{"id":"https://openalex.org/W4390871073","doi":"https://doi.org/10.1088/1361-6501/ad1eb2","title":"Direct voxel classification from x-ray projections for 3D pore detection applied to laser sintered parts","display_name":"Direct voxel classification from x-ray projections for 3D pore detection applied to laser sintered parts","publication_year":2024,"publication_date":"2024-01-15","ids":{"openalex":"https://openalex.org/W4390871073","doi":"https://doi.org/10.1088/1361-6501/ad1eb2"},"language":"en","primary_location":{"id":"doi:10.1088/1361-6501/ad1eb2","doi":"https://doi.org/10.1088/1361-6501/ad1eb2","is_oa":true,"landing_page_url":"https://doi.org/10.1088/1361-6501/ad1eb2","pdf_url":"https://iopscience.iop.org/article/10.1088/1361-6501/ad1eb2/pdf","source":{"id":"https://openalex.org/S109302362","display_name":"Measurement Science and Technology","issn_l":"0957-0233","issn":["0957-0233","1361-6501"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","jufo-2","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Measurement Science and Technology","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://iopscience.iop.org/article/10.1088/1361-6501/ad1eb2/pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063486259","display_name":"Simon Bellens","orcid":"https://orcid.org/0000-0001-9003-8704","observed_orcids":["https://orcid.org/0000-0001-9003-8704"]},"institutions":[{"id":"https://openalex.org/I9679517","display_name":"Materialise (Belgium)","ror":"https://ror.org/00tc93763","country_code":"BE","type":"company","lineage":["https://openalex.org/I9679517"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Simon Bellens","raw_affiliation_strings":["Central research, Materialise NV, Technologielaan 15, Leuven, 3001, BELGIUM"],"raw_orcid":"https://orcid.org/0000-0001-9003-8704","affiliations":[{"raw_affiliation_string":"Central research, Materialise NV, Technologielaan 15, Leuven, 3001, BELGIUM","institution_ids":["https://openalex.org/I9679517"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058890865","display_name":"Patricio Guerrero","orcid":"https://orcid.org/0000-0003-0390-0699","observed_orcids":["https://orcid.org/0000-0003-0390-0699"]},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Patricio Guerrero","raw_affiliation_strings":["KU Leuven Department of Mechanical Engineering, Celestijnenlaan 300, Leuven, 3001, BELGIUM"],"raw_orcid":"https://orcid.org/0000-0003-0390-0699","affiliations":[{"raw_affiliation_string":"KU Leuven Department of Mechanical Engineering, Celestijnenlaan 300, Leuven, 3001, BELGIUM","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Michel Janssens","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I9679517","display_name":"Materialise (Belgium)","ror":"https://ror.org/00tc93763","country_code":"BE","type":"company","lineage":["https://openalex.org/I9679517"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Michel Janssens","raw_affiliation_strings":["Materialise NV, Technologielaan 15, Leuven, 3001, BELGIUM"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materialise NV, Technologielaan 15, Leuven, 3001, BELGIUM","institution_ids":["https://openalex.org/I9679517"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061245134","display_name":"Patrick Vandewalle","orcid":"https://orcid.org/0000-0002-7106-8024","observed_orcids":["https://orcid.org/0000-0002-7106-8024"]},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Patrick Vandewalle","raw_affiliation_strings":["KU Leuven Department of Electrical Engineering, Jan Pieter de Nayerlaan 5, Sint-Katelijne-Waver, 2860, BELGIUM"],"raw_orcid":"https://orcid.org/0000-0002-7106-8024","affiliations":[{"raw_affiliation_string":"KU Leuven Department of Electrical Engineering, Jan Pieter de Nayerlaan 5, Sint-Katelijne-Waver, 2860, BELGIUM","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066436377","display_name":"Wim Dewulf","orcid":"https://orcid.org/0000-0002-9184-051X","observed_orcids":["https://orcid.org/0000-0002-9184-051X"]},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Wim Dewulf","raw_affiliation_strings":["KU Leuven Department of Mechanical Engineering, Celestijnenlaan 300, Leuven, Flanders, 3001, BELGIUM"],"raw_orcid":"https://orcid.org/0000-0002-9184-051X","affiliations":[{"raw_affiliation_string":"KU Leuven Department of Mechanical Engineering, Celestijnenlaan 300, Leuven, Flanders, 3001, BELGIUM","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5063486259"],"corresponding_institution_ids":["https://openalex.org/I9679517"],"apc_list":{"value":3165,"currency":"USD","value_usd":3165},"apc_paid":null,"fwci":0.5533,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.52103935,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"35","issue":"4","first_page":"046004","last_page":"046004"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.3458999991416931,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.3458999991416931,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":0.26660001277923584,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11949","display_name":"Nuclear Physics and Applications","score":0.050700001418590546,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voxel-classification","display_name":"voxel classification","score":0.7850000262260437},{"id":"https://openalex.org/keywords/x-ray-projections","display_name":"X-ray projections","score":0.6869999766349792},{"id":"https://openalex.org/keywords/limited-angle-computed-tomography","display_name":"limited-angle tomography","score":0.6039999723434448},{"id":"https://openalex.org/keywords/limited-view-reconstruction","display_name":"limited-view reconstruction","score":0.6880000233650208},{"id":"https://openalex.org/keywords/deep-learning","display_name":"deep learning","score":0.6909999847412109},{"id":"https://openalex.org/keywords/laser-sintering","display_name":"laser sintering","score":0.8259999752044678},{"id":"https://openalex.org/keywords/polymer-parts","display_name":"polymer parts","score":0.7689999938011169},{"id":"https://openalex.org/keywords/in-line-quality-control","display_name":"in-line quality control","score":0.7829999923706055},{"id":"https://openalex.org/keywords/reconstruction-artifacts","display_name":"reconstruction artifacts","score":0.656000018119812}],"concepts":[{"id":"https://openalex.org/C57493831","wikidata":"https://www.wikidata.org/wiki/Q3134666","display_name":"Projection (relational algebra)","level":2,"score":0.7021835446357727},{"id":"https://openalex.org/C54170458","wikidata":"https://www.wikidata.org/wiki/Q663554","display_name":"Voxel","level":2,"score":0.6333692669868469},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5715643763542175},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.5679658651351929},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.565704345703125},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.552589476108551},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5397317409515381},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4813973903656006},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.45333653688430786},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.4322744905948639},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.42084598541259766},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.41748160123825073},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.21147915720939636},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1331099569797516},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1088/1361-6501/ad1eb2","doi":"https://doi.org/10.1088/1361-6501/ad1eb2","is_oa":true,"landing_page_url":"https://doi.org/10.1088/1361-6501/ad1eb2","pdf_url":"https://iopscience.iop.org/article/10.1088/1361-6501/ad1eb2/pdf","source":{"id":"https://openalex.org/S109302362","display_name":"Measurement Science and Technology","issn_l":"0957-0233","issn":["0957-0233","1361-6501"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","jufo-2","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Measurement Science and Technology","raw_type":"journal-article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:20.500.12942/735685","doi":null,"is_oa":false,"landing_page_url":"https://lirias.kuleuven.be/handle/20.500.12942/735685","pdf_url":null,"source":{"id":"https://openalex.org/S7407055369","display_name":"Lirias","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Measurement Science And Technology, vol. 35 (4), Art.No. ARTN 046004","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1088/1361-6501/ad1eb2","doi":"https://doi.org/10.1088/1361-6501/ad1eb2","is_oa":true,"landing_page_url":"https://doi.org/10.1088/1361-6501/ad1eb2","pdf_url":"https://iopscience.iop.org/article/10.1088/1361-6501/ad1eb2/pdf","source":{"id":"https://openalex.org/S109302362","display_name":"Measurement Science and Technology","issn_l":"0957-0233","issn":["0957-0233","1361-6501"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","jufo-2","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Measurement Science and Technology","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G8336089225","display_name":null,"funder_award_id":"HBC.2020.2280","funder_id":"https://openalex.org/F4320313460","funder_display_name":"Agentschap Innoveren en Ondernemen"}],"funders":[{"id":"https://openalex.org/F4320313460","display_name":"Agentschap Innoveren en Ondernemen","ror":"https://ror.org/032xdry56"},{"id":"https://openalex.org/F4320327336","display_name":"Vlaamse regering","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4390871073.pdf","grobid_xml":"https://content.openalex.org/works/W4390871073.grobid-xml"},"referenced_works_count":26,"referenced_works":["https://openalex.org/W2028361884","https://openalex.org/W2073498690","https://openalex.org/W2085914392","https://openalex.org/W2133059825","https://openalex.org/W2194775991","https://openalex.org/W2409216860","https://openalex.org/W2528995880","https://openalex.org/W2533020866","https://openalex.org/W2619834476","https://openalex.org/W2793179076","https://openalex.org/W2800378296","https://openalex.org/W2802620534","https://openalex.org/W2807745371","https://openalex.org/W2851782922","https://openalex.org/W2885147249","https://openalex.org/W2948956954","https://openalex.org/W2972922788","https://openalex.org/W2999942426","https://openalex.org/W3091605548","https://openalex.org/W3157613442","https://openalex.org/W4220659151","https://openalex.org/W4281752540","https://openalex.org/W4282590750","https://openalex.org/W4322013155","https://openalex.org/W4362474578","https://openalex.org/W6849636490"],"related_works":["https://openalex.org/W3127093784","https://openalex.org/W4220659151","https://openalex.org/W4318940740","https://openalex.org/W2924445059","https://openalex.org/W3049097190","https://openalex.org/W6925406029","https://openalex.org/W4391029104","https://openalex.org/W4388195754","https://openalex.org/W4200128434","https://openalex.org/W3199644702"],"abstract_inverted_index":{"Abstract":[0],"X-ray":[1],"computed":[2],"tomography":[3],"(XCT)":[4],"is":[5,156],"a":[6,19,30,43,70,82,92,97,102,170],"validated":[7,157],"and":[8,16,50,101,124,133,168],"frequently":[9],"used":[10],"tool":[11],"to":[12,17,72,107,120],"verify":[13],"part":[14],"geometry":[15],"perform":[18],"non-destructive":[20],"inspection":[21,38],"of":[22,29,33,46,54,77,96,145,162],"additive":[23],"manufacturing":[24],"parts.":[25,64],"However,":[26],"the":[27,47,52,78,115,122,146,152,174],"acquisition":[28,179],"large":[31],"number":[32],"x-ray":[34,99,116,160,176],"projections":[35,117,161],"generates":[36],"long":[37],"times.":[39],"This":[40],"conflicts":[41],"with":[42],"high":[44],"throughput":[45],"production":[48],"process":[49],"hinders":[51],"integration":[53],"XCT":[55,136],"as":[56],"an":[57],"in-line":[58],"quality":[59],"control":[60],"procedure":[61],"for":[62,130],"low-end":[63],"In":[65],"this":[66],"paper,":[67],"we":[68],"propose":[69],"method":[71,90,155],"obtain":[73],"three-dimensional":[74],"(3D)":[75],"information":[76,144],"internal":[79],"pores":[80],"from":[81],"limited":[83,86,131,134],"view":[84,132],"or":[85,149],"angle":[87,135],"scan.":[88],"The":[89,154],"combines":[91],"forward":[93],"projection":[94],"model":[95],"cone-beam":[98],"system":[100],"deep":[103],"learning":[104],"neural":[105],"network":[106],"directly":[108],"classify":[109],"each":[110],"individual":[111],"voxel,":[112],"based":[113],"on":[114,158],"in":[118,173],"order":[119],"avoid":[121],"reconstruction":[123,128],"segmentation":[125],"step.":[126],"Accompanying":[127],"artifacts":[129],"scans":[137],"are":[138],"thereby":[139],"reduced,":[140],"while":[141],"preserving":[142],"3D":[143],"pores,":[147],"defects":[148],"inclusions":[150],"inside":[151],"material.":[153],"real":[159],"polymer":[163],"laser":[164],"sintered":[165],"industrial":[166],"parts":[167],"shows":[169],"significant":[171],"reduction":[172],"required":[175],"projections,":[177],"hence":[178],"time.":[180]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2024-01-16T00:00:00"}