{"id":"https://openalex.org/W4391237278","doi":"https://doi.org/10.1109/ictacs59847.2023.10390098","title":"Comparative Analysis of Existing Deep Learning Techniques for Automatic Defects Detection in Printed Circuit Boards","display_name":"Comparative Analysis of Existing Deep Learning Techniques for Automatic Defects Detection in Printed Circuit Boards","publication_year":2023,"publication_date":"2023-11-01","ids":{"openalex":"https://openalex.org/W4391237278","doi":"https://doi.org/10.1109/ictacs59847.2023.10390098"},"language":"en","primary_location":{"id":"doi:10.1109/ictacs59847.2023.10390098","doi":"https://doi.org/10.1109/ictacs59847.2023.10390098","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ictacs59847.2023.10390098","pdf_url":null,"source":{"id":"https://openalex.org/S4363608123","display_name":"International Conference on Technological Advancements in Computational Sciences (ICTACS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 3rd International Conference on Technological Advancements in Computational Sciences (ICTACS)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102746066","display_name":"Nikhil Aggarwal","orcid":"https://orcid.org/0000-0003-1805-5918","observed_orcids":["https://orcid.org/0000-0003-1805-5918"]},"institutions":[{"id":"https://openalex.org/I101407740","display_name":"Chandigarh University","ror":"https://ror.org/05t4pvx35","country_code":"IN","type":"education","lineage":["https://openalex.org/I101407740"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Nikhil Aggarwal","raw_affiliation_strings":["Chandigarh University,Department of Electronics and Communication Engineering,Mohali","Department of Electronics and Communication Engineering, Chandigarh University, Mohali"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chandigarh University,Department of Electronics and Communication Engineering,Mohali","institution_ids":["https://openalex.org/I101407740"]},{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Chandigarh University, Mohali","institution_ids":["https://openalex.org/I101407740"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075029328","display_name":"Manish Deshwal","orcid":"https://orcid.org/0000-0003-0154-1346","observed_orcids":["https://orcid.org/0000-0003-0154-1346"]},"institutions":[{"id":"https://openalex.org/I101407740","display_name":"Chandigarh University","ror":"https://ror.org/05t4pvx35","country_code":"IN","type":"education","lineage":["https://openalex.org/I101407740"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Manish Deshwal","raw_affiliation_strings":["Chandigarh University,Department of Electronics and Communication Engineering,Mohali","Department of Electronics and Communication Engineering, Chandigarh University, Mohali"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chandigarh University,Department of Electronics and Communication Engineering,Mohali","institution_ids":["https://openalex.org/I101407740"]},{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Chandigarh University, Mohali","institution_ids":["https://openalex.org/I101407740"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009718659","display_name":"Piyush Samant","orcid":"https://orcid.org/0000-0001-9181-9932","observed_orcids":["https://orcid.org/0000-0001-9181-9932"]},"institutions":[{"id":"https://openalex.org/I4405256344","display_name":"MiRXES Lab Pte. Ltd. (Singapore)","ror":"https://ror.org/041mrvc03","country_code":"SG","type":"company","lineage":["https://openalex.org/I4405256344"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Piyush Samant","raw_affiliation_strings":["MiRXES,Department of research and development,Singapore","Department of research and development, MiRXES, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MiRXES,Department of research and development,Singapore","institution_ids":["https://openalex.org/I4405256344"]},{"raw_affiliation_string":"Department of research and development, MiRXES, Singapore","institution_ids":["https://openalex.org/I4405256344"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.24,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.76401697,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1176","last_page":"1181"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/printed-circuit-board-defect-detection","display_name":"printed circuit board defect detection","score":0.8700000047683716},{"id":"https://openalex.org/keywords/automated-visual-inspection","display_name":"automated visual inspection","score":0.7350000143051147},{"id":"https://openalex.org/keywords/yolov5","display_name":"YOLOv5","score":0.921999990940094},{"id":"https://openalex.org/keywords/object-detection","display_name":"object detection","score":0.6809999942779541},{"id":"https://openalex.org/keywords/electronics-manufacturing-quality-control","display_name":"electronics manufacturing quality control","score":0.7229999899864197},{"id":"https://openalex.org/keywords/deep-learning-model-comparison","display_name":"deep learning model comparison","score":0.5389999747276306}],"concepts":[{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.7674782276153564},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6533120274543762},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.571099579334259},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4251110553741455},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07827326655387878}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ictacs59847.2023.10390098","doi":"https://doi.org/10.1109/ictacs59847.2023.10390098","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ictacs59847.2023.10390098","pdf_url":null,"source":{"id":"https://openalex.org/S4363608123","display_name":"International Conference on Technological Advancements in Computational Sciences (ICTACS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 3rd International Conference on Technological Advancements in Computational Sciences (ICTACS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.428600013256073}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W2912886105","https://openalex.org/W2914154500","https://openalex.org/W2941001797","https://openalex.org/W2993222219","https://openalex.org/W3034713821","https://openalex.org/W3137421590","https://openalex.org/W3169384804","https://openalex.org/W3186516637","https://openalex.org/W3194730353","https://openalex.org/W3198841946","https://openalex.org/W4205995027","https://openalex.org/W4223916596","https://openalex.org/W4225624948","https://openalex.org/W4285815568","https://openalex.org/W4286560905","https://openalex.org/W4312958416","https://openalex.org/W4320712931","https://openalex.org/W4323045956","https://openalex.org/W4375863227"],"related_works":["https://openalex.org/W4400868420","https://openalex.org/W7163994229","https://openalex.org/W6930550283","https://openalex.org/W4322097739","https://openalex.org/W4410228737","https://openalex.org/W4407728162","https://openalex.org/W4417278195","https://openalex.org/W4285815568","https://openalex.org/W4389352643","https://openalex.org/W4412934085"],"abstract_inverted_index":{"Printed":[0],"Circuit":[1],"Board":[2],"(PCB)":[3],"defect":[4,37,77,114],"identification":[5],"is":[6],"an":[7],"crucial":[8],"task":[9],"in":[10,18,31],"the":[11,48,66,112],"electronics":[12],"industry,":[13],"as":[14],"it":[15],"may":[16],"help":[17],"production":[19],"of":[20,51],"high":[21],"quality":[22],"product.":[23],"Deep":[24],"learning-based":[25,61],"techniques":[26,39,64],"have":[27,40,73,86,125],"shown":[28],"promising":[29],"results":[30],"detecting":[32],"PCB":[33,53,76,94,108],"defects.":[34],"Several":[35],"automated":[36],"detection":[38,50,78,115],"recently":[41],"been":[42,103,126],"used":[43,106,127],"by":[44],"numerous":[45,90],"industries":[46],"for":[47,65,107],"early":[49],"any":[52],"manufacturing":[54],"errors.":[55],"Such":[56],"businesses":[57],"commonly":[58],"utilize":[59],"deep":[60,82],"image":[62,95,109],"recognition":[63],"same.":[67],"In":[68],"this":[69],"research":[70],"work.,":[71],"we":[72],"discussed":[74],"recent":[75],"algorithm":[79],"based":[80],"on":[81],"learning":[83],"concepts.":[84],"We":[85],"also":[87,102],"gone":[88],"through":[89],"publicly":[91],"accessible":[92],"industrial":[93],"datasets.":[96],"A":[97],"modified":[98],"YOLOv5s":[99],"model":[100],"has":[101],"proposed":[104],"specifically":[105],"datasets,":[110],"with":[111],"available":[113],"techniques.":[116],"Important":[117],"parameters":[118],"including":[119],"Accuracy,":[120],"Sensitivity,":[121],"Specificity,":[122],"and":[123],"AUC":[124],"to":[128],"compare":[129],"performance.":[130]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2}],"updated_date":"2026-10-06T10:28:23.643775","created_date":"2024-01-26T00:00:00"}