{"id":"https://openalex.org/W4385075879","doi":"https://doi.org/10.1016/j.physleta.2023.129036","title":"Performance-enhanced photodetector based on ZnO/MWCNTs/MXene hybrid layer: Enhanced charge transport and hot-electrons injection","display_name":"Performance-enhanced photodetector based on ZnO/MWCNTs/MXene hybrid layer: Enhanced charge transport and hot-electrons injection","publication_year":2023,"publication_date":"2023-07-22","ids":{"openalex":"https://openalex.org/W4385075879","doi":"https://doi.org/10.1016/j.physleta.2023.129036"},"language":"en","primary_location":{"id":"doi:10.1016/j.physleta.2023.129036","doi":"https://doi.org/10.1016/j.physleta.2023.129036","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.physleta.2023.129036","pdf_url":null,"source":{"id":"https://openalex.org/S104875562","display_name":"Physics Letters A","issn_l":"0375-9601","issn":["0375-9601","1873-2429"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Physics Letters A","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://doi.org/10.2139/ssrn.4444044","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066755551","display_name":"Lingling Chu","orcid":"https://orcid.org/0000-0003-1612-158X","observed_orcids":["https://orcid.org/0000-0003-1612-158X"]},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ling  ling Chu","raw_affiliation_strings":["Anhui University","Anhui University, China","College of Integrated Circuits, Anhui University, No. 111 Jiulong Road, Hefei, Anhui Province, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"Anhui University, China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"College of Integrated Circuits, Anhui University, No. 111 Jiulong Road, Hefei, Anhui Province, People's Republic of China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066755551","display_name":"Lingling Chu","orcid":"https://orcid.org/0000-0003-1612-158X","observed_orcids":["https://orcid.org/0000-0003-1612-158X"]},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Lingling Chu","raw_affiliation_strings":["Anhui University","Anhui University, China","College of Integrated Circuits, Anhui University, No. 111 Jiulong Road, Hefei, Anhui Province, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"Anhui University, China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"College of Integrated Circuits, Anhui University, No. 111 Jiulong Road, Hefei, Anhui Province, People's Republic of China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110163162","display_name":"Chao Nie","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]},{"id":"https://openalex.org/I174385955","display_name":"Hefei Normal University","ror":"https://ror.org/01b64k086","country_code":"CN","type":"education","lineage":["https://openalex.org/I174385955"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Xu","raw_affiliation_strings":["Anhui University","Anhui University, China","School of Electronic Information and Integrated Circuits, Hefei Normal University, Hefei 230601, Anhui, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"Anhui University, China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Electronic Information and Integrated Circuits, Hefei Normal University, Hefei 230601, Anhui, People's Republic of China","institution_ids":["https://openalex.org/I174385955"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5158338683","display_name":"Ning Wei","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I174385955","display_name":"Hefei Normal University","ror":"https://ror.org/01b64k086","country_code":"CN","type":"education","lineage":["https://openalex.org/I174385955"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ning Wei","raw_affiliation_strings":["Hefei Normal University","Hefei Normal University, Hefei, China","School of Electronic Information and Integrated Circuits, Hefei Normal University, Hefei 230601, Anhui, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hefei Normal University","institution_ids":["https://openalex.org/I174385955"]},{"raw_affiliation_string":"Hefei Normal University, Hefei, China","institution_ids":["https://openalex.org/I174385955"]},{"raw_affiliation_string":"School of Electronic Information and Integrated Circuits, Hefei Normal University, Hefei 230601, Anhui, People's Republic of China","institution_ids":["https://openalex.org/I174385955"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100328766","display_name":"Haibo Wang","orcid":"https://orcid.org/0000-0001-5321-8888","observed_orcids":["https://orcid.org/0000-0001-5321-8888","https://orcid.org/0000-0002-4772-6963","https://orcid.org/0000-0003-2326-1425"]},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]},{"id":"https://openalex.org/I174385955","display_name":"Hefei Normal University","ror":"https://ror.org/01b64k086","country_code":"CN","type":"education","lineage":["https://openalex.org/I174385955"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haibo Wang","raw_affiliation_strings":["Hefei Normal University","Hefei Normal University, Hefei, China","College of Integrated Circuits, Anhui University, No. 111 Jiulong Road, Hefei, Anhui Province, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hefei Normal University","institution_ids":["https://openalex.org/I174385955"]},{"raw_affiliation_string":"Hefei Normal University, Hefei, China","institution_ids":["https://openalex.org/I174385955"]},{"raw_affiliation_string":"College of Integrated Circuits, Anhui University, No. 111 Jiulong Road, Hefei, Anhui Province, People's Republic of China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110163162","display_name":"Chao Nie","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Nie","raw_affiliation_strings":["Anhui University","Anhui University, China","College of Electronic Information Engineering, Anhui University, No. 111 Jiulong Road, Hefei, Anhui Province, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"Anhui University, China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"College of Electronic Information Engineering, Anhui University, No. 111 Jiulong Road, Hefei, Anhui Province, People's Republic of China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"last","author":{"id":null,"display_name":"Liting Deng","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liting Deng","raw_affiliation_strings":["Anhui University","Anhui University, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"Anhui University, China","institution_ids":["https://openalex.org/I143868143"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5066755551"],"corresponding_institution_ids":["https://openalex.org/I143868143"],"apc_list":{"value":2680,"currency":"USD","value_usd":2680},"apc_paid":null,"fwci":0.7414,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.60461506,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"482","issue":null,"first_page":"129036","last_page":"129036"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.986299991607666,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.986299991607666,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10078","display_name":"Advanced Photocatalysis Techniques","score":0.005499999970197678,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.0008999999845400453,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mxene","display_name":"MXene","score":0.8199999928474426},{"id":"https://openalex.org/keywords/multi-walled-carbon-nanotubes","display_name":"multi-walled carbon nanotubes","score":0.9990000128746033},{"id":"https://openalex.org/keywords/hot-electron-injection","display_name":"hot electron injection","score":0.9070000052452087},{"id":"https://openalex.org/keywords/charge-transfer-enhancement","display_name":"charge transfer enhancement","score":0.6620000004768372},{"id":"https://openalex.org/keywords/localized-surface-plasmon-resonance","display_name":"localized surface plasmon resonance","score":0.9620000123977661},{"id":"https://openalex.org/keywords/space-charge-region","display_name":"depletion region","score":0.9399999976158142},{"id":"https://openalex.org/keywords/specific-detectivity","display_name":"detectivity","score":0.6830000281333923},{"id":"https://openalex.org/keywords/responsivity","display_name":"responsivity","score":0.968999981880188},{"id":"https://openalex.org/keywords/interface-engineering","display_name":"interface engineering","score":0.6370000243186951}],"concepts":[{"id":"https://openalex.org/C2779845233","wikidata":"https://www.wikidata.org/wiki/Q3381567","display_name":"Photocurrent","level":2,"score":0.8329436779022217},{"id":"https://openalex.org/C23125352","wikidata":"https://www.wikidata.org/wiki/Q210765","display_name":"Photodetector","level":2,"score":0.7798378467559814},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.7044020295143127},{"id":"https://openalex.org/C178889773","wikidata":"https://www.wikidata.org/wiki/Q7316011","display_name":"Responsivity","level":3,"score":0.6740556955337524},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.6305360794067383},{"id":"https://openalex.org/C513720949","wikidata":"https://www.wikidata.org/wiki/Q1778729","display_name":"Carbon nanotube","level":2,"score":0.5731350779533386},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.52118319272995},{"id":"https://openalex.org/C103132145","wikidata":"https://www.wikidata.org/wiki/Q1669228","display_name":"Space charge","level":3,"score":0.4638199210166931},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.4312775135040283},{"id":"https://openalex.org/C98446981","wikidata":"https://www.wikidata.org/wiki/Q288224","display_name":"Depletion region","level":3,"score":0.41643065214157104},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3131161332130432},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.30056172609329224},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.0694417655467987},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.physleta.2023.129036","doi":"https://doi.org/10.1016/j.physleta.2023.129036","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.physleta.2023.129036","pdf_url":null,"source":{"id":"https://openalex.org/S104875562","display_name":"Physics Letters A","issn_l":"0375-9601","issn":["0375-9601","1873-2429"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Physics Letters A","raw_type":"journal-article"},{"id":"doi:10.2139/ssrn.4444044","doi":"https://doi.org/10.2139/ssrn.4444044","is_oa":true,"landing_page_url":"https://doi.org/10.2139/ssrn.4444044","pdf_url":null,"source":{"id":"https://openalex.org/S4210172589","display_name":"SSRN Electronic Journal","issn_l":"1556-5068","issn":["1556-5068"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1318003438","host_organization_name":"RELX Group (Netherlands)","host_organization_lineage":["https://openalex.org/I1318003438"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"posted-content"}],"best_oa_location":{"id":"doi:10.2139/ssrn.4444044","doi":"https://doi.org/10.2139/ssrn.4444044","is_oa":true,"landing_page_url":"https://doi.org/10.2139/ssrn.4444044","pdf_url":null,"source":{"id":"https://openalex.org/S4210172589","display_name":"SSRN Electronic Journal","issn_l":"1556-5068","issn":["1556-5068"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1318003438","host_organization_name":"RELX Group (Netherlands)","host_organization_lineage":["https://openalex.org/I1318003438"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"posted-content"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1976395109","https://openalex.org/W2014451195","https://openalex.org/W2023701165","https://openalex.org/W2038190143","https://openalex.org/W2075594981","https://openalex.org/W2311584416","https://openalex.org/W2792931123","https://openalex.org/W2804557699","https://openalex.org/W2806996951","https://openalex.org/W2944236634","https://openalex.org/W2980456798","https://openalex.org/W3020204536","https://openalex.org/W3106508446","https://openalex.org/W3112790873","https://openalex.org/W3113062527","https://openalex.org/W3132491905","https://openalex.org/W3138420394","https://openalex.org/W3152621335","https://openalex.org/W3210786387","https://openalex.org/W3211510971","https://openalex.org/W4206254578","https://openalex.org/W4310664475"],"related_works":["https://openalex.org/W4387735075","https://openalex.org/W4310664475","https://openalex.org/W4405662433","https://openalex.org/W4200392941","https://openalex.org/W3165451403","https://openalex.org/W2910813544","https://openalex.org/W4401675413","https://openalex.org/W4393318406","https://openalex.org/W4401534397","https://openalex.org/W4304783139"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":1}],"updated_date":"2026-11-12T12:28:57.059296","created_date":"2023-07-23T00:00:00"}