{"id":"https://openalex.org/W4387486175","doi":"https://doi.org/10.1109/icemi59194.2023.10270734","title":"Research on Self-Learning Flaw Detection in Ultrasonic C-Scan Non-Destructive Testing","display_name":"Research on Self-Learning Flaw Detection in Ultrasonic C-Scan Non-Destructive Testing","publication_year":2023,"publication_date":"2023-08-09","ids":{"openalex":"https://openalex.org/W4387486175","doi":"https://doi.org/10.1109/icemi59194.2023.10270734"},"language":"en","primary_location":{"id":"doi:10.1109/icemi59194.2023.10270734","doi":"https://doi.org/10.1109/icemi59194.2023.10270734","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icemi59194.2023.10270734","pdf_url":null,"source":{"id":"https://openalex.org/S4306422632","display_name":"IEEE International Conference on Electronic Measurement & Instruments","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 16th International Conference on Electronic Measurement &amp; Instruments (ICEMI)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100344732","display_name":"\u0416\u0438\u043f\u0435\u043d\u0433 \u041b\u0438","orcid":"https://orcid.org/0000-0002-0415-087X","observed_orcids":["https://orcid.org/0000-0002-0415-087X"]},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhipeng Li","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020632770","display_name":"Yibing Shi","orcid":"https://orcid.org/0000-0002-6521-972X","observed_orcids":["https://orcid.org/0000-0002-6521-972X"]},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yibing Shi","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100382136","display_name":"Yanjun Li","orcid":"https://orcid.org/0000-0003-3971-9795","observed_orcids":["https://orcid.org/0000-0003-3971-9795"]},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanjun Li","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100624529","display_name":"Wei Zhang","orcid":"https://orcid.org/0000-0002-1218-9475","observed_orcids":["https://orcid.org/0000-0002-1218-9475"]},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Zhang","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5020162725","display_name":"Ao Qiu","orcid":"https://orcid.org/0000-0002-1433-2415","observed_orcids":["https://orcid.org/0000-0002-1433-2415"]},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ao Qiu","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":2.488,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.87943262,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"401","last_page":"405"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.7651000022888184,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.7651000022888184,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.22360000014305115,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12940","display_name":"Structural Engineering and Materials Analysis","score":0.0017000000225380063,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ultrasonic-c-scan","display_name":"ultrasonic C-scan","score":0.9800000190734863},{"id":"https://openalex.org/keywords/defect-detection","display_name":"defect detection","score":0.906000018119812},{"id":"https://openalex.org/keywords/contrastive-learning","display_name":"contrastive learning","score":0.8640000224113464},{"id":"https://openalex.org/keywords/unsupervised-learning","display_name":"unsupervised learning","score":0.8309999704360962},{"id":"https://openalex.org/keywords/class-imbalance","display_name":"class imbalance","score":0.6010000109672546},{"id":"https://openalex.org/keywords/convolutional-neural-networks","display_name":"convolutional neural networks","score":0.5649999976158142},{"id":"https://openalex.org/keywords/corrosion-monitoring","display_name":"corrosion monitoring","score":0.8970000147819519},{"id":"https://openalex.org/keywords/self-supervised-learning","display_name":"self-supervised learning","score":0.5109999775886536}],"concepts":[{"id":"https://openalex.org/C81288441","wikidata":"https://www.wikidata.org/wiki/Q20736125","display_name":"Ultrasonic sensor","level":2,"score":0.833449125289917},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6737409234046936},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5992336869239807},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5671094059944153},{"id":"https://openalex.org/C2779426996","wikidata":"https://www.wikidata.org/wiki/Q18389128","display_name":"Echo (communications protocol)","level":2,"score":0.5208064317703247},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5029749274253845},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.49232304096221924},{"id":"https://openalex.org/C117978034","wikidata":"https://www.wikidata.org/wiki/Q5422192","display_name":"Extractor","level":2,"score":0.4574001431465149},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.44989413022994995},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.43062829971313477},{"id":"https://openalex.org/C175309249","wikidata":"https://www.wikidata.org/wiki/Q725864","display_name":"Pipeline transport","level":2,"score":0.41452547907829285},{"id":"https://openalex.org/C59404180","wikidata":"https://www.wikidata.org/wiki/Q17013334","display_name":"Feature learning","level":2,"score":0.4130045175552368},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.26585516333580017},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13823872804641724},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C21880701","wikidata":"https://www.wikidata.org/wiki/Q2144042","display_name":"Process engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C87717796","wikidata":"https://www.wikidata.org/wiki/Q146326","display_name":"Environmental engineering","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icemi59194.2023.10270734","doi":"https://doi.org/10.1109/icemi59194.2023.10270734","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icemi59194.2023.10270734","pdf_url":null,"source":{"id":"https://openalex.org/S4306422632","display_name":"IEEE International Conference on Electronic Measurement & Instruments","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 16th International Conference on Electronic Measurement &amp; Instruments (ICEMI)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322143","display_name":"China National Offshore Oil Corporation","ror":"https://ror.org/054dq0621"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W2019328284","https://openalex.org/W2073606477","https://openalex.org/W2086792172","https://openalex.org/W2125410023","https://openalex.org/W2587663945","https://openalex.org/W2663890310","https://openalex.org/W2897427890","https://openalex.org/W2902551404","https://openalex.org/W2950674600","https://openalex.org/W2996641449","https://openalex.org/W3005680577","https://openalex.org/W3035060554","https://openalex.org/W3036982689","https://openalex.org/W3045898397","https://openalex.org/W3171007011","https://openalex.org/W4200015542","https://openalex.org/W4205261370","https://openalex.org/W4210854460","https://openalex.org/W4226213816","https://openalex.org/W6672268669"],"related_works":["https://openalex.org/W4388405857","https://openalex.org/W4405521797","https://openalex.org/W3204836756","https://openalex.org/W2994856480","https://openalex.org/W7127588467","https://openalex.org/W7164018686","https://openalex.org/W2106727297","https://openalex.org/W3098104182","https://openalex.org/W4317923885","https://openalex.org/W4386849090"],"abstract_inverted_index":{"The":[0,86,107,161],"ultrasonic":[1,55,62,84,105],"C-scan":[2],"technique":[3,30],"is":[4,72],"widely":[5],"utilized":[6],"for":[7,53],"corrosion":[8],"monitoring":[9],"of":[10,23,28,35,58,79,95,102,111,146,159,174,182,189],"metal":[11],"plates":[12],"and":[13,38,99,122,137,180],"pipelines":[14],"due":[15],"to":[16,19,74,131,152],"its":[17],"ability":[18],"generate":[20],"comprehensible":[21],"images":[22],"flaws.":[24,160],"However,":[25],"the":[26,36,43,90,93,100,144,165,178,190],"application":[27],"this":[29,47],"has":[31],"been":[32],"challenging":[33],"because":[34],"large-scale":[37],"unbalanced":[39],"signals":[40,57,81],"reflected":[41],"from":[42,83],"tested":[44],"objects.":[45],"In":[46],"paper,":[48],"we":[49],"present":[50],"a":[51,114,119,123],"method":[52,109],"identifying":[54,177],"response":[56],"defects":[59],"using":[60,186],"an":[61,133,153],"detection":[63],"with":[64,156],"contrastive":[65,139],"learning":[66,170],"(UD-CL)":[67],"framework.":[68],"This":[69],"self-learning":[70],"framework":[71],"used":[73,130],"unsupervisedly":[75],"learn":[76],"latent":[77,135],"representations":[78],"echo":[80,97],"obtained":[82],"C-scans.":[85],"algorithm":[87],"addresses":[88],"both":[89],"imbalance":[91],"in":[92,172,176],"distribution":[94],"raw":[96],"data":[98],"lack":[101],"sufficient":[103],"annotated":[104],"signals.":[106],"UD-CL":[108,166],"consists":[110],"two":[112],"components:":[113],"feature":[115],"extractor":[116],"based":[117],"on":[118],"convolutional":[120],"network":[121],"learnable":[124],"nonlinear":[125],"transformation":[126],"layer,":[127],"which":[128],"are":[129],"obtain":[132],"efficient":[134],"representation":[136],"perform":[138],"optimization,":[140],"respectively.":[141],"We":[142],"demonstrate":[143],"effectiveness":[145],"our":[147],"approach":[148],"by":[149],"applying":[150],"it":[151],"aluminum":[154],"plate":[155],"various":[157],"types":[158],"results":[162],"show":[163],"that":[164],"outperforms":[167],"previous":[168],"deep":[169],"techniques":[171],"terms":[173],"accuracy":[175],"location":[179],"category":[181],"flaws":[183],"when":[184],"trained":[185],"only":[187],"10%":[188],"labels.":[191]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-10-31T12:09:11.096373","created_date":"2023-10-11T00:00:00"}
