{"id":"https://openalex.org/W4387068232","doi":"https://doi.org/10.1109/jsyst.2023.3315958","title":"Synchro-Squeezing Transform for High-Impedance Fault Detection in Power Distribution Systems","display_name":"Synchro-Squeezing Transform for High-Impedance Fault Detection in Power Distribution Systems","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4387068232","doi":"https://doi.org/10.1109/jsyst.2023.3315958"},"language":"en","primary_location":{"id":"doi:10.1109/jsyst.2023.3315958","doi":"https://doi.org/10.1109/jsyst.2023.3315958","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2023.3315958","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-2","norway-1","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039072421","display_name":"Ruchi Chandrakar","orcid":"https://orcid.org/0000-0001-6700-4629","observed_orcids":["https://orcid.org/0000-0001-6700-4629","https://orcid.org/0009-0009-9405-3560"]},"institutions":[{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ruchi Chandrakar","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology, New Delhi, India"],"raw_orcid":"https://orcid.org/0000-0001-6700-4629","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, New Delhi, India","institution_ids":["https://openalex.org/I68891433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084525263","display_name":"Rahul Dubey","orcid":"https://orcid.org/0000-0002-1662-3718","observed_orcids":["https://orcid.org/0000-0002-1662-3718"]},"institutions":[{"id":"https://openalex.org/I4210151956","display_name":"Robert Bosch (India)","ror":"https://ror.org/04my8ty22","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210151956","https://openalex.org/I889804353"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Rahul Kumar Dubey","raw_affiliation_strings":["Bosch Engineering and Business Solutions, Bengaluru, India"],"raw_orcid":"https://orcid.org/0000-0002-1662-3718","affiliations":[{"raw_affiliation_string":"Bosch Engineering and Business Solutions, Bengaluru, India","institution_ids":["https://openalex.org/I4210151956"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073634264","display_name":"Bijaya Ketan Panigrahi","orcid":"https://orcid.org/0000-0003-2062-2889","observed_orcids":["https://orcid.org/0000-0003-2062-2889"]},"institutions":[{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Bijaya Ketan Panigrahi","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology, New Delhi, India"],"raw_orcid":"https://orcid.org/0000-0003-2062-2889","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, New Delhi, India","institution_ids":["https://openalex.org/I68891433"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2345,"currency":"USD","value_usd":2345},"apc_paid":null,"fwci":0.9594,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.69446507,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.002099999925121665,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.0008999999845400453,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/high-impedance-fault-detection","display_name":"high impedance fault detection","score":0.9459999799728394},{"id":"https://openalex.org/keywords/distribution-networks","display_name":"distribution networks","score":0.8880000114440918},{"id":"https://openalex.org/keywords/reconstruction-error","display_name":"reconstruction error","score":0.6710000038146973},{"id":"https://openalex.org/keywords/distributed-generation","display_name":"distributed generation","score":0.8330000042915344},{"id":"https://openalex.org/keywords/ev-penetration","display_name":"EV penetration","score":0.871999979019165},{"id":"https://openalex.org/keywords/ieee-13-node-test-feeder","display_name":"IEEE 13-node test feeder","score":0.7459999918937683},{"id":"https://openalex.org/keywords/real-time-digital-simulation","display_name":"real-time digital simulation","score":0.7519999742507935}],"concepts":[{"id":"https://openalex.org/C174268685","wikidata":"https://www.wikidata.org/wiki/Q769127","display_name":"High impedance","level":3,"score":0.5145425200462341},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5132274627685547},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.503678023815155},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49931859970092773},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.4600425064563751},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.44933080673217773},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.4463212490081787},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.4338865876197815},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34817448258399963},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19750159978866577},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jsyst.2023.3315958","doi":"https://doi.org/10.1109/jsyst.2023.3315958","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsyst.2023.3315958","pdf_url":null,"source":{"id":"https://openalex.org/S95999327","display_name":"IEEE Systems Journal","issn_l":"1932-8184","issn":["1932-8184","1937-9234","2373-7816"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-2","norway-1","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Systems Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.7207000255584717,"display_name":"Industry, innovation and infrastructure"}],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322724","display_name":"Ministry of Education, India","ror":"https://ror.org/048xjjh50"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W98279822","https://openalex.org/W2032792471","https://openalex.org/W2050340551","https://openalex.org/W2078012124","https://openalex.org/W2111015730","https://openalex.org/W2122634891","https://openalex.org/W2124332756","https://openalex.org/W2141449645","https://openalex.org/W2150946322","https://openalex.org/W2169820194","https://openalex.org/W2320936718","https://openalex.org/W2413218194","https://openalex.org/W2567241916","https://openalex.org/W2762654164","https://openalex.org/W2790561973","https://openalex.org/W2803609292","https://openalex.org/W2902940846","https://openalex.org/W2946355626","https://openalex.org/W2960020789","https://openalex.org/W2963157523","https://openalex.org/W3009250952","https://openalex.org/W3056908629","https://openalex.org/W3084086021","https://openalex.org/W3133082861","https://openalex.org/W3178522489","https://openalex.org/W4210396483","https://openalex.org/W4285298170","https://openalex.org/W4293370555"],"related_works":["https://openalex.org/W2984587368","https://openalex.org/W3135647981","https://openalex.org/W3207342424","https://openalex.org/W6935884709","https://openalex.org/W4408795206","https://openalex.org/W4313060937","https://openalex.org/W4211180994","https://openalex.org/W4399801552","https://openalex.org/W3046071693","https://openalex.org/W3068347772"],"abstract_inverted_index":{"Distribution":[0],"systems":[1],"are":[2,74,204,232],"most":[3],"vulnerable":[4],"to":[5,47,64,69,76,84,92,127,140,158,189],"high-impedance":[6,25],"faults":[7,12],"(HIFs).":[8],"These":[9],"types":[10],"of":[11,36,53,80,88,97,116,198,228,264],"occur":[13],"when":[14],"the":[15,48,78,94,113,132,141,152,160,163,172,176,186,211,218,229,255,262],"primary":[16],"electrical":[17],"conductor":[18],"fails":[19],"or":[20],"comes":[21],"into":[22],"contact":[23],"with":[24,185,254],"substances,":[26],"such":[27],"as":[28],"asphalt,":[29],"grass,":[30],"sand,":[31],"concrete,":[32],"etc.":[33],"The":[34,86,135,166,179,196,225,249],"magnitude":[35],"fault":[37],"current":[38,144],"is":[39,91,138,156,169,183,266],"particularly":[40],"low":[41],"for":[42,112,146],"certain":[43],"grounding":[44],"materials":[45],"due":[46],"nonlinear":[49],"and":[50,175,215,246,261,278],"high":[51],"impedance":[52],"resistive":[54],"surfaces.":[55],"As":[56],"a":[57,103,274],"result,":[58],"traditional":[59],"overcurrent":[60],"relays":[61],"usually":[62],"fail":[63],"operate,":[65],"which":[66],"may":[67],"lead":[68],"fire":[70],"hazards.":[71],"Also,":[72],"they":[73],"unable":[75],"detect":[77],"characteristics":[79],"HIF":[81,117,191,202,238,258],"accurately,":[82],"leading":[83],"maloperation.":[85],"motive":[87],"this":[89],"work":[90],"overcome":[93],"above-mentioned":[95],"challenges":[96],"conventional":[98],"relays.":[99],"This":[100,122],"article":[101],"proposes":[102],"linear":[104],"time\u2013frequency":[105,148,164],"wavelet-based":[106],"tool":[107],"called":[108],"synchro-squeezing":[109],"transform":[110],"(SST)":[111],"distortion":[114],"detection":[115,259,276],"in":[118,131,210],"power":[119],"distribution":[120,213],"networks.":[121],"study":[123],"uses":[124],"wavelet":[125,136],"SST":[126,137,154,265,272],"redistribute":[128],"signal":[129,145,161,174],"energy":[130],"frequency":[133],"domain.":[134,165],"applied":[139],"measured":[142],"phase":[143],"maximum":[147],"ridge":[149],"extraction.":[150],"Then,":[151],"inverse":[153],"operation":[155],"performed":[157],"reconstruct":[159],"from":[162,192,239],"reconstruction":[167,180],"error":[168,181],"calculated":[170],"between":[171],"original":[173],"reconstructed":[177],"signal.":[178],"value":[182,188],"compared":[184,253],"base":[187],"discriminate":[190],"other":[193],"non-HIF":[194],"events.":[195],"impact":[197],"distributed":[199],"generation":[200],"on":[201,217],"features":[203],"further":[205],"explored":[206],"by":[207],"EV":[208],"penetration":[209],"RSCAD":[212],"system":[214],"validated":[216],"IEEE-13":[219],"node":[220],"test":[221],"feeder":[222],"using":[223],"RTDS.":[224],"main":[226],"contributions":[227],"proposed":[230],"method":[231],"viz.,":[233],"it":[234],"can":[235],"correctly":[236],"distinguish":[237],"severe":[240],"faults,":[241],"switching":[242],"events,":[243],"energization":[244],"scenarios,":[245],"noisy":[247],"environments.":[248],"algorithm":[250],"has":[251,273],"been":[252],"previously":[256],"reported":[257],"techniques,":[260],"efficacy":[263],"presented":[267],"through":[268],"real-time":[269],"simulation":[270],"results.":[271],"fast":[275],"time":[277],"less":[279],"computation":[280],"burden.":[281]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":6}],"updated_date":"2026-09-25T08:18:29.962427","created_date":"2023-09-27T00:00:00"}