{"id":"https://openalex.org/W4386737366","doi":"https://doi.org/10.1109/tia.2023.3315273","title":"Reliable and Effective Fault Diagnosis/Tolerance Technique Using Enhanced Distorted Current\u2013Voltage SVPWM Method for Multilevel Inverters","display_name":"Reliable and Effective Fault Diagnosis/Tolerance Technique Using Enhanced Distorted Current\u2013Voltage SVPWM Method for Multilevel Inverters","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4386737366","doi":"https://doi.org/10.1109/tia.2023.3315273"},"language":"en","primary_location":{"id":"doi:10.1109/tia.2023.3315273","doi":"https://doi.org/10.1109/tia.2023.3315273","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tia.2023.3315273","pdf_url":null,"source":{"id":"https://openalex.org/S192268925","display_name":"IEEE Transactions on Industry Applications","issn_l":"0093-9994","issn":["0093-9994","1939-9367"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-2","ki-jl-1","norway-1","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industry Applications","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009248587","display_name":"Laith M. Halabi","orcid":"https://orcid.org/0000-0003-2571-1960","observed_orcids":["https://orcid.org/0000-0003-2571-1960"]},"institutions":[{"id":"https://openalex.org/I4405255751","display_name":"Nablus University for Vocational and Technical Education","ror":"https://ror.org/03crewh69","country_code":"PS","type":"education","lineage":["https://openalex.org/I4405255751"]}],"countries":["PS"],"is_corresponding":false,"raw_author_name":"Laith M. Halabi","raw_affiliation_strings":["College of Technical and Vocational Engineering, Nablus University for Vocational and Technical Education, Ramallah, State of Palestine"],"raw_orcid":"https://orcid.org/0000-0003-2571-1960","affiliations":[{"raw_affiliation_string":"College of Technical and Vocational Engineering, Nablus University for Vocational and Technical Education, Ramallah, State of Palestine","institution_ids":["https://openalex.org/I4405255751"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038849055","display_name":"Ibrahim Mohd Alsofyani","orcid":"https://orcid.org/0000-0002-2670-3789","observed_orcids":["https://orcid.org/0000-0002-2670-3789"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ibrahim Mohd Alsofyani","raw_affiliation_strings":["Digital Center, SEMI-TS, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-2670-3789","affiliations":[{"raw_affiliation_string":"Digital Center, SEMI-TS, South Korea","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073846036","display_name":"Kyo\u2010Beum Lee","orcid":"https://orcid.org/0000-0002-2125-9500","observed_orcids":["https://orcid.org/0000-0002-2125-9500"]},"institutions":[{"id":"https://openalex.org/I57664883","display_name":"Ajou University","ror":"https://ror.org/03tzb2h73","country_code":"KR","type":"education","lineage":["https://openalex.org/I57664883"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyo-Beum Lee","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Ajou University, Suwon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-2125-9500","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Ajou University, Suwon, South Korea","institution_ids":["https://openalex.org/I57664883"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2345,"currency":"USD","value_usd":2345},"apc_paid":null,"fwci":0.5701,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.56550327,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10504","display_name":"Sensorless Control of Electric Motors","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-diagnosis","display_name":"fault diagnosis","score":0.796999990940094},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"fault tolerance","score":0.9359999895095825},{"id":"https://openalex.org/keywords/multilevel-inverter","display_name":"multilevel inverter","score":0.8870000243186951},{"id":"https://openalex.org/keywords/space-vector-modulation","display_name":"space vector modulation","score":0.9409999847412109},{"id":"https://openalex.org/keywords/open-circuit-fault","display_name":"open-circuit fault","score":0.8709999918937683},{"id":"https://openalex.org/keywords/lookup-tables","display_name":"look-up table","score":0.8939999938011169},{"id":"https://openalex.org/keywords/dc-link-voltage","display_name":"DC bus voltage","score":0.843999981880188},{"id":"https://openalex.org/keywords/power-converter-reliability","display_name":"converter reliability","score":0.5619999766349792}],"concepts":[{"id":"https://openalex.org/C92746544","wikidata":"https://www.wikidata.org/wiki/Q585184","display_name":"Pulse-width modulation","level":3,"score":0.6199365258216858},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.5809070467948914},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5590911507606506},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5505573153495789},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5096638202667236},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5091602206230164},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5084242224693298},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5034999251365662},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4961443841457367},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4454685151576996},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4338809847831726},{"id":"https://openalex.org/C2988790929","wikidata":"https://www.wikidata.org/wiki/Q125977","display_name":"Space vector","level":4,"score":0.4278325140476227},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16773179173469543},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.12910938262939453},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06961888074874878},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tia.2023.3315273","doi":"https://doi.org/10.1109/tia.2023.3315273","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tia.2023.3315273","pdf_url":null,"source":{"id":"https://openalex.org/S192268925","display_name":"IEEE Transactions on Industry Applications","issn_l":"0093-9994","issn":["0093-9994","1939-9367"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-2","ki-jl-1","norway-1","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industry Applications","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.7207000255584717,"display_name":"Industry, innovation and infrastructure"}],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320335199","display_name":"Korea Institute of Energy Technology Evaluation and Planning","ror":"https://ror.org/02zq38y32"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":52,"referenced_works":["https://openalex.org/W1641947315","https://openalex.org/W1966336208","https://openalex.org/W1975478918","https://openalex.org/W1984008622","https://openalex.org/W2024878069","https://openalex.org/W2032232674","https://openalex.org/W2071760299","https://openalex.org/W2083390614","https://openalex.org/W2083442383","https://openalex.org/W2090364380","https://openalex.org/W2096496623","https://openalex.org/W2111528612","https://openalex.org/W2128169773","https://openalex.org/W2174980551","https://openalex.org/W2344926255","https://openalex.org/W2519788208","https://openalex.org/W2569671843","https://openalex.org/W2590567059","https://openalex.org/W2596622177","https://openalex.org/W2609701023","https://openalex.org/W2611512373","https://openalex.org/W2615304178","https://openalex.org/W2748466216","https://openalex.org/W2764091729","https://openalex.org/W2766069343","https://openalex.org/W2784141121","https://openalex.org/W2895885249","https://openalex.org/W2921480691","https://openalex.org/W2941027649","https://openalex.org/W2942518927","https://openalex.org/W2945582359","https://openalex.org/W2965581357","https://openalex.org/W2972334793","https://openalex.org/W2979856970","https://openalex.org/W2986780359","https://openalex.org/W3000653190","https://openalex.org/W3010166076","https://openalex.org/W3010331428","https://openalex.org/W3015038153","https://openalex.org/W3015523922","https://openalex.org/W3030334220","https://openalex.org/W3047202348","https://openalex.org/W3084053497","https://openalex.org/W3087521200","https://openalex.org/W3091996530","https://openalex.org/W3109306712","https://openalex.org/W3170496359","https://openalex.org/W4220756568","https://openalex.org/W4220855663","https://openalex.org/W4283761585","https://openalex.org/W4285205155","https://openalex.org/W4285271556"],"related_works":["https://openalex.org/W2141359996","https://openalex.org/W4293105820","https://openalex.org/W2374399167","https://openalex.org/W1576838085","https://openalex.org/W4411551306","https://openalex.org/W4283761585","https://openalex.org/W4322711108","https://openalex.org/W4214715832","https://openalex.org/W4200236771","https://openalex.org/W2787651843"],"abstract_inverted_index":{"Faults":[0],"are":[1,26,41,93],"a":[2,20,97,117],"common":[3,31],"issue":[4],"affecting":[5],"the":[6,29,48,81,86,108,113,127,130,134,138,143],"reliability":[7],"of":[8,19,28,33,107,129,137,142],"power":[9,21],"conversion":[10],"systems.":[11],"They":[12],"can":[13,64],"occur":[14],"in":[15,73,85],"any":[16],"switching":[17],"device":[18],"converter.":[22],"Open":[23],"circuit":[24,71],"faults":[25,72],"one":[27],"most":[30],"types":[32],"faults,":[34],"and":[35,39,67,78,89,96,132,150],"their":[36],"early":[37],"detection":[38,106],"tolerance":[40,121],"crucial":[42],"to":[43,125],"prevent":[44],"severe":[45],"effects":[46,128],"on":[47],"system.":[49,139],"In":[50,80],"this":[51],"paper,":[52],"an":[53],"enhanced":[54],"distorted":[55],"current\u2013voltage":[56],"space":[57],"vector":[58],"pulse-width":[59],"modulation":[60],"(SVPWM)":[61],"method":[62,145],"that":[63],"effectively":[65],"detect":[66],"tolerate":[68],"different":[69],"open":[70],"multilevel":[74],"converters":[75],"is":[76,101,115,123,146],"presented":[77],"illustrated.":[79],"proposed":[82,144],"method,":[83],"changes":[84],"output":[87],"current":[88],"DC":[90],"link":[91],"voltage":[92],"detected":[94],"first,":[95],"specific":[98],"look-up":[99],"table":[100],"then":[102],"generated":[103],"for":[104],"accurate":[105],"faulty":[109],"device.":[110],"Subsequently,":[111],"after":[112],"fault":[114,120,131],"detected,":[116],"modified":[118],"SVPWM":[119],"strategy":[122],"applied":[124],"mitigate":[126],"restore":[133],"healthy":[135],"operation":[136],"The":[140],"effectiveness":[141],"verified":[147],"through":[148],"simulation":[149],"experimental":[151],"results.":[152]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2023-09-15T00:00:00"}