{"id":"https://openalex.org/W4402355824","doi":"https://doi.org/10.1364/isa.2024.fd1.6","title":"Simulating diffusion and repulsion of charges in single photon semiconductor detectors","display_name":"Simulating diffusion and repulsion of charges in single photon semiconductor detectors","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4402355824","doi":"https://doi.org/10.1364/isa.2024.fd1.6"},"language":"en","primary_location":{"id":"doi:10.1364/isa.2024.fd1.6","doi":"https://doi.org/10.1364/isa.2024.fd1.6","is_oa":false,"landing_page_url":"https://doi.org/10.1364/isa.2024.fd1.6","pdf_url":null,"source":{"id":"https://openalex.org/S4363606186","display_name":"Imaging and Applied Optics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optica Imaging Congress 2024 (3D, AOMS, COSI, ISA, pcAOP)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Manuel Ballester","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I111979921","display_name":"Northwestern University","ror":"https://ror.org/000e0be47","country_code":"US","type":"education","lineage":["https://openalex.org/I111979921"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Manuel Ballester","raw_affiliation_strings":["Northwestern University, Evanston, Illinois 60208, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Northwestern University, Evanston, Illinois 60208, USA","institution_ids":["https://openalex.org/I111979921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069485014","display_name":"Jaromir Kaspar","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210151799","display_name":"Siemens Healthcare (United States)","ror":"https://ror.org/054962n91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210151799"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jaromir Kaspar","raw_affiliation_strings":["Siemens Medical Solutions USA Inc., Hoffman Estates, IL 60192, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens Medical Solutions USA Inc., Hoffman Estates, IL 60192, USA","institution_ids":["https://openalex.org/I4210151799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037522903","display_name":"Francesc Massan\u00e9s","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210151799","display_name":"Siemens Healthcare (United States)","ror":"https://ror.org/054962n91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210151799"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Francesc Massan\u00e9s","raw_affiliation_strings":["Siemens Medical Solutions USA Inc., Hoffman Estates, IL 60192, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens Medical Solutions USA Inc., Hoffman Estates, IL 60192, USA","institution_ids":["https://openalex.org/I4210151799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011928112","display_name":"Alexander Hans Vija","orcid":"https://orcid.org/0000-0002-5562-7922","observed_orcids":["https://orcid.org/0000-0002-5562-7922"]},"institutions":[{"id":"https://openalex.org/I4210151799","display_name":"Siemens Healthcare (United States)","ror":"https://ror.org/054962n91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210151799"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alexander Hans Vija","raw_affiliation_strings":["Siemens Medical Solutions USA Inc., Hoffman Estates, IL 60192, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens Medical Solutions USA Inc., Hoffman Estates, IL 60192, USA","institution_ids":["https://openalex.org/I4210151799"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048650003","display_name":"Aggelos K. Katsaggelos","orcid":"https://orcid.org/0000-0003-4554-0070","observed_orcids":["https://orcid.org/0000-0003-4554-0070"]},"institutions":[{"id":"https://openalex.org/I111979921","display_name":"Northwestern University","ror":"https://ror.org/000e0be47","country_code":"US","type":"education","lineage":["https://openalex.org/I111979921"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aggelos K. Katsaggelos","raw_affiliation_strings":["Northwestern University, Evanston, Illinois 60208, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Northwestern University, Evanston, Illinois 60208, USA","institution_ids":["https://openalex.org/I111979921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17531372,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"FD1.6","last_page":"FD1.6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.8471999764442444,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.8471999764442444,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.027400000020861626,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11216","display_name":"Radiation Detection and Scintillator Technologies","score":0.02500000037252903,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/charge-propagation","display_name":"charge propagation","score":0.7129999995231628},{"id":"https://openalex.org/keywords/electrostatic-repulsion","display_name":"electrostatic repulsion","score":0.9210000038146973},{"id":"https://openalex.org/keywords/charge-diffusion","display_name":"charge diffusion","score":0.9269999861717224},{"id":"https://openalex.org/keywords/single-photon-detectors","display_name":"single-photon detectors","score":0.8090000152587891},{"id":"https://openalex.org/keywords/semiconductor-detectors","display_name":"semiconductor detectors","score":0.8519999980926514},{"id":"https://openalex.org/keywords/monte-carlo-simulation","display_name":"Monte Carlo simulation","score":0.9269999861717224},{"id":"https://openalex.org/keywords/charge-transport","display_name":"charge transport","score":0.39399999380111694}],"concepts":[{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.6872003078460693},{"id":"https://openalex.org/C69357855","wikidata":"https://www.wikidata.org/wiki/Q163214","display_name":"Diffusion","level":2,"score":0.6589781641960144},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.6404044032096863},{"id":"https://openalex.org/C159317903","wikidata":"https://www.wikidata.org/wiki/Q3198","display_name":"Photon","level":2,"score":0.5949957966804504},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5356833934783936},{"id":"https://openalex.org/C148704626","wikidata":"https://www.wikidata.org/wiki/Q257415","display_name":"Semiconductor detector","level":3,"score":0.5325590372085571},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.46446695923805237},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.44157353043556213},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.29908978939056396},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.11085617542266846}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1364/isa.2024.fd1.6","doi":"https://doi.org/10.1364/isa.2024.fd1.6","is_oa":false,"landing_page_url":"https://doi.org/10.1364/isa.2024.fd1.6","pdf_url":null,"source":{"id":"https://openalex.org/S4363606186","display_name":"Imaging and Applied Optics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optica Imaging Congress 2024 (3D, AOMS, COSI, ISA, pcAOP)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1972938010","https://openalex.org/W2001234187","https://openalex.org/W2082484161","https://openalex.org/W2152474941","https://openalex.org/W4313544678"],"related_works":["https://openalex.org/W3189650789","https://openalex.org/W4246721751","https://openalex.org/W4404112220","https://openalex.org/W4416172250","https://openalex.org/W2051275061","https://openalex.org/W4408181509","https://openalex.org/W4389665766","https://openalex.org/W1973029134","https://openalex.org/W4412710449","https://openalex.org/W2013494232"],"abstract_inverted_index":{"We":[0],"introduce":[1],"a":[2],"novel":[3],"Monte":[4],"Carlo":[5],"approach":[6],"for":[7,15],"simulating":[8],"charge":[9],"propagation":[10],"in":[11],"semiconductor":[12],"detectors,":[13],"accounting":[14],"Coulomb":[16],"repulsion":[17],"and":[18],"diffusion":[19],"over":[20],"time.":[21]},"counts_by_year":[],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2024-09-10T00:00:00"}