{"id":"https://openalex.org/W4400772005","doi":"https://doi.org/10.1109/eiceeai60672.2023.10590367","title":"Deep Learning Detection of Defect-Free Bangles: Machine Vision Approach for Quality Assurance in Bangle Manufacturing","display_name":"Deep Learning Detection of Defect-Free Bangles: Machine Vision Approach for Quality Assurance in Bangle Manufacturing","publication_year":2023,"publication_date":"2023-12-27","ids":{"openalex":"https://openalex.org/W4400772005","doi":"https://doi.org/10.1109/eiceeai60672.2023.10590367"},"language":"en","primary_location":{"id":"doi:10.1109/eiceeai60672.2023.10590367","doi":"https://doi.org/10.1109/eiceeai60672.2023.10590367","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/eiceeai60672.2023.10590367","pdf_url":null,"source":{"id":"https://openalex.org/S7407096299","display_name":"International Engineering Conference on Electrical, Energy, and Artificial Intelligence (EICEEAI)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 2nd International Engineering Conference on Electrical, Energy, and Artificial Intelligence (EICEEAI)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034100499","display_name":"Helcy D. Alon","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I3516337","display_name":"Batangas State University","ror":"https://ror.org/019en2y21","country_code":"PH","type":"education","lineage":["https://openalex.org/I3516337"]}],"countries":["PH"],"is_corresponding":false,"raw_author_name":"Helcy D. Alon","raw_affiliation_strings":["College of Engineering, Batangas State University - TNEU,Batangas City,Philippines"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Engineering, Batangas State University - TNEU,Batangas City,Philippines","institution_ids":["https://openalex.org/I3516337"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025735450","display_name":"Alvin Sarraga Alon","orcid":"https://orcid.org/0000-0002-6083-7916","observed_orcids":["https://orcid.org/0000-0002-6083-7916"]},"institutions":[{"id":"https://openalex.org/I3516337","display_name":"Batangas State University","ror":"https://ror.org/019en2y21","country_code":"PH","type":"education","lineage":["https://openalex.org/I3516337"]}],"countries":["PH"],"is_corresponding":false,"raw_author_name":"Alvin Sarraga Alon","raw_affiliation_strings":["Digital Transformation Center, Batangas State University - TNEU,Batangas City,Philippines"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Digital Transformation Center, Batangas State University - TNEU,Batangas City,Philippines","institution_ids":["https://openalex.org/I3516337"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011659482","display_name":"Ryan S. Evangelista","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ryan S. Evangelista","raw_affiliation_strings":["School of Graduate Studies, Sulu State College,Sulu,Philippines"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Graduate Studies, Sulu State College,Sulu,Philippines","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075251562","display_name":"Michael Angelo D. Ligayo","orcid":"https://orcid.org/0000-0002-5687-5178","observed_orcids":["https://orcid.org/0000-0002-5687-5178"]},"institutions":[{"id":"https://openalex.org/I3132376896","display_name":"Quezon City University","ror":"https://ror.org/01sdhtm90","country_code":"PH","type":"education","lineage":["https://openalex.org/I3132376896"]}],"countries":["PH"],"is_corresponding":false,"raw_author_name":"Michael Angelo Delos Santos Ligayo","raw_affiliation_strings":["College of Engineering, Quezon City University,Quezon City,Philippines"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Engineering, Quezon City University,Quezon City,Philippines","institution_ids":["https://openalex.org/I3132376896"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009627620","display_name":"Ryan Carreon Reyes","orcid":"https://orcid.org/0000-0002-3115-2280","observed_orcids":["https://orcid.org/0000-0002-3115-2280"]},"institutions":[{"id":"https://openalex.org/I4210096824","display_name":"Technological University of the Philippines","ror":"https://ror.org/00v4vjb95","country_code":"PH","type":"education","lineage":["https://openalex.org/I4210096824"]}],"countries":["PH"],"is_corresponding":false,"raw_author_name":"Ryan Reyes","raw_affiliation_strings":["Technological University of the Philippines,Dept. of Electrical Engineering,Manila,Philippines"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technological University of the Philippines,Dept. of Electrical Engineering,Manila,Philippines","institution_ids":["https://openalex.org/I4210096824"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064188522","display_name":"Michelle C. Reyes","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405262328","display_name":"Far Eastern University \u2013 Dr. Nicanor Reyes Medical Foundation","ror":"https://ror.org/02pwvf650","country_code":"PH","type":"education","lineage":["https://openalex.org/I4405262328"]}],"countries":["PH"],"is_corresponding":false,"raw_author_name":"Michelle C. Reyes","raw_affiliation_strings":["FEU Nicanor Reyes Medical Foundation,General Education Department,Quezon City,Philippines"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FEU Nicanor Reyes Medical Foundation,General Education Department,Quezon City,Philippines","institution_ids":["https://openalex.org/I4405262328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075458726","display_name":"Jovencio V. Merin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210096824","display_name":"Technological University of the Philippines","ror":"https://ror.org/00v4vjb95","country_code":"PH","type":"education","lineage":["https://openalex.org/I4210096824"]}],"countries":["PH"],"is_corresponding":false,"raw_author_name":"Jovencio Merin","raw_affiliation_strings":["Technological University of the Philippines,Dept. of Electrical Engineering,Manila,Philippines"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technological University of the Philippines,Dept. of Electrical Engineering,Manila,Philippines","institution_ids":["https://openalex.org/I4210096824"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037526061","display_name":"Yolanda D. Austria","orcid":"https://orcid.org/0000-0002-3188-0907","observed_orcids":["https://orcid.org/0000-0002-3188-0907"]},"institutions":[{"id":"https://openalex.org/I103193709","display_name":"Adamson University","ror":"https://ror.org/00xbjad38","country_code":"PH","type":"education","lineage":["https://openalex.org/I103193709"]}],"countries":["PH"],"is_corresponding":false,"raw_author_name":"Yolanda D. Austria","raw_affiliation_strings":["Adamson University,Dept of Computer Engineering,Manila,Philippines"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Adamson University,Dept of Computer Engineering,Manila,Philippines","institution_ids":["https://openalex.org/I103193709"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"16","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/defect-detection","display_name":"defect detection","score":0.8190000057220459},{"id":"https://openalex.org/keywords/quality-assurance","display_name":"quality assurance","score":0.8059999942779541},{"id":"https://openalex.org/keywords/machine-vision","display_name":"machine vision","score":0.902999997138977},{"id":"https://openalex.org/keywords/deep-learning","display_name":"deep learning","score":0.48500001430511475},{"id":"https://openalex.org/keywords/object-detection","display_name":"object detection","score":0.5699999928474426}],"concepts":[{"id":"https://openalex.org/C106436119","wikidata":"https://www.wikidata.org/wiki/Q836575","display_name":"Quality assurance","level":3,"score":0.8417942523956299},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5555143356323242},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5139241218566895},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.45653730630874634},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3845559358596802},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26060348749160767},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.06703019142150879},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.05507904291152954},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2778618615","wikidata":"https://www.wikidata.org/wiki/Q4008393","display_name":"External quality assessment","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/eiceeai60672.2023.10590367","doi":"https://doi.org/10.1109/eiceeai60672.2023.10590367","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/eiceeai60672.2023.10590367","pdf_url":null,"source":{"id":"https://openalex.org/S7407096299","display_name":"International Engineering Conference on Electrical, Energy, and Artificial Intelligence (EICEEAI)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 2nd International Engineering Conference on Electrical, Energy, and Artificial Intelligence (EICEEAI)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W2997548842","https://openalex.org/W3090794067","https://openalex.org/W3094514110","https://openalex.org/W3161310854","https://openalex.org/W3187252104","https://openalex.org/W3208803276","https://openalex.org/W3215234531","https://openalex.org/W4296626078","https://openalex.org/W4310717060","https://openalex.org/W4323768997","https://openalex.org/W4327560014","https://openalex.org/W4362575754","https://openalex.org/W4362663195","https://openalex.org/W6946151184"],"related_works":["https://openalex.org/W4403938005","https://openalex.org/W4375827307","https://openalex.org/W4400771203","https://openalex.org/W4405908399","https://openalex.org/W4414067975","https://openalex.org/W4408995346","https://openalex.org/W7130553908","https://openalex.org/W4415514549","https://openalex.org/W3199992936","https://openalex.org/W4411099136"],"abstract_inverted_index":{"This":[0,150,193],"study":[1,31,194],"explores":[2],"the":[3,26,54,78,81,104,130,133,196],"application":[4],"of":[5,28,45,58,148,159,199],"deep":[6,204],"learning":[7,205],"and":[8,51,56,67,75,136,140,174,183,203],"machine":[9,201],"vision":[10,202],"methods":[11],"to":[12,21,98,119,154],"identify":[13],"defect-free,":[14],"circular":[15],"bangles.":[16,29,59,102,160],"The":[17,30,60,161],"main":[18],"objective":[19],"is":[20],"improve":[22],"quality":[23,187,208],"control":[24,188],"in":[25,53,109,125,189,210],"manufacturing":[27,191],"introduces":[32],"a":[33,38,85,181],"new":[34],"model":[35,61,82,105,134],"that":[36],"achieves":[37],"remarkable":[39,107],"mean":[40,164],"Average":[41],"Precision":[42],"(mAP)":[43,167],"score":[44],"99.1%,":[46],"showcasing":[47],"its":[48,96,123,152,171,178],"exceptional":[49,172],"accuracy":[50],"efficiency":[52],"identification":[55],"categorization":[57],"successfully":[62],"differentiates":[63],"between":[64],"\u201cgood,\u201d":[65],"\u201cdefect,\u201d":[66],"\u201cbroken\u201d":[68,141],"bangles,":[69,93,112,142],"as":[70,180],"evidenced":[71],"by":[72],"thorough":[73],"testing":[74,79,173],"analysis.":[76],"During":[77,129],"phase,":[80,132],"regularly":[83],"achieved":[84],"99%":[86],"average":[87,145,165],"detection":[88,114,146],"rate":[89,147],"for":[90,186,206],"recognizing":[91,126],"\u201cgood\u201d":[92],"hence":[94],"confirming":[95],"capacity":[97],"properly":[99],"detect":[100],"perfect":[101],"Moreover,":[103],"demonstrated":[106],"competence":[108],"detecting":[110],"\u201cdefect\u201d":[111,139],"achieving":[113,143],"rates":[115],"ranging":[116],"from":[117],"98%":[118],"97%,":[120],"thereby":[121],"emphasizing":[122],"efficacy":[124],"flawed":[127],"goods.":[128],"analysis":[131,175],"consistently":[135],"precisely":[137],"recognized":[138],"an":[144],"98%.":[149],"confirms":[151],"capability":[153],"effectively":[155],"classify":[156],"various":[157],"types":[158],"model's":[162],"high":[163],"precision":[166],"value,":[168],"along":[169],"with":[170],"results,":[176],"highlights":[177,195],"promise":[179],"reliable":[182],"effective":[184],"solution":[185],"bangle":[190,211],"applications.":[192],"substantial":[197],"advantages":[198],"utilizing":[200],"accurate":[207],"assurance":[209],"manufacturing.":[212]},"counts_by_year":[],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2024-07-19T00:00:00"}