{"id":"https://openalex.org/W4401360384","doi":"https://doi.org/10.1109/mn60932.2024.10615401","title":"Accuracy Assessment of Non-Intrusive Measurement of Two-Port Impedance and Admittance Parameters by Inductive Couplers","display_name":"Accuracy Assessment of Non-Intrusive Measurement of Two-Port Impedance and Admittance Parameters by Inductive Couplers","publication_year":2024,"publication_date":"2024-07-02","ids":{"openalex":"https://openalex.org/W4401360384","doi":"https://doi.org/10.1109/mn60932.2024.10615401"},"language":"en","primary_location":{"id":"doi:10.1109/mn60932.2024.10615401","doi":"https://doi.org/10.1109/mn60932.2024.10615401","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/mn60932.2024.10615401","pdf_url":null,"source":{"id":"https://openalex.org/S7407086023","display_name":"IEEE International Symposium on Measurements & Networking (M&N)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Measurements & Networking (M&N)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://re.public.polimi.it/bitstream/11311/1275908/6/Article_Z_vs_Y_2x2_Postprint.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043709882","display_name":"Simone Negri","orcid":"https://orcid.org/0000-0001-7048-9380","observed_orcids":["https://orcid.org/0000-0001-7048-9380"]},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Simone Negri","raw_affiliation_strings":["Politecnico di Milano,Department of Electronics, Information and Bioengineering,Milano,Italy","Department of Electronics,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Milano,Department of Electronics, Information and Bioengineering,Milano,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Department of Electronics,","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010506865","display_name":"Giordano Spadacini","orcid":"https://orcid.org/0000-0002-9778-693X","observed_orcids":["https://orcid.org/0000-0002-9778-693X"]},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giordano Spadacini","raw_affiliation_strings":["Politecnico di Milano,Department of Electronics, Information and Bioengineering,Milano,Italy","Department of Electronics,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Milano,Department of Electronics, Information and Bioengineering,Milano,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Department of Electronics,","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079370638","display_name":"Flavia Grassi","orcid":"https://orcid.org/0000-0001-6844-8766","observed_orcids":["https://orcid.org/0000-0001-6844-8766"]},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Flavia Grassi","raw_affiliation_strings":["Politecnico di Milano,Department of Electronics, Information and Bioengineering,Milano,Italy","Department of Electronics,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Milano,Department of Electronics, Information and Bioengineering,Milano,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Department of Electronics,","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010923388","display_name":"Sergio A. Pignari","orcid":"https://orcid.org/0000-0002-6657-1530","observed_orcids":["https://orcid.org/0000-0002-6657-1530"]},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Sergio A. Pignari","raw_affiliation_strings":["Politecnico di Milano,Department of Electronics, Information and Bioengineering,Milano,Italy","Department of Electronics,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Milano,Department of Electronics, Information and Bioengineering,Milano,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Department of Electronics,","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":null,"apc_paid":null,"fwci":0.7647,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.60338291,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.7451000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.7451000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.121799997985363,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.0689999982714653,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inductive-coupler","display_name":"inductive coupler","score":0.7289999723434448},{"id":"https://openalex.org/keywords/admittance-measurement","display_name":"admittance measurement","score":0.8510000109672546},{"id":"https://openalex.org/keywords/non-intrusive-measurement","display_name":"non-intrusive measurement","score":0.8690000176429749},{"id":"https://openalex.org/keywords/measurement-accuracy","display_name":"measurement accuracy","score":0.7110000252723694},{"id":"https://openalex.org/keywords/vector-network-analyzer","display_name":"vector network analyzer","score":0.7929999828338623},{"id":"https://openalex.org/keywords/s-parameters","display_name":"S-parameters","score":0.550000011920929},{"id":"https://openalex.org/keywords/passive-networks","display_name":"passive networks","score":0.7179999947547913},{"id":"https://openalex.org/keywords/power-electronics","display_name":"power electronics","score":0.8619999885559082}],"concepts":[{"id":"https://openalex.org/C108811297","wikidata":"https://www.wikidata.org/wiki/Q214518","display_name":"Admittance","level":3,"score":0.8151694536209106},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.724838137626648},{"id":"https://openalex.org/C172066009","wikidata":"https://www.wikidata.org/wiki/Q5463955","display_name":"Focused Impedance Measurement","level":3,"score":0.6269736886024475},{"id":"https://openalex.org/C32802771","wikidata":"https://www.wikidata.org/wiki/Q2443617","display_name":"Port (circuit theory)","level":2,"score":0.571148157119751},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.48944321274757385},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4630999267101288},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.4457990825176239},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.40673309564590454},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3661752939224243},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3338289260864258},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3325682282447815},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.25228962302207947}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/mn60932.2024.10615401","doi":"https://doi.org/10.1109/mn60932.2024.10615401","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/mn60932.2024.10615401","pdf_url":null,"source":{"id":"https://openalex.org/S7407086023","display_name":"IEEE International Symposium on Measurements & Networking (M&N)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Measurements & Networking (M&N)","raw_type":"proceedings-article"},{"id":"pmh:oai:re.public.polimi.it:11311/1275908","doi":null,"is_oa":true,"landing_page_url":"https://hdl.handle.net/11311/1275908","pdf_url":"https://re.public.polimi.it/bitstream/11311/1275908/6/Article_Z_vs_Y_2x2_Postprint.pdf","source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:re.public.polimi.it:11311/1275908","doi":null,"is_oa":true,"landing_page_url":"https://hdl.handle.net/11311/1275908","pdf_url":"https://re.public.polimi.it/bitstream/11311/1275908/6/Article_Z_vs_Y_2x2_Postprint.pdf","source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G1175062043","display_name":null,"funder_award_id":"1033\u2013 17/06/2022","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"},{"id":"https://openalex.org/G2649423451","display_name":null,"funder_award_id":"CN0000002 3","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"},{"id":"https://openalex.org/G5379359101","display_name":null,"funder_award_id":"103317/06/2022,CN00000023","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"}],"funders":[{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4401360384.pdf","grobid_xml":"https://content.openalex.org/works/W4401360384.grobid-xml"},"referenced_works_count":23,"referenced_works":["https://openalex.org/W2019017255","https://openalex.org/W2059408905","https://openalex.org/W2060083630","https://openalex.org/W2066626412","https://openalex.org/W2105920864","https://openalex.org/W2135795438","https://openalex.org/W2610055935","https://openalex.org/W2782403210","https://openalex.org/W2945219405","https://openalex.org/W2981339426","https://openalex.org/W3190541168","https://openalex.org/W3191046393","https://openalex.org/W3200786955","https://openalex.org/W3204188537","https://openalex.org/W3215353010","https://openalex.org/W4226296417","https://openalex.org/W4302014045","https://openalex.org/W4311719786","https://openalex.org/W4312376835","https://openalex.org/W4391696935","https://openalex.org/W4396799292","https://openalex.org/W4403278059","https://openalex.org/W4404564022"],"related_works":["https://openalex.org/W4404564022","https://openalex.org/W4391696935","https://openalex.org/W4396799292","https://openalex.org/W4403278059","https://openalex.org/W4413977994","https://openalex.org/W4224241214","https://openalex.org/W2915065628","https://openalex.org/W2066626412","https://openalex.org/W4229045922","https://openalex.org/W4296515371"],"abstract_inverted_index":{"Many":[0],"applications,":[1],"ranging":[2],"from":[3,148],"power":[4],"electronics":[5],"to":[6,37,55,174],"electromagnetic":[7],"interference":[8],"modelling,":[9],"take":[10],"advantage":[11],"of":[12,33,41,80,116,162],"in-circuit":[13],"impedance":[14,85,103,142],"and":[15,84,102,143,167],"admittance":[16,101,144],"measurements,":[17],"that":[18,140],"is,":[19,141],"carried":[20],"out":[21],"while":[22],"equipment":[23],"is":[24,106,165],"operating.":[25],"Single-port":[26],"literature":[27],"methods,":[28],"based":[29],"on":[30,94,172],"the":[31,39,48,81,95,99,120,177],"use":[32],"clamp-on":[34],"inductive":[35,158],"probes":[36],"couple":[38],"ports":[40,155],"a":[42,91,113],"vector":[43],"network":[44],"analyser":[45],"(VNA)":[46],"with":[47],"system":[49],"under":[50],"test,":[51],"are":[52,60,110,131],"advantageous":[53],"due":[54],"their":[56],"non-intrusive":[57],"setup,":[58],"but":[59],"not":[61],"suitable":[62,114],"for":[63,78],"multiport":[64],"systems.":[65],"Just":[66],"recently,":[67],"two-port":[68],"inductively-coupled":[69,100],"methods":[70,105,109,164],"were":[71],"proposed":[72],"in":[73,119],"two":[74],"different":[75],"formulations,":[76],"namely,":[77],"measurement":[79,104,178],"full$\\mathbf{2}\\times":[82],"\\mathbf{2}$admittance":[83],"matrix,":[86],"respectively.":[87],"In":[88],"this":[89],"paper,":[90],"comparative":[92],"investigation":[93],"accuracy":[96,161],"provided":[97],"by":[98],"presented.":[107],"Both":[108],"tested":[111],"using":[112,157],"set":[115],"passive":[117],"networks":[118],"150":[121],"kHz":[122],"-":[123],"30":[124],"MHz":[125],"frequency":[126],"range.":[127],"The":[128,160],"obtained":[129],"results":[130],"compared":[132],"versus":[133],"an":[134],"accurate":[135],"(yet":[136],"intrusive)":[137],"reference":[138],"result,":[139],"parameters":[145,150],"mathematically":[146],"converted":[147],"scattering":[149],"directly":[151],"measured":[152],"at":[153],"VNA":[154],"without":[156],"couplers.":[159],"both":[163],"quantified":[166],"discussed,":[168],"providing":[169],"useful":[170],"insights":[171],"how":[173],"possibly":[175],"improve":[176],"setup.":[179]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2024-08-07T00:00:00"}