{"id":"https://openalex.org/W4401070490","doi":"https://doi.org/10.1109/led.2024.3435345","title":"Evidence of Widely Distributed Time Constants in the Vertical Charge Loss of 3-D Charge-Trap NAND Flash Memories","display_name":"Evidence of Widely Distributed Time Constants in the Vertical Charge Loss of 3-D Charge-Trap NAND Flash Memories","publication_year":2024,"publication_date":"2024-07-29","ids":{"openalex":"https://openalex.org/W4401070490","doi":"https://doi.org/10.1109/led.2024.3435345"},"language":"en","primary_location":{"id":"doi:10.1109/led.2024.3435345","doi":"https://doi.org/10.1109/led.2024.3435345","is_oa":true,"landing_page_url":"https://doi.org/10.1109/led.2024.3435345","pdf_url":null,"source":{"id":"https://openalex.org/S19887683","display_name":"IEEE Electron Device Letters","issn_l":"0741-3106","issn":["0741-3106","1558-0563"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-2","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Electron Device Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/led.2024.3435345","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5093294016","display_name":"David Gianluigi Refaldi","orcid":"https://orcid.org/0009-0003-0836-1820","observed_orcids":["https://orcid.org/0009-0003-0836-1820"]},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"David G. Refaldi","raw_affiliation_strings":["Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milan, Italy","Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy"],"raw_orcid":"https://orcid.org/0009-0003-0836-1820","affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076462300","display_name":"Gerardo Malavena","orcid":"https://orcid.org/0000-0002-5756-8989","observed_orcids":["https://orcid.org/0000-0002-5756-8989"]},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Gerardo Malavena","raw_affiliation_strings":["Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milan, Italy","Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy"],"raw_orcid":"https://orcid.org/0000-0002-5756-8989","affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008691003","display_name":"Luca Chiavarone","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210130962","display_name":"Micron (Italy)","ror":"https://ror.org/039m3s961","country_code":"IT","type":"company","lineage":["https://openalex.org/I11912373","https://openalex.org/I4210130962"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca Chiavarone","raw_affiliation_strings":["Process Research and Development, Micron Technology Inc., Vimercate, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Process Research and Development, Micron Technology Inc., Vimercate, Italy","institution_ids":["https://openalex.org/I4210130962"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024578577","display_name":"Alessandro Sottocornola Spinelli","orcid":"https://orcid.org/0000-0002-3290-6734","observed_orcids":["https://orcid.org/0000-0002-3290-6734"]},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alessandro S. Spinelli","raw_affiliation_strings":["Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milan, Italy","Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy"],"raw_orcid":"https://orcid.org/0000-0002-3290-6734","affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063049108","display_name":"Christian Monzio Compagnoni","orcid":"https://orcid.org/0000-0001-9820-6709","observed_orcids":["https://orcid.org/0000-0001-9820-6709"]},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Christian Monzio Compagnoni","raw_affiliation_strings":["Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milan, Italy","Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy"],"raw_orcid":"https://orcid.org/0000-0001-9820-6709","affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2495,"currency":"USD","value_usd":2495},"apc_paid":{"value":2495,"currency":"USD","value_usd":2495},"fwci":0.712,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.63540384,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"45","issue":"10","first_page":"1811","last_page":"1814"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9653000235557556,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9653000235557556,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.012299999594688416,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.007400000002235174,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/time-constant","display_name":"time constant","score":0.753000020980835},{"id":"https://openalex.org/keywords/data-retention","display_name":"data retention","score":0.8930000066757202},{"id":"https://openalex.org/keywords/activation-energy","display_name":"activation energy","score":0.8529999852180481},{"id":"https://openalex.org/keywords/cryogenic-operation","display_name":"cryogenic operation","score":0.7009999752044678},{"id":"https://openalex.org/keywords/temperature-dependence","display_name":"temperature dependence","score":0.7099999785423279},{"id":"https://openalex.org/keywords/program-operation","display_name":"program operation","score":0.41999998688697815}],"concepts":[{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.7632917165756226},{"id":"https://openalex.org/C81370116","wikidata":"https://www.wikidata.org/wiki/Q1335249","display_name":"Time constant","level":2,"score":0.7086858749389648},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.6759774684906006},{"id":"https://openalex.org/C9395851","wikidata":"https://www.wikidata.org/wiki/Q177929","display_name":"Stack (abstract data type)","level":2,"score":0.6130999326705933},{"id":"https://openalex.org/C121099081","wikidata":"https://www.wikidata.org/wiki/Q665580","display_name":"Trap (plumbing)","level":2,"score":0.595711886882782},{"id":"https://openalex.org/C188082385","wikidata":"https://www.wikidata.org/wiki/Q73792","display_name":"Charge (physics)","level":2,"score":0.525842010974884},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5001153945922852},{"id":"https://openalex.org/C2777924906","wikidata":"https://www.wikidata.org/wiki/Q34168","display_name":"Trapping","level":2,"score":0.4994180202484131},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4438857436180115},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4202503263950348},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.3422408401966095},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.31619375944137573},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3144546151161194},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29853272438049316},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.21590688824653625},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.13145780563354492},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10732489824295044},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.07637396454811096},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/led.2024.3435345","doi":"https://doi.org/10.1109/led.2024.3435345","is_oa":true,"landing_page_url":"https://doi.org/10.1109/led.2024.3435345","pdf_url":null,"source":{"id":"https://openalex.org/S19887683","display_name":"IEEE Electron Device Letters","issn_l":"0741-3106","issn":["0741-3106","1558-0563"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-2","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Electron Device Letters","raw_type":"journal-article"},{"id":"pmh:oai:re.public.polimi.it:11311/1274422","doi":null,"is_oa":true,"landing_page_url":"https://hdl.handle.net/11311/1274422","pdf_url":"https://re.public.polimi.it/bitstream/11311/1274422/1/edl24.pdf","source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1109/led.2024.3435345","doi":"https://doi.org/10.1109/led.2024.3435345","is_oa":true,"landing_page_url":"https://doi.org/10.1109/led.2024.3435345","pdf_url":null,"source":{"id":"https://openalex.org/S19887683","display_name":"IEEE Electron Device Letters","issn_l":"0741-3106","issn":["0741-3106","1558-0563"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-2","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Electron Device Letters","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4401070490.pdf","grobid_xml":"https://content.openalex.org/works/W4401070490.grobid-xml"},"referenced_works_count":17,"referenced_works":["https://openalex.org/W1518929885","https://openalex.org/W2113143253","https://openalex.org/W2169071812","https://openalex.org/W2323400788","https://openalex.org/W2524846051","https://openalex.org/W2544022642","https://openalex.org/W2545558283","https://openalex.org/W2601087915","https://openalex.org/W2806574537","https://openalex.org/W2946350377","https://openalex.org/W3006330903","https://openalex.org/W3162708822","https://openalex.org/W4376606690","https://openalex.org/W4376606732","https://openalex.org/W4380302652","https://openalex.org/W4390187878","https://openalex.org/W4396949093"],"related_works":["https://openalex.org/W4410395031","https://openalex.org/W4200541801","https://openalex.org/W2964683765","https://openalex.org/W4376606732","https://openalex.org/W3171574260","https://openalex.org/W1586261359","https://openalex.org/W4398151467","https://openalex.org/W4225294496","https://openalex.org/W4225305080","https://openalex.org/W4387197015"],"abstract_inverted_index":{"In":[0],"this":[1],"letter,":[2],"through":[3],"experimental":[4],"evidence":[5],"collected":[6],"at":[7,54,74,107],"room":[8],"temperature":[9,53,73,125],"and":[10,104],"in":[11],"the":[12,18,24,44,52,56,65,68,72,89,108,123,132],"deep-cryogenic":[13,133],"regime,":[14],"we":[15],"demonstrate":[16],"that":[17,43,96],"so-called":[19],"vertical":[20,76],"charge":[21,77],"loss":[22,78],"from":[23],"gate":[25],"stack":[26],"of":[27,46,67,88,126],"3-D":[28],"charge-trap":[29],"NAND":[30,127],"Flash":[31,128],"memories":[32,129],"is":[33,59,79,97],"a":[34],"process":[35],"featuring":[36],"widely":[37],"distributed":[38],"time":[39,48,69],"constants.":[40],"Results":[41],"reveal":[42],"turn-on":[45],"these":[47],"constants":[49,70],"depends":[50],"on":[51,71],"which":[55,75],"program":[57,105],"operation":[58],"carried":[60],"out.":[61],"This,":[62],"combined":[63],"with":[64],"dependence":[66],"monitored,":[80],"gives":[81],"rise":[82],"to":[83,99,121,131],"an":[84],"apparent":[85],"activation":[86],"energy":[87],"cell":[90],"threshold-voltage":[91],"transient":[92],"during":[93],"data":[94,102],"retention":[95,103],"close":[98],"zero":[100],"when":[101,119],"occur":[106],"same":[109],"temperature.":[110],"This":[111],"phenomenology":[112],"must":[113],"be":[114],"carefully":[115],"taken":[116],"into":[117],"account":[118],"trying":[120],"extend":[122],"working":[124],"down":[130],"regime.":[134]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2024-07-31T00:00:00"}