{"id":"https://openalex.org/W4393973671","doi":"https://doi.org/10.1109/icops45740.2023.10481055","title":"Developing a Crossed-Field Test Structure with Gate Field Emission Arrays","display_name":"Developing a Crossed-Field Test Structure with Gate Field Emission Arrays","publication_year":2023,"publication_date":"2023-05-21","ids":{"openalex":"https://openalex.org/W4393973671","doi":"https://doi.org/10.1109/icops45740.2023.10481055"},"language":"en","primary_location":{"id":"doi:10.1109/icops45740.2023.10481055","doi":"https://doi.org/10.1109/icops45740.2023.10481055","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icops45740.2023.10481055","pdf_url":null,"source":{"id":"https://openalex.org/S4363607929","display_name":"IEEE International Conference on Plasma Science (ICOPS)","issn_l":"0730-9244","issn":["0730-9244","2576-7208"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Conference on Plasma Science (ICOPS)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"C. Segura Del Rio","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I120156002","display_name":"Boise State University","ror":"https://ror.org/02e3zdp86","country_code":"US","type":"education","lineage":["https://openalex.org/I120156002"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. Segura Del Rio","raw_affiliation_strings":["Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","institution_ids":["https://openalex.org/I120156002"]},{"raw_affiliation_string":"Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America","institution_ids":["https://openalex.org/I120156002"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005506403","display_name":"Cody Oberbeck","orcid":"https://orcid.org/0009-0001-7486-9492","observed_orcids":["https://orcid.org/0009-0001-7486-9492"]},"institutions":[{"id":"https://openalex.org/I120156002","display_name":"Boise State University","ror":"https://ror.org/02e3zdp86","country_code":"US","type":"education","lineage":["https://openalex.org/I120156002"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. Oberbeck","raw_affiliation_strings":["Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","institution_ids":["https://openalex.org/I120156002"]},{"raw_affiliation_string":"Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America","institution_ids":["https://openalex.org/I120156002"]}]},{"author_position":"middle","author":{"id":null,"display_name":"R. Briggs","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I120156002","display_name":"Boise State University","ror":"https://ror.org/02e3zdp86","country_code":"US","type":"education","lineage":["https://openalex.org/I120156002"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Briggs","raw_affiliation_strings":["Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","institution_ids":["https://openalex.org/I120156002"]},{"raw_affiliation_string":"Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America","institution_ids":["https://openalex.org/I120156002"]}]},{"author_position":"middle","author":{"id":null,"display_name":"R. Bhattacharjee","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I120156002","display_name":"Boise State University","ror":"https://ror.org/02e3zdp86","country_code":"US","type":"education","lineage":["https://openalex.org/I120156002"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Bhattacharjee","raw_affiliation_strings":["Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","institution_ids":["https://openalex.org/I120156002"]},{"raw_affiliation_string":"Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America","institution_ids":["https://openalex.org/I120156002"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040869804","display_name":"Ranajoy Bhattacharya","orcid":"https://orcid.org/0000-0002-7965-1986","observed_orcids":["https://orcid.org/0000-0002-7965-1986"]},"institutions":[{"id":"https://openalex.org/I120156002","display_name":"Boise State University","ror":"https://ror.org/02e3zdp86","country_code":"US","type":"education","lineage":["https://openalex.org/I120156002"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Bhattacharya","raw_affiliation_strings":["Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","institution_ids":["https://openalex.org/I120156002"]},{"raw_affiliation_string":"Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America","institution_ids":["https://openalex.org/I120156002"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028094116","display_name":"Marcus Pearlman","orcid":"https://orcid.org/0000-0003-1792-179X","observed_orcids":["https://orcid.org/0000-0003-1792-179X"]},"institutions":[{"id":"https://openalex.org/I120156002","display_name":"Boise State University","ror":"https://ror.org/02e3zdp86","country_code":"US","type":"education","lineage":["https://openalex.org/I120156002"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Pearlman","raw_affiliation_strings":["Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","institution_ids":["https://openalex.org/I120156002"]},{"raw_affiliation_string":"Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America","institution_ids":["https://openalex.org/I120156002"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048679872","display_name":"Nedeljko Karaulac","orcid":"https://orcid.org/0000-0002-1545-0843","observed_orcids":["https://orcid.org/0000-0002-1545-0843"]},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. Karaulac","raw_affiliation_strings":["Massachusetts Institute of Technology,Electrical Engineering and Computer Science,Cambridge,Massachusetts,United States of America","Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology,Electrical Engineering and Computer Science,Cambridge,Massachusetts,United States of America","institution_ids":["https://openalex.org/I63966007"]},{"raw_affiliation_string":"Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States of America","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018574560","display_name":"Girish Rughoobur","orcid":"https://orcid.org/0000-0002-1693-4532","observed_orcids":["https://orcid.org/0000-0002-1693-4532"]},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"G. Rughoobur","raw_affiliation_strings":["Massachusetts Institute of Technology,Electrical Engineering and Computer Science,Cambridge,Massachusetts,United States of America","Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology,Electrical Engineering and Computer Science,Cambridge,Massachusetts,United States of America","institution_ids":["https://openalex.org/I63966007"]},{"raw_affiliation_string":"Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States of America","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111888752","display_name":"Winston Chern","orcid":"https://orcid.org/0000-0002-5452-8009","observed_orcids":["https://orcid.org/0000-0002-5452-8009"]},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W. Chern","raw_affiliation_strings":["Massachusetts Institute of Technology,Electrical Engineering and Computer Science,Cambridge,Massachusetts,United States of America","Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology,Electrical Engineering and Computer Science,Cambridge,Massachusetts,United States of America","institution_ids":["https://openalex.org/I63966007"]},{"raw_affiliation_string":"Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States of America","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063695026","display_name":"Akintunde I. Akinwande","orcid":"https://orcid.org/0000-0003-3001-9223","observed_orcids":["https://orcid.org/0000-0003-3001-9223"]},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A.I. Akinwande","raw_affiliation_strings":["Massachusetts Institute of Technology,Electrical Engineering and Computer Science,Cambridge,Massachusetts,United States of America","Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology,Electrical Engineering and Computer Science,Cambridge,Massachusetts,United States of America","institution_ids":["https://openalex.org/I63966007"]},{"raw_affiliation_string":"Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States of America","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080575046","display_name":"Jim Browning","orcid":"https://orcid.org/0000-0002-2768-1817","observed_orcids":["https://orcid.org/0000-0002-2768-1817"]},"institutions":[{"id":"https://openalex.org/I120156002","display_name":"Boise State University","ror":"https://ror.org/02e3zdp86","country_code":"US","type":"education","lineage":["https://openalex.org/I120156002"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Browning","raw_affiliation_strings":["Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","institution_ids":["https://openalex.org/I120156002"]},{"raw_affiliation_string":"Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America","institution_ids":["https://openalex.org/I120156002"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022174209","display_name":"B. Sainz","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I120156002","display_name":"Boise State University","ror":"https://ror.org/02e3zdp86","country_code":"US","type":"education","lineage":["https://openalex.org/I120156002"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. Sainz","raw_affiliation_strings":["Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","institution_ids":["https://openalex.org/I120156002"]},{"raw_affiliation_string":"Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America","institution_ids":["https://openalex.org/I120156002"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044220190","display_name":"N. K. Manker","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I120156002","display_name":"Boise State University","ror":"https://ror.org/02e3zdp86","country_code":"US","type":"education","lineage":["https://openalex.org/I120156002"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. Manker","raw_affiliation_strings":["Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Boise State University,Electrical and Computer Engineering Department,Boise,Idaho,United States of America","institution_ids":["https://openalex.org/I120156002"]},{"raw_affiliation_string":"Electrical and Computer Engineering Department, Boise State University, Boise, Idaho, United States of America","institution_ids":["https://openalex.org/I120156002"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11175","display_name":"Gyrotron and Vacuum Electronics Research","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11175","display_name":"Gyrotron and Vacuum Electronics Research","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","score":0.0024999999441206455,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11920","display_name":"Pulsed Power Technology Applications","score":0.0020000000949949026,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/crossed-field-amplifier","display_name":"crossed-field amplifier","score":0.9909999966621399},{"id":"https://openalex.org/keywords/field-emission","display_name":"field emission","score":0.5260000228881836},{"id":"https://openalex.org/keywords/high-voltage-pulse-generation","display_name":"high-voltage pulse generation","score":0.550000011920929},{"id":"https://openalex.org/keywords/xbee-modules","display_name":"XBee modules","score":0.6029999852180481},{"id":"https://openalex.org/keywords/vacuum-chamber-testing","display_name":"vacuum chamber testing","score":0.5630000233650208},{"id":"https://openalex.org/keywords/gain-measurement","display_name":"gain measurement","score":0.550000011920929}],"concepts":[{"id":"https://openalex.org/C121029787","wikidata":"https://www.wikidata.org/wiki/Q902877","display_name":"Field electron emission","level":3,"score":0.5826809406280518},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5526514649391174},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4812195599079132},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4071992039680481},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2114306390285492},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.15055689215660095},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.10706087946891785},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0856214165687561},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icops45740.2023.10481055","doi":"https://doi.org/10.1109/icops45740.2023.10481055","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icops45740.2023.10481055","pdf_url":null,"source":{"id":"https://openalex.org/S4363607929","display_name":"IEEE International Conference on Plasma Science (ICOPS)","issn_l":"0730-9244","issn":["0730-9244","2576-7208"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Conference on Plasma Science (ICOPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G6452617292","display_name":null,"funder_award_id":"FA9550-22-1-0434","funder_id":"https://openalex.org/F4320338279","funder_display_name":"Air Force Office of Scientific Research"}],"funders":[{"id":"https://openalex.org/F4320338279","display_name":"Air Force Office of Scientific Research","ror":"https://ror.org/011e9bt93"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1897447474","https://openalex.org/W2711522998","https://openalex.org/W3211828700"],"related_works":["https://openalex.org/W51931739","https://openalex.org/W3211828700","https://openalex.org/W4413267688","https://openalex.org/W4416798578","https://openalex.org/W3215597149","https://openalex.org/W2108731798","https://openalex.org/W2711522998","https://openalex.org/W2143303056","https://openalex.org/W1668654165","https://openalex.org/W2129911957"],"abstract_inverted_index":{"We":[0],"are":[1,24,108,140],"developing":[2,26],"a":[3,27,42,57,69,98,102,206],"Crossed-Field":[4,193],"Amplifier":[5,194],"(CFA)":[6,195],"experiment":[7,87],"utilizing":[8,173],"silicon":[9],"Gate":[10],"Field":[11],"Emitter":[12],"Arrays":[13],"(GFEA)":[14],"[1].":[15,38],"These":[16],"devices":[17],"have":[18],"9M":[19,175],"emitter":[20,36,157],"tips,":[21],"but":[22],"we":[23],"currently":[25],"driver":[28,40,64,89,112,128,166],"system":[29,90],"using":[30],"arrays":[31,121,145],"of":[32,104,148,153,184,201,208],"1000":[33,35],"x":[34,155],"tips":[37],"The":[39,63,127,159],"provides":[41],"1":[43,117],"ms":[44],"duration":[45],"square":[46],"pulse":[47,82,169],"up":[48],"to":[49,52,68,163,168,179,188],"60":[50],"V":[51],"drive":[53],"the":[54,73,81,86,88,106,111,120,134,143,165,170,192],"GFEAs":[55,107],"in":[56,191],"repetitive":[58],"or":[59],"single":[60],"shot":[61],"mode.":[62],"circuit":[65,129,167],"communicates":[66],"wirelessly":[67],"desktop":[70],"computer":[71],"through":[72],"\u201cXBee\u201d":[74],"ISM":[75],"2.4":[76],"GHz":[77],"module":[78],"from":[79],"where":[80],"is":[83,122,162],"triggered.":[84],"In":[85,97],"will":[91,211],"float":[92],"at":[93,101,124,197,205],"-3":[94],"kV":[95],"[2].":[96],"vacuum":[99],"chamber":[100],"pressure":[103],"10\u22128Torr":[105],"tested":[109],"with":[110,142],"circuit.":[113],"A":[114],"collector":[115],"spaced":[116],"mm":[118],"above":[119],"kept":[123],"200":[125],"V.":[126],"has":[130],"been":[131],"demonstrated":[132],"for":[133],"smaller":[135],"arrays,":[136],"and":[137],"new":[138],"experiments":[139],"underway":[141],"larger":[144],"which":[146],"consist":[147],"36":[149],"sub-arrays":[150],"(each":[151],"array":[152,177],"500":[154,156],"tips).":[158],"experimental":[160,203],"purpose":[161],"use":[164],"test":[171],"structure":[172],"eight":[174],"tip":[176],"die":[178],"generate":[180],"an":[181],"emission":[182],"current":[183],"150":[185],"mA":[186],"capable":[187],"produce":[189],"gain":[190],"designed":[196],"BSU":[198],"[3].":[199],"Design":[200],"this":[202],"CFA":[204],"frequency":[207],"900":[209],"MHz":[210],"be":[212],"discussed.":[213]},"counts_by_year":[],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2024-04-06T00:00:00"}