{"id":"https://openalex.org/W4391062072","doi":"https://doi.org/10.1016/j.ceramint.2024.01.129","title":"Plasma etching-Induced surface modification and interfacial defect passivation for antimony triselenide thin film solar cells","display_name":"Plasma etching-Induced surface modification and interfacial defect passivation for antimony triselenide thin film solar cells","publication_year":2024,"publication_date":"2024-01-21","ids":{"openalex":"https://openalex.org/W4391062072","doi":"https://doi.org/10.1016/j.ceramint.2024.01.129"},"language":"en","primary_location":{"id":"doi:10.1016/j.ceramint.2024.01.129","doi":"https://doi.org/10.1016/j.ceramint.2024.01.129","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.ceramint.2024.01.129","pdf_url":null,"source":{"id":"https://openalex.org/S106928643","display_name":"Ceramics International","issn_l":"0272-8842","issn":["0272-8842","1873-3956"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ceramics International","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074438449","display_name":"Chunyan Duan","orcid":"https://orcid.org/0000-0002-9963-6900","observed_orcids":["https://orcid.org/0000-0002-9963-6900"]},"institutions":[{"id":"https://openalex.org/I4405280632","display_name":"Foshan Polytechnic","ror":"https://ror.org/0379rzh60","country_code":"CN","type":"education","lineage":["https://openalex.org/I4405280632"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunyan Duan","raw_affiliation_strings":["School of New Energy and Environmental Protection Engineering, Foshan Polytechnic, Foshan, 528137, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of New Energy and Environmental Protection Engineering, Foshan Polytechnic, Foshan, 528137, China","institution_ids":["https://openalex.org/I4405280632"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061593188","display_name":"Guojie Chen","orcid":"https://orcid.org/0000-0002-5909-6583","observed_orcids":["https://orcid.org/0000-0002-5909-6583"]},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Guojie Chen","raw_affiliation_strings":["Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, Guangdong, 518060, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, Guangdong, 518060, China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100615381","display_name":"Jun Zhao","orcid":"https://orcid.org/0000-0002-7285-5812","observed_orcids":["https://orcid.org/0000-0002-7285-5812"]},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jun Zhao","raw_affiliation_strings":["Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, Guangdong, 518060, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, Guangdong, 518060, China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076077413","display_name":"Changji Hu","orcid":"https://orcid.org/0000-0001-9407-1018","observed_orcids":["https://orcid.org/0000-0001-9407-1018"]},"institutions":[{"id":"https://openalex.org/I4405280632","display_name":"Foshan Polytechnic","ror":"https://ror.org/0379rzh60","country_code":"CN","type":"education","lineage":["https://openalex.org/I4405280632"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changji Hu","raw_affiliation_strings":["School of New Energy and Environmental Protection Engineering, Foshan Polytechnic, Foshan, 528137, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of New Energy and Environmental Protection Engineering, Foshan Polytechnic, Foshan, 528137, China","institution_ids":["https://openalex.org/I4405280632"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101518226","display_name":"Wenrong Hu","orcid":"https://orcid.org/0000-0002-5882-2221","observed_orcids":["https://orcid.org/0000-0002-5882-2221"]},"institutions":[{"id":"https://openalex.org/I4405280632","display_name":"Foshan Polytechnic","ror":"https://ror.org/0379rzh60","country_code":"CN","type":"education","lineage":["https://openalex.org/I4405280632"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenrong Hu","raw_affiliation_strings":["School of New Energy and Environmental Protection Engineering, Foshan Polytechnic, Foshan, 528137, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of New Energy and Environmental Protection Engineering, Foshan Polytechnic, Foshan, 528137, China","institution_ids":["https://openalex.org/I4405280632"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054327443","display_name":"Umar Farooq","orcid":"https://orcid.org/0000-0001-5152-9826","observed_orcids":["https://orcid.org/0000-0001-5152-9826"]},"institutions":[{"id":"https://openalex.org/I135237710","display_name":"Zhejiang Normal University","ror":"https://ror.org/01vevwk45","country_code":"CN","type":"education","lineage":["https://openalex.org/I135237710"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Umar Farooq","raw_affiliation_strings":["Key Laboratory of the Ministry of Education for Advanced Catalysis Materials, Zhejiang Normal University, Jinhua, Zhejiang, 321004, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of the Ministry of Education for Advanced Catalysis Materials, Zhejiang Normal University, Jinhua, Zhejiang, 321004, China","institution_ids":["https://openalex.org/I135237710"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005838290","display_name":"Zhenghua Su","orcid":"https://orcid.org/0000-0003-2137-3933","observed_orcids":["https://orcid.org/0000-0003-2137-3933"]},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhenghua Su","raw_affiliation_strings":["Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, Guangdong, 518060, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, Guangdong, 518060, China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101866716","display_name":"Rong Zhe Tang","orcid":"https://orcid.org/0000-0001-5809-2583","observed_orcids":["https://orcid.org/0000-0001-5809-2583"]},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]},{"id":"https://openalex.org/I4405280632","display_name":"Foshan Polytechnic","ror":"https://ror.org/0379rzh60","country_code":"CN","type":"education","lineage":["https://openalex.org/I4405280632"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rong Tang","raw_affiliation_strings":["School of New Energy and Environmental Protection Engineering, Foshan Polytechnic, Foshan, 528137, China","Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, Guangdong, 518060, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of New Energy and Environmental Protection Engineering, Foshan Polytechnic, Foshan, 528137, China","institution_ids":["https://openalex.org/I4405280632"]},{"raw_affiliation_string":"Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, Guangdong, 518060, China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100366885","display_name":"Shuo Chen","orcid":"https://orcid.org/0000-0003-1512-376X","observed_orcids":["https://orcid.org/0000-0003-1512-376X","https://orcid.org/0000-0002-7990-4947","https://orcid.org/0009-0007-4051-4806","https://orcid.org/0000-0002-6675-605X"]},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuo Chen","raw_affiliation_strings":["Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, Guangdong, 518060, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, Guangdong, 518060, China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015166573","display_name":"Guangxing Liang","orcid":"https://orcid.org/0000-0002-9033-4885","observed_orcids":["https://orcid.org/0000-0002-9033-4885"]},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Guangxing Liang","raw_affiliation_strings":["Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, Guangdong, 518060, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, Guangdong, 518060, China","institution_ids":["https://openalex.org/I180726961"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5015166573","https://openalex.org/A5061593188","https://openalex.org/A5100615381"],"corresponding_institution_ids":["https://openalex.org/I180726961"],"apc_list":{"value":3440,"currency":"USD","value_usd":3440},"apc_paid":null,"fwci":0.2855,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.39258957,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":"50","issue":"7","first_page":"12253","last_page":"12262"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10275","display_name":"2D Materials and Applications","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sb2se3-thin-film-solar-cells","display_name":"Sb2Se3 thin-film solar cells","score":0.9350000023841858},{"id":"https://openalex.org/keywords/plasma-etching","display_name":"plasma etching","score":0.996999979019165},{"id":"https://openalex.org/keywords/surface-modification","display_name":"surface modification","score":0.9380000233650208},{"id":"https://openalex.org/keywords/interface-defect-passivation","display_name":"interfacial defect passivation","score":0.859000027179718},{"id":"https://openalex.org/keywords/interfacial-recombination","display_name":"interfacial recombination","score":0.9330000281333923},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"surface roughness","score":0.8759999871253967},{"id":"https://openalex.org/keywords/post-selenization","display_name":"post-selenization","score":0.9200000166893005},{"id":"https://openalex.org/keywords/surface-engineering","display_name":"surface engineering","score":0.6010000109672546}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8856875896453857},{"id":"https://openalex.org/C100460472","wikidata":"https://www.wikidata.org/wiki/Q2368605","display_name":"Etching (microfabrication)","level":3,"score":0.6673752665519714},{"id":"https://openalex.org/C33574316","wikidata":"https://www.wikidata.org/wiki/Q917260","display_name":"Passivation","level":3,"score":0.6646276712417603},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6020551919937134},{"id":"https://openalex.org/C22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","level":3,"score":0.5918639898300171},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.5207557678222656},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.5002551078796387},{"id":"https://openalex.org/C82706917","wikidata":"https://www.wikidata.org/wiki/Q10251","display_name":"Plasma","level":2,"score":0.4881308972835541},{"id":"https://openalex.org/C541565711","wikidata":"https://www.wikidata.org/wiki/Q1099","display_name":"Antimony","level":2,"score":0.4767219126224518},{"id":"https://openalex.org/C107187091","wikidata":"https://www.wikidata.org/wiki/Q2392011","display_name":"Plasma etching","level":4,"score":0.47296255826950073},{"id":"https://openalex.org/C71039073","wikidata":"https://www.wikidata.org/wiki/Q3439090","display_name":"Surface finish","level":2,"score":0.4656584560871124},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.44147616624832153},{"id":"https://openalex.org/C198865614","wikidata":"https://www.wikidata.org/wiki/Q5046374","display_name":"Carrier lifetime","level":3,"score":0.42557284235954285},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.418687641620636},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.291511595249176},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.2626207172870636},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.23790085315704346},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.22192901372909546},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.16244667768478394},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.ceramint.2024.01.129","doi":"https://doi.org/10.1016/j.ceramint.2024.01.129","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.ceramint.2024.01.129","pdf_url":null,"source":{"id":"https://openalex.org/S106928643","display_name":"Ceramics International","issn_l":"0272-8842","issn":["0272-8842","1873-3956"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ceramics International","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.9853000044822693}],"study_designs":[],"awards":[{"id":"https://openalex.org/G332969668","display_name":null,"funder_award_id":"62104157","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3947136531","display_name":null,"funder_award_id":"62074102","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7015752759","display_name":null,"funder_award_id":"2022A1515010979","funder_id":"https://openalex.org/F4320337111","funder_display_name":"Basic and Applied Basic Research Foundation of Guangdong Province"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320337111","display_name":"Basic and Applied Basic Research Foundation of Guangdong Province","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1586371271","https://openalex.org/W1968286323","https://openalex.org/W1968917296","https://openalex.org/W2620275035","https://openalex.org/W2802826055","https://openalex.org/W2806196220","https://openalex.org/W2824137845","https://openalex.org/W2908971674","https://openalex.org/W2963513688","https://openalex.org/W2963983378","https://openalex.org/W2970205818","https://openalex.org/W2996479167","https://openalex.org/W3008705703","https://openalex.org/W3010307513","https://openalex.org/W3017702805","https://openalex.org/W3043363698","https://openalex.org/W3102290575","https://openalex.org/W3135351709","https://openalex.org/W4200289375","https://openalex.org/W4248682981","https://openalex.org/W4312415385"],"related_works":["https://openalex.org/W4200105147","https://openalex.org/W2766541824","https://openalex.org/W4400844248","https://openalex.org/W4415385463","https://openalex.org/W4321350556","https://openalex.org/W2969977568","https://openalex.org/W4386574776","https://openalex.org/W4392214882","https://openalex.org/W4399557737","https://openalex.org/W3013478276"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-10-29T09:56:32.521200","created_date":"2024-01-22T00:00:00"}