{"id":"https://openalex.org/W4403566629","doi":"https://doi.org/10.1016/j.ndteint.2024.103248","title":"Low-frequency magnetic incremental permeability for the non-destructive evaluation of hardness profile after carburization treatment with large case hardening depth","display_name":"Low-frequency magnetic incremental permeability for the non-destructive evaluation of hardness profile after carburization treatment with large case hardening depth","publication_year":2024,"publication_date":"2024-10-19","ids":{"openalex":"https://openalex.org/W4403566629","doi":"https://doi.org/10.1016/j.ndteint.2024.103248"},"language":"en","primary_location":{"id":"doi:10.1016/j.ndteint.2024.103248","doi":"https://doi.org/10.1016/j.ndteint.2024.103248","is_oa":true,"landing_page_url":"https://doi.org/10.1016/j.ndteint.2024.103248","pdf_url":"https://www.sciencedirect.com/science/article/am/pii/S0963869524002135","source":{"id":"https://openalex.org/S4210233251","display_name":"NDT & E International","issn_l":"0963-8695","issn":["0963-8695","1879-1174"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-2","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"NDT & E International","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://www.sciencedirect.com/science/article/am/pii/S0963869524002135","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091998554","display_name":"Hicham Lberni","orcid":"https://orcid.org/0009-0002-9906-5148","observed_orcids":["https://orcid.org/0009-0002-9906-5148"]},"institutions":[{"id":"https://openalex.org/I100532134","display_name":"Lyon 1 Universit\u00e9","ror":"https://ror.org/029brtt94","country_code":"FR","type":"education","lineage":["https://openalex.org/I100532134","https://openalex.org/I203339264"]},{"id":"https://openalex.org/I112936343","display_name":"\u00c9cole Centrale de Lyon","ror":"https://ror.org/05s6rge65","country_code":"FR","type":"education","lineage":["https://openalex.org/I112936343","https://openalex.org/I203339264"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4210091020","display_name":"Centre Technique des Industries M\u00e9caniques","ror":"https://ror.org/00c051916","country_code":"FR","type":"other","lineage":["https://openalex.org/I4210091020"]},{"id":"https://openalex.org/I4405259338","display_name":"Engineering Science Lyon Tohoku, Materials under eXtreme conditions","ror":"https://ror.org/023d00661","country_code":"JP","type":"facility","lineage":["https://openalex.org/I100532134","https://openalex.org/I112936343","https://openalex.org/I1294671590","https://openalex.org/I201537933","https://openalex.org/I203339264","https://openalex.org/I4405259338","https://openalex.org/I48430043"]},{"id":"https://openalex.org/I48430043","display_name":"Institut National des Sciences Appliqu\u00e9es de Lyon","ror":"https://ror.org/050jn9y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I203339264","https://openalex.org/I48430043"]}],"countries":["FR","JP"],"is_corresponding":false,"raw_author_name":"Hicham Lberni","raw_affiliation_strings":["CETIM, 52 Avenue F\u00e9lix Louat, 60300, Senlis, France","ELyTMaX IRL3757, CNRS, Univ. Lyon, INSA Lyon, Centrale Lyon, Universit\u00e9 Claude Bernard Lyon 1, Tohoku University, Sendai, Japan","Univ. Lyon, INSA-Lyon, LGEF EA682, F69621, France"],"raw_orcid":"https://orcid.org/0009-0002-9906-5148","affiliations":[{"raw_affiliation_string":"CETIM, 52 Avenue F\u00e9lix Louat, 60300, Senlis, France","institution_ids":["https://openalex.org/I4210091020"]},{"raw_affiliation_string":"ELyTMaX IRL3757, CNRS, Univ. Lyon, INSA Lyon, Centrale Lyon, Universit\u00e9 Claude Bernard Lyon 1, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I100532134","https://openalex.org/I112936343","https://openalex.org/I1294671590","https://openalex.org/I201537933","https://openalex.org/I4405259338","https://openalex.org/I48430043"]},{"raw_affiliation_string":"Univ. Lyon, INSA-Lyon, LGEF EA682, F69621, France","institution_ids":["https://openalex.org/I48430043"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088224587","display_name":"Benjamin Ducharne","orcid":"https://orcid.org/0000-0002-2046-211X","observed_orcids":["https://orcid.org/0000-0002-2046-211X"]},"institutions":[{"id":"https://openalex.org/I100532134","display_name":"Lyon 1 Universit\u00e9","ror":"https://ror.org/029brtt94","country_code":"FR","type":"education","lineage":["https://openalex.org/I100532134","https://openalex.org/I203339264"]},{"id":"https://openalex.org/I112936343","display_name":"\u00c9cole Centrale de Lyon","ror":"https://ror.org/05s6rge65","country_code":"FR","type":"education","lineage":["https://openalex.org/I112936343","https://openalex.org/I203339264"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4405259338","display_name":"Engineering Science Lyon Tohoku, Materials under eXtreme conditions","ror":"https://ror.org/023d00661","country_code":"JP","type":"facility","lineage":["https://openalex.org/I100532134","https://openalex.org/I112936343","https://openalex.org/I1294671590","https://openalex.org/I201537933","https://openalex.org/I203339264","https://openalex.org/I4405259338","https://openalex.org/I48430043"]},{"id":"https://openalex.org/I48430043","display_name":"Institut National des Sciences Appliqu\u00e9es de Lyon","ror":"https://ror.org/050jn9y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I203339264","https://openalex.org/I48430043"]}],"countries":["FR","JP"],"is_corresponding":true,"raw_author_name":"Benjamin Ducharne","raw_affiliation_strings":["ELyTMaX IRL3757, CNRS, Univ. Lyon, INSA Lyon, Centrale Lyon, Universit\u00e9 Claude Bernard Lyon 1, Tohoku University, Sendai, Japan","Univ. Lyon, INSA-Lyon, LGEF EA682, F69621, France"],"raw_orcid":"https://orcid.org/0000-0002-2046-211X","affiliations":[{"raw_affiliation_string":"ELyTMaX IRL3757, CNRS, Univ. Lyon, INSA Lyon, Centrale Lyon, Universit\u00e9 Claude Bernard Lyon 1, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I100532134","https://openalex.org/I112936343","https://openalex.org/I1294671590","https://openalex.org/I201537933","https://openalex.org/I4405259338","https://openalex.org/I48430043"]},{"raw_affiliation_string":"Univ. Lyon, INSA-Lyon, LGEF EA682, F69621, France","institution_ids":["https://openalex.org/I48430043"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063029485","display_name":"H\u00e9l\u00e8ne Petitpr\u00e9","orcid":"https://orcid.org/0009-0007-3055-0985","observed_orcids":["https://orcid.org/0009-0007-3055-0985"]},"institutions":[{"id":"https://openalex.org/I4210091020","display_name":"Centre Technique des Industries M\u00e9caniques","ror":"https://ror.org/00c051916","country_code":"FR","type":"other","lineage":["https://openalex.org/I4210091020"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"H\u00e9l\u00e8ne Petitpr\u00e9","raw_affiliation_strings":["CETIM, 52 Avenue F\u00e9lix Louat, 60300, Senlis, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CETIM, 52 Avenue F\u00e9lix Louat, 60300, Senlis, France","institution_ids":["https://openalex.org/I4210091020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110937209","display_name":"Jean-Fran\u00e7ois Mogniotte","orcid":"https://orcid.org/0000-0001-9335-4243","observed_orcids":["https://orcid.org/0000-0001-9335-4243"]},"institutions":[{"id":"https://openalex.org/I48430043","display_name":"Institut National des Sciences Appliqu\u00e9es de Lyon","ror":"https://ror.org/050jn9y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I203339264","https://openalex.org/I48430043"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Jean-Fran\u00e7ois Mogniotte","raw_affiliation_strings":["Univ. Lyon, INSA-Lyon, LGEF EA682, F69621, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Lyon, INSA-Lyon, LGEF EA682, F69621, France","institution_ids":["https://openalex.org/I48430043"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072377527","display_name":"Yves Armand Tene Deffo","orcid":"https://orcid.org/0000-0001-8825-5611","observed_orcids":["https://orcid.org/0000-0001-8825-5611"]},"institutions":[{"id":"https://openalex.org/I144693123","display_name":"University of Buea","ror":"https://ror.org/041kdhz15","country_code":"CM","type":"education","lineage":["https://openalex.org/I144693123"]}],"countries":["CM"],"is_corresponding":false,"raw_author_name":"Yves Armand Tene Deffo","raw_affiliation_strings":["Faculty of Engineering and Technology, University of Buea, Buea P.O. Box 63, Cameroon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering and Technology, University of Buea, Buea P.O. Box 63, Cameroon","institution_ids":["https://openalex.org/I144693123"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100403597","display_name":"Fan Zhang","orcid":"https://orcid.org/0009-0006-1934-5043","observed_orcids":["https://orcid.org/0009-0006-1934-5043"]},"institutions":[{"id":"https://openalex.org/I4210091020","display_name":"Centre Technique des Industries M\u00e9caniques","ror":"https://ror.org/00c051916","country_code":"FR","type":"other","lineage":["https://openalex.org/I4210091020"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Fan Zhang","raw_affiliation_strings":["CETIM, 52 Avenue F\u00e9lix Louat, 60300, Senlis, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CETIM, 52 Avenue F\u00e9lix Louat, 60300, Senlis, France","institution_ids":["https://openalex.org/I4210091020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050404490","display_name":"Christophe Gallais","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210165303","display_name":"Safran (France)","ror":"https://ror.org/05sqf9v67","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210165303"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Christophe Gallais","raw_affiliation_strings":["Audit et RT Industriels, SAFRAN TRANSMISSION SYSTEMS, Colombes, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Audit et RT Industriels, SAFRAN TRANSMISSION SYSTEMS, Colombes, France","institution_ids":["https://openalex.org/I4210165303"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5088224587"],"corresponding_institution_ids":["https://openalex.org/I100532134","https://openalex.org/I112936343","https://openalex.org/I1294671590","https://openalex.org/I201537933","https://openalex.org/I4405259338","https://openalex.org/I48430043"],"apc_list":{"value":4540,"currency":"USD","value_usd":4540},"apc_paid":null,"fwci":2.2913,"has_fulltext":true,"cited_by_count":18,"citation_normalized_percentile":{"value":0.87178528,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"149","issue":null,"first_page":"103248","last_page":"103248"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13440","display_name":"Electromagnetic Effects on Materials","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2506","display_name":"Metals and Alloys"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/carburization","display_name":"carburizing","score":0.9269999861717224},{"id":"https://openalex.org/keywords/hardness-profile","display_name":"hardness profile","score":0.9020000100135803},{"id":"https://openalex.org/keywords/non-destructive-testing","display_name":"non-destructive testing","score":0.9300000071525574},{"id":"https://openalex.org/keywords/ferromagnetic-steel","display_name":"ferromagnetic steel","score":0.8700000047683716},{"id":"https://openalex.org/keywords/surface-hardness","display_name":"surface hardness","score":0.5080000162124634},{"id":"https://openalex.org/keywords/wear-resistance","display_name":"wear resistance","score":0.5550000071525574},{"id":"https://openalex.org/keywords/reference-charts","display_name":"reference charts","score":0.550000011920929}],"concepts":[{"id":"https://openalex.org/C44255700","wikidata":"https://www.wikidata.org/wiki/Q978423","display_name":"Hardening (computing)","level":3,"score":0.7130266427993774},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6004295349121094},{"id":"https://openalex.org/C137581009","wikidata":"https://www.wikidata.org/wiki/Q1205902","display_name":"Case hardening","level":3,"score":0.5529640913009644},{"id":"https://openalex.org/C120882062","wikidata":"https://www.wikidata.org/wiki/Q28352","display_name":"Permeability (electromagnetism)","level":3,"score":0.5103067755699158},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.4950768053531647},{"id":"https://openalex.org/C42698342","wikidata":"https://www.wikidata.org/wiki/Q3236003","display_name":"Hardness","level":2,"score":0.4162095785140991},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.3650883436203003},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.3364221751689911},{"id":"https://openalex.org/C77595967","wikidata":"https://www.wikidata.org/wiki/Q3151013","display_name":"Forensic engineering","level":1,"score":0.33343517780303955},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20123007893562317},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06858709454536438},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C41625074","wikidata":"https://www.wikidata.org/wiki/Q176088","display_name":"Membrane","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.ndteint.2024.103248","doi":"https://doi.org/10.1016/j.ndteint.2024.103248","is_oa":true,"landing_page_url":"https://doi.org/10.1016/j.ndteint.2024.103248","pdf_url":"https://www.sciencedirect.com/science/article/am/pii/S0963869524002135","source":{"id":"https://openalex.org/S4210233251","display_name":"NDT & E International","issn_l":"0963-8695","issn":["0963-8695","1879-1174"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-2","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"NDT & E International","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-04806527v1","doi":null,"is_oa":true,"landing_page_url":"https://hal.science/hal-04806527","pdf_url":"https://hal.science/hal-04806527/document","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"NDT & E International, 2025, 149, pp.103248. ⟨10.1016/j.ndteint.2024.103248⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1016/j.ndteint.2024.103248","doi":"https://doi.org/10.1016/j.ndteint.2024.103248","is_oa":true,"landing_page_url":"https://doi.org/10.1016/j.ndteint.2024.103248","pdf_url":"https://www.sciencedirect.com/science/article/am/pii/S0963869524002135","source":{"id":"https://openalex.org/S4210233251","display_name":"NDT & E International","issn_l":"0963-8695","issn":["0963-8695","1879-1174"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-2","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"NDT & E International","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4403566629.pdf","grobid_xml":"https://content.openalex.org/works/W4403566629.grobid-xml"},"referenced_works_count":29,"referenced_works":["https://openalex.org/W86090505","https://openalex.org/W1968492994","https://openalex.org/W1994166151","https://openalex.org/W2001483262","https://openalex.org/W2024592443","https://openalex.org/W2028247401","https://openalex.org/W2029366328","https://openalex.org/W2049869302","https://openalex.org/W2100788482","https://openalex.org/W2143983126","https://openalex.org/W2166207675","https://openalex.org/W2197162317","https://openalex.org/W2528377205","https://openalex.org/W2898546607","https://openalex.org/W2913258143","https://openalex.org/W2921212129","https://openalex.org/W2921328229","https://openalex.org/W2931459557","https://openalex.org/W2932964228","https://openalex.org/W3112992426","https://openalex.org/W3115578106","https://openalex.org/W3128266823","https://openalex.org/W3181772729","https://openalex.org/W4244062886","https://openalex.org/W4294310861","https://openalex.org/W4367056101","https://openalex.org/W4386625120","https://openalex.org/W4392850359","https://openalex.org/W6945075419"],"related_works":["https://openalex.org/W7048630787","https://openalex.org/W4407054539","https://openalex.org/W7167442503","https://openalex.org/W4407849146","https://openalex.org/W7214200090","https://openalex.org/W4386625120","https://openalex.org/W4367056101","https://openalex.org/W7160833658","https://openalex.org/W7054439895","https://openalex.org/W7118262850"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":13},{"year":2025,"cited_by_count":5}],"updated_date":"2026-11-11T12:16:26.678958","created_date":"2024-10-20T00:00:00"}