{"id":"https://openalex.org/W4396608596","doi":"https://doi.org/10.1007/s00339-024-07511-w","title":"Light-triggered defect dynamics in silicon wafers: understanding degradation mechanisms","display_name":"Light-triggered defect dynamics in silicon wafers: understanding degradation mechanisms","publication_year":2024,"publication_date":"2024-05-01","ids":{"openalex":"https://openalex.org/W4396608596","doi":"https://doi.org/10.1007/s00339-024-07511-w"},"language":"en","primary_location":{"id":"doi:10.1007/s00339-024-07511-w","doi":"https://doi.org/10.1007/s00339-024-07511-w","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00339-024-07511-w","pdf_url":null,"source":{"id":"https://openalex.org/S52123058","display_name":"Applied Physics A","issn_l":"0947-8396","issn":["0947-8396","1432-0630"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","dongbi-d","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics A","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5093633009","display_name":"Yougherta Chibane","orcid":"https://orcid.org/0000-0002-2411-1392","observed_orcids":["https://orcid.org/0000-0002-2411-1392"]},"institutions":[{"id":"https://openalex.org/I108754898","display_name":"Badji Mokhtar-Annaba University","ror":"https://ror.org/03sf55932","country_code":"DZ","type":"education","lineage":["https://openalex.org/I108754898"]}],"countries":["DZ"],"is_corresponding":true,"raw_author_name":"Yougherta Chibane","raw_affiliation_strings":["Laboratory of Semiconductors (LSC), Department of Physics, Faculty of Sciences, Badji Mokhtar University, Annaba, Algeria"],"raw_orcid":"https://orcid.org/0000-0002-2411-1392","affiliations":[{"raw_affiliation_string":"Laboratory of Semiconductors (LSC), Department of Physics, Faculty of Sciences, Badji Mokhtar University, Annaba, Algeria","institution_ids":["https://openalex.org/I108754898"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073530392","display_name":"Yacine Kouhlane","orcid":"https://orcid.org/0000-0003-4849-7928","observed_orcids":["https://orcid.org/0000-0003-4849-7928"]},"institutions":[{"id":"https://openalex.org/I108754898","display_name":"Badji Mokhtar-Annaba University","ror":"https://ror.org/03sf55932","country_code":"DZ","type":"education","lineage":["https://openalex.org/I108754898"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"Yacine Kouhlane","raw_affiliation_strings":["Laboratory of Advanced Systems and Materials (LASMA), Department of Physics, Faculty of Sciences, Badji Mokhtar University, Annaba, Algeria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Advanced Systems and Materials (LASMA), Department of Physics, Faculty of Sciences, Badji Mokhtar University, Annaba, Algeria","institution_ids":["https://openalex.org/I108754898"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067205602","display_name":"Djoudi Bouhafs","orcid":"https://orcid.org/0000-0002-7059-6810","observed_orcids":["https://orcid.org/0000-0002-7059-6810"]},"institutions":[{"id":"https://openalex.org/I4210162261","display_name":"Centre de Recherche en Technologie des Semi-conducteurs pour l\u2019Energ\u00e9tique","ror":"https://ror.org/04kymnq52","country_code":"DZ","type":"facility","lineage":["https://openalex.org/I4210162261"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"Djoudi Bouhafs","raw_affiliation_strings":["Research Center in Semiconductor Technology for the Energetic (CRTSE), Algiers, Algeria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Center in Semiconductor Technology for the Energetic (CRTSE), Algiers, Algeria","institution_ids":["https://openalex.org/I4210162261"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112896992","display_name":"Wafa Achour","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210162261","display_name":"Centre de Recherche en Technologie des Semi-conducteurs pour l\u2019Energ\u00e9tique","ror":"https://ror.org/04kymnq52","country_code":"DZ","type":"facility","lineage":["https://openalex.org/I4210162261"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"Wafa Achour","raw_affiliation_strings":["Research Center in Semiconductor Technology for the Energetic (CRTSE), Algiers, Algeria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Center in Semiconductor Technology for the Energetic (CRTSE), Algiers, Algeria","institution_ids":["https://openalex.org/I4210162261"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054759779","display_name":"Asmaa Mohammed-Krarroubi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210162261","display_name":"Centre de Recherche en Technologie des Semi-conducteurs pour l\u2019Energ\u00e9tique","ror":"https://ror.org/04kymnq52","country_code":"DZ","type":"facility","lineage":["https://openalex.org/I4210162261"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"Asmaa Mohammed-Krarroubi","raw_affiliation_strings":["Research Center in Semiconductor Technology for the Energetic (CRTSE), Algiers, Algeria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Center in Semiconductor Technology for the Energetic (CRTSE), Algiers, Algeria","institution_ids":["https://openalex.org/I4210162261"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025623105","display_name":"Amar Khelfane","orcid":"https://orcid.org/0000-0003-1450-8502","observed_orcids":["https://orcid.org/0000-0003-1450-8502"]},"institutions":[{"id":"https://openalex.org/I4210162261","display_name":"Centre de Recherche en Technologie des Semi-conducteurs pour l\u2019Energ\u00e9tique","ror":"https://ror.org/04kymnq52","country_code":"DZ","type":"facility","lineage":["https://openalex.org/I4210162261"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"Amar Khelfane","raw_affiliation_strings":["Research Center in Semiconductor Technology for the Energetic (CRTSE), Algiers, Algeria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Center in Semiconductor Technology for the Energetic (CRTSE), Algiers, Algeria","institution_ids":["https://openalex.org/I4210162261"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5093633009"],"corresponding_institution_ids":["https://openalex.org/I108754898"],"apc_list":{"value":3590,"currency":"USD","value_usd":3590},"apc_paid":null,"fwci":0.3942,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.47987138,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":96},"biblio":{"volume":"130","issue":"5","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/light-induced-degradation","display_name":"light-induced degradation","score":0.8970000147819519},{"id":"https://openalex.org/keywords/minority-carrier-lifetime","display_name":"minority carrier lifetime","score":0.8690000176429749},{"id":"https://openalex.org/keywords/crystalline-silicon-wafers","display_name":"crystalline silicon wafers","score":0.871999979019165},{"id":"https://openalex.org/keywords/boron-doped-silicon","display_name":"boron-doped silicon","score":0.875},{"id":"https://openalex.org/keywords/silicon-nitride-coating","display_name":"silicon nitride coating","score":0.6890000104904175},{"id":"https://openalex.org/keywords/boron-oxygen-complexes","display_name":"boron-oxygen complexes","score":0.9860000014305115},{"id":"https://openalex.org/keywords/defect-kinetics","display_name":"defect kinetics","score":0.4819999933242798},{"id":"https://openalex.org/keywords/dark-annealing","display_name":"dark annealing","score":0.9020000100135803},{"id":"https://openalex.org/keywords/heat-treatment","display_name":"heat treatment","score":0.8059999942779541},{"id":"https://openalex.org/keywords/solar-cell-degradation","display_name":"solar cell degradation","score":0.6129999756813049}],"concepts":[{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.8802340030670166},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.7312027215957642},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6917446851730347},{"id":"https://openalex.org/C501308230","wikidata":"https://www.wikidata.org/wiki/Q618","display_name":"Boron","level":2,"score":0.6675773859024048},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.5926787853240967},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5493910908699036},{"id":"https://openalex.org/C512968161","wikidata":"https://www.wikidata.org/wiki/Q556","display_name":"Hydrogen","level":2,"score":0.5480388402938843},{"id":"https://openalex.org/C2777431650","wikidata":"https://www.wikidata.org/wiki/Q413828","display_name":"Silicon nitride","level":3,"score":0.5408798456192017},{"id":"https://openalex.org/C2780243435","wikidata":"https://www.wikidata.org/wiki/Q410193","display_name":"Boron nitride","level":2,"score":0.507502019405365},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.4983642101287842},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.41263532638549805},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.37518006563186646},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3193568289279938},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2163054645061493},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.12795671820640564},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.12455305457115173},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s00339-024-07511-w","doi":"https://doi.org/10.1007/s00339-024-07511-w","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00339-024-07511-w","pdf_url":null,"source":{"id":"https://openalex.org/S52123058","display_name":"Applied Physics A","issn_l":"0947-8396","issn":["0947-8396","1432-0630"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","dongbi-d","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics A","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320335007","display_name":"Direction G\u00e9n\u00e9rale de la Recherche Scientifique et du D\u00e9veloppement Technologique","ror":"https://ror.org/04jpfrv51"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":80,"referenced_works":["https://openalex.org/W1894442149","https://openalex.org/W1967125470","https://openalex.org/W1969852179","https://openalex.org/W1970562471","https://openalex.org/W1972816930","https://openalex.org/W1974221205","https://openalex.org/W1976344960","https://openalex.org/W1979036053","https://openalex.org/W1982164345","https://openalex.org/W1994129683","https://openalex.org/W2003811349","https://openalex.org/W2009338951","https://openalex.org/W2032055961","https://openalex.org/W2033773042","https://openalex.org/W2033938526","https://openalex.org/W2042032633","https://openalex.org/W2062825355","https://openalex.org/W2071178093","https://openalex.org/W2075719136","https://openalex.org/W2089800395","https://openalex.org/W2092764428","https://openalex.org/W2114492324","https://openalex.org/W2139599281","https://openalex.org/W2153838710","https://openalex.org/W2164739499","https://openalex.org/W2200447917","https://openalex.org/W2221799354","https://openalex.org/W2249931174","https://openalex.org/W2523452826","https://openalex.org/W2536720531","https://openalex.org/W2587250502","https://openalex.org/W2729448572","https://openalex.org/W2785948445","https://openalex.org/W2800537374","https://openalex.org/W2809602001","https://openalex.org/W2885103377","https://openalex.org/W2889516961","https://openalex.org/W2903458473","https://openalex.org/W2904691817","https://openalex.org/W2941558042","https://openalex.org/W2947061602","https://openalex.org/W3007983981","https://openalex.org/W3088890537","https://openalex.org/W3101764385","https://openalex.org/W3119997254","https://openalex.org/W3133571747","https://openalex.org/W3142395563","https://openalex.org/W3145860238","https://openalex.org/W3154946877","https://openalex.org/W3172770400","https://openalex.org/W3186062764","https://openalex.org/W3202798198","https://openalex.org/W3207614420","https://openalex.org/W3211053780","https://openalex.org/W3214365969","https://openalex.org/W4206514604","https://openalex.org/W4213389122","https://openalex.org/W4224918492","https://openalex.org/W4225274903","https://openalex.org/W4229015488","https://openalex.org/W4229071842","https://openalex.org/W4229078657","https://openalex.org/W4283212598","https://openalex.org/W4283263040","https://openalex.org/W4283719495","https://openalex.org/W4296963491","https://openalex.org/W4302293186","https://openalex.org/W4306916606","https://openalex.org/W4308887834","https://openalex.org/W4318586117","https://openalex.org/W4324144427","https://openalex.org/W4385350217","https://openalex.org/W4385977111","https://openalex.org/W4387756707","https://openalex.org/W4388713768","https://openalex.org/W4389785908","https://openalex.org/W4390189447","https://openalex.org/W6884968801","https://openalex.org/W6889763143","https://openalex.org/W6908463229"],"related_works":["https://openalex.org/W2059743869","https://openalex.org/W2757102828","https://openalex.org/W3034917671","https://openalex.org/W6891660496","https://openalex.org/W1663383707","https://openalex.org/W7057633954","https://openalex.org/W2904691817","https://openalex.org/W3154946877","https://openalex.org/W3123508656","https://openalex.org/W4405176777"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2}],"updated_date":"2026-10-17T09:40:24.721904","created_date":"2024-05-04T00:00:00"}