{"id":"https://openalex.org/W4385656255","doi":"https://doi.org/10.23919/isdeiv55268.2023.10200896","title":"Methods for statistical analysis of the breakdown voltage of vacuum gaps","display_name":"Methods for statistical analysis of the breakdown voltage of vacuum gaps","publication_year":2023,"publication_date":"2023-06-25","ids":{"openalex":"https://openalex.org/W4385656255","doi":"https://doi.org/10.23919/isdeiv55268.2023.10200896"},"language":"en","primary_location":{"id":"doi:10.23919/isdeiv55268.2023.10200896","doi":"https://doi.org/10.23919/isdeiv55268.2023.10200896","is_oa":false,"landing_page_url":"https://doi.org/10.23919/isdeiv55268.2023.10200896","pdf_url":null,"source":{"id":"https://openalex.org/S4306420127","display_name":"International Symposium on Discharges and Electrical Insulation in Vacuum","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 30th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084331212","display_name":"Patrick Rumpelt","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210166982","display_name":"ABB (Germany)","ror":"https://ror.org/05yeg2858","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210166982","https://openalex.org/I885143765"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Patrick Rumpelt","raw_affiliation_strings":["ABB - Germany, Ratingen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ABB - Germany, Ratingen, Germany","institution_ids":["https://openalex.org/I4210166982"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014993369","display_name":"Michael Weuffel","orcid":"https://orcid.org/0000-0002-0015-7628","observed_orcids":["https://orcid.org/0000-0002-0015-7628"]},"institutions":[{"id":"https://openalex.org/I4210166982","display_name":"ABB (Germany)","ror":"https://ror.org/05yeg2858","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210166982","https://openalex.org/I885143765"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Michael Weuffel","raw_affiliation_strings":["ABB - Germany, Ratingen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ABB - Germany, Ratingen, Germany","institution_ids":["https://openalex.org/I4210166982"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001715739","display_name":"Thomas Schmoelzer","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210166982","display_name":"ABB (Germany)","ror":"https://ror.org/05yeg2858","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210166982","https://openalex.org/I885143765"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas Schm\u00f6lzer","raw_affiliation_strings":["ABB - Germany, Ratingen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ABB - Germany, Ratingen, Germany","institution_ids":["https://openalex.org/I4210166982"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110057405","display_name":"Thierry Delachaux","orcid":"https://orcid.org/0009-0005-8401-3726","observed_orcids":["https://orcid.org/0009-0005-8401-3726"]},"institutions":[{"id":"https://openalex.org/I885143765","display_name":"ABB (Switzerland)","ror":"https://ror.org/00ks5vt51","country_code":"CH","type":"company","lineage":["https://openalex.org/I885143765"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Thierry Delachaux","raw_affiliation_strings":["ABB Switzerland Ltd,Corporate Research,Baden-D\u00e4ttwil,Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ABB Switzerland Ltd,Corporate Research,Baden-D\u00e4ttwil,Switzerland","institution_ids":["https://openalex.org/I885143765"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5107276864","display_name":"Kai Hencken","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I885143765","display_name":"ABB (Switzerland)","ror":"https://ror.org/00ks5vt51","country_code":"CH","type":"company","lineage":["https://openalex.org/I885143765"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Kai Hencken","raw_affiliation_strings":["ABB Switzerland Ltd,Corporate Research,Baden-D\u00e4ttwil,Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ABB Switzerland Ltd,Corporate Research,Baden-D\u00e4ttwil,Switzerland","institution_ids":["https://openalex.org/I885143765"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.1624,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.8393108,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"13","last_page":"16"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12077","display_name":"Vacuum and Plasma Arcs","score":0.18379999697208405,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12077","display_name":"Vacuum and Plasma Arcs","score":0.18379999697208405,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.1776999980211258,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.1356000006198883,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/vacuum-interrupters","display_name":"vacuum interrupters","score":0.9229999780654907},{"id":"https://openalex.org/keywords/breakdown-voltage","display_name":"breakdown voltage","score":0.7960000038146973},{"id":"https://openalex.org/keywords/lightning-impulse-voltage","display_name":"lightning impulse voltage","score":0.9269999861717224},{"id":"https://openalex.org/keywords/dielectric-testing","display_name":"dielectric testing","score":0.7929999828338623},{"id":"https://openalex.org/keywords/breakdown-probability","display_name":"breakdown probability","score":0.6740000247955322},{"id":"https://openalex.org/keywords/quality-control","display_name":"quality control","score":0.675000011920929},{"id":"https://openalex.org/keywords/statistical-significance","display_name":"statistical significance","score":0.7099999785423279},{"id":"https://openalex.org/keywords/sequential-testing","display_name":"sequential testing","score":0.828000009059906},{"id":"https://openalex.org/keywords/vacuum-gap","display_name":"vacuum gap","score":0.39800000190734863}],"concepts":[{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.7101263999938965},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.596312403678894},{"id":"https://openalex.org/C70401718","wikidata":"https://www.wikidata.org/wiki/Q343241","display_name":"Dielectric strength","level":3,"score":0.5452849864959717},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.4740868806838989},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.46587228775024414},{"id":"https://openalex.org/C190540093","wikidata":"https://www.wikidata.org/wiki/Q5274914","display_name":"Dielectric withstand test","level":3,"score":0.4138225018978119},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3773042559623718},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3565956652164459},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.35158324241638184},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21448472142219543}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.23919/isdeiv55268.2023.10200896","doi":"https://doi.org/10.23919/isdeiv55268.2023.10200896","is_oa":false,"landing_page_url":"https://doi.org/10.23919/isdeiv55268.2023.10200896","pdf_url":null,"source":{"id":"https://openalex.org/S4306420127","display_name":"International Symposium on Discharges and Electrical Insulation in Vacuum","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 30th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1990688000","https://openalex.org/W2023071006","https://openalex.org/W2995169007","https://openalex.org/W4387039486"],"related_works":["https://openalex.org/W4385656338","https://openalex.org/W4387039486","https://openalex.org/W3212850904","https://openalex.org/W2017307896","https://openalex.org/W2136530847","https://openalex.org/W4226241967","https://openalex.org/W2063610657","https://openalex.org/W1935951910","https://openalex.org/W2110680613","https://openalex.org/W4416771730"],"abstract_inverted_index":{"Dielectric":[0],"testing":[1,74,138],"of":[2,25,37,53,57,143,149,196,223,227,267,277,280,289,292],"equipment":[3],"is":[4,46,176,206,218],"performed":[5],"for":[6,66,76,107,146,172],"different":[7],"duties":[8],"including":[9],"the":[10,23,26,34,38,50,67,95,108,130,164,168,194,221,238,275,278,287,290,297,299],"lightning":[11],"impulse":[12],"voltage":[13,110,235],"(LIV).":[14],"In":[15,127,193],"cases":[16],"where":[17],"vacuum":[18,41],"interrupters":[19],"(VI)":[20],"are":[21,89,119],"used,":[22],"determination":[24],"critical":[27,183,211,239],"LIV":[28,166],"value":[29,106,204,212],"poses":[30],"challenges":[31],"due":[32],"to":[33,48,61,116,139,163,186,219,296],"statistical":[35,82,169,301],"nature":[36],"breakdown":[39,68,109,132,161,203,234],"in":[40,59,136,256],"[1,":[42,125],"2].":[43,126],"Consequently,":[44],"it":[45],"required":[47,171],"evaluate":[49],"dielectric":[51,137,197],"behavior":[52],"a":[54,104,122,141,147,158,181,190,202,210,224,230,233,247,251,258,281],"large":[55],"number":[56,148,226],"specimens":[58],"order":[60],"obtain":[62],"statistically":[63],"significant":[64],"values":[65,145],"voltage.":[69],"Especially":[70],"during":[71],"early":[72],"development":[73],"and":[75,155,249],"quality":[77],"control":[78],"procedures":[79],"that":[80,100,102,118,180],"provide":[81,111],"significance":[83,170,302],"even":[84],"with":[85,189,294],"smaller":[86,173],"test":[87,174],"batches":[88,175],"highly":[90],"desirable.":[91],"The":[92,216],"idea":[93],"behind":[94],"methods":[96],"presented":[97],"here":[98],"is,":[99],"tests":[101],"yield":[103],"numerical":[105,144],"greater":[112,236],"information":[113],"as":[114,246],"compared":[115,264],"those":[117],"based":[120],"on":[121],"pass/fail":[123],"criterion":[124],"this":[128,199],"paper,":[129],"always":[131],"method":[133,242],"was":[134],"used":[135],"create":[140],"set":[142],"VIs.":[150],"Experimental":[151],"data":[152],"were":[153],"reviewed":[154],"converted":[156],"into":[157],"function":[159],"relating":[160],"probability":[162,222],"applied":[165],"voltage.Furthermore,":[167],"established":[177],"by":[178,265],"assuming":[179],"certain":[182],"level":[184],"needs":[185],"be":[187,263,304],"fulfilled":[188],"high":[191],"probability.":[192],"case":[195],"characterization,":[198],"means":[200,266],"whether":[201],"$\\mathrm{U}_{\\mathrm{d}}$":[205],"above":[207],"or":[208,253,283],"below":[209],"$\\mathrm{U}_{\\mathrm{c}}$":[213],"(limit":[214],"voltage).":[215],"goal":[217],"determine":[220],"larger":[225],"pieces":[228],"(e.g.":[229],"batch)":[231],"having":[232],"than":[237],"value.":[240],"This":[241],"produces":[243],"two":[244,254],"probabilities":[245],"result":[248],"defines":[250],"range":[252],"trendlines":[255],"which":[257],"derived":[259],"ratio":[260,276],"R":[261,271,293],"can":[262,303],"sequential":[268],"testing.":[269],"Here":[270],"respectively":[272],"log(R)":[273],"describes":[274],"likelihoods":[279],"positive":[282],"negative":[284],"assignment.":[285],"With":[286],"help":[288],"position":[291],"respect":[295],"trendline,":[298],"desired":[300],"achieved.":[305]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2023-08-09T00:00:00"}