{"id":"https://openalex.org/W4386804871","doi":"https://doi.org/10.1007/978-981-99-3716-5_22","title":"Garment Defect Detection System Based on Histogram Using Deep Learning","display_name":"Garment Defect Detection System Based on Histogram Using Deep Learning","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4386804871","doi":"https://doi.org/10.1007/978-981-99-3716-5_22"},"language":"en","primary_location":{"id":"doi:10.1007/978-981-99-3716-5_22","doi":"https://doi.org/10.1007/978-981-99-3716-5_22","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-99-3716-5_22","pdf_url":null,"source":{"id":"https://openalex.org/S4210169156","display_name":"Lecture notes in networks and systems","issn_l":"2367-3389","issn":["2367-3389","2367-3370"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319972","host_organization_name":"Springer International Publishing","host_organization_lineage":["https://openalex.org/P4310319972","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer International Publishing","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Networks and Systems","raw_type":"book-chapter"},"volume":{"id":"https://openalex.org/W4386805016","display_name":"Proceedings of Fourth Doctoral Symposium on Computational Intelligence"},"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011506371","display_name":"Mayur Rahul","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I229991691","display_name":"Chhatrapati Shahu Ji Maharaj University","ror":"https://ror.org/040qxz868","country_code":"IN","type":"education","lineage":["https://openalex.org/I229991691"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Mayur Rahul","raw_affiliation_strings":["Department of Computer Application, UIET, CSJM University Kanpur Nagar, Kanpur, Uttar Pradesh, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Application, UIET, CSJM University Kanpur Nagar, Kanpur, Uttar Pradesh, India","institution_ids":["https://openalex.org/I229991691"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038650263","display_name":"Namita Tiwari","orcid":"https://orcid.org/0000-0001-6355-9459","observed_orcids":["https://orcid.org/0000-0001-6355-9459"]},"institutions":[{"id":"https://openalex.org/I229991691","display_name":"Chhatrapati Shahu Ji Maharaj University","ror":"https://ror.org/040qxz868","country_code":"IN","type":"education","lineage":["https://openalex.org/I229991691"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Namita Tiwari","raw_affiliation_strings":["Department of Mathematics, School of Basic Sciences, CSJM University Kanpur, Kanpur, Uttar Pradesh, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mathematics, School of Basic Sciences, CSJM University Kanpur, Kanpur, Uttar Pradesh, India","institution_ids":["https://openalex.org/I229991691"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080465240","display_name":"Ayushi Prakash","orcid":"https://orcid.org/0000-0002-9199-5503","observed_orcids":["https://orcid.org/0000-0002-9199-5503"]},"institutions":[{"id":"https://openalex.org/I4387154809","display_name":"ABES Engineering College","ror":"https://ror.org/04hp0cf98","country_code":"IN","type":"education","lineage":["https://openalex.org/I4387154809"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ayushi Prakash","raw_affiliation_strings":["ABES Engineering College, Ghaziabad, Uttar Pradesh, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ABES Engineering College, Ghaziabad, Uttar Pradesh, India","institution_ids":["https://openalex.org/I4387154809"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064089724","display_name":"Vikash Yadav","orcid":"https://orcid.org/0000-0003-1348-1379","observed_orcids":["https://orcid.org/0000-0003-1348-1379"]},"institutions":[{"id":"https://openalex.org/I2801491316","display_name":"Government of Uttar Pradesh","ror":"https://ror.org/00hx1yw75","country_code":"IN","type":"government","lineage":["https://openalex.org/I2801491316"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Vikash Yadav","raw_affiliation_strings":["Government Polytechnic Bighapur Unnao, Department of Technical Education, Uttar Pradesh, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Government Polytechnic Bighapur Unnao, Department of Technical Education, Uttar Pradesh, India","institution_ids":["https://openalex.org/I2801491316"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5064089724"],"corresponding_institution_ids":["https://openalex.org/I2801491316"],"apc_list":null,"apc_paid":null,"fwci":1.6534,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.82626337,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"255","last_page":"265"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automated-quality-inspection","display_name":"automated quality inspection","score":0.6190000176429749},{"id":"https://openalex.org/keywords/local-binary-pattern","display_name":"local binary pattern","score":0.7250000238418579},{"id":"https://openalex.org/keywords/histogram-based-feature-extraction","display_name":"histogram-based feature extraction","score":0.6899999976158142},{"id":"https://openalex.org/keywords/deep-learning-classification","display_name":"deep learning classification","score":0.7639999985694885}],"concepts":[{"id":"https://openalex.org/C53533937","wikidata":"https://www.wikidata.org/wiki/Q185020","display_name":"Histogram","level":3,"score":0.716232180595398},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7027541995048523},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6633800268173218},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.5770683288574219},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5727661848068237},{"id":"https://openalex.org/C17426736","wikidata":"https://www.wikidata.org/wiki/Q419918","display_name":"Histogram of oriented gradients","level":4,"score":0.5344637632369995},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.5025489330291748},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4782627820968628},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.45621031522750854},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.44555121660232544},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3974936604499817},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23133432865142822},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.11473500728607178},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.059750914573669434},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-981-99-3716-5_22","doi":"https://doi.org/10.1007/978-981-99-3716-5_22","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-99-3716-5_22","pdf_url":null,"source":{"id":"https://openalex.org/S4210169156","display_name":"Lecture notes in networks and systems","issn_l":"2367-3389","issn":["2367-3389","2367-3370"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319972","host_organization_name":"Springer International Publishing","host_organization_lineage":["https://openalex.org/P4310319972","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer International Publishing","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Networks and Systems","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W172389119","https://openalex.org/W1975920834","https://openalex.org/W1988646500","https://openalex.org/W2022320998","https://openalex.org/W2034856412","https://openalex.org/W2085525849","https://openalex.org/W2093680491","https://openalex.org/W2102897080","https://openalex.org/W2144273095","https://openalex.org/W2344428106","https://openalex.org/W2520299402","https://openalex.org/W2584792247","https://openalex.org/W2591552189","https://openalex.org/W2592902783","https://openalex.org/W2593395851","https://openalex.org/W2603394956","https://openalex.org/W2626955082","https://openalex.org/W2766021674","https://openalex.org/W2790567169","https://openalex.org/W2806915783","https://openalex.org/W2884013364","https://openalex.org/W2884918210","https://openalex.org/W2965630881","https://openalex.org/W2980587280","https://openalex.org/W3001083904","https://openalex.org/W3001472289","https://openalex.org/W3011838753","https://openalex.org/W3024836211","https://openalex.org/W3039548339","https://openalex.org/W3045521890","https://openalex.org/W3082199560","https://openalex.org/W3083451994","https://openalex.org/W3090823074","https://openalex.org/W3110649866","https://openalex.org/W3194043088","https://openalex.org/W4223470815","https://openalex.org/W4229966376"],"related_works":["https://openalex.org/W4391880666","https://openalex.org/W4411099136","https://openalex.org/W7211881494","https://openalex.org/W4409805198","https://openalex.org/W7009790721","https://openalex.org/W2770065347","https://openalex.org/W2981845603","https://openalex.org/W4392395494","https://openalex.org/W4400792634","https://openalex.org/W4372354928"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3}],"updated_date":"2026-11-12T12:28:57.059296","created_date":"2023-09-17T00:00:00"}