{"id":"https://openalex.org/W4402040341","doi":"https://doi.org/10.1109/tps.2024.3446817","title":"Static Current Balancing Strategy for Parallel IGBTs Based on Parametric Compensation","display_name":"Static Current Balancing Strategy for Parallel IGBTs Based on Parametric Compensation","publication_year":2024,"publication_date":"2024-07-01","ids":{"openalex":"https://openalex.org/W4402040341","doi":"https://doi.org/10.1109/tps.2024.3446817"},"language":"en","primary_location":{"id":"doi:10.1109/tps.2024.3446817","doi":"https://doi.org/10.1109/tps.2024.3446817","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tps.2024.3446817","pdf_url":null,"source":{"id":"https://openalex.org/S164692974","display_name":"IEEE Transactions on Plasma Science","issn_l":"0093-3813","issn":["0093-3813","1939-9375"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Plasma Science","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022446163","display_name":"Lan Peng","orcid":"https://orcid.org/0000-0003-0439-9787","observed_orcids":["https://orcid.org/0000-0003-0439-9787"]},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lan Peng","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-0439-9787","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102723037","display_name":"Haihong Huang","orcid":"https://orcid.org/0000-0001-7557-4584","observed_orcids":["https://orcid.org/0000-0001-7557-4584"]},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haihong Huang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0001-7557-4584","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100617264","display_name":"Haixin Wang","orcid":"https://orcid.org/0000-0003-2315-6465","observed_orcids":["https://orcid.org/0000-0003-2315-6465","https://orcid.org/0000-0002-5714-0149"]},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haixin Wang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I16365422"],"apc_list":{"value":2495,"currency":"USD","value_usd":2495},"apc_paid":null,"fwci":0.1904,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.3242604,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"52","issue":"7","first_page":"2907","last_page":"2916"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9556000232696533,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9556000232696533,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11920","display_name":"Pulsed Power Technology Applications","score":0.00989999994635582,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.007499999832361937,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parasitic-inductance","display_name":"parasitic inductance","score":0.9079999923706055},{"id":"https://openalex.org/keywords/parasitic-resistance","display_name":"parasitic resistance","score":0.8830000162124634},{"id":"https://openalex.org/keywords/equilibrium-points","display_name":"equilibrium points","score":0.5230000019073486}],"concepts":[{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.679286539554596},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.6049952507019043},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.578889012336731},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5182178616523743},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4277041256427765},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35150691866874695},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12180149555206299},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tps.2024.3446817","doi":"https://doi.org/10.1109/tps.2024.3446817","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tps.2024.3446817","pdf_url":null,"source":{"id":"https://openalex.org/S164692974","display_name":"IEEE Transactions on Plasma Science","issn_l":"0093-3813","issn":["0093-3813","1939-9375"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Plasma Science","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G4239083022","display_name":null,"funder_award_id":"U22A20225","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1547705810","https://openalex.org/W2001845833","https://openalex.org/W2138750320","https://openalex.org/W2157725583","https://openalex.org/W2160069146","https://openalex.org/W2162827174","https://openalex.org/W2320629975","https://openalex.org/W2346958490","https://openalex.org/W2566790682","https://openalex.org/W2624731621","https://openalex.org/W2770556114","https://openalex.org/W2784748820","https://openalex.org/W2801368495","https://openalex.org/W2884966605","https://openalex.org/W2953504715","https://openalex.org/W2988443771","https://openalex.org/W2990925732","https://openalex.org/W3043683582","https://openalex.org/W3088107926","https://openalex.org/W3137706449","https://openalex.org/W3208212038","https://openalex.org/W4206346422","https://openalex.org/W4226060470","https://openalex.org/W4313271916","https://openalex.org/W4385626870","https://openalex.org/W4387079354"],"related_works":["https://openalex.org/W4409600393","https://openalex.org/W2369202224","https://openalex.org/W2376384803","https://openalex.org/W4407694993","https://openalex.org/W2907152736","https://openalex.org/W2145754670","https://openalex.org/W4384067465","https://openalex.org/W4414223558","https://openalex.org/W7127381155","https://openalex.org/W2017607374"],"abstract_inverted_index":{"Insulated":[0],"gate":[1,100],"bipolar":[2],"transistor":[3],"(IGBT)":[4],"parallel":[5,51,60,74,162,185,232],"connection":[6],"is":[7,16,37,64,201],"an":[8,172],"effective":[9],"way":[10],"to":[11,55,67,203],"solve":[12],"the":[13,17,21,24,40,44,57,69,73,81,98,116,124,128,134,151,158,161,178,184,188,205,217,223,228],"problem,":[14],"which":[15,122,234],"gradual":[18],"increase":[19],"in":[20,29,72],"capacity":[22],"of":[23,39,49,59,150,160,191,208],"magnetic":[25],"confinement":[26],"power":[27],"supply":[28],"a":[30,50,154,196,236],"Tokamak":[31],"device.":[32],"Static":[33],"current":[34,70,180,197,229],"balance":[35],"(SCB)":[36],"one":[38],"key":[41],"factors":[42],"for":[43,239],"safe":[45],"and":[46,127,146,242],"stable":[47],"operation":[48],"IGBT":[52,61],"system.":[53],"Therefore,":[54,195],"improve":[56],"stability":[58],"systems,":[62],"it":[63],"very":[65],"important":[66],"study":[68,131],"difference":[71,181,198,230],"IGBTs":[75,152,186],"under":[76,187],"various":[77],"parameter":[78,89,95,107,126,193,210],"differences.":[79,194],"However,":[80],"existing":[82],"results":[83,112,214],"have":[84,153],"focused":[85],"mainly":[86],"on":[87,157],"device":[88,92,125,240],"matching":[90,96,117],"through":[91],"screening,":[93],"driving":[94,101],"using":[97],"active":[99],"(AGD)":[102],"method,":[103],"or":[104],"single":[105],"parasitic":[106,138,141],"(PP)":[108],"matching.":[109],"These":[110],"research":[111],"do":[113],"not":[114],"analyze":[115,204],"strategy":[118],"between":[119,183,231],"multiple":[120,209],"parameters,":[121],"are":[123,168],"PP.":[129],"The":[130,212],"showed":[132],"that":[133,175,216],"collector":[135,143],"inductance,":[136,139],"emitter":[137,140],"resistance,":[142,145],"equivalent":[144,147],"series":[148],"voltage":[149],"significant":[155],"impact":[156],"SCB":[159],"IGBTs.":[163],"When":[164],"these":[165,192],"five":[166],"parameters":[167],"mismatched,":[169],"there":[170],"exists":[171],"equilibrium":[173,206],"point":[174,207],"can":[176,225],"reduce":[177,227],"static":[179],"(SCD)":[182],"total":[189],"influence":[190],"model":[199],"(CDM)":[200],"created":[202],"mismatches.":[211],"experimental":[213],"show":[215],"multiparameter":[218],"compensation":[219],"scheme":[220],"implemented":[221],"by":[222],"CDM":[224],"effectively":[226],"IGBTs,":[233],"provides":[235],"feasible":[237],"reference":[238],"selection":[241],"circuit":[243],"design.":[244]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-09-24T07:57:37.273135","created_date":"2024-08-31T00:00:00"}