{"id":"https://openalex.org/W4394566528","doi":"https://doi.org/10.1002/qre.3555","title":"A new ordering method of basic events in dynamic fault tree for sequential binary decision diagram","display_name":"A new ordering method of basic events in dynamic fault tree for sequential binary decision diagram","publication_year":2024,"publication_date":"2024-04-08","ids":{"openalex":"https://openalex.org/W4394566528","doi":"https://doi.org/10.1002/qre.3555"},"language":"en","primary_location":{"id":"doi:10.1002/qre.3555","doi":"https://doi.org/10.1002/qre.3555","is_oa":false,"landing_page_url":"https://doi.org/10.1002/qre.3555","pdf_url":null,"source":{"id":"https://openalex.org/S165633816","display_name":"Quality and Reliability Engineering International","issn_l":"0748-8017","issn":["0748-8017","1099-1638"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Quality and Reliability Engineering International","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109829615","display_name":"Tudi Huang","orcid":"https://orcid.org/0009-0000-5296-8564","observed_orcids":["https://orcid.org/0009-0000-5296-8564"]},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tudi Huang","raw_affiliation_strings":["Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, Sichuan, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, Sichuan, P. R. China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049965078","display_name":"Ying Zeng","orcid":"https://orcid.org/0000-0003-4162-6387","observed_orcids":["https://orcid.org/0000-0003-4162-6387","https://orcid.org/0009-0003-2335-9614"]},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ying Zeng","raw_affiliation_strings":["Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, Sichuan, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, Sichuan, P. R. China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100653134","display_name":"Yan\u2010Feng Li","orcid":"https://orcid.org/0000-0002-9121-1465","observed_orcids":["https://orcid.org/0000-0002-9121-1465"]},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yan\u2010Feng Li","raw_affiliation_strings":["Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, Sichuan, P. R. China"],"raw_orcid":"https://orcid.org/0000-0002-9121-1465","affiliations":[{"raw_affiliation_string":"Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, Sichuan, P. R. China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014627828","display_name":"Jun Liu","orcid":"https://orcid.org/0000-0003-3242-3182","observed_orcids":["https://orcid.org/0000-0003-3242-3182"]},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Liu","raw_affiliation_strings":["Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, Sichuan, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, Sichuan, P. R. China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069596116","display_name":"Hong\u2010Zhong Huang","orcid":"https://orcid.org/0000-0003-4478-8349","observed_orcids":["https://orcid.org/0000-0003-4478-8349"]},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hong\u2010Zhong Huang","raw_affiliation_strings":["Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, Sichuan, P. R. China"],"raw_orcid":"https://orcid.org/0000-0003-4478-8349","affiliations":[{"raw_affiliation_string":"Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, Sichuan, P. R. China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5069596116","https://openalex.org/A5100653134"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":{"value":4330,"currency":"USD","value_usd":4330},"apc_paid":null,"fwci":1.6667,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.86221476,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"40","issue":"5","first_page":"2904","last_page":"2914"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9204000234603882,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9204000234603882,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.05180000141263008,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.004100000020116568,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dynamic-fault-trees","display_name":"dynamic fault trees","score":0.9739999771118164},{"id":"https://openalex.org/keywords/reliability-analysis","display_name":"reliability analysis","score":0.7390000224113464}],"concepts":[{"id":"https://openalex.org/C3309909","wikidata":"https://www.wikidata.org/wiki/Q864155","display_name":"Binary decision diagram","level":2,"score":0.8285971879959106},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6650452613830566},{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.6417601108551025},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5860722064971924},{"id":"https://openalex.org/C20837028","wikidata":"https://www.wikidata.org/wiki/Q623966","display_name":"Influence diagram","level":3,"score":0.5320124626159668},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.5269069075584412},{"id":"https://openalex.org/C186399060","wikidata":"https://www.wikidata.org/wiki/Q959962","display_name":"Diagram","level":2,"score":0.4801566004753113},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4760981798171997},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4646992087364197},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.39573949575424194},{"id":"https://openalex.org/C84525736","wikidata":"https://www.wikidata.org/wiki/Q831366","display_name":"Decision tree","level":2,"score":0.3733745515346527},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34440597891807556},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22438591718673706},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1430867612361908},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.05997022986412048},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/qre.3555","doi":"https://doi.org/10.1002/qre.3555","is_oa":false,"landing_page_url":"https://doi.org/10.1002/qre.3555","pdf_url":null,"source":{"id":"https://openalex.org/S165633816","display_name":"Quality and Reliability Engineering International","issn_l":"0748-8017","issn":["0748-8017","1099-1638"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Quality and Reliability Engineering International","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G3404834100","display_name":null,"funder_award_id":"J2019-IV-0001-0068","funder_id":"https://openalex.org/F4320329860","funder_display_name":"National Science and Technology Major Project"}],"funders":[{"id":"https://openalex.org/F4320329860","display_name":"National Science and Technology Major Project","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W597526143","https://openalex.org/W1954843585","https://openalex.org/W1965047962","https://openalex.org/W2018550389","https://openalex.org/W2033997465","https://openalex.org/W2053619330","https://openalex.org/W2079038730","https://openalex.org/W2095783266","https://openalex.org/W2104496936","https://openalex.org/W2116110829","https://openalex.org/W2136245106","https://openalex.org/W2151761246","https://openalex.org/W2152078980","https://openalex.org/W2154884120","https://openalex.org/W2158392936","https://openalex.org/W2163267540","https://openalex.org/W2419439244","https://openalex.org/W2793058854","https://openalex.org/W2944417109","https://openalex.org/W3045887866","https://openalex.org/W3047165269","https://openalex.org/W3049636381","https://openalex.org/W3091340434","https://openalex.org/W3112635018","https://openalex.org/W3156111803","https://openalex.org/W4324045057","https://openalex.org/W4375793444","https://openalex.org/W4391755707"],"related_works":["https://openalex.org/W597526143","https://openalex.org/W3112635018","https://openalex.org/W4293824716","https://openalex.org/W2095783266","https://openalex.org/W2352002655","https://openalex.org/W2076921432","https://openalex.org/W2361464998","https://openalex.org/W2152078980","https://openalex.org/W2061019130","https://openalex.org/W1965047962"],"abstract_inverted_index":{"Abstract":[0],"Dynamic":[1],"fault":[2],"tree":[3],"(DFT)":[4],"is":[5],"a":[6,49],"reliable":[7],"method":[8,32],"for":[9,57],"modeling":[10],"complex":[11],"systems":[12,22],"with":[13],"dynamic":[14],"characteristics.":[15],"However,":[16],"evaluating":[17],"the":[18,52,65],"reliability":[19],"of":[20],"such":[21],"can":[23],"be":[24],"complex.":[25],"The":[26],"sequential":[27],"binary":[28],"decision":[29],"diagram":[30],"(SBDD)":[31],"simplifies":[33],"this":[34],"process":[35],"by":[36],"reducing":[37],"computational":[38],"complexity.":[39],"This":[40],"study":[41],"investigates":[42],"factors":[43],"influencing":[44],"SBDD":[45],"size":[46],"and":[47],"proposes":[48],"new":[50],"method,":[51,56],"complete":[53],"priority":[54],"ordering":[55,58],"basic":[59],"events":[60],"in":[61,68],"SBDDs.":[62],"Results":[63],"demonstrate":[64],"method's":[66],"effectiveness":[67],"comparison":[69],"to":[70],"existing":[71],"approaches.":[72]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2024-04-09T00:00:00"}