{"id":"https://openalex.org/W4396915340","doi":"https://doi.org/10.1117/12.2692531","title":"Freeform manufacturing process optimized by automatically generated CAD model","display_name":"Freeform manufacturing process optimized by automatically generated CAD model","publication_year":2024,"publication_date":"2024-05-15","ids":{"openalex":"https://openalex.org/W4396915340","doi":"https://doi.org/10.1117/12.2692531"},"language":"en","primary_location":{"id":"doi:10.1117/12.2692531","doi":"https://doi.org/10.1117/12.2692531","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2692531","pdf_url":null,"source":{"id":"https://openalex.org/S4363607920","display_name":"International Optical Design Conference","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Optical Design Conference 2023","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102007879","display_name":"Yiwen Fan","orcid":"https://orcid.org/0000-0002-5029-2107","observed_orcids":["https://orcid.org/0000-0002-5029-2107"]},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yiwen Fan","raw_affiliation_strings":["The Institute of Optics, Univ. of Rochester (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Institute of Optics, Univ. of Rochester (United States)","institution_ids":["https://openalex.org/I5388228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072282448","display_name":"Daniel K. Nikolov","orcid":"https://orcid.org/0000-0002-5075-0075","observed_orcids":["https://orcid.org/0000-0002-5075-0075","https://orcid.org/0000-0002-2233-2108"]},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Daniel K. Nikolov","raw_affiliation_strings":["The Institute of Optics, Univ. of Rochester (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Institute of Optics, Univ. of Rochester (United States)","institution_ids":["https://openalex.org/I5388228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113208022","display_name":"Mike Pomerantz","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mike Pomerantz","raw_affiliation_strings":["The Institute of Optics, Univ. of Rochester (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Institute of Optics, Univ. of Rochester (United States)","institution_ids":["https://openalex.org/I5388228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016130665","display_name":"A. Nick Vamivakas","orcid":"https://orcid.org/0000-0003-4253-1611","observed_orcids":["https://orcid.org/0000-0003-4253-1611"]},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Nick Vamivakas","raw_affiliation_strings":["The Institute of Optics, Univ. of Rochester (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Institute of Optics, Univ. of Rochester (United States)","institution_ids":["https://openalex.org/I5388228"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004153189","display_name":"Jannick P. Rolland","orcid":"https://orcid.org/0000-0003-2747-4022","observed_orcids":["https://orcid.org/0000-0003-2747-4022"]},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jannick P. Rolland","raw_affiliation_strings":["The Institute of Optics, Univ. of Rochester (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Institute of Optics, Univ. of Rochester (United States)","institution_ids":["https://openalex.org/I5388228"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I5388228"],"apc_list":null,"apc_paid":null,"fwci":1.4244,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.77352941,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"82","last_page":"82"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.6596999764442444,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.6596999764442444,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10783","display_name":"Additive Manufacturing and 3D Printing Technologies","score":0.20999999344348907,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.05510000139474869,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/datum","display_name":"datum","score":0.7419999837875366},{"id":"https://openalex.org/keywords/fiducials","display_name":"fiducials","score":0.9929999709129333},{"id":"https://openalex.org/keywords/dimensional-metrology","display_name":"dimensional metrology","score":0.5839999914169312},{"id":"https://openalex.org/keywords/process-optimization","display_name":"process optimization","score":0.5529999732971191}],"concepts":[{"id":"https://openalex.org/C194789388","wikidata":"https://www.wikidata.org/wiki/Q17855283","display_name":"CAD","level":2,"score":0.8741898536682129},{"id":"https://openalex.org/C58754882","wikidata":"https://www.wikidata.org/wiki/Q1502887","display_name":"Geodetic datum","level":2,"score":0.7040424942970276},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6987632513046265},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6383944153785706},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.6180816888809204},{"id":"https://openalex.org/C173974348","wikidata":"https://www.wikidata.org/wiki/Q1469893","display_name":"Fiducial marker","level":2,"score":0.5332118272781372},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5268106460571289},{"id":"https://openalex.org/C108882727","wikidata":"https://www.wikidata.org/wiki/Q2991685","display_name":"Solid modeling","level":2,"score":0.5169767141342163},{"id":"https://openalex.org/C119823426","wikidata":"https://www.wikidata.org/wiki/Q184793","display_name":"Computer Aided Design","level":2,"score":0.4988892078399658},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2255552113056183},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1908998191356659},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.10741710662841797},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C58640448","wikidata":"https://www.wikidata.org/wiki/Q42515","display_name":"Cartography","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.2692531","doi":"https://doi.org/10.1117/12.2692531","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2692531","pdf_url":null,"source":{"id":"https://openalex.org/S4363607920","display_name":"International Optical Design Conference","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Optical Design Conference 2023","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2142880224","https://openalex.org/W3001039664","https://openalex.org/W3118956845","https://openalex.org/W3158695919","https://openalex.org/W3211179500"],"related_works":["https://openalex.org/W4415590017","https://openalex.org/W2947507835","https://openalex.org/W2364759060","https://openalex.org/W387852170","https://openalex.org/W7075598347","https://openalex.org/W1970704729","https://openalex.org/W4324323382","https://openalex.org/W4230906833","https://openalex.org/W2332116760","https://openalex.org/W2323467399"],"abstract_inverted_index":{"We":[0],"developed,":[1],"tested,":[2],"and":[3,19,30],"applied":[4],"a":[5],"software":[6],"tool":[7],"that":[8],"automatically":[9],"generates":[10],"high-accuracy":[11],"CAD":[12],"models":[13],"of":[14],"freeform":[15,26],"elements":[16],"with":[17],"datums":[18],"fiducials,":[20],"facilitating":[21],"the":[22],"efficient":[23],"transition":[24],"from":[25],"design":[27],"to":[28],"fabrication":[29],"measurement.":[31]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2024-05-16T00:00:00"}