{"id":"https://openalex.org/W4389936788","doi":"https://doi.org/10.1007/s10825-023-02121-w","title":"Comparative study of electrical investigation for temperature measurement in AlGaN/GaN HEMT","display_name":"Comparative study of electrical investigation for temperature measurement in AlGaN/GaN HEMT","publication_year":2023,"publication_date":"2023-12-19","ids":{"openalex":"https://openalex.org/W4389936788","doi":"https://doi.org/10.1007/s10825-023-02121-w"},"language":"en","primary_location":{"id":"doi:10.1007/s10825-023-02121-w","doi":"https://doi.org/10.1007/s10825-023-02121-w","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10825-023-02121-w","pdf_url":null,"source":{"id":"https://openalex.org/S39312595","display_name":"Journal of Computational Electronics","issn_l":"1569-8025","issn":["1569-8025","1572-8137"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-40","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Computational Electronics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029914255","display_name":"Fahmida Sharmin Jui","orcid":"https://orcid.org/0009-0001-0380-7067","observed_orcids":["https://orcid.org/0009-0001-0380-7067"]},"institutions":[{"id":"https://openalex.org/I74969885","display_name":"Southern University Bangladesh","ror":"https://ror.org/05bg0c903","country_code":"BD","type":"education","lineage":["https://openalex.org/I74969885"]}],"countries":["BD"],"is_corresponding":false,"raw_author_name":"Fahmida Sharmin Jui","raw_affiliation_strings":["Electronics and Communication Engineering, Southern University Bangladesh, Chittagong, Bangladesh"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Communication Engineering, Southern University Bangladesh, Chittagong, Bangladesh","institution_ids":["https://openalex.org/I74969885"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103181019","display_name":"Sabrina Sharmeen Alam","orcid":"https://orcid.org/0009-0008-2624-4253","observed_orcids":["https://orcid.org/0009-0008-2624-4253"]},"institutions":[{"id":"https://openalex.org/I894293524","display_name":"University of Chittagong","ror":"https://ror.org/01173vs27","country_code":"BD","type":"education","lineage":["https://openalex.org/I894293524"]}],"countries":["BD"],"is_corresponding":false,"raw_author_name":"Sabrina Alam","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, University of Chittagong, Chittagong, Bangladesh"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, University of Chittagong, Chittagong, Bangladesh","institution_ids":["https://openalex.org/I894293524"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075083686","display_name":"Anwar Jarndal","orcid":"https://orcid.org/0000-0002-1873-2088","observed_orcids":["https://orcid.org/0000-0002-1873-2088"]},"institutions":[{"id":"https://openalex.org/I29891158","display_name":"University of Sharjah","ror":"https://ror.org/00engpz63","country_code":"AE","type":"education","lineage":["https://openalex.org/I29891158"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Anwar Jarndal","raw_affiliation_strings":["Department of Electrical Engineering, University of Sharjah, Sharjah, United Arab Emirates"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Sharjah, Sharjah, United Arab Emirates","institution_ids":["https://openalex.org/I29891158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008879645","display_name":"Christophe Gaqui\u00e8re","orcid":"https://orcid.org/0000-0003-3082-2489","observed_orcids":["https://orcid.org/0000-0003-3082-2489"]},"institutions":[{"id":"https://openalex.org/I2279609970","display_name":"Universit\u00e9 de Lille","ror":"https://ror.org/02kzqn938","country_code":"FR","type":"education","lineage":["https://openalex.org/I2279609970"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Christophe Gaquiere","raw_affiliation_strings":["Institute of Electronic, Microelectronic and Nanotechnology (IEMN), University of Lille, Lille, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electronic, Microelectronic and Nanotechnology (IEMN), University of Lille, Lille, France","institution_ids":["https://openalex.org/I2279609970"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043133624","display_name":"Mohammad Abdul Alim","orcid":"https://orcid.org/0000-0002-3984-0176","observed_orcids":["https://orcid.org/0000-0002-3984-0176"]},"institutions":[{"id":"https://openalex.org/I894293524","display_name":"University of Chittagong","ror":"https://ror.org/01173vs27","country_code":"BD","type":"education","lineage":["https://openalex.org/I894293524"]}],"countries":["BD"],"is_corresponding":true,"raw_author_name":"Mohammad A. Alim","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, University of Chittagong, Chittagong, Bangladesh"],"raw_orcid":"https://orcid.org/0000-0002-3984-0176","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, University of Chittagong, Chittagong, Bangladesh","institution_ids":["https://openalex.org/I894293524"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5043133624"],"corresponding_institution_ids":["https://openalex.org/I894293524"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.8148,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.65304647,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":98},"biblio":{"volume":"23","issue":"1","first_page":"42","last_page":"50"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9750999808311462,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9750999808311462,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.02459999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/self-heating-effect","display_name":"self-heating","score":0.8220000267028809},{"id":"https://openalex.org/keywords/channel-temperature","display_name":"channel temperature","score":0.7820000052452087},{"id":"https://openalex.org/keywords/thermal-resistance","display_name":"thermal resistance","score":0.925000011920929},{"id":"https://openalex.org/keywords/algan-gan-high-electron-mobility-transistors","display_name":"AlGaN/GaN HEMT","score":0.9459999799728394},{"id":"https://openalex.org/keywords/gan-hemt","display_name":"GaN HEMT","score":0.6880000233650208},{"id":"https://openalex.org/keywords/silicon-carbide-substrate","display_name":"SiC substrate","score":0.8970000147819519},{"id":"https://openalex.org/keywords/dc-i-v-characteristics","display_name":"DC I-V characteristics","score":0.878000020980835},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"temperature measurement","score":0.628000020980835},{"id":"https://openalex.org/keywords/device-modeling","display_name":"device modeling","score":0.48100000619888306}],"concepts":[{"id":"https://openalex.org/C162057924","wikidata":"https://www.wikidata.org/wiki/Q1617706","display_name":"High-electron-mobility transistor","level":4,"score":0.8640638589859009},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7816400527954102},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5894961953163147},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.1256369650363922},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10468477010726929},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10059070587158203},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10825-023-02121-w","doi":"https://doi.org/10.1007/s10825-023-02121-w","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10825-023-02121-w","pdf_url":null,"source":{"id":"https://openalex.org/S39312595","display_name":"Journal of Computational Electronics","issn_l":"1569-8025","issn":["1569-8025","1572-8137"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-40","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Computational Electronics","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-04369026v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.science/hal-04369026","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Computational Electronics, 2023, ⟨10.1007/s10825-023-02121-w⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1788004718","https://openalex.org/W1983156928","https://openalex.org/W2006981183","https://openalex.org/W2066225989","https://openalex.org/W2075194657","https://openalex.org/W2089498795","https://openalex.org/W2096074167","https://openalex.org/W2103125572","https://openalex.org/W2109792546","https://openalex.org/W2116759134","https://openalex.org/W2124854217","https://openalex.org/W2135923206","https://openalex.org/W2144504447","https://openalex.org/W2157880699","https://openalex.org/W2170542824","https://openalex.org/W2245707036","https://openalex.org/W2279086974","https://openalex.org/W2338803235","https://openalex.org/W2432731060","https://openalex.org/W2519255709","https://openalex.org/W2564119593","https://openalex.org/W2614768675","https://openalex.org/W2890702453","https://openalex.org/W2943261423","https://openalex.org/W2963629841","https://openalex.org/W3048358913","https://openalex.org/W3051071297","https://openalex.org/W3129103315","https://openalex.org/W3173724570","https://openalex.org/W3205069665","https://openalex.org/W4206943659","https://openalex.org/W4280492892"],"related_works":["https://openalex.org/W2943267390","https://openalex.org/W4411233211","https://openalex.org/W1983156928","https://openalex.org/W4283259475","https://openalex.org/W2963965558","https://openalex.org/W2783786346","https://openalex.org/W2564816657","https://openalex.org/W3039564044","https://openalex.org/W2905014146","https://openalex.org/W2778911185"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3}],"updated_date":"2026-10-25T09:29:13.331239","created_date":"2023-12-20T00:00:00"}