{"id":"https://openalex.org/W4401247673","doi":"https://doi.org/10.1109/isiea61920.2024.10607326","title":"Study of PWB Metal Surface Roughness Influence on GDDR6 Memory Data Transmission at 16 Gbps","display_name":"Study of PWB Metal Surface Roughness Influence on GDDR6 Memory Data Transmission at 16 Gbps","publication_year":2024,"publication_date":"2024-07-06","ids":{"openalex":"https://openalex.org/W4401247673","doi":"https://doi.org/10.1109/isiea61920.2024.10607326"},"language":"en","primary_location":{"id":"doi:10.1109/isiea61920.2024.10607326","doi":"https://doi.org/10.1109/isiea61920.2024.10607326","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/isiea61920.2024.10607326","pdf_url":null,"source":{"id":"https://openalex.org/S7407087792","display_name":"IEEE Symposium on Industrial Electronics & Applications (ISIEA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Symposium on Industrial Electronics & Applications (ISIEA)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043056373","display_name":"Chang Fei Yee","orcid":"https://orcid.org/0000-0001-6766-0845","observed_orcids":["https://orcid.org/0000-0001-6766-0845"]},"institutions":[{"id":"https://openalex.org/I4210098220","display_name":"Keysight Technologies (Singapore)","ror":"https://ror.org/01155gk87","country_code":"SG","type":"company","lineage":["https://openalex.org/I4210098220","https://openalex.org/I4210115805"]},{"id":"https://openalex.org/I4210115805","display_name":"Keysight Technologies (United States)","ror":"https://ror.org/02903cd17","country_code":"US","type":"company","lineage":["https://openalex.org/I4210115805"]},{"id":"https://openalex.org/I4210129523","display_name":"Keysight Technologies (Austria)","ror":"https://ror.org/036y1an55","country_code":"AT","type":"company","lineage":["https://openalex.org/I4210115805","https://openalex.org/I4210129523"]},{"id":"https://openalex.org/I4210149610","display_name":"Keysight Technologies (United Kingdom)","ror":"https://ror.org/04g81mm64","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210115805","https://openalex.org/I4210149610"]}],"countries":["AT","GB","SG","US"],"is_corresponding":true,"raw_author_name":"Chang Fei Yee","raw_affiliation_strings":["Keysight Technologies"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Keysight Technologies","institution_ids":["https://openalex.org/I4210098220","https://openalex.org/I4210115805","https://openalex.org/I4210129523","https://openalex.org/I4210149610"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5043056373"],"corresponding_institution_ids":["https://openalex.org/I4210098220","https://openalex.org/I4210115805","https://openalex.org/I4210129523","https://openalex.org/I4210149610"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.948199987411499,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.948199987411499,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.02590000070631504,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11263","display_name":"Electromagnetic Simulation and Numerical Methods","score":0.0052999998442828655,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metal-surface-roughness","display_name":"metal surface roughness","score":0.8479999899864197},{"id":"https://openalex.org/keywords/skin-effect","display_name":"skin effect","score":0.7720000147819519},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"signal integrity","score":0.9290000200271606},{"id":"https://openalex.org/keywords/memory-interface","display_name":"memory interface","score":0.652999997138977},{"id":"https://openalex.org/keywords/graphics-processing-units","display_name":"graphics processing units","score":0.7549999952316284},{"id":"https://openalex.org/keywords/coupled-microstrip","display_name":"coupled microstrip","score":0.7360000014305115},{"id":"https://openalex.org/keywords/line-impedance","display_name":"line impedance","score":0.8270000219345093},{"id":"https://openalex.org/keywords/signal-reflection","display_name":"signal reflection","score":0.9390000104904175},{"id":"https://openalex.org/keywords/link-loss","display_name":"link loss","score":0.9660000205039978},{"id":"https://openalex.org/keywords/far-end-crosstalk","display_name":"far-end crosstalk","score":0.9570000171661377}],"concepts":[{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.6308401823043823},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.5675480961799622},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5449442267417908},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4666896462440491},{"id":"https://openalex.org/C71039073","wikidata":"https://www.wikidata.org/wiki/Q3439090","display_name":"Surface finish","level":2,"score":0.45944488048553467},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.34684956073760986},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3271811008453369},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.18327650427818298},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1540614366531372},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.132648766040802},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.08016106486320496}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isiea61920.2024.10607326","doi":"https://doi.org/10.1109/isiea61920.2024.10607326","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/isiea61920.2024.10607326","pdf_url":null,"source":{"id":"https://openalex.org/S7407087792","display_name":"IEEE Symposium on Industrial Electronics & Applications (ISIEA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Symposium on Industrial Electronics & Applications (ISIEA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W10143836","https://openalex.org/W2765386737","https://openalex.org/W3194287510","https://openalex.org/W3210971099","https://openalex.org/W4285103244","https://openalex.org/W4285407115","https://openalex.org/W4297808662"],"related_works":["https://openalex.org/W4414270851","https://openalex.org/W4328012120","https://openalex.org/W2153940413","https://openalex.org/W1597042960","https://openalex.org/W2318500665","https://openalex.org/W7213541333","https://openalex.org/W1967655871","https://openalex.org/W2894139158","https://openalex.org/W2771296694","https://openalex.org/W4401324885"],"abstract_inverted_index":{"This":[0],"paper":[1,26],"introduces":[2],"Graphics":[3,9],"Double":[4],"Data":[5],"Rate":[6],"6":[7],"Synchronous":[8],"Random":[10],"Access":[11],"Memory":[12],"(GDDR6":[13],"SGRAM)":[14],"and":[15,35,44,95],"its":[16,45],"application":[17],"in":[18,38,51,86],"graphics":[19],"processing":[20],"unit":[21],"(GPU).":[22],"Besides":[23],"that,":[24],"this":[25,60],"also":[27],"describes":[28],"the":[29,62,81],"concept":[30],"of":[31,53,59,88],"metal":[32,82],"surface":[33,83],"roughness":[34,84],"skin":[36],"effect":[37],"printed":[39],"wiring":[40],"board":[41],"(PWB)":[42],"stack-up":[43],"influence":[46,85],"on":[47],"GDDR6":[48],"memory":[49],"interface":[50],"terms":[52,87],"signal":[54,63,91],"integrity.":[55],"In":[56],"later":[57],"section":[58],"paper,":[61],"integrity":[64],"analysis":[65],"with":[66],"two":[67],"dimensional":[68],"electromagnetic":[69],"(2DEM)":[70],"modelling":[71],"for":[72],"coupled":[73],"microstrip":[74],"using":[75],"Advanced":[76],"Design":[77],"System":[78],"to":[79],"investigate":[80],"line":[89],"impedance,":[90],"reflection,":[92],"link":[93],"loss":[94],"far":[96],"end":[97],"crosstalk":[98],"(FEXT)":[99],"is":[100],"presented.":[101]},"counts_by_year":[],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2024-08-03T00:00:00"}