid.org/0000-0002-7961-3437","observed_orcids":["https://orcid.org/0000-0002-7961-3437"]},"institutions":[{"id":"https://openalex.org/I131762061","display_name":"Georgian Technical University","ror":"https://ror.org/00aamz256","country_code":"GE","type":"education","lineage":["https://openalex.org/I131762061"]}],"countries":["GE"],"is_corresponding":true,"raw_author_name":"Irakli Nakhutsrishvili","raw_affiliation_strings":["Georgian Technical University, 77 Kostava Street, Tbilisi, Georgia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgian Technical University, 77 Kostava Street, Tbilisi, Georgia","institution_ids":["https://openalex.org/I131762061"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5015235073"],"corresponding_institution_ids":["https://openalex.org/I131762061"],"apc_list":null,"apc_paid":null,"fwci":0.1885,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.32841226,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"69","issue":"4","first_page":"532","last_page":"535"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/seebeck-coefficient","display_name":"Seebeck coefficient","score":0.7870000004768372},{"id":"https://openalex.org/keywords/carrier-concentration","display_name":"carrier concentration","score":0.8629999756813049},{"id":"https://openalex.org/keywords/hall-resistance","display_name":"Hall resistance","score":0.9629999995231628},{"id":"https://openalex.org/keywords/annealing","display_name":"annealing","score":0.6629999876022339},{"id":"https://openalex.org/keywords/thermoelectric-properties","display_name":"thermoelectric properties","score":0.7350000143051147}],"concepts":[{"id":"https://openalex.org/C112625512","wikidata":"https://www.wikidata.org/wiki/Q1091448","display_name":"Seebeck coefficient","level":3,"score":0.8112832307815552},{"id":"https://openalex.org/C63024428","wikidata":"https://www.wikidata.org/wiki/Q552456","display_name":"Thermoelectric effect","level":2,"score":0.7780232429504395},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.6877158284187317},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6133555173873901},{"id":"https://openalex.org/C104232198","wikidata":"https://www.wikidata.org/wiki/Q865807","display_name":"Charge carrier","level":2,"score":0.5188299417495728},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.46204373240470886},{"id":"https://openalex.org/C207365445","wikidata":"https://www.wikidata.org/wiki/Q15020929","display_name":"Thermoelectric materials","level":3,"score":0.44764021039009094},{"id":"https://openalex.org/C13355873","wikidata":"https://www.wikidata.org/wiki/Q2920850","display_name":"Connection (principal bundle)","level":2,"score":0.44428879022598267},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4179404377937317},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.3459396958351135},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.33430543541908264},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2266901731491089},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.18560054898262024},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.18552616238594055},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10427716374397278},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.09585034847259521},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08760929107666016},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.08140036463737488}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1595/205651325x17302083510551","doi":"https://doi.org/10.1595/205651325x17302083510551","is_oa":true,"landing_page_url":"https://doi.org/10.1595/205651325x17302083510551","pdf_url":null,"source":{"id":"https://openalex.org/S2736604622","display_name":"Johnson Matthey Technology Review","issn_l":"2056-5135","issn":["2056-5135"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-c","jufo-1","norway-1","oarl","poland-40","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310311780","host_organization_name":"Johnson Matthey","host_organization_lineage":["https://openalex.org/P4310311780"],"host_organization_lineage_names":["Johnson Matthey"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Johnson Matthey Technology Review","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1595/205651325x17302083510551","doi":"https://doi.org/10.1595/205651325x17302083510551","is_oa":true,"landing_page_url":"https://doi.org/10.1595/205651325x17302083510551","pdf_url":null,"source":{"id":"https://openalex.org/S2736604622","display_name":"Johnson Matthey Technology Review","issn_l":"2056-5135","issn":["2056-5135"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-c","jufo-1","norway-1","oarl","poland-40","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310311780","host_organization_name":"Johnson Matthey","host_organization_lineage":["https://openalex.org/P4310311780"],"host_organization_lineage_names":["Johnson Matthey"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Johnson Matthey Technology Review","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2004132446","https://openalex.org/W2040481314","https://openalex.org/W2054182504","https://openalex.org/W2072363273","https://openalex.org/W2980604656","https://openalex.org/W3036914811","https://openalex.org/W3110493424","https://openalex.org/W3121822356","https://openalex.org/W4210859679","https://openalex.org/W4220687588","https://openalex.org/W4290851624","https://openalex.org/W4292318978","https://openalex.org/W4396844198"],"related_works":["https://openalex.org/W1646937351","https://openalex.org/W4391514833","https://openalex.org/W4392157698","https://openalex.org/W2067465446","https://openalex.org/W2086381930","https://openalex.org/W2333240262","https://openalex.org/W2107714174","https://openalex.org/W3167911873","https://openalex.org/W1513874929","https://openalex.org/W1491718300"],"abstract_inverted_index":{"By":[0],"combining":[1],"formulae":[2],"known":[3],"from":[4],"the":[5,11,28,37,54,64,68,71],"literature":[6],"that":[7],"relate":[8],"thermoelectric":[9,79],"parameters,":[10],"expression":[12],"n":[13],"\u2245":[14],"1.13\u00b710":[15],"19":[16],"e":[17],"Sr\u20132":[18,22],"/r":[19],"H":[20,41],"(e":[21],"\u20130.17)":[23],"is":[24,60],"obtained.":[25],"That":[26],"is,":[27],"concentration":[29],"of":[30,70],"charge":[31],"carriers":[32],"can":[33],"be":[34],"determined":[35],"using":[36,53],"Hall":[38],"resistance":[39],"(r":[40],")":[42],"and":[43],"reduced":[44],"Seebeck":[45,55],"coefficient.":[46],"Since":[47],"these":[48],"two":[49],"parameters":[50],"are":[51,80],"calculated":[52],"coefficient":[56,59],"(S),":[57],"this":[58],"sufficient":[61],"to":[62],"determine":[63],"concentration.":[65],"To":[66],"demonstrate":[67],"use":[69],"obtained":[72],"new":[73],"formula,":[74],"experimental":[75],"data":[76],"on":[77],"silicon-germanium":[78],"discussed.":[81]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2024-10-30T00:00:00"}