{"id":"https://openalex.org/W4392385162","doi":"https://doi.org/10.3390/photonics11030226","title":"A Deep Learning-Based Preprocessing Method for Single Interferometric Fringe Patterns","display_name":"A Deep Learning-Based Preprocessing Method for Single Interferometric Fringe Patterns","publication_year":2024,"publication_date":"2024-02-29","ids":{"openalex":"https://openalex.org/W4392385162","doi":"https://doi.org/10.3390/photonics11030226"},"language":"en","primary_location":{"id":"doi:10.3390/photonics11030226","doi":"https://doi.org/10.3390/photonics11030226","is_oa":true,"landing_page_url":"https://doi.org/10.3390/photonics11030226","pdf_url":"https://www.mdpi.com/2304-6732/11/3/226/pdf?version=1709214514","source":{"id":"https://openalex.org/S2738274844","display_name":"Photonics","issn_l":"2304-6732","issn":["2304-6732"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Photonics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/2304-6732/11/3/226/pdf?version=1709214514","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042678678","display_name":"Xueliang Zhu","orcid":"https://orcid.org/0000-0002-3988-2173","observed_orcids":["https://orcid.org/0000-0002-3988-2173"]},"institutions":[{"id":"https://openalex.org/I4210110558","display_name":"Xi'an Technological University","ror":"https://ror.org/01t8prc81","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210110558"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xueliang Zhu","raw_affiliation_strings":["Independent  - affiliation not provided to SSRN","Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an 710021, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Independent  - affiliation not provided to SSRN","institution_ids":[]},{"raw_affiliation_string":"Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an 710021, China","institution_ids":["https://openalex.org/I4210110558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102751042","display_name":"Di Zhang","orcid":"https://orcid.org/0009-0000-9033-1230","observed_orcids":["https://orcid.org/0009-0000-9033-1230"]},"institutions":[{"id":"https://openalex.org/I4210110558","display_name":"Xi'an Technological University","ror":"https://ror.org/01t8prc81","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210110558"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Di zhangdi","raw_affiliation_strings":["Independent  - affiliation not provided to SSRN","Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an 710021, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Independent  - affiliation not provided to SSRN","institution_ids":[]},{"raw_affiliation_string":"Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an 710021, China","institution_ids":["https://openalex.org/I4210110558"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yilei Hao","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210110558","display_name":"Xi'an Technological University","ror":"https://ror.org/01t8prc81","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210110558"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yilei Hao","raw_affiliation_strings":["Independent  - affiliation not provided to SSRN","Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an 710021, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Independent  - affiliation not provided to SSRN","institution_ids":[]},{"raw_affiliation_string":"Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an 710021, China","institution_ids":["https://openalex.org/I4210110558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000150192","display_name":"Bingcai Liu","orcid":"https://orcid.org/0000-0002-9587-9403","observed_orcids":["https://orcid.org/0000-0002-9587-9403"]},"institutions":[{"id":"https://openalex.org/I4210110558","display_name":"Xi'an Technological University","ror":"https://ror.org/01t8prc81","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210110558"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bingcai Liu","raw_affiliation_strings":["Independent  - affiliation not provided to SSRN","Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an 710021, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Independent  - affiliation not provided to SSRN","institution_ids":[]},{"raw_affiliation_string":"Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an 710021, China","institution_ids":["https://openalex.org/I4210110558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100357115","display_name":"Hongjun Wang","orcid":"https://orcid.org/0000-0002-8504-7013","observed_orcids":["https://orcid.org/0000-0002-8504-7013"]},"institutions":[{"id":"https://openalex.org/I4210110558","display_name":"Xi'an Technological University","ror":"https://ror.org/01t8prc81","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210110558"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongjun Wang","raw_affiliation_strings":["Independent  - affiliation not provided to SSRN","Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an 710021, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Independent  - affiliation not provided to SSRN","institution_ids":[]},{"raw_affiliation_string":"Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an 710021, China","institution_ids":["https://openalex.org/I4210110558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101402943","display_name":"Ailing Tian","orcid":"https://orcid.org/0000-0003-1545-0314","observed_orcids":["https://orcid.org/0000-0003-1545-0314"]},"institutions":[{"id":"https://openalex.org/I4210110558","display_name":"Xi'an Technological University","ror":"https://ror.org/01t8prc81","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210110558"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ailing Tian","raw_affiliation_strings":["Independent  - affiliation not provided to SSRN","Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an 710021, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Independent  - affiliation not provided to SSRN","institution_ids":[]},{"raw_affiliation_string":"Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an 710021, China","institution_ids":["https://openalex.org/I4210110558"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5102751042"],"corresponding_institution_ids":["https://openalex.org/I4210110558"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2728},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2728},"fwci":0.7463,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.65559192,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"11","issue":"3","first_page":"226","last_page":"226"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","score":0.0019000000320374966,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/modified-u-net","display_name":"modified U-Net","score":0.8289999961853027},{"id":"https://openalex.org/keywords/spatial-attention","display_name":"spatial attention","score":0.9729999899864197},{"id":"https://openalex.org/keywords/channel-attention","display_name":"channel attention","score":1.0},{"id":"https://openalex.org/keywords/background-noise-reduction","display_name":"background noise suppression","score":0.6230000257492065},{"id":"https://openalex.org/keywords/phase-retrieval","display_name":"phase retrieval","score":0.47699999809265137}],"concepts":[{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.7551827430725098},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6641364693641663},{"id":"https://openalex.org/C34736171","wikidata":"https://www.wikidata.org/wiki/Q918333","display_name":"Preprocessor","level":2,"score":0.608085036277771},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5580228567123413},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.46840590238571167},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.3834453523159027},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3215775489807129},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.176759272813797},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.13013914227485657}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.3390/photonics11030226","doi":"https://doi.org/10.3390/photonics11030226","is_oa":true,"landing_page_url":"https://doi.org/10.3390/photonics11030226","pdf_url":"https://www.mdpi.com/2304-6732/11/3/226/pdf?version=1709214514","source":{"id":"https://openalex.org/S2738274844","display_name":"Photonics","issn_l":"2304-6732","issn":["2304-6732"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Photonics","raw_type":"journal-article"},{"id":"doi:10.2139/ssrn.4608717","doi":"https://doi.org/10.2139/ssrn.4608717","is_oa":true,"landing_page_url":"https://doi.org/10.2139/ssrn.4608717","pdf_url":null,"source":{"id":"https://openalex.org/S4210172589","display_name":"SSRN Electronic Journal","issn_l":"1556-5068","issn":["1556-5068"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1318003438","host_organization_name":"RELX Group (Netherlands)","host_organization_lineage":["https://openalex.org/I1318003438"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"posted-content"},{"id":"pmh:oai:doaj.org/article:4e0c4260a497433bbf0168199796da99","doi":null,"is_oa":false,"landing_page_url":"https://doaj.org/article/4e0c4260a497433bbf0168199796da99","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Photonics, Vol 11, Iss 3, p 226 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.3390/photonics11030226","doi":"https://doi.org/10.3390/photonics11030226","is_oa":true,"landing_page_url":"https://doi.org/10.3390/photonics11030226","pdf_url":"https://www.mdpi.com/2304-6732/11/3/226/pdf?version=1709214514","source":{"id":"https://openalex.org/S2738274844","display_name":"Photonics","issn_l":"2304-6732","issn":["2304-6732"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Photonics","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320327224","display_name":"Shaanxi Provincial Science and Technology Department","ror":"https://ror.org/01c2sx728"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4392385162.pdf","grobid_xml":"https://content.openalex.org/works/W4392385162.grobid-xml"},"referenced_works_count":23,"referenced_works":["https://openalex.org/W1901129140","https://openalex.org/W1977152971","https://openalex.org/W1981334013","https://openalex.org/W1995260510","https://openalex.org/W2023058990","https://openalex.org/W2031141918","https://openalex.org/W2041837587","https://openalex.org/W2057539270","https://openalex.org/W2067361078","https://openalex.org/W2087703093","https://openalex.org/W2094114486","https://openalex.org/W2122002777","https://openalex.org/W2788906943","https://openalex.org/W2798122215","https://openalex.org/W2883579164","https://openalex.org/W2884436604","https://openalex.org/W2884585870","https://openalex.org/W2923997689","https://openalex.org/W2962767316","https://openalex.org/W3015788359","https://openalex.org/W3126099975","https://openalex.org/W3202568607","https://openalex.org/W4250755111"],"related_works":["https://openalex.org/W3080589929","https://openalex.org/W3121393469","https://openalex.org/W2348882898","https://openalex.org/W2164429328","https://openalex.org/W4410947045","https://openalex.org/W7214956751","https://openalex.org/W2383064638","https://openalex.org/W3205174227","https://openalex.org/W2951128516","https://openalex.org/W4409500905"],"abstract_inverted_index":{"A":[0],"novel":[1],"preprocessing":[2],"method":[3,104],"based":[4],"on":[5],"a":[6],"modified":[7],"U-NET":[8],"is":[9,17],"proposed":[10,103],"for":[11,142],"single":[12,72,143],"interference":[13,73,144],"fringes.":[14,145],"The":[15,78,102],"framework":[16],"constructed":[18],"by":[19,114,127],"introducing":[20],"spatial":[21],"attention":[22,25],"and":[23,43,63,97,108],"channel":[24],"modules":[26],"to":[27,51],"optimize":[28],"performance.":[29],"In":[30,119],"this":[31,68],"process,":[32],"interferometric":[33],"fringe":[34,41,56],"maps":[35,57],"with":[36,131],"an":[37,59],"added":[38],"background":[39],"intensity,":[40],"amplitude,":[42],"ambient":[44],"noise":[45],"are":[46],"used":[47],"as":[48,112],"the":[49,52,81,87,121,136,139],"input":[50],"network,":[53],"which":[54],"outputs":[55],"in":[58,75],"ideal":[60],"state.":[61],"Simulated":[62],"experimental":[64],"results":[65,82],"demonstrated":[66],"that":[67],"technique":[69],"can":[70],"preprocess":[71],"fringes":[74,126],"~1":[76],"microsecond.":[77],"quality":[79],"of":[80,100,116,138],"was":[83],"further":[84],"evaluated":[85],"using":[86],"root":[88],"mean":[89],"square":[90],"error,":[91],"peak":[92],"signal-to-noise":[93],"ratio,":[94],"structural":[95],"similarity,":[96],"equivalent":[98],"number":[99],"views.":[101],"outperformed":[105],"U-NET,":[106],"U-NET++,":[107],"other":[109],"conventional":[110],"algorithms":[111],"measured":[113],"each":[115],"these":[117],"metrics.":[118],"addition,":[120],"model":[122],"produced":[123],"high-quality":[124],"normalized":[125],"combining":[128],"objective":[129],"data":[130],"visual":[132],"effects,":[133],"significantly":[134],"improving":[135],"accuracy":[137],"phase":[140],"solutions":[141]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":5}],"updated_date":"2026-11-12T12:28:57.059296","created_date":"2024-03-05T00:00:00"}