{"id":"https://openalex.org/W4403678024","doi":"https://doi.org/10.1109/esserc62670.2024.10719583","title":"Characterizations and Framework Modeling of Bulk MOSFET Threshold Voltage Based on a Physical Charge-Based Model Down to 4 K","display_name":"Characterizations and Framework Modeling of Bulk MOSFET Threshold Voltage Based on a Physical Charge-Based Model Down to 4 K","publication_year":2024,"publication_date":"2024-09-09","ids":{"openalex":"https://openalex.org/W4403678024","doi":"https://doi.org/10.1109/esserc62670.2024.10719583"},"language":"en","primary_location":{"id":"doi:10.1109/esserc62670.2024.10719583","doi":"https://doi.org/10.1109/esserc62670.2024.10719583","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/esserc62670.2024.10719583","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE European Solid-State Electronics Research Conference (ESSERC)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013362156","display_name":"Hao Su","orcid":"https://orcid.org/0000-0002-2444-7128","observed_orcids":["https://orcid.org/0000-0002-2444-7128"]},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Su","raw_affiliation_strings":["Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103019910","display_name":"Yunfeng Xie","orcid":"https://orcid.org/0000-0003-1189-4321","observed_orcids":["https://orcid.org/0000-0003-1189-4321"]},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunfeng Xie","raw_affiliation_strings":["Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101373524","display_name":"Yuhuan Lin","orcid":"https://orcid.org/0000-0002-5117-5893","observed_orcids":["https://orcid.org/0000-0002-5117-5893"]},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuhuan Lin","raw_affiliation_strings":["Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101143227","display_name":"Haihan Wu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haihan Wu","raw_affiliation_strings":["Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100397217","display_name":"Wenxin Li","orcid":"https://orcid.org/0000-0003-4329-4136","observed_orcids":["https://orcid.org/0000-0003-4329-4136","https://orcid.org/0009-0004-3914-4148"]},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenxin Li","raw_affiliation_strings":["Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071123892","display_name":"Zhuxuan Ma","orcid":"https://orcid.org/0000-0002-7024-425X","observed_orcids":["https://orcid.org/0000-0002-7024-425X"]},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhizhao Ma","raw_affiliation_strings":["Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113957733","display_name":"Yiyuan Cai","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiyuan Cai","raw_affiliation_strings":["Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102208691","display_name":"Xu Si","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xu Si","raw_affiliation_strings":["Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100765485","display_name":"Shenghua Zhou","orcid":"https://orcid.org/0000-0002-9271-6633","observed_orcids":["https://orcid.org/0000-0002-9271-6633"]},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shenghua Zhou","raw_affiliation_strings":["Southern University of Science and Technology (SUSTech),Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology (SUSTech),Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058153744","display_name":"Guangchong Hu","orcid":"https://orcid.org/0009-0005-1929-7312","observed_orcids":["https://orcid.org/0009-0005-1929-7312"]},"institutions":[{"id":"https://openalex.org/I4405275017","display_name":"Shenzhen International Quantum Academy","ror":"https://ror.org/02spjd661","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4405275017"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangchong Hu","raw_affiliation_strings":["International Quantum Academy,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"International Quantum Academy,Shenzhen,China","institution_ids":["https://openalex.org/I4405275017"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052167600","display_name":"Yu He","orcid":"https://orcid.org/0000-0002-8892-9425","observed_orcids":["https://orcid.org/0000-0002-8892-9425"]},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu He","raw_affiliation_strings":["Southern University of Science and Technology (SUSTech),Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology (SUSTech),Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018934856","display_name":"Feichi Zhou","orcid":"https://orcid.org/0000-0001-7756-1082","observed_orcids":["https://orcid.org/0000-0001-7756-1082"]},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feichi Zhou","raw_affiliation_strings":["Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100390113","display_name":"Xiaoguang Liu","orcid":"https://orcid.org/0000-0002-0935-3094","observed_orcids":["https://orcid.org/0000-0002-0935-3094"]},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoguang Liu","raw_affiliation_strings":["Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021091015","display_name":"Longyang Lin","orcid":"https://orcid.org/0000-0002-4702-737X","observed_orcids":["https://orcid.org/0000-0002-4702-737X"]},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longyang Lin","raw_affiliation_strings":["Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049887447","display_name":"Yida Li","orcid":"https://orcid.org/0000-0002-5675-582X","observed_orcids":["https://orcid.org/0000-0002-5675-582X"]},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yida Li","raw_affiliation_strings":["Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063677490","display_name":"H.Y. Yu","orcid":"https://orcid.org/0000-0002-1527-8756","observed_orcids":["https://orcid.org/0000-0002-1527-8756"]},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongyu Yu","raw_affiliation_strings":["Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100437921","display_name":"Kai Chen","orcid":"https://orcid.org/0000-0001-5128-4013","observed_orcids":["https://orcid.org/0000-0001-5128-4013"]},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai Chen","raw_affiliation_strings":["Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern University of Science and Technology (SUSTech),School of Microelectronics,Shenzhen,China","institution_ids":["https://openalex.org/I3045169105"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.5624,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.80874384,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"733","last_page":"736"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.0017999999690800905,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"threshold voltage","score":0.7670000195503235},{"id":"https://openalex.org/keywords/bulk-mosfet","display_name":"bulk MOSFET","score":0.9440000057220459},{"id":"https://openalex.org/keywords/low-temperature-operation","display_name":"low-temperature operation","score":0.6320000290870667},{"id":"https://openalex.org/keywords/bsim4","display_name":"BSIM4","score":0.8090000152587891},{"id":"https://openalex.org/keywords/drain-induced-barrier-lowering","display_name":"drain-induced barrier lowering","score":0.8080000281333923},{"id":"https://openalex.org/keywords/body-effect","display_name":"body effect","score":0.9860000014305115}],"concepts":[{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.7847436666488647},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.6850729584693909},{"id":"https://openalex.org/C188082385","wikidata":"https://www.wikidata.org/wiki/Q73792","display_name":"Charge (physics)","level":2,"score":0.5056073665618896},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4668249487876892},{"id":"https://openalex.org/C4775677","wikidata":"https://www.wikidata.org/wiki/Q7449393","display_name":"Semiconductor device modeling","level":3,"score":0.4364228844642639},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.42314839363098145},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.41260042786598206},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3881296217441559},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3867453634738922},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3830932378768921},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36487680673599243},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.351243257522583},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19659850001335144},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.17611902952194214},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.10945877432823181},{"id":"https://openalex.org/C109214941","wikidata":"https://www.wikidata.org/wiki/Q18334","display_name":"Particle physics","level":1,"score":0.09858518838882446}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esserc62670.2024.10719583","doi":"https://doi.org/10.1109/esserc62670.2024.10719583","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/esserc62670.2024.10719583","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE European Solid-State Electronics Research Conference (ESSERC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[{"id":"https://metadata.un.org/sdg/7","score":0.7200000286102295,"display_name":"Affordable and clean energy"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1972355621","https://openalex.org/W2065851146","https://openalex.org/W2068488703","https://openalex.org/W2128201333","https://openalex.org/W2794745494","https://openalex.org/W2795812195","https://openalex.org/W2891246502","https://openalex.org/W2951024704","https://openalex.org/W3014062342","https://openalex.org/W3019381406","https://openalex.org/W3063161198","https://openalex.org/W3135081570","https://openalex.org/W3184465909","https://openalex.org/W4319303170","https://openalex.org/W4391305476","https://openalex.org/W4399396496"],"related_works":["https://openalex.org/W1977042749","https://openalex.org/W2542162669","https://openalex.org/W2042881279","https://openalex.org/W2121451436","https://openalex.org/W2115248544","https://openalex.org/W1608296848","https://openalex.org/W2975003965","https://openalex.org/W2049062674","https://openalex.org/W2492111440","https://openalex.org/W4297923311"],"abstract_inverted_index":{"This":[0],"work":[1],"systematically":[2,65],"characterizes":[3],"and":[4,17,50,61,67,80],"models":[5],"threshold":[6,41],"voltage":[7],"($V_{t":[8],"h}$)":[9],"of":[10,40],"bulk":[11],"MOSFETs":[12],"fabricated":[13],"on":[14,87],"commercial":[15],"40-nm":[16],"180-nm":[18],"processes":[19],"from":[20,24],"a":[21],"leading":[22],"foundry":[23],"300":[25],"K":[26,85],"down":[27,82],"to":[28,83],"4":[29,84],"K.":[30],"In":[31],"this":[32],"framework,":[33],"temperature":[34],"effects":[35,77],"associated":[36],"with":[37,95],"each":[38],"aspect":[39],"voltage,":[42],"i.e.,":[43],"channel":[44],"size":[45],"scaling":[46],"(both":[47],"width":[48],"W":[49],"length":[51],"L),":[52],"as":[53,55],"well":[54],"terminal":[56],"biases":[57],"that":[58],"induce":[59],"DIBL":[60],"body":[62],"effect":[63],"are":[64,78],"investigated":[66],"precisely":[68],"modeled,":[69],"respectively.":[70],"For":[71],"the":[72,96],"first":[73],"time,":[74],"these":[75],"second-order":[76],"characterized":[79],"modeled":[81],"based":[86],"our":[88],"recently":[89],"developed":[90],"physical":[91],"charge-based":[92],"model,":[93],"combined":[94],"adjusted":[97],"BSIM4":[98],"model.":[99]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-10-14T16:39:01.820549","created_date":"2025-10-10T00:00:00"}