{"id":"https://openalex.org/W4391246579","doi":"https://doi.org/10.1117/12.3010096","title":"Low-noise single-photon avalanche diode array with extended NIR sensitivity","display_name":"Low-noise single-photon avalanche diode array with extended NIR sensitivity","publication_year":2024,"publication_date":"2024-01-26","ids":{"openalex":"https://openalex.org/W4391246579","doi":"https://doi.org/10.1117/12.3010096"},"language":"en","primary_location":{"id":"doi:10.1117/12.3010096","doi":"https://doi.org/10.1117/12.3010096","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.3010096","pdf_url":null,"source":{"id":"https://openalex.org/S7407115257","display_name":"Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications XXI","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033941129","display_name":"Cyril Saudan","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Cyril Saudan","raw_affiliation_strings":["Pi Imaging Technology SA (Switzerland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pi Imaging Technology SA (Switzerland)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030680218","display_name":"Ivan Michel Antolovi\u0107","orcid":"https://orcid.org/0000-0001-6155-6895","observed_orcids":["https://orcid.org/0000-0001-6155-6895"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Michel Antolovic","raw_affiliation_strings":["Pi Imaging Technology SA (Switzerland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pi Imaging Technology SA (Switzerland)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064136773","display_name":"Harald Homulle","orcid":"https://orcid.org/0000-0002-8798-5409","observed_orcids":["https://orcid.org/0000-0002-8798-5409"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Harald Homulle","raw_affiliation_strings":["Pi Imaging Technology SA (Switzerland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pi Imaging Technology SA (Switzerland)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057000064","display_name":"Augusto Carimatto","orcid":"https://orcid.org/0000-0001-5348-4975","observed_orcids":["https://orcid.org/0000-0001-5348-4975"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Augusto Carimatto","raw_affiliation_strings":["Pi Imaging Technology SA (Switzerland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pi Imaging Technology SA (Switzerland)","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5092561344","display_name":"Stefanos Tsoukias","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Stefanos Tsoukias","raw_affiliation_strings":["Pi Imaging Technology SA (Switzerland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pi Imaging Technology SA (Switzerland)","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"28","last_page":"28"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.763700008392334,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.763700008392334,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.07280000299215317,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.03420000150799751,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/single-photon-avalanche-diode-array","display_name":"single-photon avalanche diode array","score":0.8980000019073486},{"id":"https://openalex.org/keywords/near-infrared-sensitivity","display_name":"near-infrared sensitivity","score":0.8309999704360962},{"id":"https://openalex.org/keywords/dark-count-rate","display_name":"dark count rate","score":0.859000027179718},{"id":"https://openalex.org/keywords/photon-detection-efficiency","display_name":"photon detection efficiency","score":0.8939999938011169},{"id":"https://openalex.org/keywords/cmos-compatible-fabrication","display_name":"CMOS-compatible fabrication","score":0.6700000166893005},{"id":"https://openalex.org/keywords/image-scanning-microscopy","display_name":"image scanning microscopy","score":0.7680000066757202},{"id":"https://openalex.org/keywords/low-noise-photon-detection","display_name":"low-noise photon detection","score":0.6620000004768372},{"id":"https://openalex.org/keywords/microlens-array","display_name":"microlens array","score":0.5120000243186951}],"concepts":[{"id":"https://openalex.org/C109679912","wikidata":"https://www.wikidata.org/wiki/Q175932","display_name":"Avalanche photodiode","level":3,"score":0.7141024470329285},{"id":"https://openalex.org/C193361668","wikidata":"https://www.wikidata.org/wiki/Q7523761","display_name":"Single-photon avalanche diode","level":4,"score":0.7089282274246216},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5991249084472656},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5718417763710022},{"id":"https://openalex.org/C95341827","wikidata":"https://www.wikidata.org/wiki/Q175898","display_name":"Avalanche diode","level":4,"score":0.5644088983535767},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5475715398788452},{"id":"https://openalex.org/C55005982","wikidata":"https://www.wikidata.org/wiki/Q3902709","display_name":"Picosecond","level":3,"score":0.47740617394447327},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.4641234874725342},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.4335385262966156},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4254196882247925},{"id":"https://openalex.org/C180651308","wikidata":"https://www.wikidata.org/wiki/Q1265973","display_name":"Dark current","level":3,"score":0.41995853185653687},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.41761428117752075},{"id":"https://openalex.org/C159317903","wikidata":"https://www.wikidata.org/wiki/Q3198","display_name":"Photon","level":2,"score":0.41529524326324463},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3348158299922943},{"id":"https://openalex.org/C23125352","wikidata":"https://www.wikidata.org/wiki/Q210765","display_name":"Photodetector","level":2,"score":0.17143219709396362},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.11622089147567749},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1044340431690216},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.3010096","doi":"https://doi.org/10.1117/12.3010096","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.3010096","pdf_url":null,"source":{"id":"https://openalex.org/S7407115257","display_name":"Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications XXI","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2032587815","https://openalex.org/W2081935535","https://openalex.org/W1527554091","https://openalex.org/W2013829854","https://openalex.org/W2180416631","https://openalex.org/W4391246762","https://openalex.org/W1967453884","https://openalex.org/W2148393925","https://openalex.org/W2971003304","https://openalex.org/W2046291858"],"abstract_inverted_index":{"Single-photon":[0],"avalanche":[1],"diode":[2],"(SPAD)":[3],"arrays":[4,59],"have":[5,31,42],"surpassed":[6],"other":[7],"detector":[8],"technologies":[9],";":[10],"photon-multiplying":[11],"tubes":[12],"(PMTs)":[13],"in":[14,25,45,81],"signal-noise":[15],"ratio":[16],"(SNR)":[17],"and":[18,30,39,50,71,84,106,123,135,140],"electron":[19],"multiplied":[20],"charge":[21],"coupled":[22],"devices":[23],"(EMCCDs)":[24],"frame":[26],"rate":[27,100],"andphoton":[28],"fidelity,":[29],"proven":[32],"beneficial":[33],"for":[34,109],"advanced":[35],"microscopy":[36,48,54],"applications.":[37],"Resolution":[38],"SNR":[40],"improvements":[41],"been":[43],"demonstrated":[44],"image":[46,52],"scanning":[47,53],"(ISM)":[49],"quantum":[51],"(qISM)":[55],".":[56],"Despite":[57,144],"SPAD":[58,94,150],"reaching":[60],"near":[61],"100%":[62],"fill":[63],"factor":[64],"thanks":[65],"to":[66,113,126],"optimized":[67],"micro":[68],"lense":[69],"design":[70],"fabrication":[72,117],"processes,":[73],"the":[74,82,145,149],"photon":[75],"detection":[76],"efficiency":[77],"(PDE)":[78],"remains":[79],"limited":[80],"red":[83],"near-IR":[85],"wavelengths.":[86],"In":[87],"this":[88],"work,":[89],"we":[90],"present":[91],"a":[92,131,153],"23-channels":[93],"array":[95,151],"with":[96],"low":[97,155],"dark":[98],"count":[99],"(DCR),":[101],"picosecond":[102],"time":[103],"tagging":[104],"capabilities":[105],"improved":[107],"sensitivity":[108],"wavelength":[110],"from":[111],"600":[112],"1000":[114],"nm.":[115],"The":[116],"process":[118],"is":[119],"fully":[120],"CMOS":[121],"compatible":[122],"easily":[124],"scalable":[125],"larger":[127],"arrays.":[128],"We":[129],"show":[130],"PDE":[132],"of":[133,159],"60%":[134],"15%":[136],"at":[137],"620":[138],"nm":[139],"900":[141],"nm,":[142],"respectively.":[143],"increased":[146],"spectral":[147],"response,":[148],"keeps":[152],"very":[154],"ambient":[156],"temperature":[157],"DCR":[158],"less":[160],"than":[161],"100":[162],"counts":[163],"per":[164],"second.":[165]},"counts_by_year":[],"updated_date":"2026-10-28T10:33:24.094632","created_date":"2024-01-27T00:00:00"}