{"id":"https://openalex.org/W4399798596","doi":"https://doi.org/10.1049/icp.2024.0599","title":"Measurement of partial discharge of power cables using oscillatory wave test system","display_name":"Measurement of partial discharge of power cables using oscillatory wave test system","publication_year":2023,"publication_date":"2023-09-01","ids":{"openalex":"https://openalex.org/W4399798596","doi":"https://doi.org/10.1049/icp.2024.0599"},"language":"en","primary_location":{"id":"doi:10.1049/icp.2024.0599","doi":"https://doi.org/10.1049/icp.2024.0599","is_oa":false,"landing_page_url":"https://doi.org/10.1049/icp.2024.0599","pdf_url":null,"source":{"id":"https://openalex.org/S4404663355","display_name":"IET conference proceedings.","issn_l":"2732-4494","issn":["2732-4494"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Conference Proceedings","raw_type":"journal-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Arunjothi Rajendran","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I109493002","display_name":"Central Power Research Institute","ror":"https://ror.org/00d1evr30","country_code":"IN","type":"government","lineage":["https://openalex.org/I109493002"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Arunjothi Rajendran","raw_affiliation_strings":["Central Power Research Institute, Bangalore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Central Power Research Institute, Bangalore, India","institution_ids":["https://openalex.org/I109493002"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050373997","display_name":"Dillip Kumar Puhan","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I109493002","display_name":"Central Power Research Institute","ror":"https://ror.org/00d1evr30","country_code":"IN","type":"government","lineage":["https://openalex.org/I109493002"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Dillip Kumar Puhan","raw_affiliation_strings":["Central Power Research Institute, Bangalore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Central Power Research Institute, Bangalore, India","institution_ids":["https://openalex.org/I109493002"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066385874","display_name":"Thirumurthy","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I109493002","display_name":"Central Power Research Institute","ror":"https://ror.org/00d1evr30","country_code":"IN","type":"government","lineage":["https://openalex.org/I109493002"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Thirumurthy","raw_affiliation_strings":["Central Power Research Institute, Bangalore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Central Power Research Institute, Bangalore, India","institution_ids":["https://openalex.org/I109493002"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003934077","display_name":"K. P. Meena","orcid":"https://orcid.org/0000-0003-2892-3264","observed_orcids":["https://orcid.org/0000-0003-2892-3264"]},"institutions":[{"id":"https://openalex.org/I109493002","display_name":"Central Power Research Institute","ror":"https://ror.org/00d1evr30","country_code":"IN","type":"government","lineage":["https://openalex.org/I109493002"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"K. P. Meena","raw_affiliation_strings":["Central Power Research Institute, Bangalore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Central Power Research Institute, Bangalore, India","institution_ids":["https://openalex.org/I109493002"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I109493002"],"apc_list":null,"apc_paid":null,"fwci":0.8963,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.61612869,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":"2023","issue":"46","first_page":"670","last_page":"675"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.0013000000035390258,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/partial-discharge-measurement","display_name":"partial discharge measurement","score":0.9290000200271606},{"id":"https://openalex.org/keywords/power-cables","display_name":"power cables","score":0.7509999871253967},{"id":"https://openalex.org/keywords/xlpe-cables","display_name":"XLPE cables","score":0.9739999771118164},{"id":"https://openalex.org/keywords/cable-insulation-condition-assessment","display_name":"cable insulation condition assessment","score":0.7689999938011169},{"id":"https://openalex.org/keywords/voids-in-insulation","display_name":"voids in insulation","score":0.6340000033378601},{"id":"https://openalex.org/keywords/matlab-simulink-simulation","display_name":"Simulink simulation","score":0.6800000071525574},{"id":"https://openalex.org/keywords/pscad-simulation","display_name":"PSCAD simulation","score":0.8790000081062317}],"concepts":[{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.8561598062515259},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46301907300949097},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.46107247471809387},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4138012230396271},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3699157238006592},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3396817445755005},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2997719943523407},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.287280797958374},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1589268147945404},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1049/icp.2024.0599","doi":"https://doi.org/10.1049/icp.2024.0599","is_oa":false,"landing_page_url":"https://doi.org/10.1049/icp.2024.0599","pdf_url":null,"source":{"id":"https://openalex.org/S4404663355","display_name":"IET conference proceedings.","issn_l":"2732-4494","issn":["2732-4494"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Conference Proceedings","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2982621072","https://openalex.org/W3106988576","https://openalex.org/W2484153135","https://openalex.org/W2385094529","https://openalex.org/W2079012666","https://openalex.org/W2362916984","https://openalex.org/W832591188","https://openalex.org/W2128448070","https://openalex.org/W2390824683","https://openalex.org/W2887088248"],"abstract_inverted_index":{"Oscillating":[0],"Wave":[1],"Test":[2],"System":[3],"-":[4],"OWTS":[5,85,119],"using":[6,126],"damped":[7,111],"AC":[8,18,49,112],"Voltages":[9],"(DAC)":[10,51],"is":[11,31,35,52,88,140],"an":[12,53],"alternative":[13],"test":[14,46,86,224],"method":[15,33,57],"for":[16,21,67,205],"continuous":[17,109],"voltage":[19,70,137,193,225],"testing":[20],"partial":[22,105,170,187,202],"discharge":[23,106,171,188,203],"measurement":[24,96,107,189,204],"of":[25,41,44,65,73,77,84,131,151,173,208,214,231],"power":[26,82,93,215],"cables":[27,72,216],"at":[28],"field.":[29],"It":[30],"a":[32,165],"which":[34],"used":[36],"to":[37,58,91],"analyse":[38],"the":[39,42,63,118,127,157,169,174,199,228],"healthiness":[40],"insulation":[43,66],"capacitive":[45],"object.":[47],"Damped":[48],"voltages":[50,113],"effective":[54],"and":[55,61,100,133,146,156,168,182,211,222,233],"portable":[56],"detect":[59],"PD":[60,95,122,158],"assess":[62],"condition":[64],"on-site":[68],"medium":[69,136],"XLPE":[71,138,154,175],"very":[74],"long":[75],"length":[76],"high":[78],"capacitance.":[79],"The":[80,148,186,201],"input":[81],"requirement":[83],"system":[87,120],"low":[89],"compared":[90,178,218],"conventional":[92],"frequency":[94,226],"system.":[97],"IEEE":[98,101],"400":[99],"400.4":[102],"standards":[103],"recommend":[104],"by":[108],"or":[110],"(DAC).":[114],"In":[115],"this":[116],"paper,":[117],"with":[121,179,190,219],"detection":[123],"are":[124,161,177,217],"simulated":[125,142,149,196],"SIMULINK":[128,181,232],"tool":[129],"box":[130],"MATLAB":[132,145],"PSCAD.":[134,147,234],"Defective":[135],"cable":[139,176],"also":[141,195],"in":[143,197,227],"both":[144,180,198],"circuits":[150],"OWTS,":[152],"defective":[153],"Cable":[155],"Detection":[159],"circuit":[160,167],"all":[162],"integrated":[163],"as":[164],"one":[166],"characteristics":[172],"PSCAD":[183],"software":[184],"platforms.":[185,200],"50":[191,220],"Hz":[192,221],"was":[194],"various":[206,212],"dimensions":[207],"void":[209],"sizes":[210],"rating":[213],"Oscillatory":[223],"simulation":[229],"environment":[230]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2024-06-20T00:00:00"}