{"id":"https://openalex.org/W4389476835","doi":"https://doi.org/10.1051/e3sconf/202345802002","title":"Automatic monitoring system designed to detect defects in PET preforms","display_name":"Automatic monitoring system designed to detect defects in PET preforms","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4389476835","doi":"https://doi.org/10.1051/e3sconf/202345802002"},"language":"en","primary_location":{"id":"doi:10.1051/e3sconf/202345802002","doi":"https://doi.org/10.1051/e3sconf/202345802002","is_oa":true,"landing_page_url":"https://doi.org/10.1051/e3sconf/202345802002","pdf_url":"https://www.e3s-conferences.org/articles/e3sconf/pdf/2023/95/e3sconf_emmft2023_02002.pdf","source":{"id":"https://openalex.org/S4210186093","display_name":"E3S Web of Conferences","issn_l":"2267-1242","issn":["2267-1242","2555-0403"],"is_oa":true,"is_in_doaj":true,"is_core":false,"listed_in":["ddh","doaj","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319748","host_organization_name":"EDP Sciences","host_organization_lineage":["https://openalex.org/P4310319748","https://openalex.org/P4310319982"],"host_organization_lineage_names":["EDP Sciences","Science Press"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"E3S Web of Conferences","raw_type":"journal-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.e3s-conferences.org/articles/e3sconf/pdf/2023/95/e3sconf_emmft2023_02002.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051913481","display_name":"Ksenia Degtyareva","orcid":"https://orcid.org/0009-0003-6285-3017","observed_orcids":["https://orcid.org/0009-0003-6285-3017"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"K.V. Degtyareva","raw_affiliation_strings":["Reshetnev Siberian State University of Science and Technology, 660037 Krasnoyarsk, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Reshetnev Siberian State University of Science and Technology, 660037 Krasnoyarsk, Russia","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"S.V. Nikolaev","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S.V. Nikolaev","raw_affiliation_strings":["Reshetnev Siberian State University of Science and Technology, 660037 Krasnoyarsk, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Reshetnev Siberian State University of Science and Technology, 660037 Krasnoyarsk, Russia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110360912","display_name":"V. A. Nelyub","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I177537411","display_name":"Bauman Moscow State Technical University","ror":"https://ror.org/00pb8h375","country_code":"RU","type":"education","lineage":["https://openalex.org/I177537411"]},{"id":"https://openalex.org/I212220629","display_name":"Peter the Great St. Petersburg Polytechnic University","ror":"https://ror.org/02x91aj62","country_code":"RU","type":"education","lineage":["https://openalex.org/I212220629"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"V.A. Nelyub","raw_affiliation_strings":["Bauman Moscow State Technical University, Artificial Intelligence Technology Scientific and Education Center, 105005, Moscow, Russia","Peter the Great St.Petersburg Polytechnic University, St.Petersburg, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bauman Moscow State Technical University, Artificial Intelligence Technology Scientific and Education Center, 105005, Moscow, Russia","institution_ids":["https://openalex.org/I177537411"]},{"raw_affiliation_string":"Peter the Great St.Petersburg Polytechnic University, St.Petersburg, Russia","institution_ids":["https://openalex.org/I212220629"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045549119","display_name":"\u0412 \u0421 \u0422\u044b\u043d\u0447\u0435\u043d\u043a\u043e","orcid":"https://orcid.org/0000-0002-3959-2969","observed_orcids":["https://orcid.org/0000-0002-3959-2969","https://orcid.org/0000-0002-4017-4369"]},"institutions":[{"id":"https://openalex.org/I177537411","display_name":"Bauman Moscow State Technical University","ror":"https://ror.org/00pb8h375","country_code":"RU","type":"education","lineage":["https://openalex.org/I177537411"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"V.S. Tynchenko","raw_affiliation_strings":["Bauman Moscow State Technical University, Artificial Intelligence Technology Scientific and Education Center, 105005, Moscow, Russia","Reshetnev Siberian State University of Science and Technology, 660037 Krasnoyarsk, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bauman Moscow State Technical University, Artificial Intelligence Technology Scientific and Education Center, 105005, Moscow, Russia","institution_ids":["https://openalex.org/I177537411"]},{"raw_affiliation_string":"Reshetnev Siberian State University of Science and Technology, 660037 Krasnoyarsk, Russia","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032053296","display_name":"\u0410. \u0421. \u0411\u043e\u0440\u043e\u0434\u0443\u043b\u0438\u043d","orcid":"https://orcid.org/0000-0002-9648-2395","observed_orcids":["https://orcid.org/0000-0002-9648-2395"]},"institutions":[{"id":"https://openalex.org/I177537411","display_name":"Bauman Moscow State Technical University","ror":"https://ror.org/00pb8h375","country_code":"RU","type":"education","lineage":["https://openalex.org/I177537411"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"A.S. Borodulin","raw_affiliation_strings":["Bauman Moscow State Technical University, Artificial Intelligence Technology Scientific and Education Center, 105005, Moscow, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bauman Moscow State Technical University, Artificial Intelligence Technology Scientific and Education Center, 105005, Moscow, Russia","institution_ids":["https://openalex.org/I177537411"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":10.3337,"has_fulltext":true,"cited_by_count":25,"citation_normalized_percentile":{"value":0.99040944,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"458","issue":null,"first_page":"02002","last_page":"02002"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13344","display_name":"Industrial Automation and Control Systems","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pet-preforms","display_name":"PET preforms","score":0.925000011920929},{"id":"https://openalex.org/keywords/defect-detection","display_name":"defect detection","score":0.9070000052452087},{"id":"https://openalex.org/keywords/machine-vision","display_name":"machine vision","score":0.7480000257492065},{"id":"https://openalex.org/keywords/automated-inspection","display_name":"automated inspection","score":0.6930000185966492},{"id":"https://openalex.org/keywords/image-processing","display_name":"image processing","score":0.7419999837875366},{"id":"https://openalex.org/keywords/manufacturing-quality-control","display_name":"manufacturing quality control","score":0.6309999823570251}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6513100266456604},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6509748697280884},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.6416956186294556},{"id":"https://openalex.org/C2778012447","wikidata":"https://www.wikidata.org/wiki/Q1034415","display_name":"Scope (computer science)","level":2,"score":0.600425660610199},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5419955253601074},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5360404253005981},{"id":"https://openalex.org/C204983608","wikidata":"https://www.wikidata.org/wiki/Q2111958","display_name":"Productivity","level":2,"score":0.5147442817687988},{"id":"https://openalex.org/C16320812","wikidata":"https://www.wikidata.org/wiki/Q1812200","display_name":"Idle","level":2,"score":0.4481663405895233},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.44300639629364014},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.4223308265209198},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3571857810020447},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2386416792869568},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10387983918190002},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1051/e3sconf/202345802002","doi":"https://doi.org/10.1051/e3sconf/202345802002","is_oa":true,"landing_page_url":"https://doi.org/10.1051/e3sconf/202345802002","pdf_url":"https://www.e3s-conferences.org/articles/e3sconf/pdf/2023/95/e3sconf_emmft2023_02002.pdf","source":{"id":"https://openalex.org/S4210186093","display_name":"E3S Web of Conferences","issn_l":"2267-1242","issn":["2267-1242","2555-0403"],"is_oa":true,"is_in_doaj":true,"is_core":false,"listed_in":["ddh","doaj","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319748","host_organization_name":"EDP Sciences","host_organization_lineage":["https://openalex.org/P4310319748","https://openalex.org/P4310319982"],"host_organization_lineage_names":["EDP Sciences","Science Press"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"E3S Web of Conferences","raw_type":"journal-article"},{"id":"pmh:oai:edpsciences.org:dkey/10.1051/e3sconf/202345802002","doi":null,"is_oa":true,"landing_page_url":"https://www.e3s-conferences.org/10.1051/e3sconf/202345802002/pdf","pdf_url":"https://www.e3s-conferences.org/10.1051/e3sconf/202345802002/pdf","source":{"id":"https://openalex.org/S4306400744","display_name":"Springer Link (Chiba Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I8488066","host_organization_name":"Chiba Institute of Technology","host_organization_lineage":["https://openalex.org/I8488066"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"https://doi.org/10.1051/e3sconf/202345802002","raw_type":"Text"},{"id":"pmh:oai:doaj.org/article:f75c61e15fb2417ab88fb82ff0cef473","doi":null,"is_oa":true,"landing_page_url":"https://doaj.org/article/f75c61e15fb2417ab88fb82ff0cef473","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"E3S Web of Conferences, Vol 458, p 02002 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1051/e3sconf/202345802002","doi":"https://doi.org/10.1051/e3sconf/202345802002","is_oa":true,"landing_page_url":"https://doi.org/10.1051/e3sconf/202345802002","pdf_url":"https://www.e3s-conferences.org/articles/e3sconf/pdf/2023/95/e3sconf_emmft2023_02002.pdf","source":{"id":"https://openalex.org/S4210186093","display_name":"E3S Web of Conferences","issn_l":"2267-1242","issn":["2267-1242","2555-0403"],"is_oa":true,"is_in_doaj":true,"is_core":false,"listed_in":["ddh","doaj","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319748","host_organization_name":"EDP Sciences","host_organization_lineage":["https://openalex.org/P4310319748","https://openalex.org/P4310319982"],"host_organization_lineage_names":["EDP Sciences","Science Press"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"E3S Web of Conferences","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.7207000255584717,"display_name":"Industry, innovation and infrastructure"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4389476835.pdf","grobid_xml":"https://content.openalex.org/works/W4389476835.grobid-xml"},"referenced_works_count":25,"referenced_works":["https://openalex.org/W3182479097","https://openalex.org/W3192127660","https://openalex.org/W3197612171","https://openalex.org/W3198099511","https://openalex.org/W3198809988","https://openalex.org/W4283203961","https://openalex.org/W4283212447","https://openalex.org/W4283219420","https://openalex.org/W4298145906","https://openalex.org/W4304761909","https://openalex.org/W4313209402","https://openalex.org/W4313402628","https://openalex.org/W4313427568","https://openalex.org/W4313494613","https://openalex.org/W4322500700","https://openalex.org/W4322775587","https://openalex.org/W4362560310","https://openalex.org/W4362733434","https://openalex.org/W4364360698","https://openalex.org/W4372346243","https://openalex.org/W4377041238","https://openalex.org/W4378083154","https://openalex.org/W4382058722","https://openalex.org/W4382068759","https://openalex.org/W4383346056"],"related_works":["https://openalex.org/W2526227069","https://openalex.org/W7140495049","https://openalex.org/W2527159233","https://openalex.org/W4404249780","https://openalex.org/W7125832336","https://openalex.org/W7009021220","https://openalex.org/W4409715436","https://openalex.org/W4361841185","https://openalex.org/W1997011612","https://openalex.org/W2353890124"],"abstract_inverted_index":{"The":[0,39],"goal":[1],"of":[2,63,79,82,100,110,127],"this":[3,17,67,90],"work":[4],"is":[5,20,47,68,118],"to":[6,22,76,107,120],"automate":[7],"the":[8,24,50,56,60,64,77,94,116,125],"defect":[9,86,128],"detection":[10],"system":[11],"for":[12,52,58],"PET":[13],"preforms":[14],"production.":[15],"For":[16],"purpose,":[18],"it":[19],"necessary":[21],"consider":[23],"machine":[25],"vision":[26],"method,":[27],"which":[28,103,138],"has":[29],"hardware":[30],"and":[31,55,72,98,133],"software":[32,40],"structures":[33],"that":[34],"include":[35],"many":[36],"technical":[37],"components.":[38],"in":[41,49,104,112,137],"turn":[42,105],"includes":[43],"two":[44],"parts:":[45],"one":[46],"used":[48],"computer":[51],"image":[53],"processing":[54],"other":[57],"controlling":[59],"mechanical":[61],"components":[62],"system.":[65],"However,":[66],"a":[69,108],"very":[70],"expensive":[71],"time-consuming":[73],"process":[74],"due":[75],"collection":[78],"large":[80],"amounts":[81],"information":[83],"with":[84],"labeled":[85],"samples.":[87],"As":[88],"shown,":[89],"technology":[91],"can":[92],"improve":[93],"scope,":[95],"efficiency,":[96],"quality":[97],"reliability":[99],"industrial":[101],"inspection,":[102],"leads":[106],"number":[109],"advances":[111],"modern":[113],"industry.":[114],"Also,":[115],"company":[117],"able":[119],"increase":[121,131],"its":[122],"productivity,":[123],"reduce":[124],"cost":[126],"controllers\u2019":[129],"salaries,":[130],"profits,":[132],"avoid":[134],"creating":[135],"situations":[136],"equipment":[139],"will":[140],"be":[141],"idle.":[142]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":21}],"updated_date":"2026-09-27T08:07:27.782135","created_date":"2023-12-09T00:00:00"}