{"id":"https://openalex.org/W4400324563","doi":"https://doi.org/10.1364/opticaopen.26170123.v1","title":"Increasing the Precision of Transmission Spectroscopy by Optimization of Thin Film Surface Shapes","display_name":"Increasing the Precision of Transmission Spectroscopy by Optimization of Thin Film Surface Shapes","publication_year":2024,"publication_date":"2024-07-04","ids":{"openalex":"https://openalex.org/W4400324563","doi":"https://doi.org/10.1364/opticaopen.26170123.v1"},"language":"en","primary_location":{"id":"doi:10.1364/opticaopen.26170123.v1","doi":"https://doi.org/10.1364/opticaopen.26170123.v1","is_oa":false,"landing_page_url":"https://doi.org/10.1364/opticaopen.26170123.v1","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"Optica Open","raw_type":"posted-content"},"volume":null,"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://figshare.com/articles/preprint/Increasing_the_Precision_of_Transmission_Spectroscopy_by_Optimization_of_Thin_Film_Surface_Shapes/26170123","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"John Bass","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I138006243","display_name":"University of Arizona","ror":"https://ror.org/03m2x1q45","country_code":"US","type":"education","lineage":["https://openalex.org/I138006243"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"John Bass","raw_affiliation_strings":["Wyant College of Optical Sciences, University of Arizona, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wyant College of Optical Sciences, University of Arizona, United States","institution_ids":["https://openalex.org/I138006243"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5092176752","display_name":"Manuel Ballester Matito","orcid":"https://orcid.org/0000-0001-9135-6421","observed_orcids":["https://orcid.org/0000-0001-9135-6421"]},"institutions":[{"id":"https://openalex.org/I111979921","display_name":"Northwestern University","ror":"https://ror.org/000e0be47","country_code":"US","type":"education","lineage":["https://openalex.org/I111979921"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Manuel Ballester Matito","raw_affiliation_strings":["Department of Computer Sciences, Northwestern University, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Sciences, Northwestern University, United States","institution_ids":["https://openalex.org/I111979921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030072859","display_name":"S. Fern\u00e1ndez","orcid":"https://orcid.org/0000-0003-4264-9767","observed_orcids":["https://orcid.org/0000-0003-4264-9767"]},"institutions":[{"id":"https://openalex.org/I4210165411","display_name":"Centro de Investigaciones Energ\u00e9ticas, Medioambientales y Tecnol\u00f3gicas","ror":"https://ror.org/05xx77y52","country_code":"ES","type":"facility","lineage":["https://openalex.org/I4210165411"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"S Fern\u00e1ndez","raw_affiliation_strings":["Department of Energy, CIEMAT, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Energy, CIEMAT, Spain","institution_ids":["https://openalex.org/I4210165411"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048650003","display_name":"Aggelos K. Katsaggelos","orcid":"https://orcid.org/0000-0003-4554-0070","observed_orcids":["https://orcid.org/0000-0003-4554-0070"]},"institutions":[{"id":"https://openalex.org/I111979921","display_name":"Northwestern University","ror":"https://ror.org/000e0be47","country_code":"US","type":"education","lineage":["https://openalex.org/I111979921"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aggelos Katsaggelos","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Northwestern University, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Northwestern University, United States","institution_ids":["https://openalex.org/I111979921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111556731","display_name":"Emilio Marquez","orcid":"https://orcid.org/0000-0002-1846-7413","observed_orcids":["https://orcid.org/0000-0002-1846-7413"]},"institutions":[{"id":"https://openalex.org/I39147953","display_name":"Universidad de C\u00e1diz","ror":"https://ror.org/04mxxkb11","country_code":"ES","type":"education","lineage":["https://openalex.org/I39147953"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Emilio Marquez","raw_affiliation_strings":["Department of Condensed-Matter Physics, University of Cadiz, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Condensed-Matter Physics, University of Cadiz, Spain","institution_ids":["https://openalex.org/I39147953"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069603431","display_name":"Florian Willomitzer","orcid":"https://orcid.org/0000-0003-1563-1131","observed_orcids":["https://orcid.org/0000-0003-1563-1131"]},"institutions":[{"id":"https://openalex.org/I138006243","display_name":"University of Arizona","ror":"https://ror.org/03m2x1q45","country_code":"US","type":"education","lineage":["https://openalex.org/I138006243"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Florian Willomitzer","raw_affiliation_strings":["Wyant College of Optical Sciences, University of Arizona, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wyant College of Optical Sciences, University of Arizona, United States","institution_ids":["https://openalex.org/I138006243"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I138006243"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.2363000065088272,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.2363000065088272,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.23399999737739563,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","score":0.1137000024318695,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/optical-properties-of-semiconductors","display_name":"semiconductor optical properties","score":0.781000018119812},{"id":"https://openalex.org/keywords/measurement-uncertainty-reduction","display_name":"measurement uncertainty reduction","score":0.7279999852180481},{"id":"https://openalex.org/keywords/optical-thickness-measurement","display_name":"optical thickness measurement","score":0.3160000145435333},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"surface roughness","score":0.34200000762939453}],"concepts":[{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.6215167045593262},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5956894159317017},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.5836405158042908},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.5120676159858704},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.49027684330940247},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3349088728427887},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3305790424346924},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.26693427562713623},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.25440657138824463},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20918193459510803},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1299966275691986},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11724233627319336},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.09357133507728577},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1364/opticaopen.26170123.v1","doi":"https://doi.org/10.1364/opticaopen.26170123.v1","is_oa":false,"landing_page_url":"https://doi.org/10.1364/opticaopen.26170123.v1","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"Optica Open","raw_type":"posted-content"},{"id":"pmh:oai:figshare.com:article/26170123","doi":null,"is_oa":true,"landing_page_url":"https://figshare.com/articles/preprint/Increasing_the_Precision_of_Transmission_Spectroscopy_by_Optimization_of_Thin_Film_Surface_Shapes/26170123","pdf_url":"https://figshare.com/articles/preprint/Increasing_the_Precision_of_Transmission_Spectroscopy_by_Optimization_of_Thin_Film_Surface_Shapes/26170123","source":{"id":"https://openalex.org/S4377196282","display_name":"Figshare","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4210132348","host_organization_name":"Figshare (United Kingdom)","host_organization_lineage":["https://openalex.org/I4210132348"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:figshare.com:article/26170123","doi":null,"is_oa":true,"landing_page_url":"https://figshare.com/articles/preprint/Increasing_the_Precision_of_Transmission_Spectroscopy_by_Optimization_of_Thin_Film_Surface_Shapes/26170123","pdf_url":"https://figshare.com/articles/preprint/Increasing_the_Precision_of_Transmission_Spectroscopy_by_Optimization_of_Thin_Film_Surface_Shapes/26170123","source":{"id":"https://openalex.org/S4377196282","display_name":"Figshare","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4210132348","host_organization_name":"Figshare (United Kingdom)","host_organization_lineage":["https://openalex.org/I4210132348"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Text"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4400324563.pdf","grobid_xml":"https://content.openalex.org/works/W4400324563.grobid-xml"},"referenced_works_count":5,"referenced_works":["https://openalex.org/W2013627020","https://openalex.org/W2108650516","https://openalex.org/W2312985032","https://openalex.org/W2971667511","https://openalex.org/W4306366835"],"related_works":["https://openalex.org/W3108416994","https://openalex.org/W7084099268","https://openalex.org/W2010302385","https://openalex.org/W46226046","https://openalex.org/W3217748855","https://openalex.org/W7132687709","https://openalex.org/W2379232394","https://openalex.org/W2610014762","https://openalex.org/W2011556156","https://openalex.org/W4400518846"],"abstract_inverted_index":{"While":[0],"thin":[1],"film":[2,28],"transmission":[3],"spectroscopy":[4],"systems":[5],"can":[6],"measure":[7],"semiconductor":[8],"optical":[9],"properties,":[10],"the":[11,20],"utilized":[12],"optimization-based":[13],"evaluation":[14],"methods":[15],"often":[16],"introduce":[17,23],"variances":[18],"in":[19],"results.":[21],"We":[22],"a":[24],"method":[25],"of":[26],"optimizing":[27],"surface":[29],"shapes":[30],"that":[31],"reduces":[32],"this":[33],"uncertainty.":[34]},"counts_by_year":[],"updated_date":"2026-10-13T10:08:12.033832","created_date":"2024-07-06T00:00:00"}